Yasuhiro Ogasahara, Yohei Hori, Toshihiro Katashita, Tomoki Iizuka, Hiromitsu Awano, Makoto Ikeda, Hanpei Koike |
Yasuhiro Ogasahara, Yohei Hori, Toshihiro Katashita, Tomoki Iizuka, Hiromitsu Awano, Makoto Ikeda, Hanpei Koike |
Yasuhiro Ogasahara, Yohei Hori, Toshihiro Katashita, Tomoki Iizuka, Hiromitsu Awano, Makoto Ikeda, Hanpei Koike |
Implementation of pseudo-linear feedback shift register-based physical unclonable functions on silicon and sufficient Challenge-Response pair acquisition using Built-In Self-Test before shipping. |
Implementation of pseudo-linear feedback shift register-based physical unclonable functions on silicon and sufficient Challenge-Response pair acquisition using Built-In Self-Test before shipping. |
Implementation of pseudo-linear feedback shift register-based physical unclonable functions on silicon and sufficient Challenge-Response pair acquisition using Built-In Self-Test before shipping. |
Integr., 71, 144-153 |
Integr., 71, 144-153 |
Integr., 71, 144-153 |
2020 |
有 |
|
研究論文(学術雑誌) |
公開 |
Hiromitsu Awano, Tomoki Iizuka, Makoto Ikeda |
Hiromitsu Awano, Tomoki Iizuka, Makoto Ikeda |
Hiromitsu Awano, Tomoki Iizuka, Makoto Ikeda |
PUFNet: A Deep Neural Network Based Modeling Attack for Physically Unclonable Function. |
PUFNet: A Deep Neural Network Based Modeling Attack for Physically Unclonable Function. |
PUFNet: A Deep Neural Network Based Modeling Attack for Physically Unclonable Function. |
, 1-4 |
, 1-4 |
, 1-4 |
2019 |
有 |
|
研究論文(国際会議プロシーディングス) |
公開 |
Hiromitsu Awano, Makoto Ikeda |
Hiromitsu Awano, Makoto Ikeda |
Hiromitsu Awano, Makoto Ikeda |
Fourℚ on ASIC: Breaking Speed Records for Elliptic Curve Scalar Multiplication. |
Fourℚ on ASIC: Breaking Speed Records for Elliptic Curve Scalar Multiplication. |
Fourℚ on ASIC: Breaking Speed Records for Elliptic Curve Scalar Multiplication. |
, 1733-1738 |
, 1733-1738 |
, 1733-1738 |
2019 |
有 |
|
研究論文(国際会議プロシーディングス) |
公開 |
Chun Cai, Hiromitsu Awano, Makoto Ikeda |
Chun Cai, Hiromitsu Awano, Makoto Ikeda |
Chun Cai, Hiromitsu Awano, Makoto Ikeda |
High-Speed ASIC Implementation of Paillier Cryptosystem with Homomorphism. |
High-Speed ASIC Implementation of Paillier Cryptosystem with Homomorphism. |
High-Speed ASIC Implementation of Paillier Cryptosystem with Homomorphism. |
, 1-4 |
, 1-4 |
, 1-4 |
2019 |
有 |
|
研究論文(国際会議プロシーディングス) |
公開 |
Hiromitsu Awano, Tadayuki Ichihashi, Makoto Ikeda |
Hiromitsu Awano, Tadayuki Ichihashi, Makoto Ikeda |
Hiromitsu Awano, Tadayuki Ichihashi, Makoto Ikeda |
An ASIC Crypto Processor for 254-Bit Prime-Field Pairing Featuring Programmable Arithmetic Core Optimized for Quadratic Extension Field. |
An ASIC Crypto Processor for 254-Bit Prime-Field Pairing Featuring Programmable Arithmetic Core Optimized for Quadratic Extension Field. |
An ASIC Crypto Processor for 254-Bit Prime-Field Pairing Featuring Programmable Arithmetic Core Optimized for Quadratic Extension Field. |
IEICE Transactions, 102-A, 1, 56-64 |
IEICE Transactions, 102-A, 1, 56-64 |
IEICE Transactions, 102-A, 1, 56-64 |
2019 |
有 |
|
研究論文(学術雑誌) |
公開 |
Hiromitsu Awano, Takashi Sato |
Hiromitsu Awano, Takashi Sato |
Hiromitsu Awano, Takashi Sato |
