山田 啓文

Last Update: 2019/09/30 15:13:43

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Name(Kanji/Kana/Abecedarium Latinum)
山田 啓文/ヤマダ ヒロフミ/Yamada, Hirofumi
Primary Affiliation(Org1/Job title)
Graduate Schools Engineering/Professor
Faculty
Org1 Job title
工学部
Contact Address
Type Address(Japanese) Address(English)
Office 京都市西京区京都大学桂 Katsura, Nishikyo, Kyoto
Phone
Type Number
Office
Academic Organizations You are Affiliated to in Japan
Organization name(Japanese) Organization name(English)
応用物理学会 The Japan Society of Applied Physics
日本物理学会 The Pysical Society of Japan
日本表面科学会 The Surface Science Society of Japan
日本真空学会 The Vacuum Society of Japan
日本顕微鏡学会 The Japanese Society of Microscopy
Academic Degree
Field(Japanese) Field(English) University(Japanese) University(English) Method
理学修士
博士(工学) 東京大学
Graduate School
University(Japanese) University(English) Faculty(Japanese) Faculty(English) Major(Japanese) Major(English) Degree
京都大学 大学院理学研究科修士課程物理学第一専攻 修了
Undergraduate School / Major(s)
University(Japanese) University(English) Faculty(Japanese) Faculty(English) Major(s)(Japanese) Major(s)(English) Degree
京都大学 理学部 卒業
Work Experience
Period Organization(Japanese) Organization(English) Job title(Japanese) Job title(English)
1984-1993 通商産業省工業技術院計量研究所量子部精密計測研究室 National Research Laboratory of Metrology, Agency of Industrial Science and Technology/MITI 研究員 Resarcher
1989-1991 スタンフォード大学 E.L.Ginzton研究所 Stanford University E. L. Ginzton Laboratory 訪問研究員 Visiting Researcher
1993-1996 工業技術院産業技術融合領域研究所アトムテクノロジー研究体 Joint Research Center for Atom Technology, National Institute for Advanced Interdisciplinary Research, Agency of Industrial Science and Technology/MITI 研究員 Senior Researcher
1996-2015/06/30 京都大学 Kyoto University 准教授 Associate Professor
2015/07/01- 京都大学 Kyoto University 教授 Professor
Language of Instruction
Language(japanese) Language(english) Code
英語
researchmap URL
https://researchmap.jp/read0046866
Fields of research (key words)
Key words(Japanese) Key words(English)
走査型プローブ顕微鏡 Scanning Probe Microscopy
単一分子物性計測 Electrical Properties of Single Molecules
分子スケールデバイス Molecular-Scale Device
Published Papers
Author Author(Japanese) Author(English) Title Title(Japanese) Title(English) Bibliography Bibliography(Japanese) Bibliography(English) Publication date Refereed paper Language Publishing type Disclose
K. Umeda, K. Kobayashi, T. Minato, and H. Yamada K. Umeda, K. Kobayashi, T. Minato, and H. Yamada K. Umeda, K. Kobayashi, T. Minato, and H. Yamada Atomic-Level Viscosity Distribution in the Hydration Layer Atomic-Level Viscosity Distribution in the Hydration Layer Atomic-Level Viscosity Distribution in the Hydration Layer Physical Review Letters, 122, 116001 Physical Review Letters, 122, 116001 Physical Review Letters, 122, 116001 2019/03 Refereed English Research paper(scientific journal) Disclose to all
A. Fujita , K. Kobayashi and H. Yamada A. Fujita , K. Kobayashi and H. Yamada A. Fujita , K. Kobayashi and H. Yamada Investigation of Local Hydration Structures of Alkanethiol Self-Assembled Monolayers with Different Molecular Structures by FM-AFM Investigation of Local Hydration Structures of Alkanethiol Self-Assembled Monolayers with Different Molecular Structures by FM-AFM Investigation of Local Hydration Structures of Alkanethiol Self-Assembled Monolayers with Different Molecular Structures by FM-AFM Langmuir, 34, 50, 15189-15194 Langmuir, 34, 50, 15189-15194 Langmuir, 34, 50, 15189-15194 2018/11 Refereed English Research paper(scientific journal) Disclose to all
