Jiake Wei, Takafumi Ogawa, Bin Feng, Tatsuya Yokoi, Ryo Ishikawa, Akihide Kuwabara, Katsuyuki Matsunaga, Naoya Shibata, Yuichi Ikuhara |
Jiake Wei, Takafumi Ogawa, Bin Feng, Tatsuya Yokoi, Ryo Ishikawa, Akihide Kuwabara, Katsuyuki Matsunaga, Naoya Shibata, Yuichi Ikuhara |
Jiake Wei, Takafumi Ogawa, Bin Feng, Tatsuya Yokoi, Ryo Ishikawa, Akihide Kuwabara, Katsuyuki Matsunaga, Naoya Shibata, Yuichi Ikuhara |
Direct Measurement of Electronic Band Structures at Oxide Grain Boundaries |
Direct Measurement of Electronic Band Structures at Oxide Grain Boundaries |
Direct Measurement of Electronic Band Structures at Oxide Grain Boundaries |
Nano Letters, 20, 4, 2530-2536 |
Nano Letters, 20, 4, 2530-2536 |
Nano Letters, 20, 4, 2530-2536 |
2020/04/08 |
有 |
|
研究論文(学術雑誌) |
公開 |