Ising-PUF: A machine learning attack resistant PUF featuring lattice like arrangement of Arbiter-PUFs. |
Ising-PUF: A machine learning attack resistant PUF featuring lattice like arrangement of Arbiter-PUFs. |
Ising-PUF: A machine learning attack resistant PUF featuring lattice like arrangement of Arbiter-PUFs. |
2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018, 1447-1452 |
2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018, 1447-1452 |
2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018, 1447-1452 |
2018 |
有 |
|
研究論文(国際会議プロシーディングス) |
公開 |
Shotaro Sugiyama, Hiromitsu Awano, Makoto Ikeda |
Shotaro Sugiyama, Hiromitsu Awano, Makoto Ikeda |
Shotaro Sugiyama, Hiromitsu Awano, Makoto Ikeda |
31.3 μs/Signature-Generation 256-bit 픽p ECDSA Cryptoprocessor. |
31.3 μs/Signature-Generation 256-bit 픽p ECDSA Cryptoprocessor. |
31.3 μs/Signature-Generation 256-bit 픽p ECDSA Cryptoprocessor. |
IEEE Asian Solid-State Circuits Conference, A-SSCC 2018, Tainan, Taiwan, November 5-7, 2018, 153-156 |
IEEE Asian Solid-State Circuits Conference, A-SSCC 2018, Tainan, Taiwan, November 5-7, 2018, 153-156 |
IEEE Asian Solid-State Circuits Conference, A-SSCC 2018, Tainan, Taiwan, November 5-7, 2018, 153-156 |
2018 |
有 |
|
研究論文(国際会議プロシーディングス) |
公開 |
Vinod V. Gadde, Hiromitsu Awano, Makoto Ikeda |
Vinod V. Gadde, Hiromitsu Awano, Makoto Ikeda |
Vinod V. Gadde, Hiromitsu Awano, Makoto Ikeda |
An Encryption-Authentication Unified A/D Conversion Scheme for IoT Sensor Nodes. |
An Encryption-Authentication Unified A/D Conversion Scheme for IoT Sensor Nodes. |
An Encryption-Authentication Unified A/D Conversion Scheme for IoT Sensor Nodes. |
IEEE Asian Solid-State Circuits Conference, A-SSCC 2018, Tainan, Taiwan, November 5-7, 2018, 123-126 |
IEEE Asian Solid-State Circuits Conference, A-SSCC 2018, Tainan, Taiwan, November 5-7, 2018, 123-126 |
IEEE Asian Solid-State Circuits Conference, A-SSCC 2018, Tainan, Taiwan, November 5-7, 2018, 123-126 |
2018 |
有 |
|
研究論文(国際会議プロシーディングス) |
公開 |
Shotaro Sugiyama, Hiromitsu Awano, Makoto Ikeda |
Shotaro Sugiyama, Hiromitsu Awano, Makoto Ikeda |
Shotaro Sugiyama, Hiromitsu Awano, Makoto Ikeda |
Low Latency 256-bit ECDSA Signature Generation Crypto Processor. |
Low Latency 256-bit ECDSA Signature Generation Crypto Processor. |
Low Latency 256-bit ECDSA Signature Generation Crypto Processor. |
IEICE Transactions, 101-A, 12, 2290-2296 |
IEICE Transactions, 101-A, 12, 2290-2296 |
IEICE Transactions, 101-A, 12, 2290-2296 |
2018 |
有 |
|
研究論文(学術雑誌) |
公開 |
Ikkyu Aihara, Phillip J. Bishop, Michel E. B. Ohmer, Hiromitsu Awano, Takeshi Mizumoto, Hiroshi G. Okuno, Peter M. Narins, Jean-Marc Hero |
Ikkyu Aihara, Phillip J. Bishop, Michel E. B. Ohmer, Hiromitsu Awano, Takeshi Mizumoto, Hiroshi G. Okuno, Peter M. Narins, Jean-Marc Hero |
Ikkyu Aihara, Phillip J. Bishop, Michel E. B. Ohmer, Hiromitsu Awano, Takeshi Mizumoto, Hiroshi G. Okuno, Peter M. Narins, Jean-Marc Hero |
Visualizing Phonotactic Behavior of Female Frogs in Darkness  |
Visualizing Phonotactic Behavior of Female Frogs in Darkness  |
Visualizing Phonotactic Behavior of Female Frogs in Darkness  |
SCIENTIFIC REPORTS, 7, 7:10539 |
SCIENTIFIC REPORTS, 7, 7:10539 |
SCIENTIFIC REPORTS, 7, 7:10539 |