H. Kominami, K. Kobayashi, S. Ido, H. Kimiya and H. Yamada H. Kominami, K. Kobayashi, S. Ido, H. Kimiya and H. Yamada H. Kominami, K. Kobayashi, S. Ido, H. Kimiya and H. Yamada Immunoactivity of self-assembled antibodies investigated by atomic force microscopy Immunoactivity of self-assembled antibodies investigated by atomic force microscopy Immunoactivity of self-assembled antibodies investigated by atomic force microscopy RSC Advances, 8, 29378-29384 RSC Advances, 8, 29378-29384 RSC Advances, 8, 29378-29384 2018/08 Refereed English Disclose to all
K. Umeda, K. Kobayashi, T. Minato, and H. Yamada K. Umeda, K. Kobayashi, T. Minato, and H. Yamada K. Umeda, K. Kobayashi, T. Minato, and H. Yamada Atomic-Scale 3D Local Hydration Structures Influenced by Water- Restricting Dimensions Atomic-Scale 3D Local Hydration Structures Influenced by Water- Restricting Dimensions Atomic-Scale 3D Local Hydration Structures Influenced by Water- Restricting Dimensions Langmuir, 34, 9114-9121 Langmuir, 34, 9114-9121 Langmuir, 34, 9114-9121 2018/07 Refereed Disclose to all
Y. Yamagishi, K. Kobayashi, T. Kimura, K. Noda, H. Yamada Y. Yamagishi, K. Kobayashi, T. Kimura, K. Noda, H. Yamada Y. Yamagishi, K. Kobayashi, T. Kimura, K. Noda, H. Yamada Local carrier dynamics in organic thin film transistors investigated by time- resolved Kelvin probe force microscopy Local carrier dynamics in organic thin film transistors investigated by time- resolved Kelvin probe force microscopy Local carrier dynamics in organic thin film transistors investigated by time- resolved Kelvin probe force microscopy Organic Electronics, 57, 118-122 Organic Electronics, 57, 118-122 Organic Electronics, 57, 118-122 2018/03 Refereed English Disclose to all
S. Takagaki, H. Yamada, K. Noda S. Takagaki, H. Yamada, K. Noda S. Takagaki, H. Yamada, K. Noda Contact effects analyzed by a parameter extraction method based on a single bottom-gate/top-contact organic thin-film transistor Contact effects analyzed by a parameter extraction method based on a single bottom-gate/top-contact organic thin-film transistor Contact effects analyzed by a parameter extraction method based on a single bottom-gate/top-contact organic thin-film transistor Japanese Journal of Applied Physics, 57, 3, 03EH04 Japanese Journal of Applied Physics, 57, 3, 03EH04 Japanese Journal of Applied Physics, 57, 3, 03EH04 2017/12 Refereed English Research paper(scientific journal) Disclose to all
K. Umeda, L. Zivanovic, K. Kobayashi, J. Ritala, H. Kominami, P. Spijker, A. S. Foster & H. Yamada K. Umeda, L. Zivanovic, K. Kobayashi, J. Ritala, H. Kominami, P. Spijker, A. S. Foster & H. Yamada K. Umeda, L. Zivanovic, K. Kobayashi, J. Ritala, H. Kominami, P. Spijker, A. S. Foster & H. Yamada Atomic-resolution three-dimensional hydration structures on a heterogeneously charged surface Atomic-resolution three-dimensional hydration structures on a heterogeneously charged surface Atomic-resolution three-dimensional hydration structures on a heterogeneously charged surface Nature Commnications, 8, 2111 Nature Commnications, 8, 2111 Nature Commnications, 8, 2111 2017/12 Refereed English Research paper(scientific journal) Disclose to all
Z. Ma, Y. Huang, S. Park, K. Kawai, D.-N. Kim, Y. Hirai, T. Tsuchiya, H. Yamada, and O. Tabata Z. Ma, Y. Huang, S. Park, K. Kawai, D.-N. Kim, Y. Hirai, T. Tsuchiya, H. Yamada, and O. Tabata Z. Ma, Y. Huang, S. Park, K. Kawai, D.-N. Kim, Y. Hirai, T. Tsuchiya, H. Yamada, and O. Tabata Rhombic-Shaped Nanostructures and Mechanical Properties of 2D DNA Origami Constructed with Different Crossover/Nick Designs Rhombic-Shaped Nanostructures and Mechanical Properties of 2D DNA Origami Constructed with Different Crossover/Nick Designs Rhombic-Shaped Nanostructures and Mechanical Properties of 2D DNA Origami Constructed with Different Crossover/Nick Designs Small, 1702028 Small, 1702028 Small, 1702028 2017/11 Refereed English Research paper(scientific journal) Disclose to all
