ISLAM A-K-M-Mahfuzul

最終更新日時: 2019/07/19 22:06:58

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氏名(漢字/フリガナ/アルファベット表記)
ISLAM A-K-M-Mahfuzul/イスラム エイケイエムマーフズル/Islam, A-k-m-mahfuzul
所属部署・職名(部局/所属/講座等/職名)
工学研究科/電気工学専攻電磁工学講座/講師
学部兼担
部局 所属 講座等 職名
工学部
国際高等教育院
連絡先住所
種別 住所(日本語) 住所(英語)
職場 〒615-8510 京都市西京区京都大学桂 A1棟402号室 Room 402, Building A1, Kyoto Daigaku Katsura, Nishikyo-ku, Kyoto 615-8510
連絡先電話番号
種別 番号
職場 075-383-7382
取得学位
学位名(日本語) 学位名(英語) 大学(日本語) 大学(英語) 取得区分
修士(情報学) Master 京都大学 Kyoto University
博士(情報学) PhD 京都大学 Kyoto University
出身大学院・研究科等
大学名(日本語) 大学名(英語) 研究科名(日本語) 研究科名(英語) 専攻名(日本語) 専攻名(英語) 修了区分
京都大学 Kyoto University 大学院情報学研究科修士課程通信情報システム専攻 Graduate School of Informatics Department of Communications and Computer Engineering 修了
京都大学 Kyoto University 大学院情報学研究科博士後期課程通信情報システム専攻 Graduate School of Informatics Department of Communications and Computer Engineering 修了
出身学校・専攻等
大学名(日本語) 大学名(英語) 学部名(日本語) 学部名(英語) 学科名(日本語) 学科名(英語) 卒業区分
京都大学 Kyoto University 工学部電気電子工学科(3年次編入) Faculty of Engineering Electrical and Electronic Engineering Department 卒業
Sylhet Cadet College Sylhet Cadet College 卒業
東京日本語教育センター Tokyo Japanese Language Center 卒業
Bangladesh University of Engineering and Technology Bangladesh University of Engineering and Technology Computer Science and Engineering Department 退学
出身高等学校
高等学校名 ふりがな
大分工業高等専門学校 おおいたきょうぎょうこうとうせんもんがっこう
職歴
期間 組織名(日本語) 組織名(英語) 職名(日本語) 職名(英語)
2014/02/01〜2015/03/31 日本学術振興会 Japan Society for the Promotion of Science 特別研究員 Research Fellow
2015/04/01〜2018/09/31 東京大学 The University of Tokyo 助教 Research Associate
使用言語
言語名(japanese) 言語名(english) コード
日本語
英語
個人ホームページ
URL
https://mahfuz.site/
ORCID ID
https://orcid.org/0000-0002-5011-4044
researchmap URL
https://researchmap.jp/7000025196
研究テーマ
(日本語)
1. 大規模集積回路の低消費電力設計 2. ランダムテレグラフノイズの評価とモデル化 3. オンチップセンサ回路の設計
(英語)
1. Low-power design techniques for large scale integration 2. Characterization and modeling of random telegraph noise 3. Low-power on-chip sensor circuit
研究分野(キーワード)
キーワード(日本語) キーワード(英語)
VLSI, 低電力,ランダムテレグラフノイズ,ばらつき,センサ,アナログ,ディジタル,セルライブラリ VLSI, Low-power, Random telegraph noise, Sensor, Analog, Digital, Cell library
論文
著者 著者(日本語) 著者(英語) タイトル タイトル(日本語) タイトル(英語) 書誌情報等 書誌情報等(日本語) 書誌情報等(英語) 出版年月 査読の有無 記述言語 掲載種別 公開
K. Miyazaki, Y. Lo, A. K. M. M. Islam, K. Hata, M. Takamiya, and T. Sakurai K. Miyazaki, Y. Lo, A. K. M. M. Islam, K. Hata, M. Takamiya, and T. Sakurai K. Miyazaki, Y. Lo, A. K. M. M. Islam, K. Hata, M. Takamiya, and T. Sakurai CNN-based Approach for Estimating Degradation of Power Devices by Gate Waveform Monitoring CNN-based Approach for Estimating Degradation of Power Devices by Gate Waveform Monitoring CNN-based Approach for Estimating Degradation of Power Devices by Gate Waveform Monitoring Proceedings of IEEE International Conference on IC Design and Technology (ICICDT), 104-107 Proceedings of IEEE International Conference on IC Design and Technology (ICICDT), 104-107 Proceedings of IEEE International Conference on IC Design and Technology (ICICDT), 104-107 2019/06 英語 研究論文(国際会議プロシーディングス) 公開