2017/09 |
有 |
英語 |
研究論文(学術雑誌) |
公開 |
Takeshi Mizumoto, Ikkyu Aihara, Takuma Otsuka, Hiromitsu Awano, Hiroshi G. kuno |
Takeshi Mizumoto, Ikkyu Aihara, Takuma Otsuka, Hiromitsu Awano, Hiroshi G. kuno |
Takeshi Mizumoto, Ikkyu Aihara, Takuma Otsuka, Hiromitsu Awano, Hiroshi G. kuno |
A Swarm of Sound-to-Light Conversion Devices for Monitoring Acoustic Communication among Small Nocturnal Animals |
A Swarm of Sound-to-Light Conversion Devices for Monitoring Acoustic Communication among Small Nocturnal Animals |
A Swarm of Sound-to-Light Conversion Devices for Monitoring Acoustic Communication among Small Nocturnal Animals |
Journal of Robotics and Mechatronics, 29, 1, 255-267 |
Journal of Robotics and Mechatronics, 29, 1, 255-267 |
Journal of Robotics and Mechatronics, 29, 1, 255-267 |
2017/02 |
有 |
英語 |
研究論文(学術雑誌) |
公開 |
Keitaro Koga, Hiromitsu Awano, Makoto Ikeda |
Keitaro Koga, Hiromitsu Awano, Makoto Ikeda |
Keitaro Koga, Hiromitsu Awano, Makoto Ikeda |
Yield Enhancement by Repair Circuits for Ultra-Fine Pitch Stacked-Chip Connections. |
Yield Enhancement by Repair Circuits for Ultra-Fine Pitch Stacked-Chip Connections. |
Yield Enhancement by Repair Circuits for Ultra-Fine Pitch Stacked-Chip Connections. |
26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017, 201-205 |
26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017, 201-205 |
26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017, 201-205 |
2017 |
有 |
|
研究論文(国際会議プロシーディングス) |
公開 |
Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Efficient circuit failure probability calculation along product lifetime considering device aging. |
Efficient circuit failure probability calculation along product lifetime considering device aging. |
Efficient circuit failure probability calculation along product lifetime considering device aging. |
22nd Asia and South Pacific Design Automation Conference, ASP-DAC 2017, Chiba, Japan, January 16-19, 2017, 93-98 |
22nd Asia and South Pacific Design Automation Conference, ASP-DAC 2017, Chiba, Japan, January 16-19, 2017, 93-98 |
22nd Asia and South Pacific Design Automation Conference, ASP-DAC 2017, Chiba, Japan, January 16-19, 2017, 93-98 |
2017 |
有 |
|
研究論文(国際会議プロシーディングス) |
公開 |
Abinash Mohanty, Ketul B. Sutaria, Hiromitsu Awano, Takashi Sato, Yu Cao 0001 |
Abinash Mohanty, Ketul B. Sutaria, Hiromitsu Awano, Takashi Sato, Yu Cao 0001 |
Abinash Mohanty, Ketul B. Sutaria, Hiromitsu Awano, Takashi Sato, Yu Cao 0001 |
RTN in Scaled Transistors for On-Chip Random Seed Generation. |
RTN in Scaled Transistors for On-Chip Random Seed Generation. |
RTN in Scaled Transistors for On-Chip Random Seed Generation. |
IEEE Trans. Very Large Scale Integr. Syst., 25, 8, 2248-2257 |
IEEE Trans. Very Large Scale Integr. Syst., 25, 8, 2248-2257 |
IEEE Trans. Very Large Scale Integr. Syst., 25, 8, 2248-2257 |
2017 |
有 |
|
研究論文(学術雑誌) |
公開 |
Hiromitsu Awano, Shumpei Morita, Takashi Sato |
Hiromitsu Awano, Shumpei Morita, Takashi Sato |
Hiromitsu Awano, Shumpei Morita, Takashi Sato |
Scalable Device Array for Statistical Characterization of BTI-Related Parameters. |
Scalable Device Array for Statistical Characterization of BTI-Related Parameters. |
