青木 学聡

Last Update: 2019/10/15 14:00:40

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Name(Kanji/Kana/Abecedarium Latinum)
青木 学聡/アオキ タカアキ/Aoki, Takaaki
Primary Affiliation(Org1/Job title)
Institute for Information Management and Communication (IIMC)/Associate Professor
Faculty
Org1 Job title
工学部
Concurrent Affiliation
Org1 Job title
Academic Center for Computing and Media Studies (ACCMS) Associate Professor
Center for the Promotion of Interdisciplinary Education and Research (C-PiER) 構成員
Academic Organizations You are Affiliated to in Japan
Organization name(Japanese) Organization name(English)
応用物理学会 The Japan Society of Applied Physics
日本MRS The Materials Research Society of Japan
Academic Organizations Overaseas You are Affiliated to
Organization name Country
Materials Research Society USA
Academic Degree
Field(Japanese) Field(English) University(Japanese) University(English) Method
修士(工学) 京都大学
博士(工学) 京都大学
Graduate School
University(Japanese) University(English) Faculty(Japanese) Faculty(English) Major(Japanese) Major(English) Degree
京都大学 大学院工学研究科修士課程電子物性工学専攻 修了
京都大学 大学院工学研究科博士後期課程電子物性工学専攻 修了
Undergraduate School / Major(s)
University(Japanese) University(English) Faculty(Japanese) Faculty(English) Major(s)(Japanese) Major(s)(English) Degree
京都大学 工学部電子工学科 卒業
Work Experience
Period Organization(Japanese) Organization(English) Job title(Japanese) Job title(English)
2000/04/-2001/03/ 京都大学大学院工学研究科 Graduate School of Engieering, Kyoto University 教務補佐員
2000/10/-2001/03/ (財)大阪科学技術センター Osaka Science and Technology Center 非常勤研究員
2001/04/-2005/05/ (財)大阪科学技術センター Osaka Science and Technology Center 研究員 Researcher
2005/06/-2006/01/ 京都大学大学院工学研究科 Graduate School of Engieering, Kyoto University 産学官連携助手
2006/02/-2016/02/ 京都大学大学院工学研究科 Graduate School of Engieering, Kyoto University 講師 Junior Associate Professor
2016/03/- 京都大学情報環境機構 Institute for Information Management and Communication, Kyoto Univ. 准教授 Associate Pofessor
Personal Profile
(Japanese)
大規模シミュレーションによる原子衝突現象の解明とその応用に関する研究、教育を行っている。また工学研究科附属情報センター講師として、工学研究科におけるITインフラの整備、情報セキュリティポリシーの策定と運用、大規模ソフトウェアライセンスの運用に従事している。
(English)
I am dedicated to education and research on the fundamental physics and application of atomic collision utilizing large-scale computer simulations. In addition, I am also working as a staff of center for information technology of graduate school of engineering, which is commissioned for the management and administration of IT infrastructure, information security and campus-wide software licenses of graduate school of engineering.
Personal Website(s) (URL(s))
URL
http://sakura.nucleng.kyoto-u.ac.jp/~aoki/
ORCID ID
https://orcid.org/0000-0002-5926-4903
researchmap URL
https://researchmap.jp/takaakiaoki
Research Topics
(Japanese)
ナノスケール材料の創製、評価に関するシミュレーション技術
(English)
Computer Simulations on nano-scale material modification and metrology
Overview of the research
(Japanese)
イオンビーム、プラズマ、超音速ジェット等、エネルギーをもった粒子と種々の材料表面との間で生じる衝突現象が主な研究テーマである。衝突現象の大規模計算機シミュレーションにより、その素過程を明らかにするとともに、表面ナノプロセス、高精度ナノ計測技術への応用を検討している。
(English)
My research interest is the collisional process of energetic particles, which are realized as ion beam, plasma, supersonic jet and so on. Fundamental aspects and applications for nano-scale material processing and metrology are studied by utilizing large-scale computer simulation.
Fields of research (key words)
Key words(Japanese) Key words(English)
情報基盤工学 Information Infrastructure
ナノ精度製造技術 nanoscale processing technology
ナノ精度計測技術 nanoscale measurment technology
原子スケールシミュレーション atomic-scale simulation
Published Papers
Author Author(Japanese) Author(English) Title Title(Japanese) Title(English) Bibliography Bibliography(Japanese) Bibliography(English) Publication date Refereed paper Language Publishing type Disclose
AOKI Takaaki, KAJITA Shoji, MOTOKI Tamaki, IYEMORI Toshihiko, KAWAGUCHI Tomoko AOKI Takaaki, KAJITA Shoji, MOTOKI Tamaki, IYEMORI Toshihiko, KAWAGUCHI Tomoko AOKI Takaaki, KAJITA Shoji, MOTOKI Tamaki, IYEMORI Toshihiko, KAWAGUCHI Tomoko Promoting Common Understanding on Research Data Management using Rubric Promoting Common Understanding on Research Data Management using Rubric Promoting Common Understanding on Research Data Management using Rubric Proc. 2019 8th International Congress on Advanced Applied Informatics (IIAI-AAI), 387-390 Proc. 2019 8th International Congress on Advanced Applied Informatics (IIAI-AAI), 387-390 Proc. 2019 8th International Congress on Advanced Applied Informatics (IIAI-AAI), 387-390 2019/07 Refereed English Research paper(international conference proceedings) Disclose to all
青木 学聡,梶田 将司,元木 環,家森 俊彦,川口 朋子 青木 学聡,梶田 将司,元木 環,家森 俊彦,川口 朋子 研究データマネジメントルーブリックによる自己評価と共通認識の醸成 研究データマネジメントルーブリックによる自己評価と共通認識の醸成 DEIM Forum 2019, C2-1 DEIM Forum 2019, C2-1 , C2-1 2019/03 Refereed Japanese Research paper(research society, symposium materials, etc.) Disclose to all
KAJITA Shoji, AOKI Takaaki 梶田 将司, 青木 学聡 KAJITA Shoji, AOKI Takaaki Planning on Campus-wide Research Infrastructure enhancement through Academic Data Management support Environment along Research Lifecycle 研究ライフサイクルに沿ったアカデミックデータマネジメント支援環境による 全学研究基盤強化構想 Planning on Campus-wide Research Infrastructure enhancement through Academic Data Management support Environment along Research Lifecycle IPSJ SIG TECHNICAL REPORT, 2017-IOT-38, 4, 1-6 情報処理学会研究報告, 2017-IOT-38, 4, 1-6 IPSJ SIG TECHNICAL REPORT, 2017-IOT-38, 4, 1-6 2017/06 Japanese Research paper(research society, symposium materials, etc.) Disclose to all
Toshio Seki, Hiroki Yamamoto, Takahiro Kozawa, Tadashi Shojo, Kunihiko Koike, Takaaki Aoki, Jiro Matsuo Toshio Seki, Hiroki Yamamoto, Takahiro Kozawa, Tadashi Shojo, Kunihiko Koike, Takaaki Aoki, Jiro Matsuo Toshio Seki, Hiroki Yamamoto, Takahiro Kozawa, Tadashi Shojo, Kunihiko Koike, Takaaki Aoki, Jiro Matsuo Angled etching of Si by ClF3–Ar gas cluster injection Angled etching of Si by ClF3–Ar gas cluster injection Angled etching of Si by ClF3–Ar gas cluster injection Japanese Journal of Applied Physics, 56, 6S2, 06HB02 Japanese Journal of Applied Physics, 56, 6S2, 06HB02 Japanese Journal of Applied Physics, 56, 6S2, 06HB02 2017/05 Refereed Disclose to all
青木 学聡, 久門 尚史, 木村 真之, 蛯原 義雄, 下田 宏 青木 学聡, 久門 尚史, 木村 真之, 蛯原 義雄, 下田 宏 青木 学聡, 久門 尚史, 木村 真之, 蛯原 義雄, 下田 宏 Course Development of Electric and Electronic Circuit Exercise utilizing BYOD-PC and Course Management System BYOD-PCとコース管理システムを活用した電気電子回路演習科目の実施 Course Development of Electric and Electronic Circuit Exercise utilizing BYOD-PC and Course Management System 研究報告教育学習支援情報システム(CLE), 2017, 3, 1-5 研究報告教育学習支援情報システム(CLE), 2017, 3, 1-5 研究報告教育学習支援情報システム(CLE), 2017, 3, 1-5 2017/03/21 Japanese Disclose to all
AOKI Takaaki, HISAKADO Takashi, KIMURA Masayuki, EBIHARA Yoshio, SHIMODA Hiroshi 青木学聡, 久門尚史, 木村真之, 蛯原義雄, 下田宏 AOKI Takaaki, HISAKADO Takashi, KIMURA Masayuki, EBIHARA Yoshio, SHIMODA Hiroshi Course Development of Electric and Electronic Circuit Exercise utilizing BYOD-PC and Course Management System BYOD-PCとコース管理システムを活用した電気電子回路演習科目の実施 Course Development of Electric and Electronic Circuit Exercise utilizing BYOD-PC and Course Management System IPSJ SIG TECHNICAL REPORT, CLE-2017-21, 3, 1-5 情報処理学会研究報告, CLE-2017-21, 3, 1-5 IPSJ SIG TECHNICAL REPORT, CLE-2017-21, 3, 1-5 2017/03 Japanese Research paper(research society, symposium materials, etc.) Disclose to all
Mao Tsunekawa, Eriko Amano, Hayahiko Ozono, Yui Nishizono, Shota Maeda, Yuko Matsumoto, Yasuyuki Minamiyama, Taro Misumi, Takaki Aoki, Koichi Ojiro, Kazutsuna Yamaji Mao Tsunekawa, Eriko Amano, Hayahiko Ozono, Yui Nishizono, Shota Maeda, Yuko Matsumoto, Yasuyuki Minamiyama, Taro Misumi, Takaki Aoki, Koichi Ojiro, Kazutsuna Yamaji Mao Tsunekawa, Eriko Amano, Hayahiko Ozono, Yui Nishizono, Shota Maeda, Yuko Matsumoto, Yasuyuki Minamiyama, Taro Misumi, Takaki Aoki, Koichi Ojiro, Kazutsuna Yamaji Building and Development of Research Data Management Training Tool Building and Development of Research Data Management Training Tool Building and Development of Research Data Management Training Tool Joho Chishiki Gakkaishi, 27, 4, 362 Joho Chishiki Gakkaishi, 27, 4, 362 Joho Chishiki Gakkaishi, 27, 4, 362 2017 Refereed Disclose to all
Aoki, Takaaki Kajita, Shoji Akasaka, Hirokazu Takeda, Hagane Aoki, Takaaki Kajita, Shoji Akasaka, Hirokazu Takeda, Hagane Aoki, Takaaki Kajita, Shoji Akasaka, Hirokazu Takeda, Hagane Development and Deployment of Research Data Preservation Policy at a Japanese Research University in 2016 Development and Deployment of Research Data Preservation Policy at a Japanese Research University in 2016 Development and Deployment of Research Data Preservation Policy at a Japanese Research University in 2016 2017 6th IIAI International Congress on Advanced Applied Informatics (IIAI-AAI), 120-123 2017 6th IIAI International Congress on Advanced Applied Informatics (IIAI-AAI), 120-123 2017 6th IIAI International Congress on Advanced Applied Informatics (IIAI-AAI), 120-123 2017 Refereed English Research paper(international conference proceedings) Disclose to all
AOKI Takaaki, KAJITA Shoji, AKASAKA Hirokazu, TAKEDA Hagane 青木 学聡, 梶田 将司, 赤坂 浩一, 武田 鋼 AOKI Takaaki, KAJITA Shoji, AKASAKA Hirokazu, TAKEDA Hagane Design of Long-term Data Preservation System using Enterprise Content Management and Optical Disc Archive Storage エンタープライズコンテント管理システムと 光ディスクストレージによるデジタルデータ長期保存の検討 Design of Long-term Data Preservation System using Enterprise Content Management and Optical Disc Archive Storage AXIES Annucal Conference 2016 大学ICT推進協議会2016年度年次大会 AXIES Annucal Conference 2016 2016/12 Japanese Research paper(research society, symposium materials, etc.) Disclose to all
青木 学聡, 喜多 一 青木 学聡, 喜多 一 青木 学聡, 喜多 一 Improvement of CMS Operation at User Side -- A Case of Assignment Tool on Sakai 利用者側での CMS の運用改善 -- Sakai における課題ツールを例に Improvement of CMS Operation at User Side -- A Case of Assignment Tool on Sakai 2016/12 Japanese Disclose to all
Hubert Gnaser, Hubert Gnaser, Masakazu Kusakari, Makiko Fujii, Toshio Seki, Takaaki Aoki, Jiro Matsuo Hubert Gnaser, Hubert Gnaser, Masakazu Kusakari, Makiko Fujii, Toshio Seki, Takaaki Aoki, Jiro Matsuo Hubert Gnaser, Hubert Gnaser, Masakazu Kusakari, Makiko Fujii, Toshio Seki, Takaaki Aoki, Jiro Matsuo Secondary ion emission from leucine and isoleucine under argon gas-cluster ion bombardment Secondary ion emission from leucine and isoleucine under argon gas-cluster ion bombardment Secondary ion emission from leucine and isoleucine under argon gas-cluster ion bombardment Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, 34, 3, 5 Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, 34, 3, 5 Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, 34, 3, 5 2016/05/01 Refereed Disclose to all
Toshio Seki, Yu Yoshino, Takehiko Senoo, Kunihiko Koike, Takaaki Aoki, Jiro Matsuo Toshio Seki, Yu Yoshino, Takehiko Senoo, Kunihiko Koike, Takaaki Aoki, Jiro Matsuo Toshio Seki, Yu Yoshino, Takehiko Senoo, Kunihiko Koike, Takaaki Aoki, Jiro Matsuo Reactive etching by ClF3–Ar neutral cluster beam with scanning Reactive etching by ClF3–Ar neutral cluster beam with scanning Reactive etching by ClF3–Ar neutral cluster beam with scanning Japanese Journal of Applied Physics, 55, 6S2, 06HB01 Japanese Journal of Applied Physics, 55, 6S2, 06HB01 Japanese Journal of Applied Physics, 55, 6S2, 06HB01 2016/05 Refereed Disclose to all
Masakazu Kusakari, Makiko Fujii, Toshio Seki, Toshio Seki, Takaaki Aoki, Jiro Matsuo Masakazu Kusakari, Makiko Fujii, Toshio Seki, Toshio Seki, Takaaki Aoki, Jiro Matsuo Masakazu Kusakari, Makiko Fujii, Toshio Seki, Toshio Seki, Takaaki Aoki, Jiro Matsuo Development of ambient SIMS using mega-electron-volt-energy ion probe Development of ambient SIMS using mega-electron-volt-energy ion probe Development of ambient SIMS using mega-electron-volt-energy ion probe Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, 34, 3, 4 Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, 34, 3, 4 Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, 34, 3, 4 2016/05 Refereed Disclose to all
Toshio Seki, Masakazu Kusakari, Makiko Fujii, Takaaki Aoki, Takaaki Aoki, Jiro Matsuo Toshio Seki, Masakazu Kusakari, Makiko Fujii, Takaaki Aoki, Takaaki Aoki, Jiro Matsuo Toshio Seki, Masakazu Kusakari, Makiko Fujii, Takaaki Aoki, Takaaki Aoki, Jiro Matsuo Ambient analysis of liquid materials with Wet-SIMS Ambient analysis of liquid materials with Wet-SIMS Ambient analysis of liquid materials with Wet-SIMS Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 371, 189-193 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 371, 189-193 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 371, 189-193 2016/03 Refereed Disclose to all
Rie Shishido, Makiko Fujii, Toshio Seki, Takaaki Aoki, Jiro Matsuo, Shigeru Suzuki Rie Shishido, Makiko Fujii, Toshio Seki, Takaaki Aoki, Jiro Matsuo, Shigeru Suzuki Rie Shishido, Makiko Fujii, Toshio Seki, Takaaki Aoki, Jiro Matsuo, Shigeru Suzuki Yields and images of secondary ions from organic materials by different primary Bi ions in time-of-flight secondary ion mass spectrometry Yields and images of secondary ions from organic materials by different primary Bi ions in time-of-flight secondary ion mass spectrometry Yields and images of secondary ions from organic materials by different primary Bi ions in time-of-flight secondary ion mass spectrometry Rapid Communications in Mass Spectrometry, 30, 4, 476-482 Rapid Communications in Mass Spectrometry, 30, 4, 476-482 Rapid Communications in Mass Spectrometry, 30, 4, 476-482 2016/02/28 Refereed Disclose to all
Takaaki Aoki, Toshio Seki, Jiro Matsuo Takaaki Aoki, Toshio Seki, Jiro Matsuo Takaaki Aoki, Toshio Seki, Jiro Matsuo Molecular dynamics simulations study of nano particle migration by cluster impact Molecular dynamics simulations study of nano particle migration by cluster impact Molecular dynamics simulations study of nano particle migration by cluster impact Surface and Coatings Technology, 306, 63-68 Surface and Coatings Technology, 306, 63-68 Surface and Coatings Technology, 306, 63-68 2016/02 Refereed English Research paper(scientific journal) Disclose to all
Matsuo J, Fujii M, Seki T, Aoki T. Matsuo J, Fujii M, Seki T, Aoki T. Matsuo J, Fujii M, Seki T, Aoki T. Recent developments of cluster ion beam-from nano-fabrication to analysis of bio-materials Recent developments of cluster ion beam-from nano-fabrication to analysis of bio-materials Recent developments of cluster ion beam-from nano-fabrication to analysis of bio-materials Journal of the Vacuum Society of Japan, 59, 5, 113-120 Journal of the Vacuum Society of Japan, 59, 5, 113-120 Journal of the Vacuum Society of Japan, 59, 5, 113-120 2016/01/01 Refereed Disclose to all
Matsuo J, Fujii M, Seki T, Aoki T. Matsuo J, Fujii M, Seki T, Aoki T. Matsuo J, Fujii M, Seki T, Aoki T. Recent progress in cluster beam technique Recent progress in cluster beam technique Recent progress in cluster beam technique Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering, 82, 4, 309-314 Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering, 82, 4, 309-314 Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering, 82, 4, 309-314 2016/01/01 Refereed Disclose to all
Suzuki K, Kusakari M, Fujii M, Seki T, Aoki T, Matsuo J. Suzuki K, Kusakari M, Fujii M, Seki T, Aoki T, Matsuo J. Suzuki K, Kusakari M, Fujii M, Seki T, Aoki T, Matsuo J. Development of Low-vacuum SIMS instruments with large cluster Ion beam Development of Low-vacuum SIMS instruments with large cluster Ion beam Development of Low-vacuum SIMS instruments with large cluster Ion beam Surface and Interface Analysis, 48, 11, 1121-1121 Surface and Interface Analysis, 48, 11, 1121-1121 Surface and Interface Analysis, 48, 11, 1121-1121 2016 Refereed Disclose to all
I. Yamada, J. Matsuo, N. Toyoda, T. Aoki, T. Seki I. Yamada, J. Matsuo, N. Toyoda, T. Aoki, T. Seki I. Yamada, J. Matsuo, N. Toyoda, T. Aoki, T. Seki Progress and applications of cluster ion beam technology Progress and applications of cluster ion beam technology Progress and applications of cluster ion beam technology Current Opinion in Solid State and Materials Science, 19, 1, 12-18 Current Opinion in Solid State and Materials Science, 19, 1, 12-18 Current Opinion in Solid State and Materials Science, 19, 1, 12-18 2015/02 Refereed English Research paper(scientific journal) Disclose to all
Masakazu Kusakari, Hubert Gnaser, Makiko Fujii, Toshio Seki, Toshio Seki, Takaaki Aoki, Takaaki Aoki, Jiro Matsuo, Jiro Matsuo Masakazu Kusakari, Hubert Gnaser, Makiko Fujii, Toshio Seki, Toshio Seki, Takaaki Aoki, Takaaki Aoki, Jiro Matsuo, Jiro Matsuo Masakazu Kusakari, Hubert Gnaser, Makiko Fujii, Toshio Seki, Toshio Seki, Takaaki Aoki, Takaaki Aoki, Jiro Matsuo, Jiro Matsuo Molecular cluster emission in sputtering of amino acids by argon gas-cluster ions Molecular cluster emission in sputtering of amino acids by argon gas-cluster ions Molecular cluster emission in sputtering of amino acids by argon gas-cluster ions International Journal of Mass Spectrometry, 383-384, 31-37 International Journal of Mass Spectrometry, 383-384, 31-37 International Journal of Mass Spectrometry, 383-384, 31-37 2015/01/01 Disclose to all
Toshio Seki, Makiko Fujii, Masakazu Kusakari, Shunichiro Nakagawa, Takaaki Aoki, Jiro Matsuo Toshio Seki, Makiko Fujii, Masakazu Kusakari, Shunichiro Nakagawa, Takaaki Aoki, Jiro Matsuo Toshio Seki, Makiko Fujii, Masakazu Kusakari, Shunichiro Nakagawa, Takaaki Aoki, Jiro Matsuo Analysis of liquid materials in low vacuum with Wet-SIMS Analysis of liquid materials in low vacuum with Wet-SIMS Analysis of liquid materials in low vacuum with Wet-SIMS Surface and Interface Analysis, 46, 12-13 Surface and Interface Analysis, 46, 12-13 Surface and Interface Analysis, 46, 12-13 2014/12 Refereed English Research paper(scientific journal) Disclose to all
Toshio Seki, Yoshinobu Wakamatsu, Shunichiro Nakagawa, Takaaki Aoki, Akihiko Ishihara, Jiro Matsuo Toshio Seki, Yoshinobu Wakamatsu, Shunichiro Nakagawa, Takaaki Aoki, Akihiko Ishihara, Jiro Matsuo Toshio Seki, Yoshinobu Wakamatsu, Shunichiro Nakagawa, Takaaki Aoki, Akihiko Ishihara, Jiro Matsuo Biomaterial imaging with MeV-energy heavy ion beams Biomaterial imaging with MeV-energy heavy ion beams Biomaterial imaging with MeV-energy heavy ion beams NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 332 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 332 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 332 2014/08 Refereed English Research paper(scientific journal) Disclose to all
Jiro Matsuo, Souta Torii, Kazuki Yamauchi, Keisuke Wakamoto, Masakazu Kusakari, Shunichiro Nakagawa, Makiko Fujii, Takaaki Aoki, Toshio Seki Jiro Matsuo, Souta Torii, Kazuki Yamauchi, Keisuke Wakamoto, Masakazu Kusakari, Shunichiro Nakagawa, Makiko Fujii, Takaaki Aoki, Toshio Seki Jiro Matsuo, Souta Torii, Kazuki Yamauchi, Keisuke Wakamoto, Masakazu Kusakari, Shunichiro Nakagawa, Makiko Fujii, Takaaki Aoki, Toshio Seki Novel SIMS system with focused massive cluster ion source for mass imaging spectrometry with high lateral resolution Novel SIMS system with focused massive cluster ion source for mass imaging spectrometry with high lateral resolution Novel SIMS system with focused massive cluster ion source for mass imaging spectrometry with high lateral resolution APPLIED PHYSICS EXPRESS, 7, 5, 1-56602 APPLIED PHYSICS EXPRESS, 7, 5, 1-56602 APPLIED PHYSICS EXPRESS, 7, 5, 1-56602 2014/05 Refereed English Research paper(scientific journal) Disclose to all
Makiko Fujii, Shunichirou Nakagawa, Kazuhiro Matsuda, Naoki Man, Toshio Seki, Takaaki Aoki, Jiro Matsuo Makiko Fujii, Shunichirou Nakagawa, Kazuhiro Matsuda, Naoki Man, Toshio Seki, Takaaki Aoki, Jiro Matsuo Makiko Fujii, Shunichirou Nakagawa, Kazuhiro Matsuda, Naoki Man, Toshio Seki, Takaaki Aoki, Jiro Matsuo Study on the detection limits of a new argon gas cluster ion beam secondary ion mass spectrometry apparatus using lipid compound samples Study on the detection limits of a new argon gas cluster ion beam secondary ion mass spectrometry apparatus using lipid compound samples Study on the detection limits of a new argon gas cluster ion beam secondary ion mass spectrometry apparatus using lipid compound samples RAPID COMMUNICATIONS IN MASS SPECTROMETRY, 28, 8 RAPID COMMUNICATIONS IN MASS SPECTROMETRY, 28, 8 RAPID COMMUNICATIONS IN MASS SPECTROMETRY, 28, 8 2014/04 Refereed English Research paper(scientific journal) Disclose to all
Hubert Gnaser, Makiko Fujii, Shunichirou Nakagawa, Toshio Seki, Takaaki Aoki, Jiro Matsuo Hubert Gnaser, Makiko Fujii, Shunichirou Nakagawa, Toshio Seki, Takaaki Aoki, Jiro Matsuo Hubert Gnaser, Makiko Fujii, Shunichirou Nakagawa, Toshio Seki, Takaaki Aoki, Jiro Matsuo Prolific cluster emission in sputtering of phenylalanine by argon-cluster ion bombardment Prolific cluster emission in sputtering of phenylalanine by argon-cluster ion bombardment Prolific cluster emission in sputtering of phenylalanine by argon-cluster ion bombardment INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 360, 1 INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 360, 1 INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 360, 1 2014/03 Refereed English Research paper(scientific journal) Disclose to all
Makiko Fujii, Shunichirou Nakagawa, Toshio Seki, Takaaki Aoki, Jiro Matsuo Makiko Fujii, Shunichirou Nakagawa, Toshio Seki, Takaaki Aoki, Jiro Matsuo Makiko Fujii, Shunichirou Nakagawa, Toshio Seki, Takaaki Aoki, Jiro Matsuo Quantitative analysis of lipids with argon gas cluster ion beam secondary ion massspectrometry Quantitative analysis of lipids with argon gas cluster ion beam secondary ion massspectrometry Quantitative analysis of lipids with argon gas cluster ion beam secondary ion massspectrometry Surface and Interface Analysis, 46, 1129-1132 Surface and Interface Analysis, 46, 1129-1132 Surface and Interface Analysis, 46, 1129-1132 2014/01/01 Disclose to all
Makiko Fujii, Masakazu Kusakari, Kazuhiro Matsuda, Naoki Man, Toshio Seki, Takaaki Aoki, Jiro Matsuo Makiko Fujii, Masakazu Kusakari, Kazuhiro Matsuda, Naoki Man, Toshio Seki, Takaaki Aoki, Jiro Matsuo Makiko Fujii, Masakazu Kusakari, Kazuhiro Matsuda, Naoki Man, Toshio Seki, Takaaki Aoki, Jiro Matsuo Lipid compounds analysis with MeV-SIMS apparatus for biological applications Lipid compounds analysis with MeV-SIMS apparatus for biological applications Lipid compounds analysis with MeV-SIMS apparatus for biological applications Surface and Interface Analysis, 46, 353-356 Surface and Interface Analysis, 46, 353-356 Surface and Interface Analysis, 46, 353-356 2014/01/01 Disclose to all
