粟野 皓光

Last Update: 2020/12/22 13:58:27

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Name(Kanji/Kana/Abecedarium Latinum)
粟野 皓光/アワノ ヒロミツ/Awano, Hiromitsu
Primary Affiliation(Org1/Job title)
Graduate School of Informatics/Associate Professor
Faculty
Org1 Job title
工学部
Academic Degree
Field(Japanese) Field(English) University(Japanese) University(English) Method
修士(情報学) 京都大学
博士(情報学) 京都大学
researchmap URL
https://researchmap.jp/hiromitsu_awano
Published Papers
Author Author(Japanese) Author(English) Title Title(Japanese) Title(English) Bibliography Bibliography(Japanese) Bibliography(English) Publication date Refereed paper Language Publishing type Disclose
Yasuhiro Ogasahara, Yohei Hori, Toshihiro Katashita, Tomoki Iizuka, Hiromitsu Awano, Makoto Ikeda, Hanpei Koike Yasuhiro Ogasahara, Yohei Hori, Toshihiro Katashita, Tomoki Iizuka, Hiromitsu Awano, Makoto Ikeda, Hanpei Koike Yasuhiro Ogasahara, Yohei Hori, Toshihiro Katashita, Tomoki Iizuka, Hiromitsu Awano, Makoto Ikeda, Hanpei Koike Implementation of pseudo-linear feedback shift register-based physical unclonable functions on silicon and sufficient Challenge-Response pair acquisition using Built-In Self-Test before shipping. Implementation of pseudo-linear feedback shift register-based physical unclonable functions on silicon and sufficient Challenge-Response pair acquisition using Built-In Self-Test before shipping. Implementation of pseudo-linear feedback shift register-based physical unclonable functions on silicon and sufficient Challenge-Response pair acquisition using Built-In Self-Test before shipping. Integr., 71, 144-153 Integr., 71, 144-153 Integr., 71, 144-153 2020 Refereed Research paper(scientific journal) Disclose to all
Hiromitsu Awano, Tomoki Iizuka, Makoto Ikeda Hiromitsu Awano, Tomoki Iizuka, Makoto Ikeda Hiromitsu Awano, Tomoki Iizuka, Makoto Ikeda PUFNet: A Deep Neural Network Based Modeling Attack for Physically Unclonable Function. PUFNet: A Deep Neural Network Based Modeling Attack for Physically Unclonable Function. PUFNet: A Deep Neural Network Based Modeling Attack for Physically Unclonable Function. , 1-4 , 1-4 , 1-4 2019 Refereed Research paper(international conference proceedings) Disclose to all
Hiromitsu Awano, Makoto Ikeda Hiromitsu Awano, Makoto Ikeda Hiromitsu Awano, Makoto Ikeda Fourℚ on ASIC: Breaking Speed Records for Elliptic Curve Scalar Multiplication. Fourℚ on ASIC: Breaking Speed Records for Elliptic Curve Scalar Multiplication. Fourℚ on ASIC: Breaking Speed Records for Elliptic Curve Scalar Multiplication. , 1733-1738 , 1733-1738 , 1733-1738 2019 Refereed Research paper(international conference proceedings) Disclose to all
Chun Cai, Hiromitsu Awano, Makoto Ikeda Chun Cai, Hiromitsu Awano, Makoto Ikeda Chun Cai, Hiromitsu Awano, Makoto Ikeda High-Speed ASIC Implementation of Paillier Cryptosystem with Homomorphism. High-Speed ASIC Implementation of Paillier Cryptosystem with Homomorphism. High-Speed ASIC Implementation of Paillier Cryptosystem with Homomorphism. , 1-4 , 1-4 , 1-4 2019 Refereed Research paper(international conference proceedings) Disclose to all
Hiromitsu Awano, Tadayuki Ichihashi, Makoto Ikeda Hiromitsu Awano, Tadayuki Ichihashi, Makoto Ikeda Hiromitsu Awano, Tadayuki Ichihashi, Makoto Ikeda An ASIC Crypto Processor for 254-Bit Prime-Field Pairing Featuring Programmable Arithmetic Core Optimized for Quadratic Extension Field. An ASIC Crypto Processor for 254-Bit Prime-Field Pairing Featuring Programmable Arithmetic Core Optimized for Quadratic Extension Field. An ASIC Crypto Processor for 254-Bit Prime-Field Pairing Featuring Programmable Arithmetic Core Optimized for Quadratic Extension Field. IEICE Transactions, 102-A, 1, 56-64 IEICE Transactions, 102-A, 1, 56-64 IEICE Transactions, 102-A, 1, 56-64 2019 Refereed Research paper(scientific journal) Disclose to all
Hiromitsu Awano, Takashi Sato Hiromitsu Awano, Takashi Sato Hiromitsu Awano, Takashi Sato Ising-PUF: A machine learning attack resistant PUF featuring lattice like arrangement of Arbiter-PUFs. Ising-PUF: A machine learning attack resistant PUF featuring lattice like arrangement of Arbiter-PUFs. Ising-PUF: A machine learning attack resistant PUF featuring lattice like arrangement of Arbiter-PUFs. 2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018, 1447-1452 2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018, 1447-1452 2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018, 1447-1452 2018 Refereed Research paper(international conference proceedings) Disclose to all