N. Satoh, K. Kobayashi, K. Matsushige and H. Yamada N. Satoh, K. Kobayashi, K. Matsushige and H. Yamada N. Satoh, K. Kobayashi, K. Matsushige and H. Yamada Near-field light detection of a photo induced force by atomic force microscopy with frequency modulation Near-field light detection of a photo induced force by atomic force microscopy with frequency modulation Near-field light detection of a photo induced force by atomic force microscopy with frequency modulation Japanese Journal of Applied Physics, Volume, 56, 8S1 Japanese Journal of Applied Physics, Volume, 56, 8S1 Japanese Journal of Applied Physics, Volume, 56, 8S1 2017/07 Refereed Disclose to all
K. Hizume, H. Kominami, K. Kobayashi, H. Yamada, and H. Araki K. Hizume, H. Kominami, K. Kobayashi, H. Yamada, and H. Araki K. Hizume, H. Kominami, K. Kobayashi, H. Yamada, and H. Araki Flexible DNA Path in the MCM Double Hexamer Loaded on DNA Flexible DNA Path in the MCM Double Hexamer Loaded on DNA Flexible DNA Path in the MCM Double Hexamer Loaded on DNA Biochemistry, 56, 2435-2445 Biochemistry, 56, 2435-2445 Biochemistry, 56, 2435-2445 2017/05 Refereed English Research paper(scientific journal) Disclose to all
YAMADA Hirofumi 山田 啓文 YAMADA Hirofumi Present status and future prospects of electric force microscopy Present status and future prospects of electric force microscopy Present status and future prospects of electric force microscopy IEICE Nonlinear Theory and Its Applications, 8, 2, 80-84 IEICE Nonlinear Theory and Its Applications, 8, 2, 80-84 IEICE Nonlinear Theory and Its Applications, 8, 2, 80-84 2017/04 Refereed English Research paper(scientific journal) Disclose to all
N. Satoh, M. Nakahara, K. Kobayashi, S. Watanabe, T. Fujii, K. Matsushige, H. Yamada N. Satoh, M. Nakahara, K. Kobayashi, S. Watanabe, T. Fujii, K. Matsushige, H. Yamada N. Satoh, M. Nakahara, K. Kobayashi, S. Watanabe, T. Fujii, K. Matsushige, H. Yamada Using dynamic force microscopy with piezoelectric cantilever for indentation and high-speed observation Using dynamic force microscopy with piezoelectric cantilever for indentation and high-speed observation Using dynamic force microscopy with piezoelectric cantilever for indentation and high-speed observation IEICE Nonlinear Theory and Its Applications, 8, 2, 98-106 IEICE Nonlinear Theory and Its Applications, 8, 2, 98-106 IEICE Nonlinear Theory and Its Applications, 8, 2, 98-106 2017/04 Refereed Disclose to all
A. Yao, K. Kobayashi, S. Nosaka, K. Kimura & H. Yamada A. Yao, K. Kobayashi, S. Nosaka, K. Kimura & H. Yamada A. Yao, K. Kobayashi, S. Nosaka, K. Kimura & H. Yamada Visualization of Au Nanoparticles Buried in a Polymer Matrix by Scanning Thermal Noise Microscopy Visualization of Au Nanoparticles Buried in a Polymer Matrix by Scanning Thermal Noise Microscopy Visualization of Au Nanoparticles Buried in a Polymer Matrix by Scanning Thermal Noise Microscopy Scientific Repots, 7, 42718 Scientific Repots, 7, 42718 Scientific Repots, 7, 42718 2017/02 Refereed English Research paper(scientific journal) Disclose to all
K. Kimura, K. Kobayashi, A. Yao and H. Yamada K. Kimura, K. Kobayashi, A. Yao and H. Yamada K. Kimura, K. Kobayashi, A. Yao and H. Yamada Visualization of subsurface nanoparticles in a polymer matrix using resonance tracking atomic force acoustic microscopy and contact resonance spectroscopy Visualization of subsurface nanoparticles in a polymer matrix using resonance tracking atomic force acoustic microscopy and contact resonance spectroscopy Visualization of subsurface nanoparticles in a polymer matrix using resonance tracking atomic force acoustic microscopy and contact resonance spectroscopy Nanotechnology, 27, 415707 Nanotechnology, 27, 415707 Nanotechnology, 27, 415707 2016/09 Refereed English Research paper(scientific journal) Disclose to all