Scalable Device Array for Statistical Characterization of BTI-Related Parameters. |
IEEE Trans. Very Large Scale Integr. Syst., 25, 4, 1455-1466 |
IEEE Trans. Very Large Scale Integr. Syst., 25, 4, 1455-1466 |
IEEE Trans. Very Large Scale Integr. Syst., 25, 4, 1455-1466 |
2017 |
有 |
|
研究論文(学術雑誌) |
公開 |
Takeshi Mizumoto, Ikkyu Aihara, Takuma Otsuka, Hiromitsu Awano, Hiroshi G. Okuno |
Takeshi Mizumoto, Ikkyu Aihara, Takuma Otsuka, Hiromitsu Awano, Hiroshi G. Okuno |
Takeshi Mizumoto, Ikkyu Aihara, Takuma Otsuka, Hiromitsu Awano, Hiroshi G. Okuno |
Swarm of Sound-to-Light Conversion Devices to Monitor Acoustic Communication Among Small Nocturnal Animals. |
Swarm of Sound-to-Light Conversion Devices to Monitor Acoustic Communication Among Small Nocturnal Animals. |
Swarm of Sound-to-Light Conversion Devices to Monitor Acoustic Communication Among Small Nocturnal Animals. |
JRM, 29, 1, 255-267 |
JRM, 29, 1, 255-267 |
JRM, 29, 1, 255-267 |
2017 |
有 |
|
研究論文(学術雑誌) |
公開 |
Hiromitsu Awano, Takashi Sato |
Hiromitsu Awano, Takashi Sato |
Hiromitsu Awano, Takashi Sato |
Efficient Aging-Aware Failure Probability Estimation Using Augmented Reliability and Subset Simulation.  |
Efficient Aging-Aware Failure Probability Estimation Using Augmented Reliability and Subset Simulation.  |
Efficient Aging-Aware Failure Probability Estimation Using Augmented Reliability and Subset Simulation.  |
IEICE Transactions, 100-A, 12, 2807-2815 |
IEICE Transactions, 100-A, 12, 2807-2815 |
IEICE Transactions, 100-A, 12, 2807-2815 |
2017 |
有 |
|
研究論文(学術雑誌) |
公開 |
Song Bian, Shumpei Morita, Michihiro Shintani, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Song Bian, Shumpei Morita, Michihiro Shintani, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Song Bian, Shumpei Morita, Michihiro Shintani, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Identification and Application of Invariant Critical Paths under NBTI Degradation.  |
Identification and Application of Invariant Critical Paths under NBTI Degradation.  |
Identification and Application of Invariant Critical Paths under NBTI Degradation.  |
IEICE Transactions, 100-A, 12, 2797-2806 |
IEICE Transactions, 100-A, 12, 2797-2806 |
IEICE Transactions, 100-A, 12, 2797-2806 |
2017 |
有 |
|
研究論文(学術雑誌) |
公開 |
Motoki Yoshinaga, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Motoki Yoshinaga, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Motoki Yoshinaga, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Physically unclonable function using RTN-induced delay fluctuation in ring oscillators |
Physically unclonable function using RTN-induced delay fluctuation in ring oscillators |
Physically unclonable function using RTN-induced delay fluctuation in ring oscillators |
Proceedings - IEEE International Symposium on Circuits and Systems, 2016-, 2619-2622 |
Proceedings - IEEE International Symposium on Circuits and Systems, 2016-, 2619-2622 |
Proceedings - IEEE International Symposium on Circuits and Systems, 2016-, 2619-2622 |
2016/07/29 |
有 |
英語 |
研究論文(国際会議プロシーディングス) |
公開 |