Shotaro Sugiyama, Hiromitsu Awano, Makoto Ikeda Shotaro Sugiyama, Hiromitsu Awano, Makoto Ikeda Shotaro Sugiyama, Hiromitsu Awano, Makoto Ikeda 31.3 μs/Signature-Generation 256-bit 픽p ECDSA Cryptoprocessor. 31.3 μs/Signature-Generation 256-bit 픽p ECDSA Cryptoprocessor. 31.3 μs/Signature-Generation 256-bit 픽p ECDSA Cryptoprocessor. IEEE Asian Solid-State Circuits Conference, A-SSCC 2018, Tainan, Taiwan, November 5-7, 2018, 153-156 IEEE Asian Solid-State Circuits Conference, A-SSCC 2018, Tainan, Taiwan, November 5-7, 2018, 153-156 IEEE Asian Solid-State Circuits Conference, A-SSCC 2018, Tainan, Taiwan, November 5-7, 2018, 153-156 2018 Refereed Research paper(international conference proceedings) Disclose to all
Vinod V. Gadde, Hiromitsu Awano, Makoto Ikeda Vinod V. Gadde, Hiromitsu Awano, Makoto Ikeda Vinod V. Gadde, Hiromitsu Awano, Makoto Ikeda An Encryption-Authentication Unified A/D Conversion Scheme for IoT Sensor Nodes. An Encryption-Authentication Unified A/D Conversion Scheme for IoT Sensor Nodes. An Encryption-Authentication Unified A/D Conversion Scheme for IoT Sensor Nodes. IEEE Asian Solid-State Circuits Conference, A-SSCC 2018, Tainan, Taiwan, November 5-7, 2018, 123-126 IEEE Asian Solid-State Circuits Conference, A-SSCC 2018, Tainan, Taiwan, November 5-7, 2018, 123-126 IEEE Asian Solid-State Circuits Conference, A-SSCC 2018, Tainan, Taiwan, November 5-7, 2018, 123-126 2018 Refereed Research paper(international conference proceedings) Disclose to all
Shotaro Sugiyama, Hiromitsu Awano, Makoto Ikeda Shotaro Sugiyama, Hiromitsu Awano, Makoto Ikeda Shotaro Sugiyama, Hiromitsu Awano, Makoto Ikeda Low Latency 256-bit ECDSA Signature Generation Crypto Processor. Low Latency 256-bit ECDSA Signature Generation Crypto Processor. Low Latency 256-bit ECDSA Signature Generation Crypto Processor. IEICE Transactions, 101-A, 12, 2290-2296 IEICE Transactions, 101-A, 12, 2290-2296 IEICE Transactions, 101-A, 12, 2290-2296 2018 Refereed Research paper(scientific journal) Disclose to all
Ikkyu Aihara, Phillip J. Bishop, Michel E. B. Ohmer, Hiromitsu Awano, Takeshi Mizumoto, Hiroshi G. Okuno, Peter M. Narins, Jean-Marc Hero Ikkyu Aihara, Phillip J. Bishop, Michel E. B. Ohmer, Hiromitsu Awano, Takeshi Mizumoto, Hiroshi G. Okuno, Peter M. Narins, Jean-Marc Hero Ikkyu Aihara, Phillip J. Bishop, Michel E. B. Ohmer, Hiromitsu Awano, Takeshi Mizumoto, Hiroshi G. Okuno, Peter M. Narins, Jean-Marc Hero Visualizing Phonotactic Behavior of Female Frogs in Darkness Visualizing Phonotactic Behavior of Female Frogs in Darkness Visualizing Phonotactic Behavior of Female Frogs in Darkness SCIENTIFIC REPORTS, 7, 7:10539 SCIENTIFIC REPORTS, 7, 7:10539 SCIENTIFIC REPORTS, 7, 7:10539 2017/09 Refereed English Research paper(scientific journal) Disclose to all
Takeshi Mizumoto, Ikkyu Aihara, Takuma Otsuka, Hiromitsu Awano, Hiroshi G. kuno Takeshi Mizumoto, Ikkyu Aihara, Takuma Otsuka, Hiromitsu Awano, Hiroshi G. kuno Takeshi Mizumoto, Ikkyu Aihara, Takuma Otsuka, Hiromitsu Awano, Hiroshi G. kuno A Swarm of Sound-to-Light Conversion Devices for Monitoring Acoustic Communication among Small Nocturnal Animals A Swarm of Sound-to-Light Conversion Devices for Monitoring Acoustic Communication among Small Nocturnal Animals A Swarm of Sound-to-Light Conversion Devices for Monitoring Acoustic Communication among Small Nocturnal Animals Journal of Robotics and Mechatronics, 29, 1, 255-267 Journal of Robotics and Mechatronics, 29, 1, 255-267 Journal of Robotics and Mechatronics, 29, 1, 255-267 2017/02 Refereed English Research paper(scientific journal) Disclose to all
Keitaro Koga, Hiromitsu Awano, Makoto Ikeda Keitaro Koga, Hiromitsu Awano, Makoto Ikeda Keitaro Koga, Hiromitsu Awano, Makoto Ikeda Yield Enhancement by Repair Circuits for Ultra-Fine Pitch Stacked-Chip Connections. Yield Enhancement by Repair Circuits for Ultra-Fine Pitch Stacked-Chip Connections. Yield Enhancement by Repair Circuits for Ultra-Fine Pitch Stacked-Chip Connections. 26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017, 201-205 26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017, 201-205 26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017, 201-205 2017 Refereed Research paper(international conference proceedings) Disclose to all
Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Efficient circuit failure probability calculation along product lifetime considering device aging. Efficient circuit failure probability calculation along product lifetime considering device aging. Efficient circuit failure probability calculation along product lifetime considering device aging. 22nd Asia and South Pacific Design Automation Conference, ASP-DAC 2017, Chiba, Japan, January 16-19, 2017, 93-98 22nd Asia and South Pacific Design Automation Conference, ASP-DAC 2017, Chiba, Japan, January 16-19, 2017, 93-98 22nd Asia and South Pacific Design Automation Conference, ASP-DAC 2017, Chiba, Japan, January 16-19, 2017, 93-98 2017 Refereed Research paper(international conference proceedings) Disclose to all
Abinash Mohanty, Ketul B. Sutaria, Hiromitsu Awano, Takashi Sato, Yu Cao 0001 Abinash Mohanty, Ketul B. Sutaria, Hiromitsu Awano, Takashi Sato, Yu Cao 0001 Abinash Mohanty, Ketul B. Sutaria, Hiromitsu Awano, Takashi Sato, Yu Cao 0001 RTN in Scaled Transistors for On-Chip Random Seed Generation. RTN in Scaled Transistors for On-Chip Random Seed Generation. RTN in Scaled Transistors for On-Chip Random Seed Generation. IEEE Trans. Very Large Scale Integr. Syst., 25, 8, 2248-2257 IEEE Trans. Very Large Scale Integr. Syst., 25, 8, 2248-2257 IEEE Trans. Very Large Scale Integr. Syst., 25, 8, 2248-2257 2017 Refereed Research paper(scientific journal) Disclose to all
Hiromitsu Awano, Shumpei Morita, Takashi Sato Hiromitsu Awano, Shumpei Morita, Takashi Sato Hiromitsu Awano, Shumpei Morita, Takashi Sato Scalable Device Array for Statistical Characterization of BTI-Related Parameters. Scalable Device Array for Statistical Characterization of BTI-Related Parameters. Scalable Device Array for Statistical Characterization of BTI-Related Parameters. IEEE Trans. Very Large Scale Integr. Syst., 25, 4, 1455-1466 IEEE Trans. Very Large Scale Integr. Syst., 25, 4, 1455-1466 IEEE Trans. Very Large Scale Integr. Syst., 25, 4, 1455-1466 2017 Refereed Research paper(scientific journal) Disclose to all
Takeshi Mizumoto, Ikkyu Aihara, Takuma Otsuka, Hiromitsu Awano, Hiroshi G. Okuno Takeshi Mizumoto, Ikkyu Aihara, Takuma Otsuka, Hiromitsu Awano, Hiroshi G. Okuno Takeshi Mizumoto, Ikkyu Aihara, Takuma Otsuka, Hiromitsu Awano, Hiroshi G. Okuno Swarm of Sound-to-Light Conversion Devices to Monitor Acoustic Communication Among Small Nocturnal Animals. Swarm of Sound-to-Light Conversion Devices to Monitor Acoustic Communication Among Small Nocturnal Animals. Swarm of Sound-to-Light Conversion Devices to Monitor Acoustic Communication Among Small Nocturnal Animals. JRM, 29, 1, 255-267 JRM, 29, 1, 255-267 JRM, 29, 1, 255-267 2017 Refereed Research paper(scientific journal) Disclose to all
Hiromitsu Awano, Takashi Sato Hiromitsu Awano, Takashi Sato Hiromitsu Awano, Takashi Sato Efficient Aging-Aware Failure Probability Estimation Using Augmented Reliability and Subset Simulation. Efficient Aging-Aware Failure Probability Estimation Using Augmented Reliability and Subset Simulation. Efficient Aging-Aware Failure Probability Estimation Using Augmented Reliability and Subset Simulation. IEICE Transactions, 100-A, 12, 2807-2815 IEICE Transactions, 100-A, 12, 2807-2815 IEICE Transactions, 100-A, 12, 2807-2815 2017 Refereed Research paper(scientific journal) Disclose to all
Song Bian, Shumpei Morita, Michihiro Shintani, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Song Bian, Shumpei Morita, Michihiro Shintani, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Song Bian, Shumpei Morita, Michihiro Shintani, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Identification and Application of Invariant Critical Paths under NBTI Degradation. Identification and Application of Invariant Critical Paths under NBTI Degradation. Identification and Application of Invariant Critical Paths under NBTI Degradation. IEICE Transactions, 100-A, 12, 2797-2806 IEICE Transactions, 100-A, 12, 2797-2806 IEICE Transactions, 100-A, 12, 2797-2806 2017 Refereed Research paper(scientific journal) Disclose to all
Motoki Yoshinaga, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Motoki Yoshinaga, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Motoki Yoshinaga, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Physically unclonable function using RTN-induced delay fluctuation in ring oscillators Physically unclonable function using RTN-induced delay fluctuation in ring oscillators Physically unclonable function using RTN-induced delay fluctuation in ring oscillators Proceedings - IEEE International Symposium on Circuits and Systems, 2016-, 2619-2622 Proceedings - IEEE International Symposium on Circuits and Systems, 2016-, 2619-2622 Proceedings - IEEE International Symposium on Circuits and Systems, 2016-, 2619-2622 2016/07/29 Refereed English Research paper(international conference proceedings) Disclose to all