藤井 麻樹子, 宍戸 理恵, 鳥居 聡太, 中川 駿一郎, 瀬木 利夫, 青木 学聡, 鈴木 茂, 松尾 二郎 藤井 麻樹子, 宍戸 理恵, 鳥居 聡太, 中川 駿一郎, 瀬木 利夫, 青木 学聡, 鈴木 茂, 松尾 二郎 クラスターSIMS法による脂質分子の高感度検出とイメージングへの応用 クラスターSIMS法による脂質分子の高感度検出とイメージングへの応用 表面科学, 35, 7 表面科学, 35, 7 , 35, 7 2014/01 Japanese Research paper(scientific journal) Disclose to all
T. Seki, S. Shitomoto, S. Nakagawa, T. Aoki, J. Matsuo T. Seki, S. Shitomoto, S. Nakagawa, T. Aoki, J. Matsuo T. Seki, S. Shitomoto, S. Nakagawa, T. Aoki, J. Matsuo An electrostatic quadrupole doublet focusing system for MeV heavy ions in MeV-SIMS An electrostatic quadrupole doublet focusing system for MeV heavy ions in MeV-SIMS An electrostatic quadrupole doublet focusing system for MeV heavy ions in MeV-SIMS NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 315 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 315 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 315 2013/11 Refereed English Research paper(scientific journal) Disclose to all
Kazuya Dobashi, Kensuke Inai, Misako Saito, Toshio Seki, Takaaki Aoki, Jiro Matsuo Kazuya Dobashi, Kensuke Inai, Misako Saito, Toshio Seki, Takaaki Aoki, Jiro Matsuo Kazuya Dobashi, Kensuke Inai, Misako Saito, Toshio Seki, Takaaki Aoki, Jiro Matsuo Ultrafine particle removal using gas cluster ion beam technology Ultrafine particle removal using gas cluster ion beam technology Ultrafine particle removal using gas cluster ion beam technology IEEE Transactions on Semiconductor Manufacturing, 26, 328-334 IEEE Transactions on Semiconductor Manufacturing, 26, 328-334 IEEE Transactions on Semiconductor Manufacturing, 26, 328-334 2013/08/15 Disclose to all
Kazuya Dobashi, Kensuke Inai, Misako Saito, Toshio Seki, Takaaki Aoki, Jiro Matsuo Kazuya Dobashi, Kensuke Inai, Misako Saito, Toshio Seki, Takaaki Aoki, Jiro Matsuo Kazuya Dobashi, Kensuke Inai, Misako Saito, Toshio Seki, Takaaki Aoki, Jiro Matsuo Ultrafine Particle Removal Using Gas Cluster Ion Beam Technology Ultrafine Particle Removal Using Gas Cluster Ion Beam Technology Ultrafine Particle Removal Using Gas Cluster Ion Beam Technology IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 26, 3 IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 26, 3 IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 26, 3 2013/08 Refereed English Research paper(scientific journal) Disclose to all
Hubert Gnaser, Makiko Fujii, Shunichirou Nakagawa, Toshio Seki, Takaaki Aoki, Jiro Matsuo Hubert Gnaser, Makiko Fujii, Shunichirou Nakagawa, Toshio Seki, Takaaki Aoki, Jiro Matsuo Hubert Gnaser, Makiko Fujii, Shunichirou Nakagawa, Toshio Seki, Takaaki Aoki, Jiro Matsuo Peptide dissociation patterns in secondary ion mass spectrometry under large argon cluster ion bombardment Peptide dissociation patterns in secondary ion mass spectrometry under large argon cluster ion bombardment Peptide dissociation patterns in secondary ion mass spectrometry under large argon cluster ion bombardment RAPID COMMUNICATIONS IN MASS SPECTROMETRY, 27, 13, 1490-1496 RAPID COMMUNICATIONS IN MASS SPECTROMETRY, 27, 13, 1490-1496 RAPID COMMUNICATIONS IN MASS SPECTROMETRY, 27, 13, 1490-1496 2013/07 Refereed English Research paper(scientific journal) Disclose to all
Takaaki Aoki, Toshio Seki, Jiro Matsuo Takaaki Aoki, Toshio Seki, Jiro Matsuo Takaaki Aoki, Toshio Seki, Jiro Matsuo Molecular dynamics simulation study of damage formation and sputtering with huge fluorine cluster impact on silicon Molecular dynamics simulation study of damage formation and sputtering with huge fluorine cluster impact on silicon Molecular dynamics simulation study of damage formation and sputtering with huge fluorine cluster impact on silicon NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 303, 170-173 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 303, 170-173 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 303, 170-173 2013/05 Refereed English Research paper(scientific journal) Disclose to all
Yasuyuki Yamamoto, Kazuya Ichiki, Toshio Seki, Takaaki Aoki, Jiro Matsuo Yasuyuki Yamamoto, Kazuya Ichiki, Toshio Seki, Takaaki Aoki, Jiro Matsuo Yasuyuki Yamamoto, Kazuya Ichiki, Toshio Seki, Takaaki Aoki, Jiro Matsuo Ion-induced damage evaluation with Ar cluster ion beams Ion-induced damage evaluation with Ar cluster ion beams Ion-induced damage evaluation with Ar cluster ion beams SURFACE AND INTERFACE ANALYSIS, 45, 1, 167-170 SURFACE AND INTERFACE ANALYSIS, 45, 1, 167-170 SURFACE AND INTERFACE ANALYSIS, 45, 1, 167-170 2013/01 Refereed English Research paper(scientific journal) Disclose to all
K. Ichiki, J. Tamura, T. Seki, T. Aoki, J. Matsuo K. Ichiki, J. Tamura, T. Seki, T. Aoki, J. Matsuo K. Ichiki, J. Tamura, T. Seki, T. Aoki, J. Matsuo Development of gas cluster ion beam irradiation system with an orthogonal acceleration TOF instrument Development of gas cluster ion beam irradiation system with an orthogonal acceleration TOF instrument Development of gas cluster ion beam irradiation system with an orthogonal acceleration TOF instrument SURFACE AND INTERFACE ANALYSIS, 45, 1 SURFACE AND INTERFACE ANALYSIS, 45, 1 SURFACE AND INTERFACE ANALYSIS, 45, 1 2013/01 Refereed English Research paper(scientific journal) Disclose to all
Aoki T. Aoki T. Aoki T. Molecular dynamics simulations of cluster impacts on solid targets: implantation, surface modification, and sputtering Molecular dynamics simulations of cluster impacts on solid targets: implantation, surface modification, and sputtering Molecular dynamics simulations of cluster impacts on solid targets: implantation, surface modification, and sputtering Journal of Computational Electronics, 1-14 Journal of Computational Electronics, 1-14 Journal of Computational Electronics, 1-14 2013 Refereed Disclose to all
Takaaki Aoki, Toshio Seki, Jiro Matsuo Takaaki Aoki, Toshio Seki, Jiro Matsuo Takaaki Aoki, Toshio Seki, Jiro Matsuo Molecular dynamics study of crater formation by core-shell structured cluster impact Molecular dynamics study of crater formation by core-shell structured cluster impact Molecular dynamics study of crater formation by core-shell structured cluster impact NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 282 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 282 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 282 2012/07 Refereed English Research paper(scientific journal) Disclose to all
J. Matsuo, K. Ichiki, Y. Yamamoto, T. Seki, T. Aoki J. Matsuo, K. Ichiki, Y. Yamamoto, T. Seki, T. Aoki J. Matsuo, K. Ichiki, Y. Yamamoto, T. Seki, T. Aoki Depth profiling analysis of damaged arginine films with Ar cluster ion beams Depth profiling analysis of damaged arginine films with Ar cluster ion beams Depth profiling analysis of damaged arginine films with Ar cluster ion beams SURFACE AND INTERFACE ANALYSIS, 44, 6 SURFACE AND INTERFACE ANALYSIS, 44, 6 SURFACE AND INTERFACE ANALYSIS, 44, 6 2012/06 Refereed English Research paper(scientific journal) Disclose to all
T. Seki, T. Aoki, J. Matsuo T. Seki, T. Aoki, J. Matsuo T. Seki, T. Aoki, J. Matsuo Etching of metallic materials with Cl-2 gas cluster ion beam Etching of metallic materials with Cl-2 gas cluster ion beam Etching of metallic materials with Cl-2 gas cluster ion beam SURFACE & COATINGS TECHNOLOGY, 206, 5 SURFACE & COATINGS TECHNOLOGY, 206, 5 SURFACE & COATINGS TECHNOLOGY, 206, 5 2011/11 Refereed English Research paper(scientific journal) Disclose to all
Masaki Hada, Sachi Ibuki, Yusaku Hontani, Yasuyuki Yamamoto, Kazuya Ichiki, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Masaki Hada, Sachi Ibuki, Yusaku Hontani, Yasuyuki Yamamoto, Kazuya Ichiki, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Masaki Hada, Sachi Ibuki, Yusaku Hontani, Yasuyuki Yamamoto, Kazuya Ichiki, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Low-damage milling of an amino acid thin film with cluster ion beam Low-damage milling of an amino acid thin film with cluster ion beam Low-damage milling of an amino acid thin film with cluster ion beam JOURNAL OF APPLIED PHYSICS, 110, 9 JOURNAL OF APPLIED PHYSICS, 110, 9 JOURNAL OF APPLIED PHYSICS, 110, 9 2011/11 Refereed English Research paper(scientific journal) Disclose to all
Yoshinobu Wakamatsu, Hideaki Yamada, Satoshi Ninomiya, Brian N. Jones, Toshio Seki, Takaaki Aoki, Roger Webb, Jiro Matsuo Yoshinobu Wakamatsu, Hideaki Yamada, Satoshi Ninomiya, Brian N. Jones, Toshio Seki, Takaaki Aoki, Roger Webb, Jiro Matsuo Yoshinobu Wakamatsu, Hideaki Yamada, Satoshi Ninomiya, Brian N. Jones, Toshio Seki, Takaaki Aoki, Roger Webb, Jiro Matsuo Highly sensitive molecular detection with swift heavy ions Highly sensitive molecular detection with swift heavy ions Highly sensitive molecular detection with swift heavy ions NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 269, 20 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 269, 20 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 269, 20 2011/10 Refereed English Research paper(scientific journal) Disclose to all
Takaaki Aoki, Toshio Seki, Jiro Matsuo Takaaki Aoki, Toshio Seki, Jiro Matsuo Takaaki Aoki, Toshio Seki, Jiro Matsuo Molecular dynamics simulations of large fluorine cluster impact on silicon with supersonic velocity Molecular dynamics simulations of large fluorine cluster impact on silicon with supersonic velocity Molecular dynamics simulations of large fluorine cluster impact on silicon with supersonic velocity NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 269, 14 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 269, 14 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 269, 14 2011/07 Refereed English Research paper(scientific journal) Disclose to all
Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo The effect of incident energy on molecular depth profiling of polymers with large Ar cluster ion beams The effect of incident energy on molecular depth profiling of polymers with large Ar cluster ion beams The effect of incident energy on molecular depth profiling of polymers with large Ar cluster ion beams SURFACE AND INTERFACE ANALYSIS, 43, 1-2 SURFACE AND INTERFACE ANALYSIS, 43, 1-2 SURFACE AND INTERFACE ANALYSIS, 43, 1-2 2011/01 Refereed English Research paper(scientific journal) Disclose to all
K. Ichiki, S. Ninomiya, Y. Nakata, H. Yamada, T. Seki, T. Aoki, J. Matsuo K. Ichiki, S. Ninomiya, Y. Nakata, H. Yamada, T. Seki, T. Aoki, J. Matsuo K. Ichiki, S. Ninomiya, Y. Nakata, H. Yamada, T. Seki, T. Aoki, J. Matsuo Surface morphology of PMMA surfaces bombarded with size-selected gas cluster ion beams Surface morphology of PMMA surfaces bombarded with size-selected gas cluster ion beams Surface morphology of PMMA surfaces bombarded with size-selected gas cluster ion beams SURFACE AND INTERFACE ANALYSIS, 43, 1-2 SURFACE AND INTERFACE ANALYSIS, 43, 1-2 SURFACE AND INTERFACE ANALYSIS, 43, 1-2 2011/01 Refereed English Research paper(scientific journal) Disclose to all
H. Yamada, Y. Nakata, S. Ninomiya, T. Seki, T. Aoki, J. Tamura, J. Matsuo H. Yamada, Y. Nakata, S. Ninomiya, T. Seki, T. Aoki, J. Tamura, J. Matsuo H. Yamada, Y. Nakata, S. Ninomiya, T. Seki, T. Aoki, J. Tamura, J. Matsuo MeV-energy probe SIMS imaging of major components in washed and fractured animal cells MeV-energy probe SIMS imaging of major components in washed and fractured animal cells MeV-energy probe SIMS imaging of major components in washed and fractured animal cells SURFACE AND INTERFACE ANALYSIS, 43, 1-2 SURFACE AND INTERFACE ANALYSIS, 43, 1-2 SURFACE AND INTERFACE ANALYSIS, 43, 1-2 2011/01 Refereed English Research paper(scientific journal) Disclose to all
Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo Analysis of organic semiconductor multilayers with Ar cluster secondary ion mass spectrometry Analysis of organic semiconductor multilayers with Ar cluster secondary ion mass spectrometry Analysis of organic semiconductor multilayers with Ar cluster secondary ion mass spectrometry SURFACE AND INTERFACE ANALYSIS, 43, 1-2 SURFACE AND INTERFACE ANALYSIS, 43, 1-2 SURFACE AND INTERFACE ANALYSIS, 43, 1-2 2011/01 Refereed English Research paper(scientific journal) Disclose to all
Masaki Hada, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Masaki Hada, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Masaki Hada, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Using ellipsometry for the evaluation of surface damage and sputtering yield in organic films with irradiation of argon cluster ion beams Using ellipsometry for the evaluation of surface damage and sputtering yield in organic films with irradiation of argon cluster ion beams Using ellipsometry for the evaluation of surface damage and sputtering yield in organic films with irradiation of argon cluster ion beams SURFACE AND INTERFACE ANALYSIS, 43, 1-2 SURFACE AND INTERFACE ANALYSIS, 43, 1-2 SURFACE AND INTERFACE ANALYSIS, 43, 1-2 2011/01 Refereed English Research paper(scientific journal) Disclose to all
Jiro Matsuo, Teruyuki Kitagawa, Toshio Seki, Takaaki Aoki Jiro Matsuo, Teruyuki Kitagawa, Toshio Seki, Takaaki Aoki Jiro Matsuo, Teruyuki Kitagawa, Toshio Seki, Takaaki Aoki Nano processing with gas cluster ion beams Nano processing with gas cluster ion beams Nano processing with gas cluster ion beams Toraibarojisuto/Journal of Japanese Society of Tribologists, 55, 776-782 Toraibarojisuto/Journal of Japanese Society of Tribologists, 55, 776-782 Toraibarojisuto/Journal of Japanese Society of Tribologists, 55, 776-782 2010/12/01 Disclose to all
T. Seki, Y. Yoshino, T. Senoo, K. Koike, S. Ninomiya, T. Aoki, J. Matsuo T. Seki, Y. Yoshino, T. Senoo, K. Koike, S. Ninomiya, T. Aoki, J. Matsuo T. Seki, Y. Yoshino, T. Senoo, K. Koike, S. Ninomiya, T. Aoki, J. Matsuo High speed Si etching with ClF3 cluster injection High speed Si etching with ClF3 cluster injection High speed Si etching with ClF3 cluster injection AIP Conference Proceedings, 1321, 317-320 AIP Conference Proceedings, 1321, 317-320 AIP Conference Proceedings, 1321, 317-320 2010/12/01 Disclose to all
Masaki Hada, Yusaku Hontani, Sachi Ibuki, Kazuya Ichiki, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Masaki Hada, Yusaku Hontani, Sachi Ibuki, Kazuya Ichiki, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Masaki Hada, Yusaku Hontani, Sachi Ibuki, Kazuya Ichiki, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Evaluation of surface damage of organic films due to irradiation with energetic ion beams Evaluation of surface damage of organic films due to irradiation with energetic ion beams Evaluation of surface damage of organic films due to irradiation with energetic ion beams AIP Conference Proceedings, 1321, 314-316 AIP Conference Proceedings, 1321, 314-316 AIP Conference Proceedings, 1321, 314-316 2010/12/01 Disclose to all
Kunihiko Koike, Yu Yoshino, Takehiko Senoo, Toshio Seki, Toshio Seki, Satoshi Ninomiya, Satoshi Ninomiya, Takaaki Aoki, Takaaki Aoki, Jiro Matsuo Kunihiko Koike, Yu Yoshino, Takehiko Senoo, Toshio Seki, Toshio Seki, Satoshi Ninomiya, Satoshi Ninomiya, Takaaki Aoki, Takaaki Aoki, Jiro Matsuo Kunihiko Koike, Yu Yoshino, Takehiko Senoo, Toshio Seki, Toshio Seki, Satoshi Ninomiya, Satoshi Ninomiya, Takaaki Aoki, Takaaki Aoki, Jiro Matsuo Anisotropic etching using reactive cluster beams Anisotropic etching using reactive cluster beams Anisotropic etching using reactive cluster beams Applied Physics Express, 3 Applied Physics Express, 3 Applied Physics Express, 3 2010/12/01 Disclose to all
Y. Yamamoto, K. Ichiki, S. Ninomiya, S. Ninomiya, T. Seki, T. Seki, T. Aoki, T. Aoki, J. Matsuo, J. Matsuo Y. Yamamoto, K. Ichiki, S. Ninomiya, S. Ninomiya, T. Seki, T. Seki, T. Aoki, T. Aoki, J. Matsuo, J. Matsuo Y. Yamamoto, K. Ichiki, S. Ninomiya, S. Ninomiya, T. Seki, T. Seki, T. Aoki, T. Aoki, J. Matsuo, J. Matsuo Evaluation of surface damage on organic materials irradiated with Ar cluster ion beam Evaluation of surface damage on organic materials irradiated with Ar cluster ion beam Evaluation of surface damage on organic materials irradiated with Ar cluster ion beam AIP Conference Proceedings, 1321, 298-301 AIP Conference Proceedings, 1321, 298-301 AIP Conference Proceedings, 1321, 298-301 2010/12/01 Disclose to all
K. Ichiki, S. Ninomiya, S. Ninomiya, T. Seki, T. Seki, T. Aoki, T. Aoki, J. Matsuo, J. Matsuo K. Ichiki, S. Ninomiya, S. Ninomiya, T. Seki, T. Seki, T. Aoki, T. Aoki, J. Matsuo, J. Matsuo K. Ichiki, S. Ninomiya, S. Ninomiya, T. Seki, T. Seki, T. Aoki, T. Aoki, J. Matsuo, J. Matsuo Energy effects on the sputtering yield of Si bombarded with gas cluster ion beams Energy effects on the sputtering yield of Si bombarded with gas cluster ion beams Energy effects on the sputtering yield of Si bombarded with gas cluster ion beams AIP Conference Proceedings, 1321, 294-297 AIP Conference Proceedings, 1321, 294-297 AIP Conference Proceedings, 1321, 294-297 2010/12/01 Disclose to all
Yoshinobu Wakamatsu, Hideaki Yamada, Satoshi Ninomiya, Satoshi Ninomiya, Brian N. Jones, Toshio Seki, Toshio Seki, Takaaki Aoki, Takaaki Aoki, Roger Webb, Jiro Matsuo, Jiro Matsuo Yoshinobu Wakamatsu, Hideaki Yamada, Satoshi Ninomiya, Satoshi Ninomiya, Brian N. Jones, Toshio Seki, Toshio Seki, Takaaki Aoki, Takaaki Aoki, Roger Webb, Jiro Matsuo, Jiro Matsuo Yoshinobu Wakamatsu, Hideaki Yamada, Satoshi Ninomiya, Satoshi Ninomiya, Brian N. Jones, Toshio Seki, Toshio Seki, Takaaki Aoki, Takaaki Aoki, Roger Webb, Jiro Matsuo, Jiro Matsuo Biomolecular emission by swift heavy ion bombardment Biomolecular emission by swift heavy ion bombardment Biomolecular emission by swift heavy ion bombardment AIP Conference Proceedings, 1321, 233-236 AIP Conference Proceedings, 1321, 233-236 AIP Conference Proceedings, 1321, 233-236 2010/12/01 Disclose to all
Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo SIMS Depth Profiling of Organic Materials with Ar Cluster Ion Beam SIMS Depth Profiling of Organic Materials with Ar Cluster Ion Beam SIMS Depth Profiling of Organic Materials with Ar Cluster Ion Beam Transactions of the Materials Research Society of Japan, 35, 4 Transactions of the Materials Research Society of Japan, 35, 4 Transactions of the Materials Research Society of Japan, 35, 4 2010/12 Refereed English Research paper(scientific journal) Disclose to all
K Ichiki, S Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo K Ichiki, S Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo K Ichiki, S Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Sputtering Properties of Si by Size-Selected Ar Gas Cluster Ion Beam Sputtering Properties of Si by Size-Selected Ar Gas Cluster Ion Beam Sputtering Properties of Si by Size-Selected Ar Gas Cluster Ion Beam Transactions of the Materials Research Society of Japan, 35, 4 Transactions of the Materials Research Society of Japan, 35, 4 Transactions of the Materials Research Society of Japan, 35, 4 2010/12 Refereed English Research paper(scientific journal) Disclose to all
H Yamada, K Ichiki, Y Nakata, S Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo H Yamada, K Ichiki, Y Nakata, S Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo H Yamada, K Ichiki, Y Nakata, S Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Processing Techniques of Biomaterials: Using Gas Cluster Ion Beam for Imaging Mass Spectrometry Processing Techniques of Biomaterials: Using Gas Cluster Ion Beam for Imaging Mass Spectrometry Processing Techniques of Biomaterials: Using Gas Cluster Ion Beam for Imaging Mass Spectrometry Transactions of the Materials Research Society of Japan, 35, 4 Transactions of the Materials Research Society of Japan, 35, 4 Transactions of the Materials Research Society of Japan, 35, 4 2010/12 Refereed English Research paper(scientific journal) Disclose to all
松尾 二郎, 北川 晃幸, 瀬木 利夫, 青木 学聡 松尾 二郎, 北川 晃幸, 瀬木 利夫, 青木 学聡 ガスクラスタイオンビームによるナノ加工技術 ガスクラスタイオンビームによるナノ加工技術 トライボロジスト, 55, 11 トライボロジスト, 55, 11 , 55, 11 2010/11 Refereed Japanese Research paper(scientific journal) Disclose to all
Jiro Matsuo, Satoshi Ninomiya, Hideaki Yamada, Kazuya Ichiki, Yoshinobu Wakamatsu, Masaki Hada, Toshio Seki, Takaaki Aoki Jiro Matsuo, Satoshi Ninomiya, Hideaki Yamada, Kazuya Ichiki, Yoshinobu Wakamatsu, Masaki Hada, Toshio Seki, Takaaki Aoki Jiro Matsuo, Satoshi Ninomiya, Hideaki Yamada, Kazuya Ichiki, Yoshinobu Wakamatsu, Masaki Hada, Toshio Seki, Takaaki Aoki SIMS with highly excited primary beams for molecular depth profiling and imaging of organic and biological materials SIMS with highly excited primary beams for molecular depth profiling and imaging of organic and biological materials SIMS with highly excited primary beams for molecular depth profiling and imaging of organic and biological materials SURFACE AND INTERFACE ANALYSIS, 42, 10-11 SURFACE AND INTERFACE ANALYSIS, 42, 10-11 SURFACE AND INTERFACE ANALYSIS, 42, 10-11 2010/10 Refereed English Research paper(scientific journal) Disclose to all
Takaaki Aoki, Toshio Seki, Toshio Seki, Jiro Matsuo, Jiro Matsuo Takaaki Aoki, Toshio Seki, Toshio Seki, Jiro Matsuo, Jiro Matsuo Takaaki Aoki, Toshio Seki, Toshio Seki, Jiro Matsuo, Jiro Matsuo MD simulation of small boron cluster implantation MD simulation of small boron cluster implantation MD simulation of small boron cluster implantation IWJT-2010: Extended Abstracts - 2010 International Workshop on Junction Technology, 114-115 IWJT-2010: Extended Abstracts - 2010 International Workshop on Junction Technology, 114-115 IWJT-2010: Extended Abstracts - 2010 International Workshop on Junction Technology, 114-115 2010/07/09 Disclose to all
Hideaki Yamada, Kazuya Ichiki, Yoshihiko Nakata, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Hideaki Yamada, Kazuya Ichiki, Yoshihiko Nakata, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Hideaki Yamada, Kazuya Ichiki, Yoshihiko Nakata, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo MeV-energy probe SIMS imaging of major components in animal cells etched using large gas cluster ions MeV-energy probe SIMS imaging of major components in animal cells etched using large gas cluster ions MeV-energy probe SIMS imaging of major components in animal cells etched using large gas cluster ions NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 268, 11-12 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 268, 11-12 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 268, 11-12 2010/06 Refereed English Research paper(scientific journal) Disclose to all