A.K.M. Mahfuzul Islam, Ryota Shimizu, and Hidetoshi Onodera A.K.M. Mahfuzul Islam, Ryota Shimizu, and Hidetoshi Onodera A.K.M. Mahfuzul Islam, Ryota Shimizu, and Hidetoshi Onodera Analysis of Random Telegraph Noise (RTN) at Near-threshold Operation by Measuring 154k Ring Oscillators, Analysis of Random Telegraph Noise (RTN) at Near-threshold Operation by Measuring 154k Ring Oscillators, Analysis of Random Telegraph Noise (RTN) at Near-threshold Operation by Measuring 154k Ring Oscillators, Proceedings of IEEE International Reliability Physics Symposium (IRPS), 1-6 Proceedings of IEEE International Reliability Physics Symposium (IRPS), 1-6 Proceedings of IEEE International Reliability Physics Symposium (IRPS), 1-6 2019/04 英語 研究論文(国際会議プロシーディングス) 公開
A.K.M. Mahfuzul Islam, Ryota Shimizu, and Hidetoshi Onodera A.K.M. Mahfuzul Islam, Ryota Shimizu, and Hidetoshi Onodera A.K.M. Mahfuzul Islam, Ryota Shimizu, and Hidetoshi Onodera Effect of Logic Depth and Switching Speed on Random Telegraph Noise Induced Delay Fluctuation Effect of Logic Depth and Switching Speed on Random Telegraph Noise Induced Delay Fluctuation Effect of Logic Depth and Switching Speed on Random Telegraph Noise Induced Delay Fluctuation Proceedings of International Conference on Microelectronic Test Structure (ICMTS), 166-170 Proceedings of International Conference on Microelectronic Test Structure (ICMTS), 166-170 Proceedings of International Conference on Microelectronic Test Structure (ICMTS), 166-170 2019/03 英語 研究論文(国際会議プロシーディングス) 公開
A.K.M. Mahfuzul Islam, Shinichi Nishizawa, Yusuke Matsui, and Yoshinobu Ichida A.K.M. Mahfuzul Islam, Shinichi Nishizawa, Yusuke Matsui, and Yoshinobu Ichida A.K.M. Mahfuzul Islam, Shinichi Nishizawa, Yusuke Matsui, and Yoshinobu Ichida Drive-Strength Selection for Synthesis of Leakage-Dominant Circuits Drive-Strength Selection for Synthesis of Leakage-Dominant Circuits Drive-Strength Selection for Synthesis of Leakage-Dominant Circuits Proceedings of International Symposium on Quality Electronic Design (ISQED), 298-303 Proceedings of International Symposium on Quality Electronic Design (ISQED), 298-303 Proceedings of International Symposium on Quality Electronic Design (ISQED), 298-303 2019/03 英語 研究論文(国際会議プロシーディングス) 公開
A.K.M. Mahfuzul Islam, and Hidetoshi Onodera A.K.M. Mahfuzul Islam, and Hidetoshi Onodera Circuit Techniques for Device-Circuit Interaction toward Minimum Energy Operation Circuit Techniques for Device-Circuit Interaction toward Minimum Energy Operation Circuit Techniques for Device-Circuit Interaction toward Minimum Energy Operation IPSJ Transactions on System LSI Design Methodology, 12, 2-12 IPSJ Transactions on System LSI Design Methodology, 12, 2-12 IPSJ Transactions on System LSI Design Methodology, 12, 2-12 2019 英語 研究論文(学術雑誌) 公開
Teruki Someya, A.K.M. Mahfuzul Islam, Takayasu Sakurai, and Makoto Takamiya Teruki Someya, A.K.M. Mahfuzul Islam, Takayasu Sakurai, and Makoto Takamiya An 11-nW CMOS Temperature-to-Digital Converter Utilizing Sub-Threshold Current at Sub-Thermal Drain Voltage An 11-nW CMOS Temperature-to-Digital Converter Utilizing Sub-Threshold Current at Sub-Thermal Drain Voltage An 11-nW CMOS Temperature-to-Digital Converter Utilizing Sub-Threshold Current at Sub-Thermal Drain Voltage IEEE Journal of Solid-State Circuits, 54, 3, 613-622 , 54, 3, 613-622 IEEE Journal of Solid-State Circuits, 54, 3, 613-622 2019 英語 研究論文(学術雑誌) 公開