T. Kimura, K. Kobayashi, H. Yamada T. Kimura, K. Kobayashi, H. Yamada T. Kimura, K. Kobayashi, H. Yamada Direct investigations of the interface impedance of organic field-effect transistors with self-assembled-monolayer-modified electrodes Direct investigations of the interface impedance of organic field-effect transistors with self-assembled-monolayer-modified electrodes Direct investigations of the interface impedance of organic field-effect transistors with self-assembled-monolayer-modified electrodes Organic Electronics, 38, 74-78 Organic Electronics, 38, 74-78 Organic Electronics, 38, 74-78 2016/08 Refereed English Research paper(scientific journal) Disclose to all
F. Ito, K. Kobayashi, P. Spijker, L. Zivanovic, K. Umeda, T. Nurmi, N. Holmberg, K. Laasonen, A. S. Foster, and H. Yamada F. Ito, K. Kobayashi, P. Spijker, L. Zivanovic, K. Umeda, T. Nurmi, N. Holmberg, K. Laasonen, A. S. Foster, and H. Yamada F. Ito, K. Kobayashi, P. Spijker, L. Zivanovic, K. Umeda, T. Nurmi, N. Holmberg, K. Laasonen, A. S. Foster, and H. Yamada Molecular Resolution of the Water Interface at an Alkali Halide with Terraces and Steps Molecular Resolution of the Water Interface at an Alkali Halide with Terraces and Steps Molecular Resolution of the Water Interface at an Alkali Halide with Terraces and Steps J. Phys. Chem. C, 120, 19714-19722 J. Phys. Chem. C, 120, 19714-19722 J. Phys. Chem. C, 120, 19714-19722 2016/08 Refereed English Research paper(scientific journal) Disclose to all
Y. Yamagishi, K. Kobayashi, K. Noda, H. Yamada Y. Yamagishi, K. Kobayashi, K. Noda, H. Yamada Y. Yamagishi, K. Kobayashi, K. Noda, H. Yamada Visualization of trapped charges being ejected from organic thin-film transistor channels by Kelvin-probe force microscopy during gate voltage sweeps Visualization of trapped charges being ejected from organic thin-film transistor channels by Kelvin-probe force microscopy during gate voltage sweeps Visualization of trapped charges being ejected from organic thin-film transistor channels by Kelvin-probe force microscopy during gate voltage sweeps Applied Physics Letters, 108, 093302 Applied Physics Letters, 108, 093302 Applied Physics Letters, 108, 093302 2016/03 Refereed English Research paper(scientific journal) Disclose to all
K. Umeda, K. Kobayashi, N.Oyabu, K.i Matsushige and H. Yamada K. Umeda, K. Kobayashi, N.Oyabu, K.i Matsushige and H. Yamada K. Umeda, K. Kobayashi, N.Oyabu, K.i Matsushige and H. Yamada Molecular-scale quantitative charge density measurement of biological molecule by frequency modulation atomic force microscopy in aqueous solutions Molecular-scale quantitative charge density measurement of biological molecule by frequency modulation atomic force microscopy in aqueous solutions Molecular-scale quantitative charge density measurement of biological molecule by frequency modulation atomic force microscopy in aqueous solutions Nanotechnology, 26, 285103 Nanotechnology, 26, 285103 Nanotechnology, 26, 285103 2015/06 Refereed English Research paper(scientific journal) Disclose to all
Y. Yamagishi, K. Noda, K. Kobayashi, and H. Yamada Y. Yamagishi, K. Noda, K. Kobayashi, and H. Yamada Y. Yamagishi, K. Noda, K. Kobayashi, and H. Yamada Interlayer Resistance and Edge-Specific Charging in Layered Molecular Crystals Revealed by Kelvin-Probe Force Microscopy Interlayer Resistance and Edge-Specific Charging in Layered Molecular Crystals Revealed by Kelvin-Probe Force Microscopy Interlayer Resistance and Edge-Specific Charging in Layered Molecular Crystals Revealed by Kelvin-Probe Force Microscopy The Journal of Physical Chemistry C, 119, 3006-3011 The Journal of Physical Chemistry C, 119, 3006-3011 The Journal of Physical Chemistry C, 119, 3006-3011 2015/02 Refereed English Research paper(scientific journal) Disclose to all