Motoki Yoshinaga, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Motoki Yoshinaga, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Motoki Yoshinaga, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Physically Unclonable Function Using RTN-Induced Delay Fluctuation in Ring Oscillators |
Physically Unclonable Function Using RTN-Induced Delay Fluctuation in Ring Oscillators |
Physically Unclonable Function Using RTN-Induced Delay Fluctuation in Ring Oscillators |
2016 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), 2619-2622 |
2016 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), 2619-2622 |
2016 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), 2619-2622 |
2016 |
有 |
英語 |
研究論文(国際会議プロシーディングス) |
公開 |
Ikkyu Aihara, Takeshi Mizumoto, Hiromitsu Awano, Hiroshi G. Okuno |
Ikkyu Aihara, Takeshi Mizumoto, Hiromitsu Awano, Hiroshi G. Okuno |
Ikkyu Aihara, Takeshi Mizumoto, Hiromitsu Awano, Hiroshi G. Okuno |
Call Alternation Between Specific Pairs of Male Frogs Revealed by a Sound-Imaging Method in Their Natural Habitat. |
Call Alternation Between Specific Pairs of Male Frogs Revealed by a Sound-Imaging Method in Their Natural Habitat. |
Call Alternation Between Specific Pairs of Male Frogs Revealed by a Sound-Imaging Method in Their Natural Habitat. |
Interspeech 2016, 17th Annual Conference of the International Speech Communication Association, San Francisco, CA, USA, September 8-12, 2016, 2597-2601 |
Interspeech 2016, 17th Annual Conference of the International Speech Communication Association, San Francisco, CA, USA, September 8-12, 2016, 2597-2601 |
Interspeech 2016, 17th Annual Conference of the International Speech Communication Association, San Francisco, CA, USA, September 8-12, 2016, 2597-2601 |
2016 |
有 |
|
研究論文(国際会議プロシーディングス) |
公開 |
Song Bian, Michihiro Shintani, Shumpei Morita, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Song Bian, Michihiro Shintani, Shumpei Morita, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Song Bian, Michihiro Shintani, Shumpei Morita, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Workload-Aware Worst Path Analysis of Processor-Scale NBTI Degradation. |
Workload-Aware Worst Path Analysis of Processor-Scale NBTI Degradation. |
Workload-Aware Worst Path Analysis of Processor-Scale NBTI Degradation. |
Proceedings of the 26th edition on Great Lakes Symposium on VLSI, GLVLSI 2016, Boston, MA, USA, May 18-20, 2016, 203-208 |
Proceedings of the 26th edition on Great Lakes Symposium on VLSI, GLVLSI 2016, Boston, MA, USA, May 18-20, 2016, 203-208 |
Proceedings of the 26th edition on Great Lakes Symposium on VLSI, GLVLSI 2016, Boston, MA, USA, May 18-20, 2016, 203-208 |
2016 |
有 |
|
研究論文(国際会議プロシーディングス) |
公開 |
Hiromitsu Awano, Takashi Sato |
Hiromitsu Awano, Takashi Sato |
Hiromitsu Awano, Takashi Sato |
Efficient transistor-level timing yield estimation via line sampling. |
Efficient transistor-level timing yield estimation via line sampling. |
Efficient transistor-level timing yield estimation via line sampling. |
Proceedings of the 53rd Annual Design Automation Conference, DAC 2016, Austin, TX, USA, June 5-9, 2016, 115-6 |
Proceedings of the 53rd Annual Design Automation Conference, DAC 2016, Austin, TX, USA, June 5-9, 2016, 115-6 |
Proceedings of the 53rd Annual Design Automation Conference, DAC 2016, Austin, TX, USA, June 5-9, 2016, 115-6 |