A.K.M. Mahfuzul Islam, and Hidetoshi Onodera A.K.M. Mahfuzul Islam, and Hidetoshi Onodera A.K.M. Mahfuzul Islam, and Hidetoshi Onodera PVT2: Process, Voltage, Temperature and Time-dependent Variability in Scaled CMOS Process, PVT2: Process, Voltage, Temperature and Time-dependent Variability in Scaled CMOS Process, PVT2: Process, Voltage, Temperature and Time-dependent Variability in Scaled CMOS Process, Proceedings of IEEE/ACM International Conference on Computer Aided Design (ICCAD), 1-6 Proceedings of IEEE/ACM International Conference on Computer Aided Design (ICCAD), 1-6 Proceedings of IEEE/ACM International Conference on Computer Aided Design (ICCAD), 1-6 2018/11 英語 研究論文(国際会議プロシーディングス) 公開
A.K.M. Mahfuzul Islam, and Hidetoshi Onodera A.K.M. Mahfuzul Islam, and Hidetoshi Onodera A.K.M. Mahfuzul Islam, and Hidetoshi Onodera Worst-case Performance Analysis Under Random Telegraph Noise Induced Threshold Voltage Variability Worst-case Performance Analysis Under Random Telegraph Noise Induced Threshold Voltage Variability Worst-case Performance Analysis Under Random Telegraph Noise Induced Threshold Voltage Variability Proceedings of ACM International Symposium on Power and Timing Modeling, Optimization and Simulation, 140-146 Proceedings of ACM International Symposium on Power and Timing Modeling, Optimization and Simulation, 140-146 Proceedings of ACM International Symposium on Power and Timing Modeling, Optimization and Simulation, 140-146 2018/07 英語 研究論文(国際会議プロシーディングス) 公開
Swapnil Sayan Saha, Shafizur Rahman, Miftahul Jannat Rasna, A.K.M. Mahfuzul Islam, and Md. Atiqur Rahman Ahad Swapnil Sayan Saha, Shafizur Rahman, Miftahul Jannat Rasna, A.K.M. Mahfuzul Islam, and Md. Atiqur Rahman Ahad Swapnil Sayan Saha, Shafizur Rahman, Miftahul Jannat Rasna, A.K.M. Mahfuzul Islam, and Md. Atiqur Rahman Ahad DU-MD: An Open-Source Human Action Dataset for Ubiquitous Wearable Sensors DU-MD: An Open-Source Human Action Dataset for Ubiquitous Wearable Sensors DU-MD: An Open-Source Human Action Dataset for Ubiquitous Wearable Sensors Proceedings of 7th International Conference on Informatics, Electronics and Vision, 567-572 Proceedings of 7th International Conference on Informatics, Electronics and Vision, 567-572 Proceedings of 7th International Conference on Informatics, Electronics and Vision, 567-572 2018/06 英語 研究論文(国際会議プロシーディングス) 公開
Teruki Someya, A.K.M. Mahfuzul Islam, Takayasu Sakurai, and Makoto Takamiya Teruki Someya, A.K.M. Mahfuzul Islam, Takayasu Sakurai, and Makoto Takamiya Teruki Someya, A.K.M. Mahfuzul Islam, Takayasu Sakurai, and Makoto Takamiya A 13nW Temperature-to-Digital Converter Utilizing Sub-threshold MOSFET Operation at Sub-thermal Drain Voltage A 13nW Temperature-to-Digital Converter Utilizing Sub-threshold MOSFET Operation at Sub-thermal Drain Voltage A 13nW Temperature-to-Digital Converter Utilizing Sub-threshold MOSFET Operation at Sub-thermal Drain Voltage Proceedings of IEEE Custom Integrated Circuits Conference (CICC), 1-4 Proceedings of IEEE Custom Integrated Circuits Conference (CICC), 1-4 Proceedings of IEEE Custom Integrated Circuits Conference (CICC), 1-4 2018/04 英語 研究論文(国際会議プロシーディングス) 公開