N. Satoh, K. Kobayashi, S. Watanabe, T. Fujii, K. Matsushige, and H. Yamada N. Satoh, K. Kobayashi, S. Watanabe, T. Fujii, K. Matsushige, and H. Yamada N. Satoh, K. Kobayashi, S. Watanabe, T. Fujii, K. Matsushige, and H. Yamada Scanning near-field optical microscopy system based on frequency-modulation atomic force microscopy using a piezoelectric cantilever Scanning near-field optical microscopy system based on frequency-modulation atomic force microscopy using a piezoelectric cantilever Scanning near-field optical microscopy system based on frequency-modulation atomic force microscopy using a piezoelectric cantilever Japanese Journal of Applied Physics, 53, 125201 Japanese Journal of Applied Physics, 53, 125201 Japanese Journal of Applied Physics, 53, 125201 2014/12 Refereed English Research paper(scientific journal) Disclose to all
Y. Araki, K. Tsukamoto, R. Takagi, T. Miyashita, N. Oyabu, K. Kobayashi, and H. Yamada Y. Araki, K. Tsukamoto, R. Takagi, T. Miyashita, N. Oyabu, K. Kobayashi, and H. Yamada Y. Araki, K. Tsukamoto, R. Takagi, T. Miyashita, N. Oyabu, K. Kobayashi, and H. Yamada Direct Observation of the Influence of Additives on Calcite Hydration by Frequency Modulation Atomic Force Microscopy Direct Observation of the Influence of Additives on Calcite Hydration by Frequency Modulation Atomic Force Microscopy Direct Observation of the Influence of Additives on Calcite Hydration by Frequency Modulation Atomic Force Microscopy Crystal Growth & Design, 14, 6254-6260 Crystal Growth & Design, 14, 6254-6260 Crystal Growth & Design, 14, 6254-6260 2014/12 Refereed English Research paper(scientific journal) Disclose to all
K. Suzuki, K. Kobayashi, A. Labuda, K. Matsushige, and H. Yamada K. Suzuki, K. Kobayashi, A. Labuda, K. Matsushige, and H. Yamada K. Suzuki, K. Kobayashi, A. Labuda, K. Matsushige, and H. Yamada Accurate formula for dissipative interaction in frequency modulation atomic force microscopy Accurate formula for dissipative interaction in frequency modulation atomic force microscopy Accurate formula for dissipative interaction in frequency modulation atomic force microscopy Applied Physics Letters, 105, 233105 Applied Physics Letters, 105, 233105 Applied Physics Letters, 105, 233105 2014/12 Refereed English Research paper(scientific journal) Disclose to all
K. Umeda, K. Kobayashi, N. Oyabu, Y. Hirata, K. Matsushige, and H. Yamada K. Umeda, K. Kobayashi, N. Oyabu, Y. Hirata, K. Matsushige, and H. Yamada K. Umeda, K. Kobayashi, N. Oyabu, Y. Hirata, K. Matsushige, and H. Yamada Practical aspects of Kelvin-probe force microscopy at solid/liquid interfaces in various liquid media Practical aspects of Kelvin-probe force microscopy at solid/liquid interfaces in various liquid media Practical aspects of Kelvin-probe force microscopy at solid/liquid interfaces in various liquid media Journal of Applied Physics, 116, 134307 Journal of Applied Physics, 116, 134307 Journal of Applied Physics, 116, 134307 2014/10 Refereed English Research paper(scientific journal) Disclose to all