Motoki Yoshinaga, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Motoki Yoshinaga, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Motoki Yoshinaga, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Physically Unclonable Function Using RTN-Induced Delay Fluctuation in Ring Oscillators Physically Unclonable Function Using RTN-Induced Delay Fluctuation in Ring Oscillators Physically Unclonable Function Using RTN-Induced Delay Fluctuation in Ring Oscillators 2016 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), 2619-2622 2016 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), 2619-2622 2016 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), 2619-2622 2016 Refereed English Research paper(international conference proceedings) Disclose to all
Ikkyu Aihara, Takeshi Mizumoto, Hiromitsu Awano, Hiroshi G. Okuno Ikkyu Aihara, Takeshi Mizumoto, Hiromitsu Awano, Hiroshi G. Okuno Ikkyu Aihara, Takeshi Mizumoto, Hiromitsu Awano, Hiroshi G. Okuno Call Alternation Between Specific Pairs of Male Frogs Revealed by a Sound-Imaging Method in Their Natural Habitat. Call Alternation Between Specific Pairs of Male Frogs Revealed by a Sound-Imaging Method in Their Natural Habitat. Call Alternation Between Specific Pairs of Male Frogs Revealed by a Sound-Imaging Method in Their Natural Habitat. Interspeech 2016, 17th Annual Conference of the International Speech Communication Association, San Francisco, CA, USA, September 8-12, 2016, 2597-2601 Interspeech 2016, 17th Annual Conference of the International Speech Communication Association, San Francisco, CA, USA, September 8-12, 2016, 2597-2601 Interspeech 2016, 17th Annual Conference of the International Speech Communication Association, San Francisco, CA, USA, September 8-12, 2016, 2597-2601 2016 Refereed Research paper(international conference proceedings) Disclose to all
Song Bian, Michihiro Shintani, Shumpei Morita, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Song Bian, Michihiro Shintani, Shumpei Morita, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Song Bian, Michihiro Shintani, Shumpei Morita, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Workload-Aware Worst Path Analysis of Processor-Scale NBTI Degradation. Workload-Aware Worst Path Analysis of Processor-Scale NBTI Degradation. Workload-Aware Worst Path Analysis of Processor-Scale NBTI Degradation. Proceedings of the 26th edition on Great Lakes Symposium on VLSI, GLVLSI 2016, Boston, MA, USA, May 18-20, 2016, 203-208 Proceedings of the 26th edition on Great Lakes Symposium on VLSI, GLVLSI 2016, Boston, MA, USA, May 18-20, 2016, 203-208 Proceedings of the 26th edition on Great Lakes Symposium on VLSI, GLVLSI 2016, Boston, MA, USA, May 18-20, 2016, 203-208 2016 Refereed Research paper(international conference proceedings) Disclose to all
Hiromitsu Awano, Takashi Sato Hiromitsu Awano, Takashi Sato Hiromitsu Awano, Takashi Sato Efficient transistor-level timing yield estimation via line sampling. Efficient transistor-level timing yield estimation via line sampling. Efficient transistor-level timing yield estimation via line sampling. Proceedings of the 53rd Annual Design Automation Conference, DAC 2016, Austin, TX, USA, June 5-9, 2016, 115-6 Proceedings of the 53rd Annual Design Automation Conference, DAC 2016, Austin, TX, USA, June 5-9, 2016, 115-6 Proceedings of the 53rd Annual Design Automation Conference, DAC 2016, Austin, TX, USA, June 5-9, 2016, 115-6 2016 Refereed Research paper(international conference proceedings) Disclose to all
Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Efficient Aging-Aware SRAM Failure Probability Calculation via Particle Filter-Based Importance Sampling. Efficient Aging-Aware SRAM Failure Probability Calculation via Particle Filter-Based Importance Sampling. Efficient Aging-Aware SRAM Failure Probability Calculation via Particle Filter-Based Importance Sampling. IEICE Transactions, 99-A, 7, 1390-1399 IEICE Transactions, 99-A, 7, 1390-1399 IEICE Transactions, 99-A, 7, 1390-1399 2016 Refereed Research paper(scientific journal) Disclose to all
Takashi Sato, Hiromitsu Awano Takashi Sato, Hiromitsu Awano Takashi Sato, Hiromitsu Awano On-chip characterization of statistical device degradation On-chip characterization of statistical device degradation On-chip characterization of statistical device degradation Circuit Design for Reliability, 69-92 Circuit Design for Reliability, 69-92 Circuit Design for Reliability, 69-92 2015/01/01 Refereed English Disclose to all
Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato ECRIPSE: An Efficient Method for Calculating RTN-Induced Failure Probability of an SRAM Cell ECRIPSE: An Efficient Method for Calculating RTN-Induced Failure Probability of an SRAM Cell ECRIPSE: An Efficient Method for Calculating RTN-Induced Failure Probability of an SRAM Cell 2015 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), 549-554 2015 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), 549-554 2015 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), 549-554 2015 Refereed English Research paper(international conference proceedings) Disclose to all
Yoshiaki Bando, Takuma Otsuka, Ikkyu Aihara, Hiromitsu Awano, Katsutoshi Itoyama, Kazuyoshi Yoshii, Hiroshi Gitchang Okuno Yoshiaki Bando, Takuma Otsuka, Ikkyu Aihara, Hiromitsu Awano, Katsutoshi Itoyama, Kazuyoshi Yoshii, Hiroshi Gitchang Okuno Yoshiaki Bando, Takuma Otsuka, Ikkyu Aihara, Hiromitsu Awano, Katsutoshi Itoyama, Kazuyoshi Yoshii, Hiroshi Gitchang Okuno Recognition of In-Field Frog Chorusing Using Bayesian Nonparametric Microphone Array Processing. Recognition of In-Field Frog Chorusing Using Bayesian Nonparametric Microphone Array Processing. Recognition of In-Field Frog Chorusing Using Bayesian Nonparametric Microphone Array Processing. Computational Sustainability, Papers from the 2015 AAAI Workshop, Austin, Texas, USA, January 26, 2015. Computational Sustainability, Papers from the 2015 AAAI Workshop, Austin, Texas, USA, January 26, 2015. Computational Sustainability, Papers from the 2015 AAAI Workshop, Austin, Texas, USA, January 26, 2015. 2015 Refereed Disclose to all
Hirofumi Shimizu, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Hirofumi Shimizu, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Hirofumi Shimizu, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Automation of Model Parameter Estimation for Random Telegraph Noise Automation of Model Parameter Estimation for Random Telegraph Noise Automation of Model Parameter Estimation for Random Telegraph Noise IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, E97A, 12, 2383-2392 IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, E97A, 12, 2383-2392 IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, E97A, 12, 2383-2392 2014/12 Refereed English Research paper(scientific journal) Disclose to all
Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato BTIarray: A Time-Overlapping Transistor Array for Efficient Statistical Characterization of Bias Temperature Instability BTIarray: A Time-Overlapping Transistor Array for Efficient Statistical Characterization of Bias Temperature Instability BTIarray: A Time-Overlapping Transistor Array for Efficient Statistical Characterization of Bias Temperature Instability IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 14, 3, 833-843 IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 14, 3, 833-843 IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 14, 3, 833-843 2014/09 Refereed English Research paper(scientific journal) Disclose to all
Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato Variability in Device Degradations: Statistical Observation of NBTI for 3996 Transistors Variability in Device Degradations: Statistical Observation of NBTI for 3996 Transistors Variability in Device Degradations: Statistical Observation of NBTI for 3996 Transistors PROCEEDINGS OF THE 2014 44TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC 2014), 218-221 PROCEEDINGS OF THE 2014 44TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC 2014), 218-221 PROCEEDINGS OF THE 2014 44TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC 2014), 218-221 2014 Refereed English Research paper(international conference proceedings) Disclose to all
Ikkyu Aihara, Takeshi Mizumoto, Takuma Otsuka, Hiromitsu Awano, Kohei Nagira, Hiroshi G. Okuno, Kazuyuki Aihara Ikkyu Aihara, Takeshi Mizumoto, Takuma Otsuka, Hiromitsu Awano, Kohei Nagira, Hiroshi G. Okuno, Kazuyuki Aihara Ikkyu Aihara, Takeshi Mizumoto, Takuma Otsuka, Hiromitsu Awano, Kohei Nagira, Hiroshi G. Okuno, Kazuyuki Aihara Spatio-Temporal Dynamics in Collective Frog Choruses Examined by Mathematical Modeling and Field Observations Spatio-Temporal Dynamics in Collective Frog Choruses Examined by Mathematical Modeling and Field Observations Spatio-Temporal Dynamics in Collective Frog Choruses Examined by Mathematical Modeling and Field Observations SCIENTIFIC REPORTS, 4, 4:3891 SCIENTIFIC REPORTS, 4, 4:3891 SCIENTIFIC REPORTS, 4, 4:3891 2014/01 Refereed English Research paper(scientific journal) Disclose to all