A.K.M. Mahfuzul Islam, Masashi Oka, and Hidetoshi Onodera A.K.M. Mahfuzul Islam, Masashi Oka, and Hidetoshi Onodera A.K.M. Mahfuzul Islam, Masashi Oka, and Hidetoshi Onodera Measurement of Temperature Effect on Random Telegraph Noise Induced Delay Fluctuation Measurement of Temperature Effect on Random Telegraph Noise Induced Delay Fluctuation Measurement of Temperature Effect on Random Telegraph Noise Induced Delay Fluctuation Proceedings of International Conference on Microelectronic Test Structure (ICMTS), 2010-2015 Proceedings of International Conference on Microelectronic Test Structure (ICMTS), 2010-2015 Proceedings of International Conference on Microelectronic Test Structure (ICMTS), 2010-2015 2018/03 英語 研究論文(国際会議プロシーディングス) 公開
Swapnil Sayan Saha, Shafizur Rahman, Miftahul Jannat Rasna, Tarek Bin Zahid, A.K.M. Mahfuzul Islam, and Md. Atiqur Rahman Ahad Swapnil Sayan Saha, Shafizur Rahman, Miftahul Jannat Rasna, Tarek Bin Zahid, A.K.M. Mahfuzul Islam, and Md. Atiqur Rahman Ahad Swapnil Sayan Saha, Shafizur Rahman, Miftahul Jannat Rasna, Tarek Bin Zahid, A.K.M. Mahfuzul Islam, and Md. Atiqur Rahman Ahad Feature Extraction, Performance Analysis and System Design using the DU Mobility Dataset Feature Extraction, Performance Analysis and System Design using the DU Mobility Dataset Feature Extraction, Performance Analysis and System Design using the DU Mobility Dataset IEEE Access, 6, 44776-447886 IEEE Access, 6, 44776-447886 IEEE Access, 6, 44776-447886 2018 英語 研究論文(学術雑誌) 公開
A. K. M. Mahfuzul Islam, Tatsuya Nakai, and Hidetoshi Onodera A. K. M. Mahfuzul Islam, Tatsuya Nakai, and Hidetoshi Onodera A. K. M. Mahfuzul Islam, Tatsuya Nakai, and Hidetoshi Onodera Statistical Analysis and Modeling of Random Telegraph Noise Based on Gate Delay Measurement Statistical Analysis and Modeling of Random Telegraph Noise Based on Gate Delay Measurement Statistical Analysis and Modeling of Random Telegraph Noise Based on Gate Delay Measurement IEEE Transactions on Semiconductor Manufacturing, 30, 3, 216-226 IEEE Transactions on Semiconductor Manufacturing, 30, 3, 216-226 IEEE Transactions on Semiconductor Manufacturing, 30, 3, 216-226 2017 英語 研究論文(学術雑誌) 公開
A. K. M. Mahfuzul Islam, M. Hamamatsu, T. Yokota, S. Lee, W. Yukita, M. Takamiya, T. Someya, and T. Sakurai A. K. M. Mahfuzul Islam, M. Hamamatsu, T. Yokota, S. Lee, W. Yukita, M. Takamiya, T. Someya, and T. Sakurai A. K. M. Mahfuzul Islam, M. Hamamatsu, T. Yokota, S. Lee, W. Yukita, M. Takamiya, T. Someya, and T. Sakurai Programmable Neuron Array Based on a 2-Transistor Multiplier Using Organic Floating-Gate for Intelligent Sensors Programmable Neuron Array Based on a 2-Transistor Multiplier Using Organic Floating-Gate for Intelligent Sensors Programmable Neuron Array Based on a 2-Transistor Multiplier Using Organic Floating-Gate for Intelligent Sensors IEEE Journal on Emerging and Selected Topics in Circuits and Systems, 7, 1, 81-91 IEEE Journal on Emerging and Selected Topics in Circuits and Systems, 7, 1, 81-91 IEEE Journal on Emerging and Selected Topics in Circuits and Systems, 7, 1, 81-91 2017 英語 研究論文(学術雑誌) 公開