N. Satoh, S. Katori, K. Kobayashi, K. Matsushige, and H. Yamada N. Satoh, S. Katori, K. Kobayashi, K. Matsushige, and H. Yamada N. Satoh, S. Katori, K. Kobayashi, K. Matsushige, and H. Yamada Surface potential measurement of fullerene/copper phthalocyanine films on indium tin oxide electrode by Kelvin probe force microscopy Surface potential measurement of fullerene/copper phthalocyanine films on indium tin oxide electrode by Kelvin probe force microscopy Surface potential measurement of fullerene/copper phthalocyanine films on indium tin oxide electrode by Kelvin probe force microscopy Japanese Journal of Applied Physics, 53, 05FY03 Japanese Journal of Applied Physics, 53, 05FY03 Japanese Journal of Applied Physics, 53, 05FY03 2014/05 Refereed English Research paper(scientific journal) Disclose to all
S. Ido; H. Kimiya; K. Kobayashi; H. Kominami; K. Matsushige; H. Yamada S. Ido; H. Kimiya; K. Kobayashi; H. Kominami; K. Matsushige; H. Yamada S. Ido; H. Kimiya; K. Kobayashi; H. Kominami; K. Matsushige; H. Yamada Immunoactive two-dimensional self-assembly of monoclonal antibodies in aqueous solution revealed by atomic force microscopy Immunoactive two-dimensional self-assembly of monoclonal antibodies in aqueous solution revealed by atomic force microscopy Immunoactive two-dimensional self-assembly of monoclonal antibodies in aqueous solution revealed by atomic force microscopy Nature Materials, 13, 3, 264-270 Nature Materials, 13, 3, 264-270 Nature Materials, 13, 3, 264-270 2014/03 Refereed English Research paper(scientific journal) Disclose to all
K. Suzuki, K. Kobayashi, N. Oyabu, K. Matsushige, and H. Yamada K. Suzuki, K. Kobayashi, N. Oyabu, K. Matsushige, and H. Yamada K. Suzuki, K. Kobayashi, N. Oyabu, K. Matsushige, and H. Yamada Molecular-scale investigations of structures and surface charge distribution of surfactant aggregates by three-dimensional force mapping Molecular-scale investigations of structures and surface charge distribution of surfactant aggregates by three-dimensional force mapping Molecular-scale investigations of structures and surface charge distribution of surfactant aggregates by three-dimensional force mapping The Journal of Chemical Physics, 140, 54704 The Journal of Chemical Physics, 140, 54704 The Journal of Chemical Physics, 140, 54704 2014/02 Refereed English Research paper(scientific journal) Disclose to all
H. Adam; S. Rode; M. Schreiber; K. Kobayashi; H. Yamada; A. Kuhnle H. Adam; S. Rode; M. Schreiber; K. Kobayashi; H. Yamada; A. Kuhnle H. Adam; S. Rode; M. Schreiber; K. Kobayashi; H. Yamada; A. Kuhnle Photothermal excitation setup for a modified commercial atomic force microscope Photothermal excitation setup for a modified commercial atomic force microscope Photothermal excitation setup for a modified commercial atomic force microscope Review of Scientific Instruments, 85, 2 Review of Scientific Instruments, 85, 2 Review of Scientific Instruments, 85, 2 2014 Refereed English Research paper(scientific journal) Disclose to all
K. Kimura; K. Kobayashi; K. Matsushige; H. Yamada K. Kimura; K. Kobayashi; K. Matsushige; H. Yamada K. Kimura; K. Kobayashi; K. Matsushige; H. Yamada Imaging of Au nanoparticles deeply buried in polymer matrix by various atomic force microscopy techniques Imaging of Au nanoparticles deeply buried in polymer matrix by various atomic force microscopy techniques Imaging of Au nanoparticles deeply buried in polymer matrix by various atomic force microscopy techniques Ultramicroscopy, 133, 41-49 Ultramicroscopy, 133, 41-49 Ultramicroscopy, 133, 41-49 2013/10 Refereed English Research paper(scientific journal) Disclose to all