J. B. Velamala, K. B. Sutaria, H. Shimizu, H. Awano, T. Sato, G. Wirth, Y. Cao J. B. Velamala, K. B. Sutaria, H. Shimizu, H. Awano, T. Sato, G. Wirth, Y. Cao J. B. Velamala, K. B. Sutaria, H. Shimizu, H. Awano, T. Sato, G. Wirth, Y. Cao Compact Modeling of Statistical BTI Under Trapping/detrapping Compact Modeling of Statistical BTI Under Trapping/detrapping Compact Modeling of Statistical BTI Under Trapping/detrapping IEEE Transactions on Electron Devices, 60, 11, 3645-3654 IEEE Transactions on Electron Devices, 60, 11, 3645-3654 IEEE Transactions on Electron Devices, 60, 11, 3645-3654 2013/11 Refereed English Disclose to all
Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato Bayesian Estimation of Multi-Trap RTN Parameters Using Markov Chain Monte Carlo Method Bayesian Estimation of Multi-Trap RTN Parameters Using Markov Chain Monte Carlo Method Bayesian Estimation of Multi-Trap RTN Parameters Using Markov Chain Monte Carlo Method IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, E95A, 12, 2272-2283 IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, E95A, 12, 2272-2283 IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, E95A, 12, 2272-2283 2012/12 Refereed English Research paper(scientific journal) Disclose to all
Hirofumi Shimizu, Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato 清水 裕史, 粟野 皓光, 筒井 弘, 越智 裕之, 佐藤 高史 Hirofumi Shimizu, Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato Estimation of Model Parameters for Random Telegraph Noise Based on Information Criterion 情報量規準を用いるRTNモデルパラメータ推定の自動化 Estimation of Model Parameters for Random Telegraph Noise Based on Information Criterion in Proc. of IPSJ DA Symposium, 2012, 5, 49-54 情報処理学会DAシンポジウム論文集, 2012, 5, 49-54 in Proc. of IPSJ DA Symposium, 2012, 5, 49-54 2012/08 Refereed Japanese Research paper(international conference proceedings) Disclose to all
Hiromitsu Awano, Shun Nishide, Hiroaki Arie, Jun Tani, Toru Takahashi, Hiroshi G. Okuno, Tetsuya Ogata Hiromitsu Awano, Shun Nishide, Hiroaki Arie, Jun Tani, Toru Takahashi, Hiroshi G. Okuno, Tetsuya Ogata Hiromitsu Awano, Shun Nishide, Hiroaki Arie, Jun Tani, Toru Takahashi, Hiroshi G. Okuno, Tetsuya Ogata Use of a Sparse Structure to Improve Learning Performance of Recurrent Neural Networks Use of a Sparse Structure to Improve Learning Performance of Recurrent Neural Networks Use of a Sparse Structure to Improve Learning Performance of Recurrent Neural Networks NEURAL INFORMATION PROCESSING, PT III, 7064, PART 3, 323-+ NEURAL INFORMATION PROCESSING, PT III, 7064, PART 3, 323-+ NEURAL INFORMATION PROCESSING, PT III, 7064, PART 3, 323-+ 2011 Refereed English Research paper(international conference proceedings) Disclose to all
Hiromitsu Awano, Tetsuya Ogata, Shun Nishide, Torn Takahashi, Kazunori Komatani, Hiroshi G. Okuno Hiromitsu Awano, Tetsuya Ogata, Shun Nishide, Torn Takahashi, Kazunori Komatani, Hiroshi G. Okuno Hiromitsu Awano, Tetsuya Ogata, Shun Nishide, Torn Takahashi, Kazunori Komatani, Hiroshi G. Okuno Human-Robot Cooperation in Arrangement of Objects Using Confidence Measure of Neuro-dynamical System Human-Robot Cooperation in Arrangement of Objects Using Confidence Measure of Neuro-dynamical System Human-Robot Cooperation in Arrangement of Objects Using Confidence Measure of Neuro-dynamical System IEEE INTERNATIONAL CONFERENCE ON SYSTEMS, MAN AND CYBERNETICS (SMC 2010), 2533-2538 IEEE INTERNATIONAL CONFERENCE ON SYSTEMS, MAN AND CYBERNETICS (SMC 2010), 2533-2538 IEEE INTERNATIONAL CONFERENCE ON SYSTEMS, MAN AND CYBERNETICS (SMC 2010), 2533-2538 2010 Refereed English Research paper(international conference proceedings) Disclose to all
H AWANO, T SATO H AWANO, T SATO H AWANO, T SATO EFFECT OF ARGON ION-BOMBARDMENT ON INTERNAL-STRESS IN EVAPORATED CO-CR FILM EFFECT OF ARGON ION-BOMBARDMENT ON INTERNAL-STRESS IN EVAPORATED CO-CR FILM EFFECT OF ARGON ION-BOMBARDMENT ON INTERNAL-STRESS IN EVAPORATED CO-CR FILM JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 27, 5, L880-L882 JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 27, 5, L880-L882 JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 27, 5, L880-L882 1988/05 Refereed English Research paper(scientific journal) Disclose to all

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Misc