2016 |
有 |
|
研究論文(国際会議プロシーディングス) |
公開 |
Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Efficient Aging-Aware SRAM Failure Probability Calculation via Particle Filter-Based Importance Sampling.  |
Efficient Aging-Aware SRAM Failure Probability Calculation via Particle Filter-Based Importance Sampling.  |
Efficient Aging-Aware SRAM Failure Probability Calculation via Particle Filter-Based Importance Sampling.  |
IEICE Transactions, 99-A, 7, 1390-1399 |
IEICE Transactions, 99-A, 7, 1390-1399 |
IEICE Transactions, 99-A, 7, 1390-1399 |
2016 |
有 |
|
研究論文(学術雑誌) |
公開 |
Takashi Sato, Hiromitsu Awano |
Takashi Sato, Hiromitsu Awano |
Takashi Sato, Hiromitsu Awano |
On-chip characterization of statistical device degradation |
On-chip characterization of statistical device degradation |
On-chip characterization of statistical device degradation |
Circuit Design for Reliability, 69-92 |
Circuit Design for Reliability, 69-92 |
Circuit Design for Reliability, 69-92 |
2015/01/01 |
有 |
英語 |
|
公開 |
Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
ECRIPSE: An Efficient Method for Calculating RTN-Induced Failure Probability of an SRAM Cell |
ECRIPSE: An Efficient Method for Calculating RTN-Induced Failure Probability of an SRAM Cell |
ECRIPSE: An Efficient Method for Calculating RTN-Induced Failure Probability of an SRAM Cell |
2015 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), 549-554 |
2015 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), 549-554 |
2015 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), 549-554 |
2015 |
有 |
英語 |
研究論文(国際会議プロシーディングス) |
公開 |
Yoshiaki Bando, Takuma Otsuka, Ikkyu Aihara, Hiromitsu Awano, Katsutoshi Itoyama, Kazuyoshi Yoshii, Hiroshi Gitchang Okuno |
Yoshiaki Bando, Takuma Otsuka, Ikkyu Aihara, Hiromitsu Awano, Katsutoshi Itoyama, Kazuyoshi Yoshii, Hiroshi Gitchang Okuno |
Yoshiaki Bando, Takuma Otsuka, Ikkyu Aihara, Hiromitsu Awano, Katsutoshi Itoyama, Kazuyoshi Yoshii, Hiroshi Gitchang Okuno |
Recognition of In-Field Frog Chorusing Using Bayesian Nonparametric Microphone Array Processing. |
Recognition of In-Field Frog Chorusing Using Bayesian Nonparametric Microphone Array Processing. |
Recognition of In-Field Frog Chorusing Using Bayesian Nonparametric Microphone Array Processing. |
Computational Sustainability, Papers from the 2015 AAAI Workshop, Austin, Texas, USA, January 26, 2015. |
Computational Sustainability, Papers from the 2015 AAAI Workshop, Austin, Texas, USA, January 26, 2015. |
Computational Sustainability, Papers from the 2015 AAAI Workshop, Austin, Texas, USA, January 26, 2015. |
2015 |
有 |
|
|
公開 |
Hirofumi Shimizu, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Hirofumi Shimizu, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Hirofumi Shimizu, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Automation of Model Parameter Estimation for Random Telegraph Noise  |
Automation of Model Parameter Estimation for Random Telegraph Noise  |
Automation of Model Parameter Estimation for Random Telegraph Noise  |
IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, E97A, 12, 2383-2392 |
IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, E97A, 12, 2383-2392 |
IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, E97A, 12, 2383-2392 |
2014/12 |
有 |
英語 |
研究論文(学術雑誌) |
公開 |
Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
BTIarray: A Time-Overlapping Transistor Array for Efficient Statistical Characterization of Bias Temperature Instability |
BTIarray: A Time-Overlapping Transistor Array for Efficient Statistical Characterization of Bias Temperature Instability |
BTIarray: A Time-Overlapping Transistor Array for Efficient Statistical Characterization of Bias Temperature Instability |
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 14, 3, 833-843 |
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 14, 3, 833-843 |
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 14, 3, 833-843 |
2014/09 |
有 |
英語 |
研究論文(学術雑誌) |
公開 |
Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato |
Variability in Device Degradations: Statistical Observation of NBTI for 3996 Transistors |
Variability in Device Degradations: Statistical Observation of NBTI for 3996 Transistors |
Variability in Device Degradations: Statistical Observation of NBTI for 3996 Transistors |
PROCEEDINGS OF THE 2014 44TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC 2014), 218-221 |
PROCEEDINGS OF THE 2014 44TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC 2014), 218-221 |
PROCEEDINGS OF THE 2014 44TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC 2014), 218-221 |
2014 |
有 |
英語 |
研究論文(国際会議プロシーディングス) |
公開 |
Ikkyu Aihara, Takeshi Mizumoto, Takuma Otsuka, Hiromitsu Awano, Kohei Nagira, Hiroshi G. Okuno, Kazuyuki Aihara |
Ikkyu Aihara, Takeshi Mizumoto, Takuma Otsuka, Hiromitsu Awano, Kohei Nagira, Hiroshi G. Okuno, Kazuyuki Aihara |
Ikkyu Aihara, Takeshi Mizumoto, Takuma Otsuka, Hiromitsu Awano, Kohei Nagira, Hiroshi G. Okuno, Kazuyuki Aihara |
Spatio-Temporal Dynamics in Collective Frog Choruses Examined by Mathematical Modeling and Field Observations  |
Spatio-Temporal Dynamics in Collective Frog Choruses Examined by Mathematical Modeling and Field Observations  |
Spatio-Temporal Dynamics in Collective Frog Choruses Examined by Mathematical Modeling and Field Observations  |
SCIENTIFIC REPORTS, 4, 4:3891 |
SCIENTIFIC REPORTS, 4, 4:3891 |
SCIENTIFIC REPORTS, 4, 4:3891 |
2014/01 |
有 |
英語 |
研究論文(学術雑誌) |
公開 |
J. B. Velamala, K. B. Sutaria, H. Shimizu, H. Awano, T. Sato, G. Wirth, Y. Cao |
J. B. Velamala, K. B. Sutaria, H. Shimizu, H. Awano, T. Sato, G. Wirth, Y. Cao |
J. B. Velamala, K. B. Sutaria, H. Shimizu, H. Awano, T. Sato, G. Wirth, Y. Cao |
Compact Modeling of Statistical BTI Under Trapping/detrapping |
Compact Modeling of Statistical BTI Under Trapping/detrapping |
Compact Modeling of Statistical BTI Under Trapping/detrapping |
IEEE Transactions on Electron Devices, 60, 11, 3645-3654 |
IEEE Transactions on Electron Devices, 60, 11, 3645-3654 |
IEEE Transactions on Electron Devices, 60, 11, 3645-3654 |
2013/11 |
有 |
英語 |
|
公開 |
Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato |
Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato |
Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato |
Bayesian Estimation of Multi-Trap RTN Parameters Using Markov Chain Monte Carlo Method  |