M. Hirose; E. Tsunemi; K. Kobayashi; H. Yamada M. Hirose; E. Tsunemi; K. Kobayashi; H. Yamada M. Hirose; E. Tsunemi; K. Kobayashi; H. Yamada Influence of grain boundary on electrical properties of organic crystalline grains investigated by dual-probe atomic force microscopy Influence of grain boundary on electrical properties of organic crystalline grains investigated by dual-probe atomic force microscopy Influence of grain boundary on electrical properties of organic crystalline grains investigated by dual-probe atomic force microscopy Applied Physics Letters, 103, 17, 173109 Applied Physics Letters, 103, 17, 173109 Applied Physics Letters, 103, 17, 173109 2013/10 Refereed English Research paper(scientific journal) Disclose to all
S. Sanna; S. Rode; R. H?lscher; S. Klassen; C. Marutschke; K. Kobayashi; H. Yamada; W.G. Schmidt; A. K?hnle S. Sanna; S. Rode; R. H?lscher; S. Klassen; C. Marutschke; K. Kobayashi; H. Yamada; W.G. Schmidt; A. K?hnle S. Sanna; S. Rode; R. H?lscher; S. Klassen; C. Marutschke; K. Kobayashi; H. Yamada; W.G. Schmidt; A. K?hnle Charge compensation by long-period reconstruction in strongly polar lithium niobate surfaces Charge compensation by long-period reconstruction in strongly polar lithium niobate surfaces Charge compensation by long-period reconstruction in strongly polar lithium niobate surfaces Physical Review B - Condensed Matter and Materials Physics, 88, 11, 115422 Physical Review B - Condensed Matter and Materials Physics, 88, 11, 115422 Physical Review B - Condensed Matter and Materials Physics, 88, 11, 115422 2013/09 Refereed English Research paper(scientific journal) Disclose to all
M. Hirose; E. Tsunemi; K. Kobayashi; H. Yamada M. Hirose; E. Tsunemi; K. Kobayashi; H. Yamada M. Hirose; E. Tsunemi; K. Kobayashi; H. Yamada Visualization of charge injection processes in polydiacetylene thin film grains by dual-probe atomic force microscopy Visualization of charge injection processes in polydiacetylene thin film grains by dual-probe atomic force microscopy Visualization of charge injection processes in polydiacetylene thin film grains by dual-probe atomic force microscopy Japanese Journal of Applied Physics, 52, 8, 85201 Japanese Journal of Applied Physics, 52, 8, 85201 Japanese Journal of Applied Physics, 52, 8, 85201 2013/08 Refereed English Research paper(scientific journal) Disclose to all
E. Tsunemi; K. Kobayashi; N. Oyabu; M. Hirose; Y. Takenaka; K. Matsushige; H. Yamada E. Tsunemi; K. Kobayashi; N. Oyabu; M. Hirose; Y. Takenaka; K. Matsushige; H. Yamada E. Tsunemi; K. Kobayashi; N. Oyabu; M. Hirose; Y. Takenaka; K. Matsushige; H. Yamada Development of multi-environment dual-probe atomic force microscopy system using optical beam deflection sensors with vertically incident laser beams Development of multi-environment dual-probe atomic force microscopy system using optical beam deflection sensors with vertically incident laser beams Development of multi-environment dual-probe atomic force microscopy system using optical beam deflection sensors with vertically incident laser beams Review of Scientific Instruments, 84, 8, 83701 Review of Scientific Instruments, 84, 8, 83701 Review of Scientific Instruments, 84, 8, 83701 2013/08 Refereed English Research paper(scientific journal) Disclose to all
K. Kobayashi; N. Oyabu; K. Kimura; S. Ido; K. Suzuki; T. Imai; K. Tagami; M. Tsukada; H. Yamada K. Kobayashi; N. Oyabu; K. Kimura; S. Ido; K. Suzuki; T. Imai; K. Tagami; M. Tsukada; H. Yamada K. Kobayashi; N. Oyabu; K. Kimura; S. Ido; K. Suzuki; T. Imai; K. Tagami; M. Tsukada; H. Yamada Visualization of hydration layers on muscovite mica in aqueous solution by frequency-modulation atomic force microscopy Visualization of hydration layers on muscovite mica in aqueous solution by frequency-modulation atomic force microscopy Visualization of hydration layers on muscovite mica in aqueous solution by frequency-modulation atomic force microscopy Journal of Chemical Physics, 138, 18, 184704 Journal of Chemical Physics, 138, 18, 184704 Journal of Chemical Physics, 138, 18, 184704 2013/05/14 Refereed English Research paper(scientific journal) Disclose to all