Author Author(Japanese) Author(English) Title Title(Japanese) Title(English) Bibliography Bibliography(Japanese) Bibliography(English) Publication date Refereed paper Language Publishing type Disclose
粟野 皓光, 佐藤 高史 粟野 皓光, 佐藤 高史 チャレンジヒステリシス特性を有するPUFの設計とシミュレーションに基づく性能評価 チャレンジヒステリシス特性を有するPUFの設計とシミュレーションに基づく性能評価 DA シンポジウム, 79-84 DA シンポジウム, 79-84 , 79-84 2017/08 Refereed Japanese Disclose to all
粟野 皓光, 佐藤 高史 粟野 皓光, 佐藤 高史 Line samplingを用いたモンテカルロ法に基づくタイミング歩留り解析の高速化 Line samplingを用いたモンテカルロ法に基づくタイミング歩留り解析の高速化 信学技報 VLSI設計技術研究会, VLD2016-117, 478, 83-84 信学技報 VLSI設計技術研究会, VLD2016-117, 478, 83-84 , VLD2016-117, 478, 83-84 2017/03 Japanese Disclose to all
H. Awano, T. Sato H. Awano, T. Sato H. Awano, T. Sato Efficient Transistor-level Timing Yield Estimation via Line Sampling Efficient Transistor-level Timing Yield Estimation via Line Sampling Efficient Transistor-level Timing Yield Estimation via Line Sampling ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), 50-55 ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), 50-55 ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), 50-55 2016/03 Refereed English Disclose to all
粟野 皓光, 佐藤 高史 粟野 皓光, 佐藤 高史 モンテカルロ法に基づくタイミング歩留り解析の高速化 モンテカルロ法に基づくタイミング歩留り解析の高速化 信学技報 VLSI設計技術研究会(デザインガイア), VLD2015-43, 37-42 信学技報 VLSI設計技術研究会(デザインガイア), VLD2015-43, 37-42 , VLD2015-43, 37-42 2015/12 Japanese Disclose to all
H. Awano, T. Sato H. Awano, T. Sato H. Awano, T. Sato Fast Monte Carlo for Timing Yield Estimation via Line Sampling Fast Monte Carlo for Timing Yield Estimation via Line Sampling Fast Monte Carlo for Timing Yield Estimation via Line Sampling Workshop on variability modeling and characterization (VMC), poster-2 Workshop on variability modeling and characterization (VMC), poster-2 Workshop on variability modeling and characterization (VMC), poster-2 2015/11 English Disclose to all
粟野 皓光, 廣本 正之, 佐藤 高史 粟野 皓光, 廣本 正之, 佐藤 高史 デバイス特性の経年劣化に起因する不良確率変化の効率的な解析手法 デバイス特性の経年劣化に起因する不良確率変化の効率的な解析手法 DA シンポジウム, 169-174 DA シンポジウム, 169-174 , 169-174 2015/08 Refereed Japanese Disclose to all
吉永 幹, 粟野 皓光, 廣本 正之, 佐藤 高史 吉永 幹, 粟野 皓光, 廣本 正之, 佐藤 高史 RTN起因のリングオシレータ発振周波数変動を利用したPUF RTN起因のリングオシレータ発振周波数変動を利用したPUF 信学技報 VLSI設計技術研究会, VLD2014-174, 112-117 信学技報 VLSI設計技術研究会, VLD2014-174, 112-117 , VLD2014-174, 112-117 2015/03 Japanese Disclose to all
粟野 皓光, 廣本 正之, 佐藤 高史 粟野 皓光, 廣本 正之, 佐藤 高史 RTNを考慮したSRAM不良確率の高速計算 RTNを考慮したSRAM不良確率の高速計算 信学技報 VLD研究会(デザインガイア), VLD2014-74, 15-20 信学技報 VLD研究会(デザインガイア), VLD2014-74, 15-20 , VLD2014-74, 15-20 2014/11 Japanese Disclose to all
吉永 幹, 粟野 皓光, 廣本 正之, 佐藤 高史 吉永 幹, 粟野 皓光, 廣本 正之, 佐藤 高史 ランダムテレグラフノイズを用いたチップ識別手法の一検討 ランダムテレグラフノイズを用いたチップ識別手法の一検討 電子情報通信学会 ソサイエティ大会, A-7-1, 95-95 電子情報通信学会 ソサイエティ大会, A-7-1, 95-95 , A-7-1, 95-95 2014/09 Japanese Disclose to all
合原一究, 粟野皓光, 水本武志, 坂東宜昭, 大塚琢馬, 柳楽浩平, 奥乃博 合原一究, 粟野皓光, 水本武志, 坂東宜昭, 大塚琢馬, 柳楽浩平, 奥乃博 合原一究, 粟野皓光, 水本武志, 坂東宜昭, 大塚琢馬, 柳楽浩平, 奥乃博 振動子モデルと音声可視化システムを用いたアマガエルの合唱法則の解析 振動子モデルと音声可視化システムを用いたアマガエルの合唱法則の解析 振動子モデルと音声可視化システムを用いたアマガエルの合唱法則の解析 人工知能学会AIチャレンジ研究会(Web), 39th, 50-56 (WEB ONLY) 人工知能学会AIチャレンジ研究会(Web), 39th, 50-56 (WEB ONLY) 人工知能学会AIチャレンジ研究会(Web), 39th, 50-56 (WEB ONLY) 2014 Japanese Disclose to all
Takashi Sato, Hiromitsu Awano, Masayuki Hiromoto Takashi Sato, Hiromitsu Awano, Masayuki Hiromoto Takashi Sato, Hiromitsu Awano, Masayuki Hiromoto A scalable device array for statistical device-aging characterization A scalable device array for statistical device-aging characterization A scalable device array for statistical device-aging characterization 2014 12TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT), 255-258 2014 12TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT), 255-258 2014 12TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT), 255-258 2014 Refereed English Disclose to all
H. Awano, M. Hiromoto, T. Sato H. Awano, M. Hiromoto, T. Sato H. Awano, M. Hiromoto, T. Sato Statistical Observation of NBTI and PBTI Degradations Statistical Observation of NBTI and PBTI Degradations Statistical Observation of NBTI and PBTI Degradations Workshop on variability modeling and characterization (VMC), poster-03 Workshop on variability modeling and characterization (VMC), poster-03 Workshop on variability modeling and characterization (VMC), poster-03 2013/11 English Disclose to all
粟野 皓光, 佐藤 高史 粟野 皓光, 佐藤 高史 トランジスタアレイを用いたBTI劣化の統計的観測 トランジスタアレイを用いたBTI劣化の統計的観測 DA シンポジウム, 85-90 DA シンポジウム, 85-90 , 85-90 2013/08 Japanese Disclose to all
粟野 皓光, 廣本 正之, 佐藤 高史 粟野 皓光, 廣本 正之, 佐藤 高史 3996トランジスタにおけるNBTI劣化の統計的ばらつき 3996トランジスタにおけるNBTI劣化の統計的ばらつき DA シンポジウム, 3-8 DA シンポジウム, 3-8 , 3-8 2013/08 Japanese Disclose to all
Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato Multi-trap RTN Parameter Extraction based on Bayesian Inference Multi-trap RTN Parameter Extraction based on Bayesian Inference Multi-trap RTN Parameter Extraction based on Bayesian Inference PROCEEDINGS OF THE FOURTEENTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN (ISQED 2013), 597-602 PROCEEDINGS OF THE FOURTEENTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN (ISQED 2013), 597-602 PROCEEDINGS OF THE FOURTEENTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN (ISQED 2013), 597-602 2013 Refereed English Disclose to all
Jyothi B. Velamala, Ketul B. Sutaria, Hirofumi Shimuzu, Hiromitsu Awano, Takashi Sato, Gilson Wirth, Yu Cao Jyothi B. Velamala, Ketul B. Sutaria, Hirofumi Shimuzu, Hiromitsu Awano, Takashi Sato, Gilson Wirth, Yu Cao Jyothi B. Velamala, Ketul B. Sutaria, Hirofumi Shimuzu, Hiromitsu Awano, Takashi Sato, Gilson Wirth, Yu Cao Logarithmic Modeling of BTI under Dynamic Circuit Operation: Static, Dynamic and Long-term Prediction Logarithmic Modeling of BTI under Dynamic Circuit Operation: Static, Dynamic and Long-term Prediction Logarithmic Modeling of BTI under Dynamic Circuit Operation: Static, Dynamic and Long-term Prediction 2013 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), CM.3.1-CM.3.5 2013 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), CM.3.1-CM.3.5 2013 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), CM.3.1-CM.3.5 2013 Refereed English Disclose to all
T. Sato, H. Awano, H. Shimizu, H. Tsutsui, H. Ochi T. Sato, H. Awano, H. Shimizu, H. Tsutsui, H. Ochi T. Sato, H. Awano, H. Shimizu, H. Tsutsui, H. Ochi Statistical Observations of NBTI-induced Threshold Voltage Shifts on Small Channel-area Devices Statistical Observations of NBTI-induced Threshold Voltage Shifts on Small Channel-area Devices Statistical Observations of NBTI-induced Threshold Voltage Shifts on Small Channel-area Devices International Symposium on Quality Electronic Design (ISQED), 306-311 International Symposium on Quality Electronic Design (ISQED), 306-311 International Symposium on Quality Electronic Design (ISQED), 306-311 2012/03 Refereed English Disclose to all
Jyothi B. Velamala, Ketul Sutaria, Hirofumi Shimizu, Hiromitsu Awano, Takashi Sato, Yu Cao Jyothi B. Velamala, Ketul Sutaria, Hirofumi Shimizu, Hiromitsu Awano, Takashi Sato, Yu Cao Jyothi B. Velamala, Ketul Sutaria, Hirofumi Shimizu, Hiromitsu Awano, Takashi Sato, Yu Cao Statistical Aging under Dynamic Voltage Scaling: A Logarithmic Model Approach Statistical Aging under Dynamic Voltage Scaling: A Logarithmic Model Approach Statistical Aging under Dynamic Voltage Scaling: A Logarithmic Model Approach 2012 IEEE CUSTOM INTEGRATED CIRCUITS CONFERENCE (CICC), 6.3.1-6.3.4 2012 IEEE CUSTOM INTEGRATED CIRCUITS CONFERENCE (CICC), 6.3.1-6.3.4 2012 IEEE CUSTOM INTEGRATED CIRCUITS CONFERENCE (CICC), 6.3.1-6.3.4 2012 Refereed English Disclose to all
粟野皓光, 清水裕史, 筒井 弘, 越智 裕之, 佐藤 高史 粟野皓光, 清水裕史, 筒井 弘, 越智 裕之, 佐藤 高史 ランダムテレグラフノイズモデル化のためのパラメータ推定法の検討 ランダムテレグラフノイズモデル化のためのパラメータ推定法の検討 デザインガイア 情報処理学会 SLDM研究会, VLD2011-66, 85-90 デザインガイア 情報処理学会 SLDM研究会, VLD2011-66, 85-90 , VLD2011-66, 85-90 2011/11 Japanese Disclose to all
粟野皓光, 尾形哲也, 有江浩明, 谷淳, 高橋徹, 奥乃博 粟野皓光, 尾形哲也, 有江浩明, 谷淳, 高橋徹, 奥乃博 粟野皓光, 尾形哲也, 有江浩明, 谷淳, 高橋徹, 奥乃博 再帰結合神経回路モデルへのスパース構造導入による学習能力の向上 再帰結合神経回路モデルへのスパース構造導入による学習能力の向上 再帰結合神経回路モデルへのスパース構造導入による学習能力の向上 情報処理学会全国大会講演論文集, 73rd, 2, 2.131-2.132-132 情報処理学会全国大会講演論文集, 73rd, 2, 2.131-2.132-132 情報処理学会全国大会講演論文集, 73rd, 2, 2.131-2.132-132 2011/03/02 Japanese Disclose to all
AWANO Hiromitsu, OGATA Tetsuya, TAKAHASHI Toru, KOMATANI Kazunori, OKUNO Hiroshi G 粟野 皓光, 尾形 哲也, 高橋 徹, 駒谷 和範, 奥乃 博 AWANO Hiromitsu, OGATA Tetsuya, TAKAHASHI Toru, KOMATANI Kazunori, OKUNO Hiroshi G Human and Robot Cooperation for Arrangement of Objects by Prediction using Recurrent Neural Network RNNを用いた行為予測による人間とロボットの協調物体配置 Human and Robot Cooperation for Arrangement of Objects by Prediction using Recurrent Neural Network 全国大会講演論文集, 72, 0, 395-396 全国大会講演論文集, 72, 0, 395-396 全国大会講演論文集, 72, 0, 395-396 2010/03/08 Japanese Disclose to all
粟野皓光, 尾形哲也, 西出俊, 高橋徹, 奥乃博 粟野皓光, 尾形哲也, 西出俊, 高橋徹, 奥乃博 粟野皓光, 尾形哲也, 西出俊, 高橋徹, 奥乃博 確信度を用いた物体配置作業における人間ロボット協調 確信度を用いた物体配置作業における人間ロボット協調 確信度を用いた物体配置作業における人間ロボット協調 日本ロボット学会学術講演会予稿集(CD-ROM), 28th, ROMBUNNO.3J1-6 日本ロボット学会学術講演会予稿集(CD-ROM), 28th, ROMBUNNO.3J1-6 日本ロボット学会学術講演会予稿集(CD-ROM), 28th, ROMBUNNO.3J1-6 2010 Japanese Disclose to all

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