Takaaki Aoki, Toshio Seki, Jiro Matsuo Takaaki Aoki, Toshio Seki, Jiro Matsuo Takaaki Aoki, Toshio Seki, Jiro Matsuo Molecular dynamics simulations for gas cluster ion beam processes Molecular dynamics simulations for gas cluster ion beam processes Molecular dynamics simulations for gas cluster ion beam processes VACUUM, 84, 8 VACUUM, 84, 8 VACUUM, 84, 8 2010/03 Refereed English Research paper(scientific journal) Disclose to all
Masaki Hada, Sachi Ibuki, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Masaki Hada, Sachi Ibuki, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Masaki Hada, Sachi Ibuki, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Evaluation of Damage Layer in an Organic Film with Irradiation of Energetic Ion Beams Evaluation of Damage Layer in an Organic Film with Irradiation of Energetic Ion Beams Evaluation of Damage Layer in an Organic Film with Irradiation of Energetic Ion Beams JAPANESE JOURNAL OF APPLIED PHYSICS, 49, 3 JAPANESE JOURNAL OF APPLIED PHYSICS, 49, 3 JAPANESE JOURNAL OF APPLIED PHYSICS, 49, 3 2010 Refereed English Research paper(scientific journal) Disclose to all
Kunihiko Koike, Yu Yoshino, Takehiko Senoo, Toshio Seki, Satoshi Ninomiya, Takaaki Aoki, Jiro Matsuo Kunihiko Koike, Yu Yoshino, Takehiko Senoo, Toshio Seki, Satoshi Ninomiya, Takaaki Aoki, Jiro Matsuo Kunihiko Koike, Yu Yoshino, Takehiko Senoo, Toshio Seki, Satoshi Ninomiya, Takaaki Aoki, Jiro Matsuo Anisotropic Etching Using Reactive Cluster Beams Anisotropic Etching Using Reactive Cluster Beams Anisotropic Etching Using Reactive Cluster Beams APPLIED PHYSICS EXPRESS, 3, 12 APPLIED PHYSICS EXPRESS, 3, 12 APPLIED PHYSICS EXPRESS, 3, 12 2010 Refereed English Research paper(scientific journal) Disclose to all
Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams RAPID COMMUNICATIONS IN MASS SPECTROMETRY, 23, 20 RAPID COMMUNICATIONS IN MASS SPECTROMETRY, 23, 20 RAPID COMMUNICATIONS IN MASS SPECTROMETRY, 23, 20 2009/10 Refereed English Research paper(scientific journal) Disclose to all
Takaaki Aoki, Toshio Seki, Jiro Matsuo Takaaki Aoki, Toshio Seki, Jiro Matsuo Takaaki Aoki, Toshio Seki, Jiro Matsuo Study of density effect of large gas cluster impact by molecular dynamics simulations Study of density effect of large gas cluster impact by molecular dynamics simulations Study of density effect of large gas cluster impact by molecular dynamics simulations NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 267, 18 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 267, 18 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 267, 18 2009/09 Refereed English Research paper(scientific journal) Disclose to all
Satoshi Ninomiya, Kazuya Ichiki, Toshio Seki, Takaaki Aoki, Jiro Matsuo Satoshi Ninomiya, Kazuya Ichiki, Toshio Seki, Takaaki Aoki, Jiro Matsuo Satoshi Ninomiya, Kazuya Ichiki, Toshio Seki, Takaaki Aoki, Jiro Matsuo The emission process of secondary ions from solids bombarded with large gas cluster ions The emission process of secondary ions from solids bombarded with large gas cluster ions The emission process of secondary ions from solids bombarded with large gas cluster ions NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 267, 16 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 267, 16 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 267, 16 2009/08 Refereed English Research paper(scientific journal) Disclose to all
T. Aoki, J. Matsuo T. Aoki, J. Matsuo T. Aoki, J. Matsuo Study of damage accumulation and annealing process at low energy boron implantation using molecular dynamics simulations Study of damage accumulation and annealing process at low energy boron implantation using molecular dynamics simulations Study of damage accumulation and annealing process at low energy boron implantation using molecular dynamics simulations Extended Abstracts of the 9th International Workshop on Junction Technology, IWJT 2009 Extended Abstracts of the 9th International Workshop on Junction Technology, IWJT 2009 Extended Abstracts of the 9th International Workshop on Junction Technology, IWJT 2009 2009/06 Refereed English Research paper(scientific journal) Disclose to all
J. Matsuo, K. Ichiki, M. Hada, S. Ninomiya, T. Seki, T. Aoki, T. Nagayama, M. Tanjyo J. Matsuo, K. Ichiki, M. Hada, S. Ninomiya, T. Seki, T. Aoki, T. Nagayama, M. Tanjyo J. Matsuo, K. Ichiki, M. Hada, S. Ninomiya, T. Seki, T. Aoki, T. Nagayama, M. Tanjyo Stress measurement of carbon cluster implanted layers with in-plane diffraction technique Stress measurement of carbon cluster implanted layers with in-plane diffraction technique Stress measurement of carbon cluster implanted layers with in-plane diffraction technique Extended Abstracts of the 9th International Workshop on Junction Technology, IWJT 2009 Extended Abstracts of the 9th International Workshop on Junction Technology, IWJT 2009 Extended Abstracts of the 9th International Workshop on Junction Technology, IWJT 2009 2009/06 Refereed English Research paper(scientific journal) Disclose to all
Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams RAPID COMMUNICATIONS IN MASS SPECTROMETRY, 23, 11 RAPID COMMUNICATIONS IN MASS SPECTROMETRY, 23, 11 RAPID COMMUNICATIONS IN MASS SPECTROMETRY, 23, 11 2009/06 Refereed English Research paper(scientific journal) Disclose to all
Y. Nakata, H. Yamada, Y. Honda, S. Ninomiya, T. Seki, T. Aoki, J. Matsuo Y. Nakata, H. Yamada, Y. Honda, S. Ninomiya, T. Seki, T. Aoki, J. Matsuo Y. Nakata, H. Yamada, Y. Honda, S. Ninomiya, T. Seki, T. Aoki, J. Matsuo Imaging mass spectrometry with nuclear microprobes for biological applications Imaging mass spectrometry with nuclear microprobes for biological applications Imaging mass spectrometry with nuclear microprobes for biological applications NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 267, 12-13 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 267, 12-13 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 267, 12-13 2009/06 Refereed English Research paper(scientific journal) Disclose to all
Takaaki Aoki, Toshio Seki, Satoshi Ninomiya, Kazuya Ichiki, Jiro Matsuo Takaaki Aoki, Toshio Seki, Satoshi Ninomiya, Kazuya Ichiki, Jiro Matsuo Takaaki Aoki, Toshio Seki, Satoshi Ninomiya, Kazuya Ichiki, Jiro Matsuo Study of crater formation and sputtering process with large gas cluster impact by molecular dynamics simulations Study of crater formation and sputtering process with large gas cluster impact by molecular dynamics simulations Study of crater formation and sputtering process with large gas cluster impact by molecular dynamics simulations NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 267, 8-9 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 267, 8-9 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 267, 8-9 2009/05 Refereed English Research paper(scientific journal) Disclose to all
T. Seki, T. Aoki, J. Matsuo T. Seki, T. Aoki, J. Matsuo T. Seki, T. Aoki, J. Matsuo High-speed processing with Cl_2 cluster ion beam High-speed processing with Cl_2 cluster ion beam High-speed processing with Cl_2 cluster ion beam NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 267, 8-9 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 267, 8-9 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 267, 8-9 2009/05 Refereed English Research paper(scientific journal) Disclose to all
Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo Low Damage Etching of Polymer Materials for Depth Profile Analysis Using Large Ar Cluster Ion Beam Low Damage Etching of Polymer Materials for Depth Profile Analysis Using Large Ar Cluster Ion Beam Low Damage Etching of Polymer Materials for Depth Profile Analysis Using Large Ar Cluster Ion Beam Journal of Surface Analysis, 15, 3 Journal of Surface Analysis, 15, 3 Journal of Surface Analysis, 15, 3 2009/02 Refereed English Research paper(scientific journal) Disclose to all
Yoshihiko Nakata, Yoshiro Honda, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Yoshihiko Nakata, Yoshiro Honda, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Yoshihiko Nakata, Yoshiro Honda, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Matrix-free high-resolution imaging mass spectrometry with high-energy ion projectiles Matrix-free high-resolution imaging mass spectrometry with high-energy ion projectiles Matrix-free high-resolution imaging mass spectrometry with high-energy ion projectiles JOURNAL OF MASS SPECTROMETRY, 44, 1 JOURNAL OF MASS SPECTROMETRY, 44, 1 JOURNAL OF MASS SPECTROMETRY, 44, 1 2009/01 Refereed English Research paper(scientific journal) Disclose to all
Hideaki Yamada, Kazuya Ichiki, Yoshihiko Nakata, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Hideaki Yamada, Kazuya Ichiki, Yoshihiko Nakata, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Hideaki Yamada, Kazuya Ichiki, Yoshihiko Nakata, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo A Processing Technique for Cell Surfaces Using Gas Cluster Ions for Imaging Mass Spectrometry A Processing Technique for Cell Surfaces Using Gas Cluster Ions for Imaging Mass Spectrometry A Processing Technique for Cell Surfaces Using Gas Cluster Ions for Imaging Mass Spectrometry Journal of the Mass Spectrometry Society of Japan, 57, 3 Journal of the Mass Spectrometry Society of Japan, 57, 3 Journal of the Mass Spectrometry Society of Japan, 57, 3 2009/01 Refereed English Research paper(scientific journal) Disclose to all
J MATSUO, S NINOMIYA, Y NAKATA, Y HONDA, K ICHIKI, T SEKI, T AOKI J MATSUO, S NINOMIYA, Y NAKATA, Y HONDA, K ICHIKI, T SEKI, T AOKI J MATSUO, S NINOMIYA, Y NAKATA, Y HONDA, K ICHIKI, T SEKI, T AOKI What size of cluster is most appropriate for SIMS? What size of cluster is most appropriate for SIMS? What size of cluster is most appropriate for SIMS? Applied Surface Science, 255, 4 Applied Surface Science, 255, 4 Applied Surface Science, 255, 4 2008/12 Refereed English Research paper(scientific journal) Disclose to all
K. Ichiki, S. Ninomiya, Y. Nakata, Y. Honda, T. Seki, T. Aoki, J. Matsuo K. Ichiki, S. Ninomiya, Y. Nakata, Y. Honda, T. Seki, T. Aoki, J. Matsuo K. Ichiki, S. Ninomiya, Y. Nakata, Y. Honda, T. Seki, T. Aoki, J. Matsuo High sputtering yields of organic compounds by large gas cluster ions High sputtering yields of organic compounds by large gas cluster ions High sputtering yields of organic compounds by large gas cluster ions APPLIED SURFACE SCIENCE, 255, 4 APPLIED SURFACE SCIENCE, 255, 4 APPLIED SURFACE SCIENCE, 255, 4 2008/12 Refereed English Research paper(scientific journal) Disclose to all
Yoshiro Honda, Yoshihiko Nakata, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Yoshiro Honda, Yoshihiko Nakata, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Yoshiro Honda, Yoshihiko Nakata, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo SIMS Analysis of Biological Mixtures with Fast Heavy Ion Irradiation SIMS Analysis of Biological Mixtures with Fast Heavy Ion Irradiation SIMS Analysis of Biological Mixtures with Fast Heavy Ion Irradiation Transactions of the MRS-J, 33, 4 Transactions of the MRS-J, 33, 4 Transactions of the MRS-J, 33, 4 2008/12 Refereed English Research paper(scientific journal) Disclose to all
S NINOMIYA, K ICHIKI, Y NAKATA, Y HONDA, T SEKI, T AOKI, J MATSUO S NINOMIYA, K ICHIKI, Y NAKATA, Y HONDA, T SEKI, T AOKI, J MATSUO S NINOMIYA, K ICHIKI, Y NAKATA, Y HONDA, T SEKI, T AOKI, J MATSUO Secondary ion emission from Si bombarded with large Ar cluster ions under UHV conditions Secondary ion emission from Si bombarded with large Ar cluster ions under UHV conditions Secondary ion emission from Si bombarded with large Ar cluster ions under UHV conditions Applied Surface Science, 255, 4 Applied Surface Science, 255, 4 Applied Surface Science, 255, 4 2008/12 Refereed English Research paper(scientific journal) Disclose to all
Satoshi Ninomiya, Yoshihiko Nakata, Yoshiro Honda, Kazuya Ichiki, Toshio Seki, Takaaki Aoki, Jiro Matsuo Satoshi Ninomiya, Yoshihiko Nakata, Yoshiro Honda, Kazuya Ichiki, Toshio Seki, Takaaki Aoki, Jiro Matsuo Satoshi Ninomiya, Yoshihiko Nakata, Yoshiro Honda, Kazuya Ichiki, Toshio Seki, Takaaki Aoki, Jiro Matsuo A fragment-free ionization technique for organic mass spectrometry with large Ar cluster ions A fragment-free ionization technique for organic mass spectrometry with large Ar cluster ions A fragment-free ionization technique for organic mass spectrometry with large Ar cluster ions APPLIED SURFACE SCIENCE, 255, 4 APPLIED SURFACE SCIENCE, 255, 4 APPLIED SURFACE SCIENCE, 255, 4 2008/12 Refereed English Research paper(scientific journal) Disclose to all
Toshio Seki, Takaaki Aoki, Jiro Matsuo Toshio Seki, Takaaki Aoki, Jiro Matsuo Toshio Seki, Takaaki Aoki, Jiro Matsuo High-Speed Nano-Processing with Cluster Ion Beams High-Speed Nano-Processing with Cluster Ion Beams High-Speed Nano-Processing with Cluster Ion Beams Transactions of the MRS-J, 33, 4 Transactions of the MRS-J, 33, 4 Transactions of the MRS-J, 33, 4 2008/12 Refereed English Research paper(scientific journal) Disclose to all
Y. Nakata, Y. Honda, S. Ninomiya, T. Seki, T. Aoki, J. Matsuo Y. Nakata, Y. Honda, S. Ninomiya, T. Seki, T. Aoki, J. Matsuo Y. Nakata, Y. Honda, S. Ninomiya, T. Seki, T. Aoki, J. Matsuo Yield enhancement of molecular ions with MeV ion-induced electronic excitation Yield enhancement of molecular ions with MeV ion-induced electronic excitation Yield enhancement of molecular ions with MeV ion-induced electronic excitation APPLIED SURFACE SCIENCE, 255, 4 APPLIED SURFACE SCIENCE, 255, 4 APPLIED SURFACE SCIENCE, 255, 4 2008/12 Refereed English Research paper(scientific journal) Disclose to all
T AOKI, T SEKI, S NINOMIYA, J MATSUO T AOKI, T SEKI, S NINOMIYA, J MATSUO T AOKI, T SEKI, S NINOMIYA, J MATSUO MD simulation study of the sputtering process by high-energy gas cluster impact MD simulation study of the sputtering process by high-energy gas cluster impact MD simulation study of the sputtering process by high-energy gas cluster impact Applied Surface Science, 255, 4 Applied Surface Science, 255, 4 Applied Surface Science, 255, 4 2008/12 Refereed English Research paper(scientific journal) Disclose to all
Satoshi Ninomiya, Jiro Matsuo, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Yoshiro Honda, Toshio Seki, Takaaki Aoki Satoshi Ninomiya, Jiro Matsuo, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Yoshiro Honda, Toshio Seki, Takaaki Aoki Satoshi Ninomiya, Jiro Matsuo, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Yoshiro Honda, Toshio Seki, Takaaki Aoki Low Damage Etching and SIMS Depth Profiling with Large Ar Cluster Ions Low Damage Etching and SIMS Depth Profiling with Large Ar Cluster Ions Low Damage Etching and SIMS Depth Profiling with Large Ar Cluster Ions Transactions of the MRS-J, 33, 4 Transactions of the MRS-J, 33, 4 Transactions of the MRS-J, 33, 4 2008/12 Refereed English Research paper(scientific journal) Disclose to all
Takeshi Hikata, Kazuhiko Hayashi, Tomoyuki Mizukoshi, Yoshiaki Sakurai, Itsuo Ishigami, Takaaki Aoki, Toshio Seki, Jiro Matsuo Takeshi Hikata, Kazuhiko Hayashi, Tomoyuki Mizukoshi, Yoshiaki Sakurai, Itsuo Ishigami, Takaaki Aoki, Toshio Seki, Jiro Matsuo Takeshi Hikata, Kazuhiko Hayashi, Tomoyuki Mizukoshi, Yoshiaki Sakurai, Itsuo Ishigami, Takaaki Aoki, Toshio Seki, Jiro Matsuo Carbon Nanotubes from a Divided Catalyst: the Carbon Transmission Method Carbon Nanotubes from a Divided Catalyst: the Carbon Transmission Method Carbon Nanotubes from a Divided Catalyst: the Carbon Transmission Method Applied Physics Express, 1 Applied Physics Express, 1 Applied Physics Express, 1 2008/02 Refereed English Research paper(scientific journal) Disclose to all
S Ninomiya, K Ichiki, Y Nakata, T Seki, T Aoki, Matsuo J S Ninomiya, K Ichiki, Y Nakata, T Seki, T Aoki, Matsuo J S Ninomiya, K Ichiki, Y Nakata, T Seki, T Aoki, Matsuo J The Effect of Incident Cluster Ion Size on Secondary Ion Yields Produced from Si The Effect of Incident Cluster Ion Size on Secondary Ion Yields Produced from Si The Effect of Incident Cluster Ion Size on Secondary Ion Yields Produced from Si Transactions of the Materials Research Society of Japan, 32, 4 Transactions of the Materials Research Society of Japan, 32, 4 Transactions of the Materials Research Society of Japan, 32, 4 2007/12 Refereed English Research paper(scientific journal) Disclose to all
S. Kakuta, S. Sasaki, K. Furusawa, T. Seki, T. Aoki, J. Matsuo S. Kakuta, S. Sasaki, K. Furusawa, T. Seki, T. Aoki, J. Matsuo S. Kakuta, S. Sasaki, K. Furusawa, T. Seki, T. Aoki, J. Matsuo Low damage smoothing of magnetic materials using off-nonnal gas cluster ion beam irradiation Low damage smoothing of magnetic materials using off-nonnal gas cluster ion beam irradiation Low damage smoothing of magnetic materials using off-nonnal gas cluster ion beam irradiation SURFACE & COATINGS TECHNOLOGY, 201, 19-20 SURFACE & COATINGS TECHNOLOGY, 201, 19-20 SURFACE & COATINGS TECHNOLOGY, 201, 19-20 2007/08 Refereed English Research paper(scientific journal) Disclose to all
Takaaki Aoki, Jiro Matsuo Takaaki Aoki, Jiro Matsuo Takaaki Aoki, Jiro Matsuo Molecular dynamics study of glancing angle gas cluster irradiation on irregular-structured surfaces Molecular dynamics study of glancing angle gas cluster irradiation on irregular-structured surfaces Molecular dynamics study of glancing angle gas cluster irradiation on irregular-structured surfaces NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 261, 1-2 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 261, 1-2 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 261, 1-2 2007/08 Refereed English Research paper(scientific journal) Disclose to all
Takaaki Aoki, Toshio Seki, Satoshi Ninomiya, Jiro Matsuo Takaaki Aoki, Toshio Seki, Satoshi Ninomiya, Jiro Matsuo Takaaki Aoki, Toshio Seki, Satoshi Ninomiya, Jiro Matsuo Molecular dynamics study of monomer and dimer emission processes with high energy gas cluster ion impact Molecular dynamics study of monomer and dimer emission processes with high energy gas cluster ion impact Molecular dynamics study of monomer and dimer emission processes with high energy gas cluster ion impact SURFACE & COATINGS TECHNOLOGY, 201, 19-20 SURFACE & COATINGS TECHNOLOGY, 201, 19-20 SURFACE & COATINGS TECHNOLOGY, 201, 19-20 2007/08 Refereed English Research paper(scientific journal) Disclose to all
Takaaki Aoki, Jiro Matsuo Takaaki Aoki, Jiro Matsuo Takaaki Aoki, Jiro Matsuo Molecular dynamics simulations of surface smoothing and sputtering process with glancing-angle gas cluster ion beams Molecular dynamics simulations of surface smoothing and sputtering process with glancing-angle gas cluster ion beams Molecular dynamics simulations of surface smoothing and sputtering process with glancing-angle gas cluster ion beams NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 257 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 257 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 257 2007/04 Refereed English Research paper(scientific journal) Disclose to all
Jiro Matsuo, Satoshi Ninomiya, Yoshihiko Nakata, Kazuya Ichiki, Takaaki Aoki, Toshio Seki Jiro Matsuo, Satoshi Ninomiya, Yoshihiko Nakata, Kazuya Ichiki, Takaaki Aoki, Toshio Seki Jiro Matsuo, Satoshi Ninomiya, Yoshihiko Nakata, Kazuya Ichiki, Takaaki Aoki, Toshio Seki Size effect in cluster collision on solid surfaces Size effect in cluster collision on solid surfaces Size effect in cluster collision on solid surfaces NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 257 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 257 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 257 2007/04 Refereed English Research paper(scientific journal) Disclose to all
Satoshi Ninomiya, Kazuya Ichiki, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo Satoshi Ninomiya, Kazuya Ichiki, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo Satoshi Ninomiya, Kazuya Ichiki, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo The effect of incident cluster ion energy and size on secondary ion yields emitted from Si The effect of incident cluster ion energy and size on secondary ion yields emitted from Si The effect of incident cluster ion energy and size on secondary ion yields emitted from Si NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 256, 1 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 256, 1 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 256, 1 2007/03 Refereed English Research paper(scientific journal) Disclose to all
Satoshi Ninomiya, Yoshihiko Nakata, Kazuya Ichiki, Toshio Seki, Takaaki Aoki, Jiro Matsuo Satoshi Ninomiya, Yoshihiko Nakata, Kazuya Ichiki, Toshio Seki, Takaaki Aoki, Jiro Matsuo Satoshi Ninomiya, Yoshihiko Nakata, Kazuya Ichiki, Toshio Seki, Takaaki Aoki, Jiro Matsuo Measurements of secondary ions emitted from organic compounds bombarded with large gas cluster ions Measurements of secondary ions emitted from organic compounds bombarded with large gas cluster ions Measurements of secondary ions emitted from organic compounds bombarded with large gas cluster ions NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 256, 1 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 256, 1 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 256, 1 2007/03 Refereed English Research paper(scientific journal) Disclose to all
K. Ichiki, S. Ninomiya, T. Seki, T. Aoki, J. Matsuo K. Ichiki, S. Ninomiya, T. Seki, T. Aoki, J. Matsuo K. Ichiki, S. Ninomiya, T. Seki, T. Aoki, J. Matsuo Surface oxidation of Si assisted by irradiation with large gas cluster ion beam in an oxygen atmosphere Surface oxidation of Si assisted by irradiation with large gas cluster ion beam in an oxygen atmosphere Surface oxidation of Si assisted by irradiation with large gas cluster ion beam in an oxygen atmosphere NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 256, 1 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 256, 1 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 256, 1 2007/03 Refereed English Research paper(scientific journal) Disclose to all