A.K.M. Mahfuzul Islam, Jun Shiomi, Tohru Ishihara, and Hidetoshi Onodera A.K.M. Mahfuzul Islam, Jun Shiomi, Tohru Ishihara, and Hidetoshi Onodera A.K.M. Mahfuzul Islam, Jun Shiomi, Tohru Ishihara, and Hidetoshi Onodera Wide-Supply-Range All-Digital Leakage Variation Sensor for On-chip Process and Temperature Monitoring Wide-Supply-Range All-Digital Leakage Variation Sensor for On-chip Process and Temperature Monitoring Wide-Supply-Range All-Digital Leakage Variation Sensor for On-chip Process and Temperature Monitoring IEEE Journal of Solid-State Circuits, 50, 11, 2475-2490 IEEE Journal of Solid-State Circuits, 50, 11, 2475-2490 IEEE Journal of Solid-State Circuits, 50, 11, 2475-2490 2015 英語 研究論文(学術雑誌) 公開
A.K.M. Mahfuzul Islam, and Hidetoshi Onodera A.K.M. Mahfuzul Islam, and Hidetoshi Onodera A.K.M. Mahfuzul Islam, and Hidetoshi Onodera Area-efficient Reconfigurable Ring Oscillator for Characterization of Static and Dynamic Variations Area-efficient Reconfigurable Ring Oscillator for Characterization of Static and Dynamic Variations Area-efficient Reconfigurable Ring Oscillator for Characterization of Static and Dynamic Variations Japanese Journal of Applied Physics, 53, 4S, 04EE01-043308 Japanese Journal of Applied Physics, 53, 4S, 04EE01-043308 Japanese Journal of Applied Physics, 53, 4S, 04EE01-043308 2014 英語 研究論文(学術雑誌) 公開
A.K.M. Mahfuzul Islam, and Hidetoshi Onodera A.K.M. Mahfuzul Islam, and Hidetoshi Onodera A.K.M. Mahfuzul Islam, and Hidetoshi Onodera On-Chip Detection of Process Shift and Process Spread for Post-Silicon Diagnosis and Model-Hardware Correlation, On-Chip Detection of Process Shift and Process Spread for Post-Silicon Diagnosis and Model-Hardware Correlation, On-Chip Detection of Process Shift and Process Spread for Post-Silicon Diagnosis and Model-Hardware Correlation, IEICE Transactions on Information and Systems, E96-D, 9, 1971-1979 IEICE Transactions on Information and Systems, E96-D, 9, 1971-1979 IEICE Transactions on Information and Systems, E96-D, 9, 1971-1979 2013 英語 研究論文(学術雑誌) 公開
Shuuichi Fujimoto, A.K.M. Mahfuzul Islam, Takashi Matsumoto, and Hidetoshi Onodera Shuuichi Fujimoto, A.K.M. Mahfuzul Islam, Takashi Matsumoto, and Hidetoshi Onodera Shuuichi Fujimoto, A.K.M. Mahfuzul Islam, Takashi Matsumoto, and Hidetoshi Onodera Inhomogeneous Ring Oscillator for Within-Die Variability and RTN Characterization, Inhomogeneous Ring Oscillator for Within-Die Variability and RTN Characterization, Inhomogeneous Ring Oscillator for Within-Die Variability and RTN Characterization, IEEE Transactions on Semiconductor Manufacturing, 26, 3, 296-305 IEEE Transactions on Semiconductor Manufacturing, 26, 3, 296-305 IEEE Transactions on Semiconductor Manufacturing, 26, 3, 296-305 2013 英語 研究論文(学術雑誌) 公開