Bayesian Estimation of Multi-Trap RTN Parameters Using Markov Chain Monte Carlo Method  |
Bayesian Estimation of Multi-Trap RTN Parameters Using Markov Chain Monte Carlo Method  |
IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, E95A, 12, 2272-2283 |
IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, E95A, 12, 2272-2283 |
IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, E95A, 12, 2272-2283 |
2012/12 |
有 |
英語 |
研究論文(学術雑誌) |
公開 |
清水 裕史, 粟野 皓光, 筒井 弘, 越智 裕之, 佐藤 高史 |
清水 裕史, 粟野 皓光, 筒井 弘, 越智 裕之, 佐藤 高史 |
Hirofumi Shimizu, Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato |
情報量規準を用いるRTNモデルパラメータ推定の自動化 |
情報量規準を用いるRTNモデルパラメータ推定の自動化 |
Estimation of Model Parameters for Random Telegraph Noise Based on Information Criterion |
情報処理学会DAシンポジウム論文集, 2012, 5, 49-54 |
情報処理学会DAシンポジウム論文集, 2012, 5, 49-54 |
in Proc. of IPSJ DA Symposium, 2012, 5, 49-54 |
2012/08 |
有 |
日本語 |
研究論文(国際会議プロシーディングス) |
公開 |
Hiromitsu Awano, Shun Nishide, Hiroaki Arie, Jun Tani, Toru Takahashi, Hiroshi G. Okuno, Tetsuya Ogata |
Hiromitsu Awano, Shun Nishide, Hiroaki Arie, Jun Tani, Toru Takahashi, Hiroshi G. Okuno, Tetsuya Ogata |
Hiromitsu Awano, Shun Nishide, Hiroaki Arie, Jun Tani, Toru Takahashi, Hiroshi G. Okuno, Tetsuya Ogata |
Use of a Sparse Structure to Improve Learning Performance of Recurrent Neural Networks |
Use of a Sparse Structure to Improve Learning Performance of Recurrent Neural Networks |
Use of a Sparse Structure to Improve Learning Performance of Recurrent Neural Networks |
NEURAL INFORMATION PROCESSING, PT III, 7064, PART 3, 323-+ |
NEURAL INFORMATION PROCESSING, PT III, 7064, PART 3, 323-+ |
NEURAL INFORMATION PROCESSING, PT III, 7064, PART 3, 323-+ |
2011 |
有 |
英語 |
研究論文(国際会議プロシーディングス) |
公開 |
Hiromitsu Awano, Tetsuya Ogata, Shun Nishide, Torn Takahashi, Kazunori Komatani, Hiroshi G. Okuno |
Hiromitsu Awano, Tetsuya Ogata, Shun Nishide, Torn Takahashi, Kazunori Komatani, Hiroshi G. Okuno |
Hiromitsu Awano, Tetsuya Ogata, Shun Nishide, Torn Takahashi, Kazunori Komatani, Hiroshi G. Okuno |
Human-Robot Cooperation in Arrangement of Objects Using Confidence Measure of Neuro-dynamical System |
Human-Robot Cooperation in Arrangement of Objects Using Confidence Measure of Neuro-dynamical System |
Human-Robot Cooperation in Arrangement of Objects Using Confidence Measure of Neuro-dynamical System |
IEEE INTERNATIONAL CONFERENCE ON SYSTEMS, MAN AND CYBERNETICS (SMC 2010), 2533-2538 |
IEEE INTERNATIONAL CONFERENCE ON SYSTEMS, MAN AND CYBERNETICS (SMC 2010), 2533-2538 |
IEEE INTERNATIONAL CONFERENCE ON SYSTEMS, MAN AND CYBERNETICS (SMC 2010), 2533-2538 |
2010 |
有 |
英語 |
研究論文(国際会議プロシーディングス) |
公開 |
H AWANO, T SATO |
H AWANO, T SATO |
H AWANO, T SATO |
EFFECT OF ARGON ION-BOMBARDMENT ON INTERNAL-STRESS IN EVAPORATED CO-CR FILM |
EFFECT OF ARGON ION-BOMBARDMENT ON INTERNAL-STRESS IN EVAPORATED CO-CR FILM |
EFFECT OF ARGON ION-BOMBARDMENT ON INTERNAL-STRESS IN EVAPORATED CO-CR FILM |
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 27, 5, L880-L882 |
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 27, 5, L880-L882 |
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 27, 5, L880-L882 |
1988/05 |
有 |
英語 |
研究論文(学術雑誌) |
公開 |