Takaaki Aoki, Jiro Matsuo Takaaki Aoki, Jiro Matsuo Takaaki Aoki, Jiro Matsuo Molecular dynamics study of surface modification with a glancing angle gas cluster ion beam Molecular dynamics study of surface modification with a glancing angle gas cluster ion beam Molecular dynamics study of surface modification with a glancing angle gas cluster ion beam NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 255, 1 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 255, 1 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 255, 1 2007/02 Refereed English Research paper(scientific journal) Disclose to all
Satoshi Ninomiya, Takaaki Aoki, Toshio Seki, Jiro Matsuo Satoshi Ninomiya, Takaaki Aoki, Toshio Seki, Jiro Matsuo Satoshi Ninomiya, Takaaki Aoki, Toshio Seki, Jiro Matsuo Secondary ion measurements for oxygen cluster ion SIMS Secondary ion measurements for oxygen cluster ion SIMS Secondary ion measurements for oxygen cluster ion SIMS APPLIED SURFACE SCIENCE, 252, 19 APPLIED SURFACE SCIENCE, 252, 19 APPLIED SURFACE SCIENCE, 252, 19 2006/07 Refereed English Research paper(scientific journal) Disclose to all
Satoshi Ninomiya, Takaaki Aoki, Toshio Seki, Jiro Matsuo Satoshi Ninomiya, Takaaki Aoki, Toshio Seki, Jiro Matsuo Satoshi Ninomiya, Takaaki Aoki, Toshio Seki, Jiro Matsuo High-intensity Si cluster ion emission from a silicon target bombarded with large Ar cluster ions High-intensity Si cluster ion emission from a silicon target bombarded with large Ar cluster ions High-intensity Si cluster ion emission from a silicon target bombarded with large Ar cluster ions APPLIED SURFACE SCIENCE, 252, 19 APPLIED SURFACE SCIENCE, 252, 19 APPLIED SURFACE SCIENCE, 252, 19 2006/07 Refereed English Research paper(scientific journal) Disclose to all
Takaaki Aoki, Jiro Matsuo Takaaki Aoki, Jiro Matsuo Takaaki Aoki, Jiro Matsuo Molecular dynamics study of particle emission by reactive cluster ion impact Molecular dynamics study of particle emission by reactive cluster ion impact Molecular dynamics study of particle emission by reactive cluster ion impact APPLIED SURFACE SCIENCE, 252, 19 APPLIED SURFACE SCIENCE, 252, 19 APPLIED SURFACE SCIENCE, 252, 19 2006/07 Refereed English Research paper(scientific journal) Disclose to all
T Aoki, J Matsuo T Aoki, J Matsuo T Aoki, J Matsuo Molecular dynamics simulations of surface modification and damage formation by gas cluster ion impacts Molecular dynamics simulations of surface modification and damage formation by gas cluster ion impacts Molecular dynamics simulations of surface modification and damage formation by gas cluster ion impacts NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 242, 1-2 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 242, 1-2 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 242, 1-2 2006/01 Refereed English Research paper(scientific journal) Disclose to all
T. Aoki, J. Matsuo T. Aoki, J. Matsuo T. Aoki, J. Matsuo Molecular dynamics simulations of the cluster-size effect on the sputtering process with reactive gas cluster ions Molecular dynamics simulations of the cluster-size effect on the sputtering process with reactive gas cluster ions Molecular dynamics simulations of the cluster-size effect on the sputtering process with reactive gas cluster ions Materials Research Society Symposium Proceedings, 908 Materials Research Society Symposium Proceedings, 908 Materials Research Society Symposium Proceedings, 908 2006 Refereed English Research paper(scientific journal) Disclose to all
T Aoki, J Matsuo T Aoki, J Matsuo T Aoki, J Matsuo Molecular dynamics study of the angular dependence of reactive cluster impacts Molecular dynamics study of the angular dependence of reactive cluster impacts Molecular dynamics study of the angular dependence of reactive cluster impacts NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 241, 1-4 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 241, 1-4 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 241, 1-4 2005/12 Refereed English Research paper(scientific journal) Disclose to all
T. Aoki, J. Matsuo T. Aoki, J. Matsuo T. Aoki, J. Matsuo Molecular dynamics study of suface structure and sputtering process by sequencial fluorine cluster impacts Molecular dynamics study of suface structure and sputtering process by sequencial fluorine cluster impacts Molecular dynamics study of suface structure and sputtering process by sequencial fluorine cluster impacts Materials Research Society Symposium Proceedings, 843 Materials Research Society Symposium Proceedings, 843 Materials Research Society Symposium Proceedings, 843 2005 Refereed English Research paper(scientific journal) Disclose to all
Jiro Matsuo, C OKUBO, T SEKI, T AOKI, N TOYODA, I YAMADA Jiro Matsuo, C OKUBO, T SEKI, T AOKI, N TOYODA, I YAMADA Jiro Matsuo, C OKUBO, T SEKI, T AOKI, N TOYODA, I YAMADA A new secondary ion mass spectrometry (SIMS) system with high-intensity cluster ion source A new secondary ion mass spectrometry (SIMS) system with high-intensity cluster ion source A new secondary ion mass spectrometry (SIMS) system with high-intensity cluster ion source Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 219-220 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 219-220 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 219-220 2004/06 Refereed English Research paper(scientific journal) Disclose to all
Takaaki Aoki, Jiro Matsuo, Isao Yamada Takaaki Aoki, Jiro Matsuo, Isao Yamada Takaaki Aoki, Jiro Matsuo, Isao Yamada Molecular Dynamics Study Of Surface Morphological Evolution By Cluster Impacts Molecular Dynamics Study Of Surface Morphological Evolution By Cluster Impacts Molecular Dynamics Study Of Surface Morphological Evolution By Cluster Impacts MRS Proceedings, 792 MRS Proceedings, 792 MRS Proceedings, 792 2004 Refereed English Research paper(scientific journal) Disclose to all
K Kimura, Y Oota, K Nakajima, M Suzuki, T Aoki, J Matsuo, A Agarwal, B Freer, A Stevenson, M Ameen K Kimura, Y Oota, K Nakajima, M Suzuki, T Aoki, J Matsuo, A Agarwal, B Freer, A Stevenson, M Ameen K Kimura, Y Oota, K Nakajima, M Suzuki, T Aoki, J Matsuo, A Agarwal, B Freer, A Stevenson, M Ameen Molecular effect on projected range in ultralow-energy ion implantation Molecular effect on projected range in ultralow-energy ion implantation Molecular effect on projected range in ultralow-energy ion implantation NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 211, 2 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 211, 2 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 211, 2 2003/10 English Research paper(scientific journal) Disclose to all
T Aoki, J Matsuo, G Takaoka, I Yamada T Aoki, J Matsuo, G Takaoka, I Yamada T Aoki, J Matsuo, G Takaoka, I Yamada Cluster species and cluster size dependence of damage formation by cluster ion impact Cluster species and cluster size dependence of damage formation by cluster ion impact Cluster species and cluster size dependence of damage formation by cluster ion impact NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 206 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 206 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 206 2003/05 Refereed English Research paper(scientific journal) Disclose to all
T Aoki, J Matsuo, G Takaoka, N Toyoda, I Yamada T Aoki, J Matsuo, G Takaoka, N Toyoda, I Yamada T Aoki, J Matsuo, G Takaoka, N Toyoda, I Yamada Defect characteristics by boron cluster ion implantation Defect characteristics by boron cluster ion implantation Defect characteristics by boron cluster ion implantation NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 206 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 206 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 206 2003/05 English Research paper(scientific journal) Disclose to all
Jiro Matsuo, Toshio Seki, Takaaki Aoki, Isao Yamada Jiro Matsuo, Toshio Seki, Takaaki Aoki, Isao Yamada Jiro Matsuo, Toshio Seki, Takaaki Aoki, Isao Yamada Atomistic study of cluster collision on solid surfaces Atomistic study of cluster collision on solid surfaces Atomistic study of cluster collision on solid surfaces Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 206 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 206 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 206 2003/05 Refereed English Research paper(scientific journal) Disclose to all
A Nakai, T Aoki, T Seki, J Matsuo, GH Takaoka, I Yamada A Nakai, T Aoki, T Seki, J Matsuo, GH Takaoka, I Yamada A Nakai, T Aoki, T Seki, J Matsuo, GH Takaoka, I Yamada Modeling of surface smoothing process by cluster ion beam irradiation Modeling of surface smoothing process by cluster ion beam irradiation Modeling of surface smoothing process by cluster ion beam irradiation NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 206 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 206 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 206 2003/05 Refereed English Research paper(scientific journal) Disclose to all
T Aoki, J Matsuo, G Takaoka T Aoki, J Matsuo, G Takaoka T Aoki, J Matsuo, G Takaoka Molecular dynamics study of damage formation characteristics by large cluster ion impacts Molecular dynamics study of damage formation characteristics by large cluster ion impacts Molecular dynamics study of damage formation characteristics by large cluster ion impacts NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 202 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 202 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 202 2003/04 Refereed English Research paper(scientific journal) Disclose to all
松尾 二郎, 瀬木 利夫, 青木 学聡 松尾 二郎, 瀬木 利夫, 青木 学聡 クラスターイオン衝突における非線形照射効果とそのプロセス応用 クラスターイオン衝突における非線形照射効果とそのプロセス応用 高温学会誌, 29, 5 高温学会誌, 29, 5 , 29, 5 2003 Refereed Japanese Research paper(scientific journal) Disclose to all
Isao Yamada, Jiro Matsuo, Zinetulla Insepov, Takaaki Aoki, Toshio Seki, Noriaki Toyoda Isao Yamada, Jiro Matsuo, Zinetulla Insepov, Takaaki Aoki, Toshio Seki, Noriaki Toyoda Isao Yamada, Jiro Matsuo, Zinetulla Insepov, Takaaki Aoki, Toshio Seki, Noriaki Toyoda Nano-processing with gas cluster ion beams Nano-processing with gas cluster ion beams Nano-processing with gas cluster ion beams Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 164-165 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 164-165 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 164-165 2000/04 Refereed English Research paper(scientific journal) Disclose to all
Toshio Seki, Takaaki Aoki, Jiro Matsuo, Isao Yamada Toshio Seki, Takaaki Aoki, Jiro Matsuo, Isao Yamada Toshio Seki, Takaaki Aoki, Jiro Matsuo, Isao Yamada STM observation of surface vacancies created by ion impact STM observation of surface vacancies created by ion impact STM observation of surface vacancies created by ion impact Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 164-165 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 164-165 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 164-165 2000/04 Refereed English Research paper(scientific journal) Disclose to all
Takaaki Aoki, Toshio Seki, Jiro Matsuo, Zinetulla INSEPOV, Isao Yamada Takaaki Aoki, Toshio Seki, Jiro Matsuo, Zinetulla INSEPOV, Isao Yamada Takaaki Aoki, Toshio Seki, Jiro Matsuo, Zinetulla INSEPOV, Isao Yamada Cluster size dependence of the impact process on a carbon substrate Cluster size dependence of the impact process on a carbon substrate Cluster size dependence of the impact process on a carbon substrate Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 153, 1-4 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 153, 1-4 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 153, 1-4 1999/06 Refereed English Research paper(scientific journal) Disclose to all
T SEKI, T AOKI, M TANOMURA, J MATSUO, I YAMADA T SEKI, T AOKI, M TANOMURA, J MATSUO, I YAMADA T SEKI, T AOKI, M TANOMURA, J MATSUO, I YAMADA Energy dependence of a single trace created by C60 ion impact Energy dependence of a single trace created by C60 ion impact Energy dependence of a single trace created by C60 ion impact Materials Chemistry and Physics, 54, 1-3 Materials Chemistry and Physics, 54, 1-3 Materials Chemistry and Physics, 54, 1-3 1998/07 Refereed English Research paper(scientific journal) Disclose to all
Takaaki Aoki, Toshio Seki, Jiro Matsuo, Zinetulla INSEPOV, Isao Yamada Takaaki Aoki, Toshio Seki, Jiro Matsuo, Zinetulla INSEPOV, Isao Yamada Takaaki Aoki, Toshio Seki, Jiro Matsuo, Zinetulla INSEPOV, Isao Yamada Molecular dynamics simulation of a carbon cluster ion impacting on a carbon surface Molecular dynamics simulation of a carbon cluster ion impacting on a carbon surface Molecular dynamics simulation of a carbon cluster ion impacting on a carbon surface Materials Chemistry and Physics, 54, 1-3 Materials Chemistry and Physics, 54, 1-3 Materials Chemistry and Physics, 54, 1-3 1998/07 Refereed English Research paper(scientific journal) Disclose to all
Daisuke TAKEUCHI, Toshio Seki, Takaaki Aoki, Jiro Matsuo, Isao Yamada Daisuke TAKEUCHI, Toshio Seki, Takaaki Aoki, Jiro Matsuo, Isao Yamada Daisuke TAKEUCHI, Toshio Seki, Takaaki Aoki, Jiro Matsuo, Isao Yamada Cluster ion bombardment on atomically flat Au(111) solid surfaces Cluster ion bombardment on atomically flat Au(111) solid surfaces Cluster ion bombardment on atomically flat Au(111) solid surfaces Materials Chemistry and Physics, 54, 1-3 Materials Chemistry and Physics, 54, 1-3 Materials Chemistry and Physics, 54, 1-3 1998/07 Refereed English Research paper(scientific journal) Disclose to all
T SEKI, T KANEKO, D TAKEUCHI, T AOKI, J MATSUO, Z INSEPOV, I YAMADA T SEKI, T KANEKO, D TAKEUCHI, T AOKI, J MATSUO, Z INSEPOV, I YAMADA T SEKI, T KANEKO, D TAKEUCHI, T AOKI, J MATSUO, Z INSEPOV, I YAMADA STM observation of HOPG surfaces irradiated with Ar cluster ions STM observation of HOPG surfaces irradiated with Ar cluster ions STM observation of HOPG surfaces irradiated with Ar cluster ions Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 121, 1-4 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 121, 1-4 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 121, 1-4 1997/01 Refereed English Research paper(scientific journal) Disclose to all

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Conference Activities & Talks
Title Title(Japanese) Title(English) Conference Conference(Japanese) Conference(English) Promotor Promotor(Japanese) Promotor(English) Date Language Assortment Disclose
大学での研究データマネジメントの全学的取組み 大学での研究データマネジメントの全学的取組み 研究・実験データの保管・共有の推進方策Ⅱ 研究・実験データの保管・共有の推進方策Ⅱ 2019/07/26 Japanese Public discourse, seminar, tutorial, course, lecture and others Disclose to all
京都大学とORCID(2019年度版) 京都大学とORCID(2019年度版) ORCID Japan Workshop ORCID Japan Workshop 2019/06/28 Japanese Oral presentation(general) Disclose to all
研究データマネジメントに対する共通理解 研究データマネジメントに対する共通理解 Japan Open Science Summit 2019 「研究データマネジメント人材の育成を展望する」 Japan Open Science Summit 2019 「研究データマネジメント人材の育成を展望する」 2019/05/28 Japanese Oral presentation(general) Disclose to all
京都大学におけるデータマネジネントの現状 : アンケート調査・ヒアリング調査報告 京都大学におけるデータマネジネントの現状 : アンケート調査・ヒアリング調査報告 京都大学におけるデータマネジネントの現状 : アンケート調査・ヒアリング調査報告 2nd Kyoto University Research Data Management Workshop 第2回京都大学研究データマネジメントワークショップ 2nd Kyoto University Research Data Management Workshop 京都大学アカデミックデータ・イノベーションユニット 京都大学アカデミックデータ・イノベーションユニット 2019/02/28 Japanese Oral presentation(general) Disclose to all
京都大学研究データマップ (2019.02.28初版) 京都大学研究データマップ (2019.02.28初版) 京都大学研究データマップ (2019.02.28初版) 2nd Kyoto University Research Data Management Workshop 第2回京都大学研究データマネジメントワークショップ 2nd Kyoto University Research Data Management Workshop 京都大学アカデミックデータ・イノベーションユニット 京都大学アカデミックデータ・イノベーションユニット 2019/02/28 Japanese Oral presentation(general) Disclose to all
ルーブリックによるRDMへの共通理解 ルーブリックによるRDMへの共通理解 ルーブリックによるRDMへの共通理解 2nd Kyoto University Research Data Management Workshop 第2回京都大学研究データマネジメントワークショップ 2nd Kyoto University Research Data Management Workshop 京都大学アカデミックデータ・イノベーションユニット 京都大学アカデミックデータ・イノベーションユニット 2019/02/28 Japanese Oral presentation(general) Disclose to all
京都大学の研究データ保存環境のこれまで 京都大学の研究データ保存環境のこれまで 京都大学の研究データ保存環境のこれまで 2nd Kyoto University Research Data Management Workshop 第2回京都大学研究データマネジメントワークショップ 2nd Kyoto University Research Data Management Workshop 京都大学アカデミックデータ・イノベーションユニット 京都大学アカデミックデータ・イノベーションユニット 2019/02/28 Japanese Oral presentation(general) Disclose to all
大学でのオープンサイエンスと研究データ管理 大学でのオープンサイエンスと研究データ管理 平成30年度大阪大学職員研修「オープンサイエンスの基礎知識:大学と研究データ」 平成30年度大阪大学職員研修「オープンサイエンスの基礎知識:大学と研究データ」 2019/02/15 Japanese Public discourse, seminar, tutorial, course, lecture and others Disclose to all
倫理審査申請システムと連携した臨床研究情報(必須文書/臨床研究データ)の 長期保管システムと臨床研究マスターファイルを組み合わせた臨床研究情報の 統合管理システムの構築 倫理審査申請システムと連携した臨床研究情報(必須文書/臨床研究データ)の 長期保管システムと臨床研究マスターファイルを組み合わせた臨床研究情報の 統合管理システムの構築 日本臨床試験学会第10回学術集会総会 日本臨床試験学会第10回学術集会総会 2019/01/25 Japanese Poster presentation Disclose to all
Kyoto University Academic Data Innovation Unit - bottom-up promotion for research data management environment in various fields 京都大学アカデミックデータ・イノベーションユニット - ボトムアップによる多様な学術データマネジメント環境整備への提言 Kyoto University Academic Data Innovation Unit - bottom-up promotion for research data management environment in various fields International Workshop on Data Science International Workshop on Data Science International Workshop on Data Science 2018/11/15 Japanese Oral presentation(general) Disclose to all
Engaging Academia with Japan-wide Data Platforms and RDM CHarter Engaging Academia with Japan-wide Data Platforms and RDM CHarter Engaging Academia with Japan-wide Data Platforms and RDM CHarter FORCE2018 meeting FORCE2018 meeting FORCE2018 meeting 2018/10/12 English Oral presentation(general) Disclose to all
Application of image processing technique for imaging SIMS analysis 画像分析技術のイメージングSIMS分析への応用 Application of image processing technique for imaging SIMS analysis The 79th JSAP Autumn Meeting, 2018 2018年第79回応用物理学会秋季学術講演会 The 79th JSAP Autumn Meeting, 2018 The Japan Society of Applied Physics 応用物理学会 The Japan Society of Applied Physics 2018/09/21 Japanese Oral presentation(general) Disclose to all
Improvement in the Detection Sensitivity of Secondary Ions by Cs Absorption with the Mist Deposition Method on a PEG Surface ミスト法を用いたセシウム付加によるPEG表面の次イオン検出感度の向上 Improvement in the Detection Sensitivity of Secondary Ions by Cs Absorption with the Mist Deposition Method on a PEG Surface The 79th JSAP Autumn Meeting, 2018 2018年第79回応用物理学会秋季学術講演会 The 79th JSAP Autumn Meeting, 2018 The Japan Society of Applied Physics 応用物理学会 The Japan Society of Applied Physics 2018/09/21 Japanese Oral presentation(general) Disclose to all
MeV-SIMS Measurement of Liquid Materials at Atmospheric Pressure 液体材料の大気圧MeV-SIMS測定 MeV-SIMS Measurement of Liquid Materials at Atmospheric Pressure The 79th JSAP Autumn Meeting, 2018 2018年第79回応用物理学会秋季学術講演会 The 79th JSAP Autumn Meeting, 2018 The Japan Society of Applied Physics 応用物理学会 The Japan Society of Applied Physics 2018/09/21 Japanese Oral presentation(general) Disclose to all
大学での研究データ管理 大学での研究データ管理 第4回RA協議会年次大会、「私たちがオープンサイエンスを進めるためにすべきこと」 第4回RA協議会年次大会、「私たちがオープンサイエンスを進めるためにすべきこと」 RA協議会年次大会実行委員会 RA協議会年次大会実行委員会 2018/09/20 Japanese Oral presentation(general) Disclose to all
大学での研究データマネジメントの進め方 大学での研究データマネジメントの進め方 Cloud week 2018@Hokkaido University Cloud week 2018@Hokkaido University 北海道大学基盤情報センター 北海道大学基盤情報センター 2018/09/03 Japanese Oral presentation(general) Disclose to all
全学的な研究データ保存システムの構築と運用 全学的な研究データ保存システムの構築と運用 平成30年度国立大学法人等情報化発表会 平成30年度国立大学法人等情報化発表会 国立大学法人等情報化連絡協議会 国立大学法人等情報化連絡協議会 2018/08/31 Japanese Oral presentation(general) Disclose to all
研究データ長期保存サービスの試行と推進方策 研究データ長期保存サービスの試行と推進方策 研究・実験データの保管・共有の推進方策 研究・実験データの保管・共有の推進方策 地域科学研究会・高等教育情報センター 地域科学研究会・高等教育情報センター 2018/08/21 Japanese Public discourse, seminar, tutorial, course, lecture and others Disclose to all
ORCID Bootstrapping at Kyoto University 京都大学でのORCID導入 ORCID Bootstrapping at Kyoto University ORCID Japan Member Meeting ORCID Japan Member Meeting ORCID Japan Member Meeting 2018/04/17 Japanese Oral presentation(general) Disclose to all
Fabrication of 3D structure by double-angled etching with reactive gas cluster injection 反応性ガスクラスターインジェクションを用いた斜め2方向エッチングによる3D構造の作成 Fabrication of 3D structure by double-angled etching with reactive gas cluster injection The 65th JSAP Spring Meeting, 2018 第65回応用物理学会春季学術講演会 The 65th JSAP Spring Meeting, 2018 2018/03/20 Japanese Oral presentation(general) Disclose to all
Development of Ambient SIMS for Analysis of Solid-Liquid Interface 固液界面分析に向けたAmbient SIMS法の開発 Development of Ambient SIMS for Analysis of Solid-Liquid Interface The 65th JSAP Spring Meeting, 2018 第65回応用物理学会春季学術講演会 The 65th JSAP Spring Meeting, 2018 2018/03/20 Japanese Oral presentation(general) Disclose to all
Development of the Beam Detecting System Using Channel Electron Multiplier (CEM) 二次電子増倍管(CEM)を用いたビーム径測定システムの開発 Development of the Beam Detecting System Using Channel Electron Multiplier (CEM) The 65th JSAP Spring Meeting, 2018 第65回応用物理学会春季学術講演会 The 65th JSAP Spring Meeting, 2018 2018/03/20 Japanese Oral presentation(general) Disclose to all
Detection Sensitivity Improvement of Secondary Ion by Sodium Absorption with mist deposition method on PEG Surface ミスト法を用いたナトリウム付加によるPEG表面の2次イオン検出感度の向上 Detection Sensitivity Improvement of Secondary Ion by Sodium Absorption with mist deposition method on PEG Surface The 65th JSAP Spring Meeting, 2018 第65回応用物理学会春季学術講演会 The 65th JSAP Spring Meeting, 2018 2018/03/20 Japanese Oral presentation(general) Disclose to all
Preliminary Study on Data Management Policy for Simulations of Ion Beam Process イオンビーム研究におけるデータマネジメント方針の予備的検討 Preliminary Study on Data Management Policy for Simulations of Ion Beam Process The 65th JSAP Spring Meeting, 2018 第65回応用物理学会春季学術講演会 The 65th JSAP Spring Meeting, 2018 2018/03/18 Japanese Poster presentation Disclose to all
京都大学のオープンサイエンス動向 京都大学のオープンサイエンス動向 第5回オープンサイエンスデータ推進ワークショップ 第5回オープンサイエンスデータ推進ワークショップ 2018/03/01 Japanese Oral presentation(general) Disclose to all
研究データ管理を大学でどのように進めるか?[Invited] 研究データ管理を大学でどのように進めるか? [Invited] 図書館総合展フォーラム「あなたもなれるデータライブラリアン」 図書館総合展フォーラム「あなたもなれるデータライブラリアン」 2017/11/17 Japanese Symposium workshop panel(nominated) Disclose to all