A.K.M. Mahfuzul Islam, Akira Tsuchiya, Kazutoshi Kobayashi, and Hidetoshi Onodera A.K.M. Mahfuzul Islam, Akira Tsuchiya, Kazutoshi Kobayashi, and Hidetoshi Onodera A.K.M. Mahfuzul Islam, Akira Tsuchiya, Kazutoshi Kobayashi, and Hidetoshi Onodera Variation-sensitive Monitor Circuits for Estimation of Global Process Parameter Variation Variation-sensitive Monitor Circuits for Estimation of Global Process Parameter Variation Variation-sensitive Monitor Circuits for Estimation of Global Process Parameter Variation IEEE Transactions on Semiconductor Manufacturing, 25, 4, 571-580 IEEE Transactions on Semiconductor Manufacturing, 25, 4, 571-580 IEEE Transactions on Semiconductor Manufacturing, 25, 4, 571-580 2012 英語 研究論文(学術雑誌) 公開

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タイトル言語:
産業財産権 (特許)
発明者 発明者(日本語) 発明者(英語) 発明の名称 発明の名称(日本語) 発明の名称(英語) 審査の段階 番号 年月 公開
Hidetoshi Onodera, and A. K. M. Mahfuzul Islam Hidetoshi Onodera, and A. K. M. Mahfuzul Islam Hidetoshi Onodera, and A. K. M. Mahfuzul Islam Reconfigurable delay circuit, delay monitor circuit using said delay circuit, variation compensation circuit, variation measurement method, and variation compensation method Reconfigurable delay circuit, delay monitor circuit using said delay circuit, variation compensation circuit, variation measurement method, and variation compensation method Reconfigurable delay circuit, delay monitor circuit using said delay circuit, variation compensation circuit, variation measurement method, and variation compensation method 特許登録 特許U.S. Patent No. 9,899,993 2018/02/20 公開
タイトル言語:
学術賞等
賞の名称(日本語) 賞の名称(英語) 授与組織名(日本語) 授与組織名(英語) 年月
ベストペーパ Best paper IEEE International Conference on Microelectronic Test Structure IEEE International Conference on Microelectronic Test Structure 2017/03/
山下記念研究賞 IPSJ Yamashita SIG Research Award 情報処理学会 Information Processing Society of Japan 2015/08/
コンピュータサイエンス領域奨励賞 Computer Science Research Award for Young Scientists 情報処理学会 Information Processing Society of Japan 2014/08/
丹羽保次郎記念論文賞 Yasujiro Niwa Outstanding Paper Award 東京電機大学 Tokyo Denki University 2014/02/
学生デザイン賞 Student Design Contest Award IEEE Asian Solid-State Circuits Conference IEEE Asian Solid-State Circuits Conference 2013/11/
優秀論文賞 Outstanding Paper Award 情報処理学会 Information Processing Society of Japan 2013/08/
VDECデザインアワード VDEC Design Award IEEE SSCS Japan Chapter IEEE SSCS Japan Chapter 2012/08/
第8回学生研究奨励賞 Student Research Award IEEE Kansai Section IEEE Kansai Section 2011/11/
畠山賞 Hatayama Memorial Award, 日本機械学会 The Japan Society of Mechanical Engineers 2007/03/
外部資金:競争的資金 (科学研究費補助金)
種別 代表/分担 テーマ(日本語) テーマ(英語) 期間
若手研究 代表 製造ばらつきを利用したCMOSセンサ回路の低消費電力設計に関する研究 2019/04/01〜2022/03/31
特別研究員奨励費 代表 特性ばらつきの自律補償技術とそれを活用したLSIの低消費電力化手法に関する研究 2013/04/01〜2015/03/31
担当科目
講義名(日本語) 講義名(英語) 開講期 学部/研究科 年度
ILAS Seminar-E2 ILAS Seminar-E2 後期 全学共通科目 2019/04〜2020/03
Mathematical Description of Natural Phenomena-E2 Mathematical Description of Natural Phenomena-E2 前期 全学共通科目 2019/04〜2020/03
Physics for All-E2 Physics for All-E2 前期 全学共通科目 2019/04〜2020/03
Practice of Basic Informatics-E2 Practice of Basic Informatics-E2 前期 全学共通科目 2019/04〜2020/03