Long-term archive system for university-wide research data preservation Long-term archive system for university-wide research data preservation Long-term archive system for university-wide research data preservation WDS Asia-Oceania Conference, 2017 WDS Asia-Oceania Conference, 2017 WDS Asia-Oceania Conference, 2017 2017/09/26 English Poster presentation Disclose to all
大学での研究データマネジメントを考える[Invited] 大学での研究データマネジメントを考える [Invited] 大学図書館問題研究会第48階全国大会 大学図書館問題研究会第48階全国大会 2017/09/11 Japanese Oral presentation(invited, special) Disclose to all
Improvement of Secondary Ion Detection Sensitivity by Adding Sodium to PEG Surface PEG表面へのナトリウム付加による2次イオン検出感度向上 Improvement of Secondary Ion Detection Sensitivity by Adding Sodium to PEG Surface The 78th JSAP Autumn Meeting, 2017 第78回応用物理学会秋季学術講演会 The 78th JSAP Autumn Meeting, 2017 2017/09/06 Japanese Oral presentation(general) Disclose to all
SIMS Measurement in Humid Condition with Pipe-Nozzle パイプ型ノズルを用いた湿潤環境下SIMS測定 SIMS Measurement in Humid Condition with Pipe-Nozzle The 78th JSAP Autumn Meeting, 2017 第78回応用物理学会秋季学術講演会 The 78th JSAP Autumn Meeting, 2017 2017/09/06 Japanese Oral presentation(general) Disclose to all
Surface structure after etching with ClF3 neutral cluster ClF3中性クラスターエッチング表面の凹凸構造 Surface structure after etching with ClF3 neutral cluster The 78th JSAP Autumn Meeting, 2017 第78回応用物理学会秋季学術講演会 The 78th JSAP Autumn Meeting, 2017 2017/09/06 Japanese Oral presentation(general) Disclose to all
Chemical analysis under ambient conditions using swift heavy ion beams Chemical analysis under ambient conditions using swift heavy ion beams Chemical analysis under ambient conditions using swift heavy ion beams 12th European Conference on Acceleratorsin Applied Research and Technology 12th European Conference on Acceleratorsin Applied Research and Technology 12th European Conference on Acceleratorsin Applied Research and Technology 2017/07/07 English Oral presentation(general) Disclose to all
研究データマネジメントと日本の大学 研究データマネジメントと日本の大学 第2回 SPARC Japan セミナー2016 (オープンアクセス・サミット2016)「研究データオープン化推進に向けて : インセンティブとデータマネジメント」 第2回 SPARC Japan セミナー2016 (オープンアクセス・サミット2016)「研究データオープン化推進に向けて : インセンティブとデータマネジメント」 2016/10/26 Japanese Oral presentation(invited, special) Disclose to all
研究データ管理と日本の大学[Invited] 研究データ管理と日本の大学 [Invited] 京都オープンサイエンス勉強会 第5回勉強会 京都オープンサイエンス勉強会 第5回勉強会 2016/10/19 Japanese Other Disclose to all
大気圧分析を目指した高速重イオンプローブによる二次イオン質量分析法の開発 大気圧分析を目指した高速重イオンプローブによる二次イオン質量分析法の開発 第62回応用物理学会春季学術講演会 第62回応用物理学会春季学術講演会 2015/03/14 Oral presentation(general) Disclose to all
ClF3中性クラスタービームによる微細パターンエッチング ClF3中性クラスタービームによる微細パターンエッチング 第62回応用物理学会春季学術講演会 第62回応用物理学会春季学術講演会 2015/03/14 Oral presentation(general) Disclose to all
低真空下におけるArクラスターイオンビームの輸送特性 低真空下におけるArクラスターイオンビームの輸送特性 第62回応用物理学会春季学術講演会 第62回応用物理学会春季学術講演会 2015/03/14 Oral presentation(general) Disclose to all
ガスクラスターイオンビームを用いた有機材料の三次元質量イメージング技術の開発 ガスクラスターイオンビームを用いた有機材料の三次元質量イメージング技術の開発 第62回応用物理学会春季学術講演会 第62回応用物理学会春季学術講演会 2015/03/14 Oral presentation(general) Disclose to all
MARLOWE二体衝突シミュレータのプリ・ポストプロセス MARLOWE二体衝突シミュレータのプリ・ポストプロセス 第62回応用物理学会春季学術講演会 第62回応用物理学会春季学術講演会 2015/03/14 Oral presentation(general) Disclose to all
MeV重イオンを用いた揮発性混合試料の低真空二次イオン質量分析 MeV重イオンを用いた揮発性混合試料の低真空二次イオン質量分析 第75回応用物理学会秋季学術講演会 第75回応用物理学会秋季学術講演会 2014/09/18 Oral presentation(general) Disclose to all
ケミカルアシスト法を用いた高感度MeV-SIMS分析に関する研究 ケミカルアシスト法を用いた高感度MeV-SIMS分析に関する研究 第75回応用物理学会秋季学術講演会 第75回応用物理学会秋季学術講演会 2014/09/18 Oral presentation(general) Disclose to all
Ar ガスクラスターイオンビームを用いた有機試料の三次元質量イメージング法の確立 Ar ガスクラスターイオンビームを用いた有機試料の三次元質量イメージング法の確立 第75回応用物理学会秋季学術講演会 第75回応用物理学会秋季学術講演会 2014/09/18 Oral presentation(general) Disclose to all
He 混合によるClF3 中性クラスター速度制御 He 混合によるClF3 中性クラスター速度制御 第75回応用物理学会秋季学術講演会 第75回応用物理学会秋季学術講演会 2014/09/18 Oral presentation(general) Disclose to all
Recent Progress in Cluster Beam -- from Semiconductor to Soft Materials Recent Progress in Cluster Beam -- from Semiconductor to Soft Materials Recent Progress in Cluster Beam -- from Semiconductor to Soft Materials The 19th International Conference on Ion Beam Modification of Materials (IBMM 2014) The 19th International Conference on Ion Beam Modification of Materials (IBMM 2014) The 19th International Conference on Ion Beam Modification of Materials (IBMM 2014) 2014/09/17 Oral presentation(general) Disclose to all
Highly Accurate Biological Analysis using Ar-GCIB SIMS with Chemical Assist Ionization Highly Accurate Biological Analysis using Ar-GCIB SIMS with Chemical Assist Ionization Highly Accurate Biological Analysis using Ar-GCIB SIMS with Chemical Assist Ionization The 15th IUMRS-International Conference in Asia (IUMRS-ICA 2014) The 15th IUMRS-International Conference in Asia (IUMRS-ICA 2014) The 15th IUMRS-International Conference in Asia (IUMRS-ICA 2014) 2014/08/25 Oral presentation(general) Disclose to all
Molecular Dynamics Simulation of Gas Cluster Impact on Coner-shaped Target Molecular Dynamics Simulation of Gas Cluster Impact on Coner-shaped Target Molecular Dynamics Simulation of Gas Cluster Impact on Coner-shaped Target The 15th IUMRS-International Conference in Asia (IUMRS-ICA 2014) The 15th IUMRS-International Conference in Asia (IUMRS-ICA 2014) The 15th IUMRS-International Conference in Asia (IUMRS-ICA 2014) 2014/08/25 Oral presentation(general) Disclose to all
MeV-SIMS with swift heavy ions at low pressure[Invited] MeV-SIMS with swift heavy ions at low pressure [Invited] MeV-SIMS with swift heavy ions at low pressure [Invited] 14th International Conference on Nuclear Microprobe Technology and Applications 14th International Conference on Nuclear Microprobe Technology and Applications 14th International Conference on Nuclear Microprobe Technology and Applications 2014/07/08 Oral presentation(invited, special) Disclose to all
アルゴンガスクラスターSIMS法の生体イメージング質量分析への応用 アルゴンガスクラスターSIMS法の生体イメージング質量分析への応用 第41回BMSコンファレンス 第41回BMSコンファレンス 2014/07/08 Poster presentation Disclose to all
High Resolution Imaging Mass with Focused Ar Cluster Beam High Resolution Imaging Mass with Focused Ar Cluster Beam High Resolution Imaging Mass with Focused Ar Cluster Beam The 16th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS16) The 16th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS16) The 16th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS16) 2014/06/20 Oral presentation(general) Disclose to all
Organic Materials Analysis Using Different Primary Bi Ions in TOF-SIMS Organic Materials Analysis Using Different Primary Bi Ions in TOF-SIMS Organic Materials Analysis Using Different Primary Bi Ions in TOF-SIMS The 16th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS16) The 16th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS16) The 16th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS16) 2014/06/19 Poster presentation Disclose to all
Highly Sensitive Lipid Analysis and Imaging Mass Spectrometry with Cluster SIMS Apparatus Highly Sensitive Lipid Analysis and Imaging Mass Spectrometry with Cluster SIMS Apparatus Highly Sensitive Lipid Analysis and Imaging Mass Spectrometry with Cluster SIMS Apparatus The 16th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS16) The 16th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS16) The 16th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS16) 2014/06/19 Poster presentation Disclose to all
Possibilities and Limitations of Biological Analysis with novel Ar-GCIB SIMS Apparatus Possibilities and Limitations of Biological Analysis with novel Ar-GCIB SIMS Apparatus Possibilities and Limitations of Biological Analysis with novel Ar-GCIB SIMS Apparatus The 16th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS16) The 16th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS16) The 16th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS16) 2014/06/19 Oral presentation(general) Disclose to all
Study of multiple collision effects in cluster impact by molecular dynamics simulations[Invited] Study of multiple collision effects in cluster impact by molecular dynamics simulations [Invited] Study of multiple collision effects in cluster impact by molecular dynamics simulations [Invited] The Conference on Application of Accelerators in Research and Industry (CAARI2014) The Conference on Application of Accelerators in Research and Industry (CAARI2014) The Conference on Application of Accelerators in Research and Industry (CAARI2014) 2014/05/28 Oral presentation(invited, special) Disclose to all
Possibilities and Limitations of MeV-SIMS for Biological Applications[Invited] Possibilities and Limitations of MeV-SIMS for Biological Applications [Invited] Possibilities and Limitations of MeV-SIMS for Biological Applications [Invited] The Conference on Application of Accelerators in Research and Industry (CAARI2014) The Conference on Application of Accelerators in Research and Industry (CAARI2014) The Conference on Application of Accelerators in Research and Industry (CAARI2014) 2014/05/26 Oral presentation(invited, special) Disclose to all
Lipid Compounds Analysis with Argon Gas Cluster Ion Beam Irradiation Lipid Compounds Analysis with Argon Gas Cluster Ion Beam Irradiation Lipid Compounds Analysis with Argon Gas Cluster Ion Beam Irradiation The Conference on Application of Accelerators in Research and Industry (CAARI2014) The Conference on Application of Accelerators in Research and Industry (CAARI2014) The Conference on Application of Accelerators in Research and Industry (CAARI2014) 2014/05/26 Oral presentation(general) Disclose to all
クラスターSIMS法を用いた脂質分子の高速イメージング質量分析 クラスターSIMS法を用いた脂質分子の高速イメージング質量分析 日本質量分析学会第62回質量分析総合討論会 日本質量分析学会第62回質量分析総合討論会 2014/05/15 Oral presentation(general) Disclose to all
低真空二次イオン質量分析法(Wet-SIMS)の開発 低真空二次イオン質量分析法(Wet-SIMS)の開発 第61回応用物理学会春季学術講演会 第61回応用物理学会春季学術講演会 2014/03/19 Oral presentation(general) Disclose to all
角形状を持つ標的材料へのクラスターイオン衝突シミュレーション 角形状を持つ標的材料へのクラスターイオン衝突シミュレーション 第61回応用物理学会春季学術講演会 第61回応用物理学会春季学術講演会 2014/03/18 Poster presentation Disclose to all
低真空下における揮発性試料の二次イオン質量分析に関する検討 低真空下における揮発性試料の二次イオン質量分析に関する検討 第61回応用物理学会春季学術講演会 第61回応用物理学会春季学術講演会 2014/03/17 Oral presentation(general) Disclose to all
新しい二次イオン質量分析法を用いた生体試料中の脂質分析 新しい二次イオン質量分析法を用いた生体試料中の脂質分析 第61回応用物理学会春季学術講演会 第61回応用物理学会春季学術講演会 2014/03/17 Oral presentation(general) Disclose to all
中性クラスター速度計測技術の開発 中性クラスター速度計測技術の開発 第61回応用物理学会春季学術講演会 第61回応用物理学会春季学術講演会 2014/03/17 Oral presentation(general) Disclose to all
水クラスターイオンビーム照射によるSIMS分析 水クラスターイオンビーム照射によるSIMS分析 第61回応用物理学会春季学術講演会 第61回応用物理学会春季学術講演会 2014/03/17 Oral presentation(general) Disclose to all
Arクラスターイオンビームを用いた細胞レベルの質量イメージング Arクラスターイオンビームを用いた細胞レベルの質量イメージング 第61回応用物理学会春季学術講演会 第61回応用物理学会春季学術講演会 2014/03/17 Oral presentation(general) Disclose to all
ClF3クラスタービームによる大面積Siエッチング技術(2) ClF3クラスタービームによる大面積Siエッチング技術(2) 第61回応用物理学会春季学術講演会 第61回応用物理学会春季学術講演会 2014/03/17 Oral presentation(general) Disclose to all
Si Etching with ClF3 Neutral Cluster Beam from Multi-nozzle Si Etching with ClF3 Neutral Cluster Beam from Multi-nozzle Si Etching with ClF3 Neutral Cluster Beam from Multi-nozzle 23rd Annual Meeting of MRS-J 23rd Annual Meeting of MRS-J 23rd Annual Meeting of MRS-J 2013/12/10 Poster presentation Disclose to all
Low Vacuum SIMS Measurement of Higher Alcohols with MeV-energy Heavy Ion Beam Low Vacuum SIMS Measurement of Higher Alcohols with MeV-energy Heavy Ion Beam Low Vacuum SIMS Measurement of Higher Alcohols with MeV-energy Heavy Ion Beam 23rd Annual Meeting of MRS-J 23rd Annual Meeting of MRS-J 23rd Annual Meeting of MRS-J 2013/12/10 Poster presentation Disclose to all
Computer simulation of cluster impact on soft- and hard- material interface Computer simulation of cluster impact on soft- and hard- material interface Computer simulation of cluster impact on soft- and hard- material interface 23rd Annual Meeting of MRS-J 23rd Annual Meeting of MRS-J 23rd Annual Meeting of MRS-J 2013/12/10 Oral presentation(general) Disclose to all
Lipid Compounds Analysis with Swift Heavy Ion Beam for Biological Applications, Lipid Compounds Analysis with Swift Heavy Ion Beam for Biological Applications, Lipid Compounds Analysis with Swift Heavy Ion Beam for Biological Applications, 23rd Annual Meeting of MRS-J 23rd Annual Meeting of MRS-J 23rd Annual Meeting of MRS-J 2013/12/10 Oral presentation(general) Disclose to all
Depth analysis of organic matelial by SIMS, using gas cluster ion beam Depth analysis of organic matelial by SIMS, using gas cluster ion beam Depth analysis of organic matelial by SIMS, using gas cluster ion beam 23rd Annual Meeting of MRS-J 23rd Annual Meeting of MRS-J 23rd Annual Meeting of MRS-J 2013/12/10 Oral presentation(general) Disclose to all
Ambient Analysis with Wet-SIMS Ambient Analysis with Wet-SIMS Ambient Analysis with Wet-SIMS 9th International Symposium on Atomic Level Characterizations for New Materials and Devices '13 9th International Symposium on Atomic Level Characterizations for New Materials and Devices '13 9th International Symposium on Atomic Level Characterizations for New Materials and Devices '13 2013/12/02 Oral presentation(general) Disclose to all
クラスターSIMS法による脂質分子の高感度検出とイメージングへの応用 クラスターSIMS法による脂質分子の高感度検出とイメージングへの応用 第33回表面科学学術講演会・第54回真空に関する連合講演会 第33回表面科学学術講演会・第54回真空に関する連合講演会 2013/11/26 Oral presentation(general) Disclose to all
京都大学工学研究科研究成果データベースの構築と活用 京都大学工学研究科研究成果データベースの構築と活用 第3回URAシンポジウム・第5回RA研究会合同大会 第3回URAシンポジウム・第5回RA研究会合同大会 2013/11/18 Poster presentation Disclose to all
Lipid Compounds Analysis with MeV-SIMS Apparatus for Biological Applications Lipid Compounds Analysis with MeV-SIMS Apparatus for Biological Applications Lipid Compounds Analysis with MeV-SIMS Apparatus for Biological Applications 2nd Workshop on Strategic Japanese-Croatian Cooperative Program 2nd Workshop on Strategic Japanese-Croatian Cooperative Program 2nd Workshop on Strategic Japanese-Croatian Cooperative Program 2013/11/15 Oral presentation(general) Disclose to all
Introduction to computer simulation programs for atomic collision Introduction to computer simulation programs for atomic collision Introduction to computer simulation programs for atomic collision 2nd Workshop on Strategic Japanese-Croatian Cooperative Program 2nd Workshop on Strategic Japanese-Croatian Cooperative Program 2nd Workshop on Strategic Japanese-Croatian Cooperative Program 2013/11/14 Oral presentation(general) Disclose to all
Analysis of liquid materials with Wet-SIMS Analysis of liquid materials with Wet-SIMS Analysis of liquid materials with Wet-SIMS 2nd Workshop on Strategic Japanese-Croatian Cooperative Program 2nd Workshop on Strategic Japanese-Croatian Cooperative Program 2nd Workshop on Strategic Japanese-Croatian Cooperative Program 2013/11/14 Oral presentation(general) Disclose to all
Mass Imaging of Biological Samples with Focused Massive Ar Cluster Ion Beams Mass Imaging of Biological Samples with Focused Massive Ar Cluster Ion Beams Mass Imaging of Biological Samples with Focused Massive Ar Cluster Ion Beams AVS 60th International Symposium & Exhibition AVS 60th International Symposium & Exhibition AVS 60th International Symposium & Exhibition 2013/10/28 Oral presentation(general) Disclose to all
Depth analysis of DSPC by SIMS, using gas cluster ion beam Depth analysis of DSPC by SIMS, using gas cluster ion beam Depth analysis of DSPC by SIMS, using gas cluster ion beam SIMS XIX 19th International Conference on Secondary Ion Mass Spectrometry SIMS XIX 19th International Conference on Secondary Ion Mass Spectrometry SIMS XIX 19th International Conference on Secondary Ion Mass Spectrometry 2013/10/03 Poster presentation Disclose to all
Possibilities and Limitations of Ar GCIB SIMS for Biological Applications Possibilities and Limitations of Ar GCIB SIMS for Biological Applications Possibilities and Limitations of Ar GCIB SIMS for Biological Applications SIMS XIX 19th International Conference on Secondary Ion Mass Spectrometry SIMS XIX 19th International Conference on Secondary Ion Mass Spectrometry SIMS XIX 19th International Conference on Secondary Ion Mass Spectrometry 2013/10/03 Poster presentation Disclose to all
Liquid Sample Measurements using Wet SIMS Apparatus with Swift Heavy Ion Beam Liquid Sample Measurements using Wet SIMS Apparatus with Swift Heavy Ion Beam Liquid Sample Measurements using Wet SIMS Apparatus with Swift Heavy Ion Beam SIMS XIX 19th International Conference on Secondary Ion Mass Spectrometry SIMS XIX 19th International Conference on Secondary Ion Mass Spectrometry SIMS XIX 19th International Conference on Secondary Ion Mass Spectrometry 2013/10/03 Oral presentation(general) Disclose to all
Generation of Ar cluster ion beam for high spatial resolution SIMS Generation of Ar cluster ion beam for high spatial resolution SIMS Generation of Ar cluster ion beam for high spatial resolution SIMS SIMS XIX 19th International Conference on Secondary Ion Mass Spectrometry SIMS XIX 19th International Conference on Secondary Ion Mass Spectrometry SIMS XIX 19th International Conference on Secondary Ion Mass Spectrometry 2013/10/03 Poster presentation Disclose to all
Secondary Ion Mass Spectrometry with Methanol Cluster Ions Secondary Ion Mass Spectrometry with Methanol Cluster Ions Secondary Ion Mass Spectrometry with Methanol Cluster Ions SIMS XIX 19th International Conference on Secondary Ion Mass Spectrometry SIMS XIX 19th International Conference on Secondary Ion Mass Spectrometry SIMS XIX 19th International Conference on Secondary Ion Mass Spectrometry 2013/10/01 Poster presentation Disclose to all
ClF3クラスタービームによる大面積Siエッチング技術 ClF3クラスタービームによる大面積Siエッチング技術 第74回応用物理学会秋季学術講演会 第74回応用物理学会秋季学術講演会 2013/09/20 Oral presentation(general) Disclose to all
高速重イオンビームを用いた脂質の二次イオン質量分析 高速重イオンビームを用いた脂質の二次イオン質量分析 第74回応用物理学会秋季学術講演会 第74回応用物理学会秋季学術講演会 2013/09/19 Oral presentation(general) Disclose to all
ガスクラスターイオンビームによる有機デバイスの深さ方向SIMS分析 ガスクラスターイオンビームによる有機デバイスの深さ方向SIMS分析 第74回応用物理学会秋季学術講演会 第74回応用物理学会秋季学術講演会 2013/09/19 Oral presentation(general) Disclose to all
マルチノズルを用いたClF3中性クラスタービームによるSiエッチング マルチノズルを用いたClF3中性クラスタービームによるSiエッチング 第74回応用物理学会秋季学術講演会 第74回応用物理学会秋季学術講演会 2013/09/19 Oral presentation(general) Disclose to all
高空間分解能クラスターSIMS用プローブの形成 高空間分解能クラスターSIMS用プローブの形成 第74回応用物理学会秋季学術講演会 第74回応用物理学会秋季学術講演会 2013/09/19 Oral presentation(general) Disclose to all
コア-シェル構造を持つクラスターの衝突シミュレーション コア-シェル構造を持つクラスターの衝突シミュレーション 第74回応用物理学会秋季学術講演会 第74回応用物理学会秋季学術講演会 2013/09/19 Oral presentation(general) Disclose to all
新しいイオンビームを用いた脂質の二次イオン質量分析 新しいイオンビームを用いた脂質の二次イオン質量分析 第61回質量分析総合討論会 第61回質量分析総合討論会 2013/09/11 Poster presentation Disclose to all
二次イオン質量分析法によるイメージング技術の進展と展望 二次イオン質量分析法によるイメージング技術の進展と展望 第61回質量分析総合討論会 第61回質量分析総合討論会 2013/09/11 Oral presentation(general) Disclose to all
Chemical Reaction on the Specimen Surface by Cluster Ion Beam Irradiation Chemical Reaction on the Specimen Surface by Cluster Ion Beam Irradiation Chemical Reaction on the Specimen Surface by Cluster Ion Beam Irradiation 2013 JSAP-MRS Joint Symposia 2013 JSAP-MRS Joint Symposia 2013 JSAP-MRS Joint Symposia 2013/09/09 Poster presentation Disclose to all
高速重イオン照射による脂質の二次イオン質量分析 高速重イオン照射による脂質の二次イオン質量分析 第40回BMSコンファレンス 第40回BMSコンファレンス 2013/07/09 Poster presentation Disclose to all
Molecular ion imaging with swift heavy ions[Invited] Molecular ion imaging with swift heavy ions [Invited] Molecular ion imaging with swift heavy ions [Invited] The 17th International Conference on Radiation Effects in Insulators (REI-17) The 17th International Conference on Radiation Effects in Insulators (REI-17) The 17th International Conference on Radiation Effects in Insulators (REI-17) 2013/07/03 Oral presentation(invited, special) Disclose to all
Bio-imaging with MeV-energy heavy ion beams[Invited] Bio-imaging with MeV-energy heavy ion beams [Invited] Bio-imaging with MeV-energy heavy ion beams [Invited] The 21st International Conference on Ion Beam Analysis (IBA 2013) The 21st International Conference on Ion Beam Analysis (IBA 2013) The 21st International Conference on Ion Beam Analysis (IBA 2013) 2013/06/24 Oral presentation(invited, special) Disclose to all
Development of MeV-SIMS imaging system with electrostatic quadrupole lens Development of MeV-SIMS imaging system with electrostatic quadrupole lens Development of MeV-SIMS imaging system with electrostatic quadrupole lens The 15th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-15) The 15th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-15) The 15th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-15) 2013/04/26 Oral presentation(general) Disclose to all
Study on the Sputtering Mechanism of Amino Acid with Ar Cluster Ion Beam Irradiation Study on the Sputtering Mechanism of Amino Acid with Ar Cluster Ion Beam Irradiation Study on the Sputtering Mechanism of Amino Acid with Ar Cluster Ion Beam Irradiation The 15th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-15) The 15th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-15) The 15th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-15) 2013/04/25 Poster presentation Disclose to all
Effects of cluster ion beam irradiation with a mixture of noble and reactive gases on inorganic solids Effects of cluster ion beam irradiation with a mixture of noble and reactive gases on inorganic solids Effects of cluster ion beam irradiation with a mixture of noble and reactive gases on inorganic solids The 15th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-15) The 15th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-15) The 15th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-15) 2013/04/25 Poster presentation Disclose to all
高空間分解能SIMS用クラスターイオン源の開発 高空間分解能SIMS用クラスターイオン源の開発 第60回応用物理学会春季学術講演会 第60回応用物理学会春季学術講演会 2013/03/29 Oral presentation(general) Disclose to all
高速重イオンをプローブとした質量イメージング技術の高速化とその応用 高速重イオンをプローブとした質量イメージング技術の高速化とその応用 第60回応用物理学会春季学術講演会 第60回応用物理学会春季学術講演会 2013/03/29 Oral presentation(general) Disclose to all
ClF3中性クラスタービームによる反応性エッチングの高速化 ClF3中性クラスタービームによる反応性エッチングの高速化 第60回応用物理学会春季学術講演会 第60回応用物理学会春季学術講演会 2013/03/29 Oral presentation(general) Disclose to all
Siトレンチ構造への巨大フッ素クラスター衝突のMDシミュレーション Siトレンチ構造への巨大フッ素クラスター衝突のMDシミュレーション 第60回応用物理学会春季学術講演会 第60回応用物理学会春季学術講演会 2013/03/29 Oral presentation(general) Disclose to all
Arクラスターイオンを用いたアミノ酸のスパッタリング機構に関する研究 Arクラスターイオンを用いたアミノ酸のスパッタリング機構に関する研究 第60回応用物理学会春季学術講演会 第60回応用物理学会春季学術講演会 2013/03/28 Oral presentation(general) Disclose to all
ガスクラスターイオンビームによるDSPCの深さ方向SIMS分析 ガスクラスターイオンビームによるDSPCの深さ方向SIMS分析 第60回応用物理学会春季学術講演会 第60回応用物理学会春季学術講演会 2013/03/28 Poster presentation Disclose to all
ジアリールエテン単結晶の光反応のフェムト秒構造ダイナミクス ジアリールエテン単結晶の光反応のフェムト秒構造ダイナミクス 第60回応用物理学会春季学術講演会 第60回応用物理学会春季学術講演会 2013/03/27 Oral presentation(general) Disclose to all
クラスターSIMS 法による脂質薄膜の構造評価 クラスターSIMS 法による脂質薄膜の構造評価 第32回表面科学学術講演会 第32回表面科学学術講演会 2012/11/12 Oral presentation(general) Disclose to all
Ultra-file particle removal using Gas cluster beam technology Ultra-file particle removal using Gas cluster beam technology Ultra-file particle removal using Gas cluster beam technology International Symposium on Semiconductor Manufactureing 2012 International Symposium on Semiconductor Manufactureing 2012 International Symposium on Semiconductor Manufactureing 2012 2012/10/15 Oral presentation(general) Disclose to all
Radiation Effects and Applications of Slow Heavy Particles[Invited] Radiation Effects and Applications of Slow Heavy Particles [Invited] Radiation Effects and Applications of Slow Heavy Particles [Invited] International conference on Swift Heavy Ions in Materials Engineering and Characterization International conference on Swift Heavy Ions in Materials Engineering and Characterization International conference on Swift Heavy Ions in Materials Engineering and Characterization 2012/10/09 Oral presentation(invited, special) Disclose to all
High-speed Processing with ClF3 Cluster Injection High-speed Processing with ClF3 Cluster Injection High-speed Processing with ClF3 Cluster Injection IUMRS-International Conference on Electronic Materials (IUMRS-ICEM 2012) IUMRS-International Conference on Electronic Materials (IUMRS-ICEM 2012) IUMRS-International Conference on Electronic Materials (IUMRS-ICEM 2012) 2012/09/23 Oral presentation(general) Disclose to all
Development of Electrostatic Quadrupole Lens for MeV-SIMS Imaging Development of Electrostatic Quadrupole Lens for MeV-SIMS Imaging Development of Electrostatic Quadrupole Lens for MeV-SIMS Imaging IUMRS-International Conference on Electronic Materials (IUMRS-ICEM 2012) IUMRS-International Conference on Electronic Materials (IUMRS-ICEM 2012) IUMRS-International Conference on Electronic Materials (IUMRS-ICEM 2012) 2012/09/23 Poster presentation Disclose to all
Etching of Si by Methanol Gas Cluster Ion Beam Irradiation Etching of Si by Methanol Gas Cluster Ion Beam Irradiation Etching of Si by Methanol Gas Cluster Ion Beam Irradiation IUMRS-International Conference on Electronic Materials (IUMRS-ICEM 2012) IUMRS-International Conference on Electronic Materials (IUMRS-ICEM 2012) IUMRS-International Conference on Electronic Materials (IUMRS-ICEM 2012) 2012/09/23 Poster presentation Disclose to all
Photoinduced Ultrafast Phase Transition in VO2 Crystal: Atomic Motion of Vanadium Photoinduced Ultrafast Phase Transition in VO2 Crystal: Atomic Motion of Vanadium Photoinduced Ultrafast Phase Transition in VO2 Crystal: Atomic Motion of Vanadium IUMRS-International Conference on Electronic Materials (IUMRS-ICEM 2012) IUMRS-International Conference on Electronic Materials (IUMRS-ICEM 2012) IUMRS-International Conference on Electronic Materials (IUMRS-ICEM 2012) 2012/09/23 Oral presentation(general) Disclose to all
Ultrafast Molecule Dymanics of Photochromic Reaction in Diarylethene Ultrafast Molecule Dymanics of Photochromic Reaction in Diarylethene Ultrafast Molecule Dymanics of Photochromic Reaction in Diarylethene IUMRS-International Conference on Electronic Materials (IUMRS-ICEM 2012) IUMRS-International Conference on Electronic Materials (IUMRS-ICEM 2012) IUMRS-International Conference on Electronic Materials (IUMRS-ICEM 2012) 2012/09/23 Oral presentation(general) Disclose to all
Bio-imaging with Swift Heavy Ion Beams Bio-imaging with Swift Heavy Ion Beams Bio-imaging with Swift Heavy Ion Beams 19th International Mass Spectrometry Conference 19th International Mass Spectrometry Conference 19th International Mass Spectrometry Conference 2012/09/15 Poster presentation Disclose to all
Molecular Imaging of Cells and Tissues with Continuous Cluster Ion Beams Molecular Imaging of Cells and Tissues with Continuous Cluster Ion Beams Molecular Imaging of Cells and Tissues with Continuous Cluster Ion Beams 19th International Mass Spectrometry Conference 19th International Mass Spectrometry Conference 19th International Mass Spectrometry Conference 2012/09/15 Oral presentation(general) Disclose to all
Secondary Ion Emission with Methanol Gas Cluster Ion Beam Irradiation Secondary Ion Emission with Methanol Gas Cluster Ion Beam Irradiation Secondary Ion Emission with Methanol Gas Cluster Ion Beam Irradiation 19th International Mass Spectrometry Conference 19th International Mass Spectrometry Conference 19th International Mass Spectrometry Conference 2012/09/15 Poster presentation Disclose to all
Development of Electrostatic Quadrupole Lens for MeV-SIMS Imaging Development of Electrostatic Quadrupole Lens for MeV-SIMS Imaging Development of Electrostatic Quadrupole Lens for MeV-SIMS Imaging 19th International Mass Spectrometry Conference 19th International Mass Spectrometry Conference 19th International Mass Spectrometry Conference 2012/09/15 Poster presentation Disclose to all
有機結晶におけるフォトクロミック反応のフェムト秒実時間観察 有機結晶におけるフォトクロミック反応のフェムト秒実時間観察 第73回応用物理学会学術講演会 第73回応用物理学会学術講演会 2012/09/13 Oral presentation(general) Disclose to all
集束クラスターイオンビーム照射による直行加速飛行時間型SIMS 分析 集束クラスターイオンビーム照射による直行加速飛行時間型SIMS 分析 第73回応用物理学会学術講演会 第73回応用物理学会学術講演会 2012/09/13 Oral presentation(general) Disclose to all
MeV-SIMS イメージング用静電型四重極レンズの開発 MeV-SIMS イメージング用静電型四重極レンズの開発 第73回応用物理学会学術講演会 第73回応用物理学会学術講演会 2012/09/13 Oral presentation(general) Disclose to all
ClF3 クラスターイオンビームによる反応性エッチング ClF3 クラスターイオンビームによる反応性エッチング 第73回応用物理学会学術講演会 第73回応用物理学会学術講演会 2012/09/13 Oral presentation(general) Disclose to all
MD Simulations of Atomic, Molecular and Cluster Impact, from X1 to X1000000[Invited] MD Simulations of Atomic, Molecular and Cluster Impact, from X1 to X1000000 [Invited] MD Simulations of Atomic, Molecular and Cluster Impact, from X1 to X1000000 [Invited] 18th international conference on ion beam modification of materials 18th international conference on ion beam modification of materials 18th international conference on ion beam modification of materials 2012/09/02 Oral presentation(invited, special) Disclose to all
Development of MeV-SIMS imaging system with Electrostatic Quadrupole Lens[Invited] Development of MeV-SIMS imaging system with Electrostatic Quadrupole Lens [Invited] Development of MeV-SIMS imaging system with Electrostatic Quadrupole Lens [Invited] 22nd International Conference on the Application of Accelerators in Research & Industry 22nd International Conference on the Application of Accelerators in Research & Industry 22nd International Conference on the Application of Accelerators in Research & Industry 2012/08/05 Oral presentation(invited, special) Disclose to all
Molecular Imaging with Focused Cluster Ion Beams[Invited] Molecular Imaging with Focused Cluster Ion Beams [Invited] Molecular Imaging with Focused Cluster Ion Beams [Invited] 22nd International Conference on the Application of Accelerators in Research & Industry 22nd International Conference on the Application of Accelerators in Research & Industry 22nd International Conference on the Application of Accelerators in Research & Industry 2012/08/05 Oral presentation(invited, special) Disclose to all
An Electrostatic Quadrupole Lens for Focusing Swift Heavy Ions in MeV-SIMS An Electrostatic Quadrupole Lens for Focusing Swift Heavy Ions in MeV-SIMS An Electrostatic Quadrupole Lens for Focusing Swift Heavy Ions in MeV-SIMS 13th International Conference On Nuclear Microprobe Technology & Applications (ICNMTA2012) 13th International Conference On Nuclear Microprobe Technology & Applications (ICNMTA2012) 13th International Conference On Nuclear Microprobe Technology & Applications (ICNMTA2012) 2012/07/26 Poster presentation Disclose to all
MeV-SIMS with Swift Heavy Ion Beams toward Molecular MeV-SIMS with Swift Heavy Ion Beams toward Molecular MeV-SIMS with Swift Heavy Ion Beams toward Molecular 13th International Conference On Nuclear Microprobe Technology & Applications (ICNMTA2012) 13th International Conference On Nuclear Microprobe Technology & Applications (ICNMTA2012) 13th International Conference On Nuclear Microprobe Technology & Applications (ICNMTA2012) 2012/07/26 Oral presentation(general) Disclose to all
原子衝突による材料科学のための大規模シミュレーション基盤 原子衝突による材料科学のための大規模シミュレーション基盤 学際大規模情報基盤共同利用・共同研究拠点 第3回シンポジウム 学際大規模情報基盤共同利用・共同研究拠点 第3回シンポジウム 2012/07/12 Oral presentation(general) Disclose to all
Concurrent job control of simulations for iterative radiation and post processing Concurrent job control of simulations for iterative radiation and post processing Concurrent job control of simulations for iterative radiation and post processing 11th International Conference on Computer Simulations of Radiation Effects in Solids 11th International Conference on Computer Simulations of Radiation Effects in Solids 11th International Conference on Computer Simulations of Radiation Effects in Solids 2012/06/24 Poster presentation Disclose to all
Evaluation of sputtering and damage with huge cluster impact using molecular dynamics simulations Evaluation of sputtering and damage with huge cluster impact using molecular dynamics simulations Evaluation of sputtering and damage with huge cluster impact using molecular dynamics simulations 11th International Conference on Computer Simulations of Radiation Effects in Solids 11th International Conference on Computer Simulations of Radiation Effects in Solids 11th International Conference on Computer Simulations of Radiation Effects in Solids 2012/06/24 Oral presentation(general) Disclose to all
An Electrostatic Quadrupole Lens for Focusing Swift Heavy Ions in MeV-SIMS An Electrostatic Quadrupole Lens for Focusing Swift Heavy Ions in MeV-SIMS An Electrostatic Quadrupole Lens for Focusing Swift Heavy Ions in MeV-SIMS The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-14) The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-14) The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-14) 2012/06/01 Oral presentation(general) Disclose to all
Large-scale MD Simulation of Huge Cluster Impact for Surface Process and Analysis[Invited] Large-scale MD Simulation of Huge Cluster Impact for Surface Process and Analysis [Invited] Large-scale MD Simulation of Huge Cluster Impact for Surface Process and Analysis [Invited] The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions 2012/05/31 Oral presentation(invited, special) Disclose to all
Boron concentration measurement in cultivated cells with Nano-SIMS Boron concentration measurement in cultivated cells with Nano-SIMS Boron concentration measurement in cultivated cells with Nano-SIMS The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-14) The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-14) The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-14) 2012/05/31 Poster presentation Disclose to all
Mass Imaging with Cluster Ion Beams Mass Imaging with Cluster Ion Beams Mass Imaging with Cluster Ion Beams The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-14) The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-14) The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-14) 2012/05/31 Oral presentation(general) Disclose to all
A Novel Imaging Technique for Cells and Tissue by Energetic Particle Bombardment A Novel Imaging Technique for Cells and Tissue by Energetic Particle Bombardment A Novel Imaging Technique for Cells and Tissue by Energetic Particle Bombardment 2012 MRS Spring Meetings 2012 MRS Spring Meetings 2012 MRS Spring Meetings 2012/04/10 Oral presentation(general) Disclose to all
Real-time Observation of Photo-induced Phase Transition of Diarylethene Real-time Observation of Photo-induced Phase Transition of Diarylethene Real-time Observation of Photo-induced Phase Transition of Diarylethene 2012 MRS Spring Meetings 2012 MRS Spring Meetings 2012 MRS Spring Meetings 2012/04/10 Oral presentation(general) Disclose to all
SiエッチングにおけるClF3クラスターの添加ガス効果 SiエッチングにおけるClF3クラスターの添加ガス効果 第59回応用物理学会関係連合講演会 第59回応用物理学会関係連合講演会 2012/03/17 Oral presentation(general) Disclose to all
Arクラスターイオンを用いた直行加速飛行時間型SIMS分析 Arクラスターイオンを用いた直行加速飛行時間型SIMS分析 第59回応用物理学会関係連合講演会 第59回応用物理学会関係連合講演会 2012/03/17 Oral presentation(general) Disclose to all
ArクラスターSIMSを用いた投影型質量イメージング ArクラスターSIMSを用いた投影型質量イメージング 第59回応用物理学会関係連合講演会 第59回応用物理学会関係連合講演会 2012/03/17 Oral presentation(general) Disclose to all
バブリング法によるメタノールクラスターイオンビーム生成 バブリング法によるメタノールクラスターイオンビーム生成 第59回応用物理学会関係連合講演会 第59回応用物理学会関係連合講演会 2012/03/17 Oral presentation(general) Disclose to all
Ar-CH3OH混合クラスタイオンビーム照射によるSi二次イオン放出 Ar-CH3OH混合クラスタイオンビーム照射によるSi二次イオン放出 第59回応用物理学会関係連合講演会 第59回応用物理学会関係連合講演会 2012/03/17 Oral presentation(general) Disclose to all
高速重イオンプローブ集束用静電型四重極レンズの開発II 高速重イオンプローブ集束用静電型四重極レンズの開発II 第59回応用物理学会関係連合講演会 第59回応用物理学会関係連合講演会 2012/03/17 Oral presentation(general) Disclose to all
ジアリールエテンのフォトクロミック反応の超高速実時間観察 ジアリールエテンのフォトクロミック反応の超高速実時間観察 第59回応用物理学会関係連合講演会 第59回応用物理学会関係連合講演会 2012/03/17 Oral presentation(general) Disclose to all
ガスクラスタービームを利用した微小パーティクル除去技術の開発 ガスクラスタービームを利用した微小パーティクル除去技術の開発 第59回応用物理学会関係連合講演会 第59回応用物理学会関係連合講演会 2012/03/16 Oral presentation(general) Disclose to all
巨大反応性クラスター衝突の大規模分子動力学シミュレーション 巨大反応性クラスター衝突の大規模分子動力学シミュレーション 第59回応用物理学会関係連合講演会 第59回応用物理学会関係連合講演会 2012/03/16 Poster presentation Disclose to all
Time-resolved Observation of the Photoinduced Phase Transition of Diarylethene Time-resolved Observation of the Photoinduced Phase Transition of Diarylethene Time-resolved Observation of the Photoinduced Phase Transition of Diarylethene Banff Meeting on Structural Dynamics Ultrafast Dynamics with Xrays and Electrons Banff Meeting on Structural Dynamics Ultrafast Dynamics with Xrays and Electrons Banff Meeting on Structural Dynamics Ultrafast Dynamics with Xrays and Electrons 2012/02/19 Poster presentation Disclose to all
Sample Preparation for Femtosecond Electron Diffraction: Low Damage Milling of Organic Materials with Cluster Ion Beams Sample Preparation for Femtosecond Electron Diffraction: Low Damage Milling of Organic Materials with Cluster Ion Beams Sample Preparation for Femtosecond Electron Diffraction: Low Damage Milling of Organic Materials with Cluster Ion Beams Banff Meeting on Structural Dynamics Ultrafast Dynamics with Xrays and Electrons Banff Meeting on Structural Dynamics Ultrafast Dynamics with Xrays and Electrons Banff Meeting on Structural Dynamics Ultrafast Dynamics with Xrays and Electrons 2012/02/19 Poster presentation Disclose to all
Computer simulations of radiation effect by single- and cluster- ion irradiation[Invited] Computer simulations of radiation effect by single- and cluster- ion irradiation [Invited] Computer simulations of radiation effect by single- and cluster- ion irradiation [Invited] IAEA Technical Meeting on Radiation induced defects in semiconductors and insulators (TM 40764) IAEA Technical Meeting on Radiation induced defects in semiconductors and insulators (TM 40764) IAEA Technical Meeting on Radiation induced defects in semiconductors and insulators (TM 40764) 2011/07/04 Symposium workshop panel(nominated) Disclose to all
Secondary Molecular Ion Emission with Swift Heavy Ions:A Novel Imaging Technique for Biological Applications Secondary Molecular Ion Emission with Swift Heavy Ions:A Novel Imaging Technique for Biological Applications Secondary Molecular Ion Emission with Swift Heavy Ions:A Novel Imaging Technique for Biological Applications E-MRS 2011 Spring Meeting E-MRS 2011 Spring Meeting E-MRS 2011 Spring Meeting 2011/05/11 Oral presentation(general) Disclose to all
Computer simulation of gas cluster ion impact[Invited] Computer simulation of gas cluster ion impact [Invited] Computer simulation of gas cluster ion impact [Invited] 19th International Conference on Ion-Surface Interactions 2009 19th International Conference on Ion-Surface Interactions 2009 19th International Conference on Ion-Surface Interactions 2009 2010/08/21 Oral presentation(invited, special) Disclose to all
ClF3中性クラスタービームによる表面励起反応 ClF3中性クラスタービームによる表面励起反応 応用物理学関係連合講演会 応用物理学関係連合講演会 2010/03/19 Oral presentation(general) Disclose to all
Material processing and evaluation with cluster ion beam[Invited] Material processing and evaluation with cluster ion beam [Invited] Material processing and evaluation with cluster ion beam [Invited] 10th International Symposium on Sputtering & Plasma Process 10th International Symposium on Sputtering & Plasma Process 10th International Symposium on Sputtering & Plasma Process 2009/07/08 Oral presentation(invited, special) Disclose to all
Cluster size effect on secondary ion emission[Invited] Cluster size effect on secondary ion emission [Invited] Cluster size effect on secondary ion emission [Invited] IUVSTA Workshop IUVSTA Workshop IUVSTA Workshop 2007/04/23 Oral presentation(invited, special) Disclose to all

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Author Author(Japanese) Author(English) Title Title(Japanese) Title(English) Publisher Publisher(Japanese) Publisher(English) Publication date Language Type Disclose
山田公監修 山田公監修 クラスターイオンビーム基礎と応用-次世代ナノ加工プロセス技術- クラスターイオンビーム基礎と応用-次世代ナノ加工プロセス技術- 日刊工業新聞社 日刊工業新聞社 2006/10 Japanese Contributor Disclose to all
Eds. Jiro Matsuo, Masataka Kase, Takaaki Aoki and Toshio Seki Eds. Jiro Matsuo, Masataka Kase, Takaaki Aoki and Toshio Seki ION IMPLANTATION TECHNOLOGY 2010: 18th International Conference on Ion Implantation Technology IIT 2010 (AIP conference proceedings CP1321) ION IMPLANTATION TECHNOLOGY 2010: 18th International Conference on Ion Implantation Technology IIT 2010 (AIP conference proceedings CP1321) American Institute of Physics American Institute of Physics 2011/01 English Joint Editor Disclose to all
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瀬木 利夫, 青木 学聡, 松尾 二郎 瀬木 利夫, 青木 学聡, 松尾 二郎 瀬木 利夫, 青木 学聡, 松尾 二郎 Analysis of Organic Materials with SIMS Using New Probe Ions 招待講演 新しいプローブイオンを用いたSIMSによる有機材料分析 (光・量子デバイス研究会 微細加工技術とバイオ・メディカル応用) Analysis of Organic Materials with SIMS Using New Probe Ions 電気学会研究会資料. OQD = The papers of technical meeting on optical and quantum devices, IEE Japan, 2018, 22, 29-33 電気学会研究会資料. OQD = The papers of technical meeting on optical and quantum devices, IEE Japan, 2018, 22, 29-33 電気学会研究会資料. OQD = The papers of technical meeting on optical and quantum devices, IEE Japan, 2018, 22, 29-33 2018/03/28 Japanese Disclose to all
MATSUO Jiro, SEKI Toshio, AOKI Takaaki 松尾 二郎, 瀬木 利夫, 青木 学聡 MATSUO Jiro, SEKI Toshio, AOKI Takaaki Recent Progress of SIMS Technique : from Novel Primary Beams to Advanced Mass Spectrometers SIMS技術の飛躍的発展を支える新技術:新奇なイオンビーム開発から先端質量分析法まで Recent Progress of SIMS Technique : from Novel Primary Beams to Advanced Mass Spectrometers Vacuum and Surface Science, 61, 7, 426-434 表面と真空, 61, 7, 426-434 Vacuum and Surface Science, 61, 7, 426-434 2018 Japanese Disclose to all
MATSUO Jiro, FUJII Makiko, SEKI Toshio, AOKI Takaaki 松尾 二郎, 藤井 麻樹子, 瀬木 利夫, 青木 学聡 MATSUO Jiro, FUJII Makiko, SEKI Toshio, AOKI Takaaki Recent Developments of Cluster Ion Beam &mdash;From Nano-fabrication to Analysis of Bio-materials&mdash; クラスターイオンビーム技術の最近の進展&mdash;ナノ加工からバイオ材料評価まで&mdash; Recent Developments of Cluster Ion Beam &mdash;From Nano-fabrication to Analysis of Bio-materials&mdash; Journal of the Vacuum Society of Japan, 59, 5, 113-120 真空技術, 59, 5, 113-120 Journal of the Vacuum Society of Japan, 59, 5, 113-120 2016 Japanese Disclose to all
Matsuo Jiro, Suzuki Kanji, Kusakari Masakazu, Fujii Makiko, Aoki Takaaki, Seki Toshio 松尾 二郎, 鈴木 敢士, 草刈 将一, 藤井 麻樹子, 青木 学聡, 瀬木 利夫 Matsuo Jiro, Suzuki Kanji, Kusakari Masakazu, Fujii Makiko, Aoki Takaaki, Seki Toshio Imaging Mass of Bio-molecules with cluster SIMS クラスターSIMS法による生体分子の高空間分解能イメージング Imaging Mass of Bio-molecules with cluster SIMS Abstract of annual meeting of the Surface Science of Japan, 35, 0 表面科学学術講演会要旨集, 35, 0 Abstract of annual meeting of the Surface Science of Japan, 35, 0 2015 Disclose to all
FUJII MAKIKO, SEKI TOSHIO, AOKI TAKAAKI, MATSUO JIRO 藤井 麻樹子, 瀬木 利夫, 青木 学聡, 松尾 二郎 FUJII MAKIKO, SEKI TOSHIO, AOKI TAKAAKI, MATSUO JIRO Recent Progress and Future Prospect of Cluster SIMS for Biological Applications クラスターSIMS法を用いた生体試料分析の現状と課題 Recent Progress and Future Prospect of Cluster SIMS for Biological Applications Abstract of annual meeting of the Surface Science of Japan, 35, 0 表面科学学術講演会要旨集, 35, 0 Abstract of annual meeting of the Surface Science of Japan, 35, 0 2015 Disclose to all
Shishido Rie, Fujii Makiko, Seki Toshio, Aoki Takaaki, Matsuo Jiro, Suzuki Shigeru 宍戸 理恵, 藤井 麻樹子, 瀬木 利夫, 青木 学聡, 松尾 二郎, 鈴木 茂 Shishido Rie, Fujii Makiko, Seki Toshio, Aoki Takaaki, Matsuo Jiro, Suzuki Shigeru Study on imaging analysis of organic materials with Bi cluster TOF-SIMS BiクラスターTOF-SIMSによる有機材料のイメージング分析に関する研究 Study on imaging analysis of organic materials with Bi cluster TOF-SIMS Abstract of annual meeting of the Surface Science of Japan, 35, 0 表面科学学術講演会要旨集, 35, 0 Abstract of annual meeting of the Surface Science of Japan, 35, 0 2015 Disclose to all
Matsuo Jiro, Nakagawa Shunichiro, Torii Souta, Fujii Makiko, Seki Toshio, Aoki Takaaki 松尾 二郎, 中川 俊一郎, 鳥居 聡太, 藤井 麻樹子, 瀬木 利夫, 青木 学聡 Matsuo Jiro, Nakagawa Shunichiro, Torii Souta, Fujii Makiko, Seki Toshio, Aoki Takaaki High sensitive detection and molecular imaging of lipid molecules with cluster SIMS クラスターSIMS法による脂質分子の高感度検出とイメージングへの応用 High sensitive detection and molecular imaging of lipid molecules with cluster SIMS Abstract of annual meeting of the Surface Science of Japan, 33, 0 表面科学学術講演会要旨集, 33, 0 Abstract of annual meeting of the Surface Science of Japan, 33, 0 2013 Disclose to all
松尾 二郎, 中川 駿一郎, 志戸本 祥, 鳥居 聡太, 瀬木 利夫, 青木 学聡 松尾 二郎, 中川 駿一郎, 志戸本 祥, 鳥居 聡太, 瀬木 利夫, 青木 学聡 松尾 二郎, 中川 駿一郎, 志戸本 祥, 鳥居 聡太, 瀬木 利夫, 青木 学聡 Cluster SIMS analysis of lipid thin films クラスターSIMS法による脂質薄膜の構造評価 Cluster SIMS analysis of lipid thin films Abstract of annual meeting of the Surface Science of Japan, 32, 0 表面科学学術講演会要旨集, 32, 0 Abstract of annual meeting of the Surface Science of Japan, 32, 0 2012 Disclose to all
Matsuo Jiro, Ichiki Kazuya, Seki Toshio, Aoki Takaaki 松尾 二郎, 市木 和弥, 瀬木 利夫, 青木 学聡 Matsuo Jiro, Ichiki Kazuya, Seki Toshio, Aoki Takaaki Bio-SIMS with Novel Primary Ion Beams toward Molecular-Imaging 2次イオン質量分析法(SIMS法)によるバイオイメー ジング Bio-SIMS with Novel Primary Ion Beams toward Molecular-Imaging Abstract of annual meeting of the Surface Science of Japan, 31, 0, 171-171 表面科学学術講演会要旨集, 31, 0, 171-171 Abstract of annual meeting of the Surface Science of Japan, 31, 0, 171-171 2011 Japanese Disclose to all
MATSUO Jiro, SEKI Toshio, AOKI Takaaki 松尾 二郎, 瀬木 利夫, 青木 学聡 MATSUO Jiro, SEKI Toshio, AOKI Takaaki Recent Progress in Cluster Ion Beam Technology クラスターイオンビーム技術の最近の進展 Recent Progress in Cluster Ion Beam Technology Journal of the Surface Science Society of Japan, 31, 11, 564-571 表面科学 : hyomen kagaku = Journal of the Surface Science Society of Japan, 31, 11, 564-571 Journal of the Surface Science Society of Japan, 31, 11, 564-571 2010/11/10 Japanese Disclose to all
Masaki Hada, Sachi Ibuki, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Masaki Hada, Sachi Ibuki, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Masaki Hada, Sachi Ibuki, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo Evaluation of damage layer in an organic film with irradiation of energetic ion beams Evaluation of damage layer in an organic film with irradiation of energetic ion beams Evaluation of damage layer in an organic film with irradiation of energetic ion beams Japanese Journal of Applied Physics, 49 Japanese Journal of Applied Physics, 49 Japanese Journal of Applied Physics, 49 2010/07/01 Disclose to all
Kazuya Ichiki, Satoshi Ninomiya, Toshio Seki, Toshio Seki, Takaaki Aoki, Takaaki Aoki, Jiro Matsuol, Jiro Matsuol Kazuya Ichiki, Satoshi Ninomiya, Toshio Seki, Toshio Seki, Takaaki Aoki, Takaaki Aoki, Jiro Matsuol, Jiro Matsuol Kazuya Ichiki, Satoshi Ninomiya, Toshio Seki, Toshio Seki, Takaaki Aoki, Takaaki Aoki, Jiro Matsuol, Jiro Matsuol Sputtering yield measurements with size-selected gas cluster ion beams Sputtering yield measurements with size-selected gas cluster ion beams Sputtering yield measurements with size-selected gas cluster ion beams Materials Research Society Symposium Proceedings, 1181, 135-140 Materials Research Society Symposium Proceedings, 1181, 135-140 Materials Research Society Symposium Proceedings, 1181, 135-140 2010/05/21 Disclose to all
MATSUO Jiro, SEKI Toshio, NINOMIYA Satoshi, AOKI Takaaki 松尾 二郎, 瀬木 利夫, 二宮 啓, 青木 学聡 MATSUO Jiro, SEKI Toshio, NINOMIYA Satoshi, AOKI Takaaki Surface smoothing with energetic cluster ion beams クラスタイオンビームによる平坦化加工技術 Surface smoothing with energetic cluster ion beams Journal of the Japan Society for Abrasive Technology, 54, 5, 272-275 砥粒加工学会誌 = Journal of the Japan Society of Grinding Engineers, 54, 5, 272-275 Journal of the Japan Society for Abrasive Technology, 54, 5, 272-275 2010/05/01 Japanese Disclose to all
yamamoto yasuyuki, ichiki kazuya, ninomiya satoshi, seki toshio, aoki takaaki, matsuo jirou 山本 恭千, 市木 和弥, 二宮 啓, 瀬木 利夫, 青木 学聡, 松尾 二郎 yamamoto yasuyuki, ichiki kazuya, ninomiya satoshi, seki toshio, aoki takaaki, matsuo jirou Instrumental development of imaging mass spectrometry with ToF-SIMS using Ar cluster ArクラスターSIMSを用いたToF型質量イメージング装置の開発 Instrumental development of imaging mass spectrometry with ToF-SIMS using Ar cluster Abstract of annual meeting of the Surface Science of Japan, 30, 0, 308-308 表面科学学術講演会要旨集, 30, 0, 308-308 Abstract of annual meeting of the Surface Science of Japan, 30, 0, 308-308 2010 Japanese Disclose to all
Wakamatsu Yoshinobu, Yamada Hideaki, Ninomiya Satoshi, Seki Toshio, Aoki Takaaki, Ishihara Akihiko, Matsuo Jiro 若松 慶信, 山田 英丙, 二宮 啓, 瀬木 利夫, 青木 学聡, 石原 昭彦, 松尾 二郎 Wakamatsu Yoshinobu, Yamada Hideaki, Ninomiya Satoshi, Seki Toshio, Aoki Takaaki, Ishihara Akihiko, Matsuo Jiro Lipid Imaging of Rat Brain Tissue with Swift Heavy Ions 高速重イオンによるラット脳組織内の脂質イメージング Lipid Imaging of Rat Brain Tissue with Swift Heavy Ions Abstract of annual meeting of the Surface Science of Japan, 30, 0, 197-197 表面科学学術講演会要旨集, 30, 0, 197-197 Abstract of annual meeting of the Surface Science of Japan, 30, 0, 197-197 2010 Japanese Disclose to all
MATSUO Jiro, SEKI Toshio, AOKI Takaaki 松尾 二郎, 瀬木 利夫, 青木 学聡 MATSUO Jiro, SEKI Toshio, AOKI Takaaki Recent Progress in Cluster Ion Beam Technology クラスターイオンビーム技術の最近の進展 Recent Progress in Cluster Ion Beam Technology Hyomen Kagaku, 31, 11, 564-571 表面科学, 31, 11, 564-571 Hyomen Kagaku, 31, 11, 564-571 2010 Japanese Disclose to all
Matsuo Jiro, Ichiki Kazuya, Yamamoto Yasuyuki, Wakamatsu Yoshinobu, Aoki Takaaki, Seki Toshio 松尾 二郎, 市木 和弥, 山本 恭千, 若松 慶喜, 青木 学聡, 瀬木 利夫 Matsuo Jiro, Ichiki Kazuya, Yamamoto Yasuyuki, Wakamatsu Yoshinobu, Aoki Takaaki, Seki Toshio SIMS for biological Applications 二次イオン質量分析法を用いた生体組織の観察 SIMS for biological Applications Abstract of annual meeting of the Surface Science of Japan, 30, 0, 447-447 表面科学学術講演会要旨集, 30, 0, 447-447 Abstract of annual meeting of the Surface Science of Japan, 30, 0, 447-447 2010 Japanese Disclose to all
Jiro Matsuo, Kazuya Ichiki, Masaki Hada, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Tsutomu Nagayama, Masayasu Tanjyo Jiro Matsuo, Kazuya Ichiki, Masaki Hada, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Tsutomu Nagayama, Masayasu Tanjyo Jiro Matsuo, Kazuya Ichiki, Masaki Hada, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Tsutomu Nagayama, Masayasu Tanjyo Stress measurement of carbon cluster implanted layers with in-plane diffraction technique Stress measurement of carbon cluster implanted layers with in-plane diffraction technique Stress measurement of carbon cluster implanted layers with in-plane diffraction technique Extended Abstracts of the 9th International Workshop on Junction Technology, IWJT 2009, 84-85 Extended Abstracts of the 9th International Workshop on Junction Technology, IWJT 2009, 84-85 Extended Abstracts of the 9th International Workshop on Junction Technology, IWJT 2009, 84-85 2009/12/01 Disclose to all
Takaaki Aoki, Jiro Matsuo Takaaki Aoki, Jiro Matsuo Takaaki Aoki, Jiro Matsuo Study of damage accumulation and annealing process at low energy boron implantation using molecular dynamics simulations Study of damage accumulation and annealing process at low energy boron implantation using molecular dynamics simulations Study of damage accumulation and annealing process at low energy boron implantation using molecular dynamics simulations Extended Abstracts of the 9th International Workshop on Junction Technology, IWJT 2009, 131-132 Extended Abstracts of the 9th International Workshop on Junction Technology, IWJT 2009, 131-132 Extended Abstracts of the 9th International Workshop on Junction Technology, IWJT 2009, 131-132 2009/12/01 Disclose to all
YAMADA Hideaki, ICHIKI Kazuya, NAKATA Yoshihiko, NINOMIYA Satoshi, SEKI Toshio, AOKI Takaaki, MATSUO Jiro Yamada Hideaki, Ichiki Kazuya, Nakata Yoshihiko, NINOMIYA Satoshi, SEKI Toshio, AOKI Takaaki, MATSUO Jiro YAMADA Hideaki, ICHIKI Kazuya, NAKATA Yoshihiko, NINOMIYA Satoshi, SEKI Toshio, AOKI Takaaki, MATSUO Jiro A Processing Technique for Cell Surfaces Using Gas Cluster Ions for Imaging Mass Spectrometry A Processing Technique for Cell Surfaces Using Gas Cluster Ions for Imaging Mass Spectrometry A Processing Technique for Cell Surfaces Using Gas Cluster Ions for Imaging Mass Spectrometry Journal of the Mass Spectrometry Society of Japan, 57, 3, 117-121 質量分析 = Mass spectroscopy, 57, 3, 117-121 Journal of the Mass Spectrometry Society of Japan, 57, 3, 117-121 2009/06/01 English Disclose to all
Wakamatsu Yoshinobu, Yamada Hideaki, Nakata Yoshihiko, Ninomiya Satoshi, Seki Toshio, Aoki Takaaki, Matsuo Jiro 若松 慶信, 山田 英丙, 中田 由彦, 二宮 啓, 瀬木 利夫, 青木 学聡, 松尾 二郎 Wakamatsu Yoshinobu, Yamada Hideaki, Nakata Yoshihiko, Ninomiya Satoshi, Seki Toshio, Aoki Takaaki, Matsuo Jiro Developing SIMS at low vacuum using fast heavy ions 高速重イオンを用いた低真空SIMSの開発 Developing SIMS at low vacuum using fast heavy ions Abstract of annual meeting of the Surface Science of Japan, 29, 0, 35-35 表面科学学術講演会要旨集, 29, 0, 35-35 Abstract of annual meeting of the Surface Science of Japan, 29, 0, 35-35 2009 Japanese Disclose to all
Takaaki Aoki, Toshio Seki, Jiro Matsuo Takaaki Aoki, Toshio Seki, Jiro Matsuo Takaaki Aoki, Toshio Seki, Jiro Matsuo Computer modeling of cluster ion impacts Computer modeling of cluster ion impacts Computer modeling of cluster ion impacts IWJT-2008 - Extended Abstracts 2008 International Workshop on Junction Technology, 49-54 IWJT-2008 - Extended Abstracts 2008 International Workshop on Junction Technology, 49-54 IWJT-2008 - Extended Abstracts 2008 International Workshop on Junction Technology, 49-54 2008/09/08 Disclose to all
NAKATA Yoshihiko, YAMADA Hideaki, HONDA Yoshiro, NINOMIYA Satoshi, SEKI Toshio, AOKI Takaaki, MATSUO Jiro 中田 由彦, 山田 英丙, 本田 善郎, 二宮 啓, 瀬木 利夫, 青木 学聡, 松尾 二郎 NAKATA Yoshihiko, YAMADA Hideaki, HONDA Yoshiro, NINOMIYA Satoshi, SEKI Toshio, AOKI Takaaki, MATSUO Jiro Imaging Mass Spectrometry with Swift Heavy Ions 高速重イオンを利用したイメージング質量分析 Imaging Mass Spectrometry with Swift Heavy Ions Journal of the Mass Spectrometry Society of Japan, 56, 4, 201-208 質量分析 = Mass spectroscopy, 56, 4, 201-208 Journal of the Mass Spectrometry Society of Japan, 56, 4, 201-208 2008/08/01 Japanese Disclose to all
HIKATA Takeshi, HAYASHI Kazuhiko, MIZUKOSHI Tomoyuki, SAKURAI Yoshiaki, ISHIGAMI Itsuo, AOKI Takaaki, SEKI Toshio, MATSUO Jiro Hikata Takeshi, Hayashi Kazuhiko, Mizukoshi Tomoyuki, SAKURAI Yoshiaki, ISHIGAMI Itsuo, AOKI Takaaki, SEKI Toshio, MATSUO Jiro HIKATA Takeshi, HAYASHI Kazuhiko, MIZUKOSHI Tomoyuki, SAKURAI Yoshiaki, ISHIGAMI Itsuo, AOKI Takaaki, SEKI Toshio, MATSUO Jiro Carbon Nanotubes from a Divided Catalyst : the Carbon Transmission Method Carbon Nanotubes from a Divided Catalyst : the Carbon Transmission Method Carbon Nanotubes from a Divided Catalyst : the Carbon Transmission Method Applied physics express, 1, 3, "34002-1"-"34002-3" Applied physics express, 1, 3, "34002-1"-"34002-3" Applied physics express, 1, 3, "34002-1"-"34002-3" 2008/03/25 English Disclose to all
Takeshi Hikata, Kazuhiko Hayashi, Tomoyuki Mizukoshi, Yoshiaki Sakurai, Itsuo Ishigami, Takaaki Aoki, Toshio Seki, Jiro Matsuo Takeshi Hikata, Kazuhiko Hayashi, Tomoyuki Mizukoshi, Yoshiaki Sakurai, Itsuo Ishigami, Takaaki Aoki, Toshio Seki, Jiro Matsuo Takeshi Hikata, Kazuhiko Hayashi, Tomoyuki Mizukoshi, Yoshiaki Sakurai, Itsuo Ishigami, Takaaki Aoki, Toshio Seki, Jiro Matsuo Carbon nanotubes from a divided catalyst: The carbon transmission method Carbon nanotubes from a divided catalyst: The carbon transmission method Carbon nanotubes from a divided catalyst: The carbon transmission method Applied Physics Express, 1, 0340021-0340023 Applied Physics Express, 1, 0340021-0340023 Applied Physics Express, 1, 0340021-0340023 2008/03/01 Disclose to all
瀬木 利夫, Aoki Takaaki, Matsuo Jiro 瀬木 利夫, Aoki Takaaki, Matsuo Jiro 瀬木 利夫, Aoki Takaaki, Matsuo Jiro High-speed processing with Cl2 cluster ion beam 塩素クラスターによる高速加工 High-speed processing with Cl2 cluster ion beam Annual report of Ion Beam Engineering Laboratory, University of Hyogo, 2008, 259-264 兵庫県立大学工学研究科イオン工学研究室論文集, 2008, 259-264 Annual report of Ion Beam Engineering Laboratory, University of Hyogo, 2008, 259-264 2008 English Disclose to all
青木 学聡, Seki Toshio, Matsuo Jiro 青木 学聡, Seki Toshio, Matsuo Jiro 青木 学聡, Seki Toshio, Matsuo Jiro Study of density effect of large gas cluster impact by molecular dynamics simulations クラスターイオン衝突の密度効果 Study of density effect of large gas cluster impact by molecular dynamics simulations Annual report of Ion Beam Engineering Laboratory, University of Hyogo, 2008, 224-227 兵庫県立大学工学研究科イオン工学研究室論文集, 2008, 224-227 Annual report of Ion Beam Engineering Laboratory, University of Hyogo, 2008, 224-227 2008 English Disclose to all
Matsuo Jiro, Ninomiya Satoshi, Aoki Takaaki, Seki Toshio 松尾 二郎, 二宮 啓, 青木 学聡, 瀬木 利夫 Matsuo Jiro, Ninomiya Satoshi, Aoki Takaaki, Seki Toshio Recent Progress in Cluster Ion Beam:-Toward Nano-Processing and Advanced Material Analysis クラスターイオンの新しい展開:~ナノプロセスから先端分析応用~ Recent Progress in Cluster Ion Beam:-Toward Nano-Processing and Advanced Material Analysis Journal of Surface Analysis, 14, 3, 196-203 Journal of Surface Analysis, 14, 3, 196-203 Journal of Surface Analysis, 14, 3, 196-203 2008 Japanese Disclose to all
Ninomiya S., Ichiki K., Nakata Y., Seki T., Aoki T., Matsuo J. 二宮 啓, 市木 和弥, 中田 由彦, 瀬木 利夫, 青木 学聡, 松尾 二郎 Ninomiya S., Ichiki K., Nakata Y., Seki T., Aoki T., Matsuo J. 23aRB-2 The effect of incident velocity of large Ar cluster ions on secondary ion emission for Si 23aRB-2 巨大Arクラスター衝突によりSiから生成される二次イオンにおける入射速度効果(放射線物理(散乱素過程),領域1,原子・分子,量子エレクトロニクス,放射線物理) 23aRB-2 The effect of incident velocity of large Ar cluster ions on secondary ion emission for Si Meeting Abstracts of the Physical Society of Japan, 63, 0 日本物理学会講演概要集, 63, 0 Meeting Abstracts of the Physical Society of Japan, 63, 0 2008 Japanese Disclose to all
Nakata Y., Honda Y., Ninomiya S., Seki T., Aoki T., Matsuo J. 中田 由彦, 本田 善郎, 二宮 啓, 瀬木 利夫, 青木 学聡, 松尾 二郎 Nakata Y., Honda Y., Ninomiya S., Seki T., Aoki T., Matsuo J. 24aRB-2 A New Approach to High Resolution Imaging Mass Spectrometry 24aRB-2 高分解能イメージング質量分析へ向けたイオン入射条件の探索(原子分子・放射線融合(イオン-表面相互作用),領域1,原子・分子,量子エレクトロニクス,放射線物理) 24aRB-2 A New Approach to High Resolution Imaging Mass Spectrometry Meeting Abstracts of the Physical Society of Japan, 63, 0 日本物理学会講演概要集, 63, 0 Meeting Abstracts of the Physical Society of Japan, 63, 0 2008 Japanese Disclose to all
Jiro Matsuo, Takaaki Aoki, Toshio Seki Jiro Matsuo, Takaaki Aoki, Toshio Seki Jiro Matsuo, Takaaki Aoki, Toshio Seki Cluster ion implantation - Prospects and challenges Cluster ion implantation - Prospects and challenges Cluster ion implantation - Prospects and challenges Extended Abstracts of the 7th International Workshop on Junction Technology, IWJT 2007, 53-54 Extended Abstracts of the 7th International Workshop on Junction Technology, IWJT 2007, 53-54 Extended Abstracts of the 7th International Workshop on Junction Technology, IWJT 2007, 53-54 2007/12/01 Disclose to all
Takaaki Aoki, Toshio Seki, Jiro Matsuo Takaaki Aoki, Toshio Seki, Jiro Matsuo Takaaki Aoki, Toshio Seki, Jiro Matsuo MD study of damage structures with poly-atomic boron cluster implantation MD study of damage structures with poly-atomic boron cluster implantation MD study of damage structures with poly-atomic boron cluster implantation Extended Abstracts of the 7th International Workshop on Junction Technology, IWJT 2007, 23-24 Extended Abstracts of the 7th International Workshop on Junction Technology, IWJT 2007, 23-24 Extended Abstracts of the 7th International Workshop on Junction Technology, IWJT 2007, 23-24 2007/12/01 Disclose to all
Ninomiya S., Ichiki K., Nakata Y., Seki T., Aoki T., Matsuo J. 二宮 啓, 市木 和弥, 中田 由彦, 瀬木 利夫, 青木 学聡, 松尾 二郎 Ninomiya S., Ichiki K., Nakata Y., Seki T., Aoki T., Matsuo J. 19aXJ-4 Measurements of secondary ion yields under size-selected cluster ion irradiation 19aXJ-4 サイズ選別されたクラスターイオン照射における二次イオン収率測定(放射線物理,領域1,原子・分子,量子エレクトロニクス,放射線物理) 19aXJ-4 Measurements of secondary ion yields under size-selected cluster ion irradiation Meeting Abstracts of the Physical Society of Japan, 62, 0 日本物理学会講演概要集, 62, 0 Meeting Abstracts of the Physical Society of Japan, 62, 0 2007 Japanese Disclose to all
Ichiki Kazuya, Ninomiya Satoshi, Seki Toshio, Aoki Takaaki, Matsuo Jiro 市木 和弥, 二宮 啓, 瀬木 利夫, 青木 学聡, 松尾 二郎 Ichiki Kazuya, Ninomiya Satoshi, Seki Toshio, Aoki Takaaki, Matsuo Jiro Incident cluster size dependence of secondary ion yields クラスターイオン照射における二次イオン収率の入射サイズ依存性 Incident cluster size dependence of secondary ion yields Abstract of annual meeting of the Surface Science of Japan, 26, 0, 108-108 表面科学講演大会講演要旨集, 26, 0, 108-108 Abstract of annual meeting of the Surface Science of Japan, 26, 0, 108-108 2006 Other Disclose to all
Ninomiya Satoshi, Ichiki Kazuya, Nakata Yoshihiko, Seki Toshio, Aoki Takaaki, Matsuo Jiro 二宮 啓, 市木 和弥, 中田 由彦, 瀬木 利夫, 青木 学聡, 松尾 二郎 Ninomiya Satoshi, Ichiki Kazuya, Nakata Yoshihiko, Seki Toshio, Aoki Takaaki, Matsuo Jiro Incident size dependence of secondary ion yields emitted from biomolecules under Ar cluster ion bombardment Arクラスターイオン衝撃により生体高分子薄膜から放出される二次イオン収率の入射サイズ依存性 Incident size dependence of secondary ion yields emitted from biomolecules under Ar cluster ion bombardment Abstract of annual meeting of the Surface Science of Japan, 26, 0, 106-106 表面科学講演大会講演要旨集, 26, 0, 106-106 Abstract of annual meeting of the Surface Science of Japan, 26, 0, 106-106 2006 Other Disclose to all
Ninomiya S., Ichiki K., Nakata Y., Seki T., Aoki T., Matsuo J. 二宮 啓, 市木 和弥, 中田 由彦, 瀬木 利夫, 青木 学聡, 松尾 二郎 Ninomiya S., Ichiki K., Nakata Y., Seki T., Aoki T., Matsuo J. 26pWD-7 Measurements of secondary ions produced by size-selected cluster ions 26pWD-7 サイズ選別されたクラスターイオンにより生成される二次イオンの測定(26pWD 放射線物理,領域1(原子・分子,量子エレクトロニクス,放射線物理)) 26pWD-7 Measurements of secondary ions produced by size-selected cluster ions Meeting Abstracts of the Physical Society of Japan, 61, 0 日本物理学会講演概要集, 61, 0 Meeting Abstracts of the Physical Society of Japan, 61, 0 2006 Japanese Disclose to all
Ninomiya S., Aoki T., Seki T., Nakata Y., Ichiki K., Matsuo J. 二宮 啓, 青木 学聡, 瀬木 利夫, 中田 由彦, 市木 和弥, 松尾 二郎 Ninomiya S., Aoki T., Seki T., Nakata Y., Ichiki K., Matsuo J. 28aTA-6 Incident cluster ion dependence of ionization probability on sputtering 28aTA-6 スパッタリングにおけるイオン化確率の入射クラスターイオン種依存性(28aTA 放射線物理,領域1(原子・分子,量子エレクトロニクス,放射線物理)) 28aTA-6 Incident cluster ion dependence of ionization probability on sputtering Meeting Abstracts of the Physical Society of Japan, 61, 0 日本物理学会講演概要集, 61, 0 Meeting Abstracts of the Physical Society of Japan, 61, 0 2006 Japanese Disclose to all
Takaaki Aoki, Jiro Matsuo Takaaki Aoki, Jiro Matsuo Takaaki Aoki, Jiro Matsuo Molecular dynamics simulations of the cluster-size effect on the sputtering process with reactive gas cluster ions Molecular dynamics simulations of the cluster-size effect on the sputtering process with reactive gas cluster ions Molecular dynamics simulations of the cluster-size effect on the sputtering process with reactive gas cluster ions Materials Research Society Symposium Proceedings, 908, 18-24 Materials Research Society Symposium Proceedings, 908, 18-24 Materials Research Society Symposium Proceedings, 908, 18-24 2005/12/01 Disclose to all
L. K. Ono, T. Aoki, T. Aoki, T. Seki, T. Seki, J. Matsuo, A. Itoh L. K. Ono, T. Aoki, T. Aoki, T. Seki, T. Seki, J. Matsuo, A. Itoh L. K. Ono, T. Aoki, T. Aoki, T. Seki, T. Seki, J. Matsuo, A. Itoh Gas cluster ion beam source for secondary ion emission measurements Gas cluster ion beam source for secondary ion emission measurements Gas cluster ion beam source for secondary ion emission measurements Novel Materials Processing by Advanced Electromagnetic Energy Sources, 227-230 Novel Materials Processing by Advanced Electromagnetic Energy Sources, 227-230 Novel Materials Processing by Advanced Electromagnetic Energy Sources, 227-230 2005/12/01 Disclose to all
N. Toyoda, S. Houzumi, T. Aoki, I. Yamada N. Toyoda, S. Houzumi, T. Aoki, I. Yamada N. Toyoda, S. Houzumi, T. Aoki, I. Yamada Exprimental study of cluster size effect with size-selected cluster ion beam Exprimental study of cluster size effect with size-selected cluster ion beam Exprimental study of cluster size effect with size-selected cluster ion beam Novel Materials Processing by Advanced Electromagnetic Energy Sources, 219-222 Novel Materials Processing by Advanced Electromagnetic Energy Sources, 219-222 Novel Materials Processing by Advanced Electromagnetic Energy Sources, 219-222 2005/12/01 Disclose to all
Takaaki Aoki, Takaaki Aoki, Jiro Matsuo, Isao Yamada, Isao Yamada Takaaki Aoki, Takaaki Aoki, Jiro Matsuo, Isao Yamada, Isao Yamada Takaaki Aoki, Takaaki Aoki, Jiro Matsuo, Isao Yamada, Isao Yamada Surface structure dependence of impact processes of gas cluster ions Surface structure dependence of impact processes of gas cluster ions Surface structure dependence of impact processes of gas cluster ions Novel Materials Processing by Advanced Electromagnetic Energy Sources, 231-234 Novel Materials Processing by Advanced Electromagnetic Energy Sources, 231-234 Novel Materials Processing by Advanced Electromagnetic Energy Sources, 231-234 2005/12/01 Disclose to all
Shigeru Kakuta, Shigeru Kakuta, Toshio Seki, Toshio Seki, Shinji Sasaki, Shinji Sasaki, Kenji Furusawa, Kenji Furusawa, Takaaki Aoki, Takaaki Aoki, Jiro Matsuo Shigeru Kakuta, Shigeru Kakuta, Toshio Seki, Toshio Seki, Shinji Sasaki, Shinji Sasaki, Kenji Furusawa, Kenji Furusawa, Takaaki Aoki, Takaaki Aoki, Jiro Matsuo Shigeru Kakuta, Shigeru Kakuta, Toshio Seki, Toshio Seki, Shinji Sasaki, Shinji Sasaki, Kenji Furusawa, Kenji Furusawa, Takaaki Aoki, Takaaki Aoki, Jiro Matsuo Size and energy distribution of gas cluster ion beam measured by energy resolved time of flight mass spectroscopy Size and energy distribution of gas cluster ion beam measured by energy resolved time of flight mass spectroscopy Size and energy distribution of gas cluster ion beam measured by energy resolved time of flight mass spectroscopy Surface and Coatings Technology, 196, 198-202 Surface and Coatings Technology, 196, 198-202 Surface and Coatings Technology, 196, 198-202 2005/06/22 Disclose to all
Shigeru Kakuta, Shigeru Kakuta, Shinji Sasaki, Shinji Sasaki, Kenji Furusawa, Kenji Furusawa, Toshio Seki, Takaaki Aoki, Jiro Matsuo Shigeru Kakuta, Shigeru Kakuta, Shinji Sasaki, Shinji Sasaki, Kenji Furusawa, Kenji Furusawa, Toshio Seki, Takaaki Aoki, Jiro Matsuo Shigeru Kakuta, Shigeru Kakuta, Shinji Sasaki, Shinji Sasaki, Kenji Furusawa, Kenji Furusawa, Toshio Seki, Takaaki Aoki, Jiro Matsuo Low damage smoothing of magnetic materials using oblique irradiation of gas cluster ion beam Low damage smoothing of magnetic materials using oblique irradiation of gas cluster ion beam Low damage smoothing of magnetic materials using oblique irradiation of gas cluster ion beam Materials Research Society Symposium Proceedings, 843, 183-188 Materials Research Society Symposium Proceedings, 843, 183-188 Materials Research Society Symposium Proceedings, 843, 183-188 2005/06/20 Disclose to all
Yoshihiko Nakata, Satoshi Ninomiya, Chikage Imada, Masafumi Nagai, Takaaki Aoki, Jiro Matsuo, Nobutsugu Imanishi Yoshihiko Nakata, Satoshi Ninomiya, Chikage Imada, Masafumi Nagai, Takaaki Aoki, Jiro Matsuo, Nobutsugu Imanishi Yoshihiko Nakata, Satoshi Ninomiya, Chikage Imada, Masafumi Nagai, Takaaki Aoki, Jiro Matsuo, Nobutsugu Imanishi Secondary neutral and ionized particle measurements under MeV-energy ion bombardment Secondary neutral and ionized particle measurements under MeV-energy ion bombardment Secondary neutral and ionized particle measurements under MeV-energy ion bombardment Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 230, 489-494 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 230, 489-494 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 230, 489-494 2005/04/01 Disclose to all
Satoshi Ninomiya, Chikage Imada, Masafumi Nagai, Yoshihiko Nakata, Takaaki Aoki, Jiro Matsuo, Nobutsugu Imanishi Satoshi Ninomiya, Chikage Imada, Masafumi Nagai, Yoshihiko Nakata, Takaaki Aoki, Jiro Matsuo, Nobutsugu Imanishi Satoshi Ninomiya, Chikage Imada, Masafumi Nagai, Yoshihiko Nakata, Takaaki Aoki, Jiro Matsuo, Nobutsugu Imanishi Total sputtering yields of solids under MeV-energy Si ion bombardment Total sputtering yields of solids under MeV-energy Si ion bombardment Total sputtering yields of solids under MeV-energy Si ion bombardment Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 230, 483-488 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 230, 483-488 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 230, 483-488 2005/04/01 Disclose to all
Takaaki Aoki, Takaaki Aoki, Jiro Matsuo Takaaki Aoki, Takaaki Aoki, Jiro Matsuo Takaaki Aoki, Takaaki Aoki, Jiro Matsuo Molecular dynamics simulations of sequential cluster ion impacts Molecular dynamics simulations of sequential cluster ion impacts Molecular dynamics simulations of sequential cluster ion impacts Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 228, 46-50 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 228, 46-50 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 228, 46-50 2005/01/01 Disclose to all
Nakata Y., Ninomiya S., Aoki T., Tsuchida H., Matsuo J., Itoh A. 中田 由彦, 二宮 啓, 青木 学聡, 土田 秀次, 松尾 二郎, 伊藤 秋男 Nakata Y., Ninomiya S., Aoki T., Tsuchida H., Matsuo J., Itoh A. 19pYR-9 Excited molecule emissions under MeV-energy ion bombardment 19pYR-9 MeV重イオン衝撃スパッタリングによる励起状態分子放出(放射線物理,領域1(原子・分子,量子エレクトロニクス,放射線物理)) 19pYR-9 Excited molecule emissions under MeV-energy ion bombardment Meeting Abstracts of the Physical Society of Japan, 60, 0 日本物理学会講演概要集, 60, 0 Meeting Abstracts of the Physical Society of Japan, 60, 0 2005 Japanese Disclose to all
Ninomiya S., Aoki T., Seki T., Matsuo J. 二宮 啓, 青木 学聡, 瀬木 利夫, 松尾 二郎 Ninomiya S., Aoki T., Seki T., Matsuo J. 19pYR-5 Secondary ion emission from semiconductors under large gas cluster Ion bombardment 19pYR-5 巨大ガスクラスターイオン衝突による半導体材料からの二次イオン放出(放射線物理,領域1(原子・分子,量子エレクトロニクス,放射線物理)) 19pYR-5 Secondary ion emission from semiconductors under large gas cluster Ion bombardment Meeting Abstracts of the Physical Society of Japan, 60, 0 日本物理学会講演概要集, 60, 0 Meeting Abstracts of the Physical Society of Japan, 60, 0 2005 Japanese Disclose to all
Nakata Y., Ninomiya S., Aoki T., Tsuchida H., Matsuo J., Itoh A. 中田 由彦, 二宮 啓, 青木 学聡, 土田 秀次, 松尾 二郎, 伊藤 秋男 Nakata Y., Ninomiya S., Aoki T., Tsuchida H., Matsuo J., Itoh A. 25aYJ-9 Measurements of yields and kinetic energies of secondary neutrals spattered by swift ion 25aYJ-9 高速イオン衝撃スパッタリングによる中性粒子の収量及び放出エネルギー測定(放射線物理,領域1(原子・分子,量子エレクトロニクス,放射線物理)) 25aYJ-9 Measurements of yields and kinetic energies of secondary neutrals spattered by swift ion Meeting Abstracts of the Physical Society of Japan, 60, 0 日本物理学会講演概要集, 60, 0 Meeting Abstracts of the Physical Society of Japan, 60, 0 2005 Japanese Disclose to all
Ninomiya S., Nakata Y., Aoki T., Matsuo J., Ito A. 二宮 啓, 中田 由彦, 青木 学聡, 松尾 二郎, 伊藤 秋男 Ninomiya S., Nakata Y., Aoki T., Matsuo J., Ito A. 25aYJ-6 A comparison of total sputtering yields measured with several methods 25aYJ-6 複数の方法で測定した全スパッタリング収率の比較(放射線物理,領域1(原子・分子,量子エレクトロニクス,放射線物理)) 25aYJ-6 A comparison of total sputtering yields measured with several methods Meeting Abstracts of the Physical Society of Japan, 60, 0 日本物理学会講演概要集, 60, 0 Meeting Abstracts of the Physical Society of Japan, 60, 0 2005 Japanese Disclose to all
Takaaki Aoki, Takaaki Aoki, Takaaki Aoki, Jiro Matsuo Takaaki Aoki, Takaaki Aoki, Takaaki Aoki, Jiro Matsuo Takaaki Aoki, Takaaki Aoki, Takaaki Aoki, Jiro Matsuo Surface structure dependence of impact processes of gas cluster ions Surface structure dependence of impact processes of gas cluster ions Surface structure dependence of impact processes of gas cluster ions Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 216, 185-190 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 216, 185-190 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 216, 185-190 2004/02/01 Disclose to all
Ninomiya S., Nakata Y., Aoki T., Matsuo J, Itoh A. 二宮 啓, 中田 由彦, Aoki T., 松尾 二郎, 伊藤 秋男 Ninomiya S., Nakata Y., Aoki T., Matsuo J, Itoh A. 12aTG-5 Total sputtering yields of insulators and metals in MeV-energy range 12aTG-5 MeV エネルギー領域での絶縁体及び金属の全スパッタリング収率測定(放射線物理, 領域 1) 12aTG-5 Total sputtering yields of insulators and metals in MeV-energy range Meeting Abstracts of the Physical Society of Japan, 59, 0 日本物理学会講演概要集, 59, 0 Meeting Abstracts of the Physical Society of Japan, 59, 0 2004 Japanese Disclose to all
Noriaki Toyoda, Shingo Houzumi, Takaaki Aoki, Isao Yamada Noriaki Toyoda, Shingo Houzumi, Takaaki Aoki, Isao Yamada Noriaki Toyoda, Shingo Houzumi, Takaaki Aoki, Isao Yamada Experimental study of cluster size effect with size-selected cluster ion beam system Experimental study of cluster size effect with size-selected cluster ion beam system Experimental study of cluster size effect with size-selected cluster ion beam system Materials Research Society Symposium - Proceedings, 792, 623-628 Materials Research Society Symposium - Proceedings, 792, 623-628 Materials Research Society Symposium - Proceedings, 792, 623-628 2003/12/01 Disclose to all
Shigeru Kakuta, Shigeru Kakuta, Toshio Seki, Toshio Seki, Shinji Sasaki, Shinji Sasaki, Kenji Furusawa, Kenji Furusawa, Takaaki Aoki, Takaaki Aoki, Jiro Matsuo Shigeru Kakuta, Shigeru Kakuta, Toshio Seki, Toshio Seki, Shinji Sasaki, Shinji Sasaki, Kenji Furusawa, Kenji Furusawa, Takaaki Aoki, Takaaki Aoki, Jiro Matsuo Shigeru Kakuta, Shigeru Kakuta, Toshio Seki, Toshio Seki, Shinji Sasaki, Shinji Sasaki, Kenji Furusawa, Kenji Furusawa, Takaaki Aoki, Takaaki Aoki, Jiro Matsuo Fast neutral Ar penetration during gas cluster ion beam irradiation into magnetic thin films Fast neutral Ar penetration during gas cluster ion beam irradiation into magnetic thin films Fast neutral Ar penetration during gas cluster ion beam irradiation into magnetic thin films Materials Research Society Symposium - Proceedings, 792, 599-604 Materials Research Society Symposium - Proceedings, 792, 599-604 Materials Research Society Symposium - Proceedings, 792, 599-604 2003/12/01 Disclose to all
Takaaki Aoki, Takaaki Aoki, Jiro Matsuo, Isao Yamada, Isao Yamada Takaaki Aoki, Takaaki Aoki, Jiro Matsuo, Isao Yamada, Isao Yamada Takaaki Aoki, Takaaki Aoki, Jiro Matsuo, Isao Yamada, Isao Yamada Molecular dynamics study of surface morphological evolution by cluster impacts Molecular dynamics study of surface morphological evolution by cluster impacts Molecular dynamics study of surface morphological evolution by cluster impacts Materials Research Society Symposium - Proceedings, 792, 497-502 Materials Research Society Symposium - Proceedings, 792, 497-502 Materials Research Society Symposium - Proceedings, 792, 497-502 2003/12/01 Disclose to all
Takaaki Aoki, Takaaki Aoki, Jiro Matsuo, Gikan Takaoka, Isao Yamada, Isao Yamada Takaaki Aoki, Takaaki Aoki, Jiro Matsuo, Gikan Takaoka, Isao Yamada, Isao Yamada Takaaki Aoki, Takaaki Aoki, Jiro Matsuo, Gikan Takaoka, Isao Yamada, Isao Yamada Cluster species and cluster size dependence of damage formation by cluster ion impact Cluster species and cluster size dependence of damage formation by cluster ion impact Cluster species and cluster size dependence of damage formation by cluster ion impact Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 206, 861-865 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 206, 861-865 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 206, 861-865 2003/05/01 Disclose to all
Jiro Matsuo, Toshio Seki, Takaaki Aoki, Isao Yamada Jiro Matsuo, Toshio Seki, Takaaki Aoki, Isao Yamada Jiro Matsuo, Toshio Seki, Takaaki Aoki, Isao Yamada Atomistic study of cluster collision on solid surfaces Atomistic study of cluster collision on solid surfaces Atomistic study of cluster collision on solid surfaces Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 206, 838-841 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 206, 838-841 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 206, 838-841 2003/05/01 Disclose to all
A. Nakai, T. Aoki, T. Seki, J. Matsuo, G. H. Takaoka, I. Yamada A. Nakai, T. Aoki, T. Seki, J. Matsuo, G. H. Takaoka, I. Yamada A. Nakai, T. Aoki, T. Seki, J. Matsuo, G. H. Takaoka, I. Yamada Modeling of surface smoothing process by cluster ion beam irradiation Modeling of surface smoothing process by cluster ion beam irradiation Modeling of surface smoothing process by cluster ion beam irradiation Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 206, 842-845 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 206, 842-845 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 206, 842-845 2003/05/01 Disclose to all
Noriaki Toyoda, Jiro Matsuo, Takaaki Aoki, Isao Yamada, David B. Fenner Noriaki Toyoda, Jiro Matsuo, Takaaki Aoki, Isao Yamada, David B. Fenner Noriaki Toyoda, Jiro Matsuo, Takaaki Aoki, Isao Yamada, David B. Fenner Secondary ion mass spectrometry with gas cluster ion beams Secondary ion mass spectrometry with gas cluster ion beams Secondary ion mass spectrometry with gas cluster ion beams Applied Surface Science, 203-204, 214-218 Applied Surface Science, 203-204, 214-218 Applied Surface Science, 203-204, 214-218 2003/01/15 Disclose to all
AOKI Takaaki, MATSUO Jiro, TAKAOKA Gikan 青木 学聡, 松尾 二郎, 高岡 義寛 AOKI Takaaki, MATSUO Jiro, TAKAOKA Gikan MD simulations of accumulation and desorption with low energy boron implantation 低エネルギーホウ素イオン注入におけるホウ素の蓄積・脱離過程のシミュレーション MD simulations of accumulation and desorption with low energy boron implantation Technical report of IEICE. SDM, 102, 540, 25-28 電子情報通信学会技術研究報告. SDM, シリコン材料・デバイス, 102, 540, 25-28 Technical report of IEICE. SDM, 102, 540, 25-28 2002/12/13 Japanese Disclose to all
Takaaki Aoki, Takaaki Aoki, Jiro Matsuo, Gikan Takaoka Takaaki Aoki, Takaaki Aoki, Jiro Matsuo, Gikan Takaoka Takaaki Aoki, Takaaki Aoki, Jiro Matsuo, Gikan Takaoka Study of damage formation by low-energy boron cluster ion implantation Study of damage formation by low-energy boron cluster ion implantation Study of damage formation by low-energy boron cluster ion implantation Proceedings of the International Conference on Ion Implantation Technology, 22-27-September-2002, 560-563 Proceedings of the International Conference on Ion Implantation Technology, 22-27-September-2002, 560-563 Proceedings of the International Conference on Ion Implantation Technology, 22-27-September-2002, 560-563 2002/01/01 Disclose to all
CHIBA Shun-ichi, AOKI Takaaki, MATSUO Jiro, TAKAOKA Gikan 千葉 俊一, 青木 学聡, 松尾 二郎, 高岡 義寛 CHIBA Shun-ichi, AOKI Takaaki, MATSUO Jiro, TAKAOKA Gikan Molecular Dynamics Simulation of Fluorine Ion Etching of Silicon 分子動力学法を用いたFイオン照射によるSi表面エッチングのシミュレーション Molecular Dynamics Simulation of Fluorine Ion Etching of Silicon Technical report of IEICE. SDM, 100, 517, 23-28 電子情報通信学会技術研究報告. SDM, シリコン材料・デバイス, 100, 517, 23-28 Technical report of IEICE. SDM, 100, 517, 23-28 2000/12/14 Japanese Disclose to all
KUSABA T., SEKI T., AOKI T., MATSUO J., KASE M., GOTO K., SUGII T., YAMADA I. 草場 拓也, 瀬木 利夫, 青木 学聡, 松尾 二郎, 加勢 正隆, 後藤 賢一, 杉井 寿博, 山田 公 KUSABA T., SEKI T., AOKI T., MATSUO J., KASE M., GOTO K., SUGII T., YAMADA I. Damage formation and enhanced diffusion by decaborane ion implantation デカボランイオン注入による損傷の形成とその増速拡散への影響 Damage formation and enhanced diffusion by decaborane ion implantation Technical report of IEICE. SDM, 98, 445, 97-104 電子情報通信学会技術研究報告. SDM, シリコン材料・デバイス, 98, 445, 97-104 Technical report of IEICE. SDM, 98, 445, 97-104 1998/12/10 Japanese Disclose to all
YAMADA Isao, MATSUO Jiro, TOYODA Noriaki, AOKI Takkaki 山田 公, 松尾 二郎, 豊田 紀章, 青木 学聡 YAMADA Isao, MATSUO Jiro, TOYODA Noriaki, AOKI Takkaki Cluster Ion Implantation and Device Processes クラスターイオン注入とデバイスプロセス Cluster Ion Implantation and Device Processes Shinku, 41, 11, 932-939 真空, 41, 11, 932-939 Shinku, 41, 11, 932-939 1998/11/20 Japanese Disclose to all
YAMADA Isao, MATSUO Jiro, TOYODA Noriaki, AOKI Takaaki, INSEPOV Zinetulla 山田 公, 松尾 二郎, 豊田 紀章, 青木 学聡, INSEPOV Zinetulla YAMADA Isao, MATSUO Jiro, TOYODA Noriaki, AOKI Takaaki, INSEPOV Zinetulla A New Sputter Etching Technology by Gas-Cluster Ion Beam ガスクラスターイオンビームによる表面エッチング A New Sputter Etching Technology by Gas-Cluster Ion Beam Journal of the Surface Science Society of Japan, 18, 12, 743-751 表面科学, 18, 12, 743-751 Journal of the Surface Science Society of Japan, 18, 12, 743-751 1997/12/10 Japanese Disclose to all
YAMADA Isao, MATSUO Jiro, TOYODA Noriaki, AOKI Takaaki 山田 公, 松尾 二郎, 豊田 紀章, 青木 学聡 YAMADA Isao, MATSUO Jiro, TOYODA Noriaki, AOKI Takaaki Gas Cluster Ion Beam Processing ガスクラスターイオンビームプロセッシング Gas Cluster Ion Beam Processing 電気学会研究会資料. MC, 金属・セラミックス研究会, 1997, 1, 27-34 電気学会研究会資料. MC, 金属・セラミックス研究会, 1997, 1, 27-34 電気学会研究会資料. MC, 金属・セラミックス研究会, 1997, 1, 27-34 1997/11/18 Japanese Disclose to all
YAMADA Isao, MATSUO Jiro, TOYODA Noriaki, AOKI Takaaki, INSEPOV Zinetulla 山田 公, 松尾 二郎, 豊田 紀章, 青木 学聡, INSEPOV Zinetulla YAMADA Isao, MATSUO Jiro, TOYODA Noriaki, AOKI Takaaki, INSEPOV Zinetulla A New Sputter Etching Technology by Gas-Gluster Ion Beam. ガスクラスターイオンビームによる表面エッチング A New Sputter Etching Technology by Gas-Gluster Ion Beam. Hyomen Kagaku, 18, 12, 743-751 表面科学, 18, 12, 743-751 Hyomen Kagaku, 18, 12, 743-751 1997 Japanese Disclose to all
AOKI T., SHIMADA N., TAKEUCHI D., MATSUO J., INSEPOV Z., YAMADA I. 青木 学聡, 島田 規広, 竹内 大輔, 松尾 二郎, Insepov Zinetulla, 山田 公 AOKI T., SHIMADA N., TAKEUCHI D., MATSUO J., INSEPOV Z., YAMADA I. The Molecular Dynamics Simulation of Boron Cluster Ion Implantation 分子動力学法によるホウ素クラスターイオン注入のシミュレーション The Molecular Dynamics Simulation of Boron Cluster Ion Implantation Technical report of IEICE. SDM, 96, 396, 49-54 電子情報通信学会技術研究報告. SDM, シリコン材料・デバイス, 96, 396, 49-54 Technical report of IEICE. SDM, 96, 396, 49-54 1996/12/06 Japanese Disclose to all

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Patents
Inventor(s) Inventor(s) (Japanese) Inventor(s) (English) Title Title(Japanese) Title(English) Stage Patent number Date Disclose
松尾 二郎, 瀬木 利夫, 青木 学聡, 土橋 和也, 井内 健介, 斉藤 美佐子 松尾 二郎, 瀬木 利夫, 青木 学聡, 土橋 和也, 井内 健介, 斉藤 美佐子 基板洗浄方法、基板洗浄装置及び真空処理装置 基板洗浄方法、基板洗浄装置及び真空処理装置 特許登録 特許第5984424号 2016/08/12 Disclose to all
大野 茂, 佐々木 新治, 古澤 賢司, 松尾 二郎, 青木 学聡, 瀬木 利夫 大野 茂, 佐々木 新治, 古澤 賢司, 松尾 二郎, 青木 学聡, 瀬木 利夫 ガスクラスターイオンビーム照射装置 ガスクラスターイオンビーム照射装置 特許登録 特許第4636862号 2010/12/03 Disclose to all
佐藤 明伸, 鈴木 晃子, ブーレル エマニュエル, 松尾 二郎, 瀬木 利夫, 青木 学聡 佐藤 明伸, 鈴木 晃子, ブーレル エマニュエル, 松尾 二郎, 瀬木 利夫, 青木 学聡 2次元フォトニック結晶光デバイスの製造方法 2次元フォトニック結晶光デバイスの製造方法 特許登録 特許第4113478号 2008/04/18 Disclose to all
佐藤 明伸, 鈴木 晃子, ブーレル エマニュエル, 松尾 二郎, 瀬木 利夫, 青木 学聡 佐藤 明伸, 鈴木 晃子, ブーレル エマニュエル, 松尾 二郎, 瀬木 利夫, 青木 学聡 固体表面の平坦化方法及びその装置 固体表面の平坦化方法及びその装置 特許登録 特許第3994111号 2007/08/03 Disclose to all
鈴木 晃子, 佐藤 明伸, ブーレル エマニュエル, 松尾 二郎, 瀬木 利夫, 青木 学聡 鈴木 晃子, 佐藤 明伸, ブーレル エマニュエル, 松尾 二郎, 瀬木 利夫, 青木 学聡 ドライエッチング方法 ドライエッチング方法 特許登録 特許第3816484号 2006/06/16 Disclose to all
佐藤 明伸, 鈴木 晃子, ブーレル エマニュエル, 松尾 二郎, 瀬木 利夫, 青木 学聡 佐藤 明伸, 鈴木 晃子, ブーレル エマニュエル, 松尾 二郎, 瀬木 利夫, 青木 学聡 固体表面の平坦化方法及びその装置 固体表面の平坦化方法及びその装置 特許公開 WO2005-031838 2005/04/07 Disclose to all
鈴木 晃子, 佐藤 明伸, ブーレル エマニュエル, 松尾 二郎, 瀬木 利夫, 青木 学聡 鈴木 晃子, 佐藤 明伸, ブーレル エマニュエル, 松尾 二郎, 瀬木 利夫, 青木 学聡 ドライエッチング方法及びその方法を用いて作製されたフォトニック結晶素子 ドライエッチング方法及びその方法を用いて作製されたフォトニック結晶素子 特許公開 特開2005-175369 2005/06/30 Disclose to all
Title language:
Awards
Title(Japanese) Title(English) Organization name(Japanese) Organization name(English) Date
Young Researcher Award The 4th IUMRS International Conference in Asia 1997/09/
Student Award XIIth International Conference on Ion Implantation Technology 1998/06/
学会奨励賞 第14回日本MRS学術シンポジウム 2002/12/
Best poster Award 15th International Conference on Ion Implantation Technology 2004/10/
External funds: competitive funds and Grants-in-Aid for Scientific Research (Kakenhi)
Type Position Title(Japanese) Title(English) Period
基盤A Assignment 巨大クラスターイオンによる機能性有機材料評価技術の研究 2011/04/01-2014/03/31
基盤研究(C) Representative クラスター衝突過程のシミュレーションと大規模原子座標データ協働モデルの研究 (平成29年度分) 2017/04/01-2018/03/31
基盤研究(C) Representative クラスター衝突過程のシミュレーションと大規模原子座標データ協働モデルの研究 (平成30年度分) 2018/04/01-2019/03/31
External funds: other than those above
System Main person Title(Japanese) Title(English) Period
文部科学省原子力システム研究開発事業 青木学聡 時間・空間スケーラビリティーを備えた統合原子シミュレーションの研究 Research of Time- and Space- Scalable Atomistic Simulation 2005/12/-2008/03/
Other research activities
Title Location Misc Period
(独) 新エネルギー・産業技術総合開発事業 「ナノ制度製造イノベーション基盤技術に関する調査」 調査委員、磁気デバイスWG副幹事 2007/08/-2008/03/
文部科学省 平成20年度国際化加速プログラム(海外先進教育研究実践支援(研究実践型))による海外研究派遣 ペンシルバニア州立大学(米国) 「量子ビームを利用した先進ナノ製造・計測」 2008/06/08-2008/07/06
文部科学省 平成20年度国際化加速プログラム(海外先進教育研究実践支援(研究実践型))による海外研究派遣 サリー大学(英国) 「量子ビームを利用した先進ナノ製造・計測」 2008/07/20-2008/10/05
学際大規模情報基盤共同利用・共同研究拠点(東京大学情報基盤センター他全国共同利用大型計算機センター) 平成21年度公募型共同研究(試行) 「高エネルギー原子衝突現象のための大規模シミュレーション基盤」, 研究代表 2009/11/-2010/03/
学際大規模情報基盤共同利用・共同研究拠点(東京大学情報基盤センター他全国共同利用大型計算機センター) 平成22年度公募型共同研究 「原子衝突による材料科学のための大規模シミュレーション基盤」, 研究代表 2010/04/-2011/03/
学際大規模情報基盤共同利用・共同研究拠点(東京大学情報基盤センター他全国共同利用大型計算機センター) 平成23年度公募型共同研究 「原子衝突による材料科学のための大規模シミュレーション基盤」, 研究代表 2011/04/-2012/03/
IAEA Coordinated Research Program (CRP) 2011/12/14-2015/12/13
Teaching subject(s)
Name(Japanese) Name(English) Term Department Period
電気電子計算工学及演習 -
電気電子計算工学及演習 Computational Methods and Exercise in Electrical and Electronic Engineering 後期 工学部 2012/04-2013/03
電気電子計算工学及演習 Computational Methods and Exercise in Electrical and Electronic Engineering 後期 工学部 2013/04-2014/03
電気電子計算工学及演習 Computational Methods and Exercise in Electrical and Electronic Engineering 後期 工学部 2014/04-2015/03
電気電子計算工学及演習 Computational Methods and Exercise in Electrical and Electronic Engineering 後期 工学部 2015/04-2016/03
電気電子計算工学及演習 Computational Methods and Exercise in Electrical and Electronic Engineering 後期 工学部 2016/04-2017/03
ILASセミナー ILAS Seminar 前期 全学共通科目 2017/04-2018/03
プログラミング(クラウド計算) Programming (Cloud Computing) 後期 全学共通科目 2017/04-2018/03
電気電子回路演習 Exercise of Electric and Electronic Circuits 前期 工学部 2017/04-2018/03
電気電子計算工学及演習 Computational Methods and Exercise in Electrical and Electronic Engineering 後期 工学部 2017/04-2018/03
ILASセミナー ILAS Seminar 前期 全学共通科目 2018/04-2019/03
プログラミング(クラウド計算) Programming (Cloud Computing) 後期 全学共通科目 2018/04-2019/03
電気電子回路演習 Exercise of Electric and Electronic Circuits 前期 工学部 2018/04-2019/03
電気電子計算工学及演習 Computational Methods and Exercise in Electrical and Electronic Engineering 後期 工学部 2018/04-2019/03
ILASセミナー ILAS Seminar 前期 全学共通科目 2019/04-2020/03
プログラミング(クラウド計算) Programming (Cloud Computing) 後期 全学共通科目 2019/04-2020/03
電気電子回路演習 Exercise of Electric and Electronic Circuits 前期 工学部 2019/04-2020/03
電気電子計算工学及演習 Computational Methods and Exercise in Electrical and Electronic Engineering 後期 工学部 2019/04-2020/03

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School management (title, position)
Title Period
工学研究科附属情報センター 講師 -
工学研究科情報セキュリティ幹事 -
計算機環境専門委員会 委員 -
図書館協議会認証システム管理特別委員会 委員 -
教育IR推進室 室員 2016/04/01-0000/00/00
Faculty management (title, position)
Title Period
工学研究科附属情報センター運営委員会 委員 2014/04/01-2015/03/31
工学研究科附属情報センター運営委員会 委員 2015/04/01-2016/03/31
情報環境機構運営委員会 委員 2016/03/01-2020/03/31
情報環境機構管理委員会 委員 2016/04/01-2020/03/31
情報環境機構運営検討委員会 委員 2016/04/01-2020/03/31
学術情報メディアセンター及び情報環境機構安全衛生委員会委員 委員 2018/04/01-
情報環境機構将来構想委員会 委員 -2020/03/31
情報環境機構KUINS利用負担金検討委員会 委員 -
情報環境機構情報セキュリティ委員会 委員 2016/06/01-2020/03/31
情報環境機構研究システム運用委員会 委員長 2018/04/01-2020/03/31
情報環境機構研究用計算機専門委員会 委員 -2020/03/31
情報環境機構スーパーコンピュータシステム運用委員会 委員 -2021/03/31
総合博物館 研究資源アーカイブ連絡会構成員 -
総合博物館 研究資源アーカイブ次期導入システム検討協力者 2017/06/-2017/08/

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Academic organizaions (conference administrator)
Organization name Group name Title Period
18th International Conference on Ion Implantation Technology Technical Program Committee, Proceeding Editor, Secretariat 2009/04/01-2011/03/31
9th International Workshop on Junction Technology Local Arrengement 2010/07/01-2011/06/30
日本MRS 第21回日本MRS学術シンポジウム シンポジウム連絡オーガナイザ(イオンビームを利用した革新的材料) 2011/09-2011/12
11th International Workshop on Junction Technology Local Arrengement 2010/06/01-2013/03
The Materials Research Society of Japan IUMRS International Conference on Electronic Materials 2012 Symposium Corresponding chair (Symp. D-3, Innovative Material Technologies Utilizing Ion Beams) 2011/12/01-2012/12/31
13th International Workshop on Junction Technology Local Arrangment 2012/06/01-2013/06/30
日本MRS 第23回日本MRS年次大会 シンポジウム連絡オーガナイザ(Symp. Q, イオンビームを利用したイオンビームを利用した革新的材料創製) 2013/07/01-2013/12/31
The Materials Research Society of Japan IUMRS International Conference in Asia 2014 Symposium Corresponding Chair (Symp. D-1, Innovative Material Technologies Utilizing Ion Beams) 2013/10/01-2014/09/30
15th International Workshop on Junction Tehcnology Local Arrangement, Program Committee 2015/04/01-2015/06/30
日本MRS 第25回日本MRS学術年次大会 シンポジウムオーガナイザ(Symp. E-1, イオンビームを利用した革新的材料創製) 2015/07/01-2015/12/31
日本MRS 第26回日本MRS学術年次大会 シンポジウムオーガナイザ(Symp. D-1, イオンビームを利用した革新的材料創製) 2016/07/01-2016/12/31
大学ICT推進協議会 2017年度年次大会 実行委員会委員 2017/04/01-2017/12/31
17th International Workshop on Junction Tehcnology Local Arrangement, Program Committee 2017/04/01-2017/06/30
IUMRS International Conference on Advanced Materials 2017 Local Arrangement 2016/06/01-2017/09/30
日本MRS 第27回日本MRS学術年次大会 組織委員会委員 2017/06/01-2018/03/31
7th IIAI International Conference on Data Science and Institutional Research Session co-organizer for "Open Science, Research Data Management, and Research Transparency" 2018/02/01-2018/07/31
日本MRS 第28回日本MRS年次大会 組織委員会委員(広報担当) / シンポジウムオーガナイザ(D-1. イオンビームを利用した革新的材料創製) 2018/06/15-2019/03/31

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Academic organizaions (conference chair)
Organization name Group name Date
日本MRS 第21回日本MRS学術シンポジウム(イオンビームを利用した革新的材料(国際セッション)) 2011/12/19
International Union of Materials Research Societies International Conference on Electronic Materials 2012 2012/09/24