K.-I. Umeda; K. Kobayashi; N. Oyabu; Y. Hirata; K. Matsushige; H. Yamada K.-I. Umeda; K. Kobayashi; N. Oyabu; Y. Hirata; K. Matsushige; H. Yamada K.-I. Umeda; K. Kobayashi; N. Oyabu; Y. Hirata; K. Matsushige; H. Yamada Analysis of capacitive force acting on a cantilever tip at solid/liquid interfaces Analysis of capacitive force acting on a cantilever tip at solid/liquid interfaces Analysis of capacitive force acting on a cantilever tip at solid/liquid interfaces Journal of Applied Physics, 113, 15, 154311 Journal of Applied Physics, 113, 15, 154311 Journal of Applied Physics, 113, 15, 154311 2013/04/21 Refereed English Research paper(scientific journal) Disclose to all
A. Labuda; K. Kobayashi; K. Suzuki; H. Yamada; P. Gr?tter A. Labuda; K. Kobayashi; K. Suzuki; H. Yamada; P. Gr?tter A. Labuda; K. Kobayashi; K. Suzuki; H. Yamada; P. Gr?tter Monotonic damping in nanoscopic hydration experiments Monotonic damping in nanoscopic hydration experiments Monotonic damping in nanoscopic hydration experiments Physical Review Letters, 110, 6, 66102 Physical Review Letters, 110, 6, 66102 Physical Review Letters, 110, 6, 66102 2013/02/07 Refereed English Research paper(scientific journal) Disclose to all
S. Ido; K. Kimura; N. Oyabu; K. Kobayashi; M. Tsukada; K. Matsushige; H. Yamada S. Ido; K. Kimura; N. Oyabu; K. Kobayashi; M. Tsukada; K. Matsushige; H. Yamada S. Ido; K. Kimura; N. Oyabu; K. Kobayashi; M. Tsukada; K. Matsushige; H. Yamada Beyond the helix pitch: Direct visualization of native DNA in aqueous solution Beyond the helix pitch: Direct visualization of native DNA in aqueous solution Beyond the helix pitch: Direct visualization of native DNA in aqueous solution ACS Nano, 7, 2, 1817-1822 ACS Nano, 7, 2, 1817-1822 ACS Nano, 7, 2, 1817-1822 2013/02 Refereed English Research paper(scientific journal) Disclose to all
M. Hattori; K. Noda; T. Nishi; K. Kobayashi; H. Yamada; K. Matsushige M. Hattori; K. Noda; T. Nishi; K. Kobayashi; H. Yamada; K. Matsushige M. Hattori; K. Noda; T. Nishi; K. Kobayashi; H. Yamada; K. Matsushige Investigation of electrical transport in anodized single TiO<sub>2</sub> nanotubes Investigation of electrical transport in anodized single TiO<sub>2</sub> nanotubes Investigation of electrical transport in anodized single TiO<sub>2</sub> nanotubes Applied Physics Letters, 102, 4, 43105 Applied Physics Letters, 102, 4, 43105 Applied Physics Letters, 102, 4, 43105 2013/01/28 Refereed English Research paper(scientific journal) Disclose to all
M. Ito; K. Kobayashi; Y. Miyato; K. Matsushige; H. Yamada M. Ito; K. Kobayashi; Y. Miyato; K. Matsushige; H. Yamada M. Ito; K. Kobayashi; Y. Miyato; K. Matsushige; H. Yamada Local potential profiling of operating carbon nanotube transistor using frequency-modulation high-frequency electrostatic force microscopy Local potential profiling of operating carbon nanotube transistor using frequency-modulation high-frequency electrostatic force microscopy Local potential profiling of operating carbon nanotube transistor using frequency-modulation high-frequency electrostatic force microscopy Applied Physics Letters, 102, 1, 13115 Applied Physics Letters, 102, 1, 13115 Applied Physics Letters, 102, 1, 13115 2013/01/07 Refereed English Research paper(scientific journal) Disclose to all
N. Satoh; E. Tsunemi; K. Kobayashi; K. Matsushige; H. Yamada N. Satoh; E. Tsunemi; K. Kobayashi; K. Matsushige; H. Yamada N. Satoh; E. Tsunemi; K. Kobayashi; K. Matsushige; H. Yamada Multi-probe atomic force microscopy using piezo-resistive cantilevers and interaction between probes Multi-probe atomic force microscopy using piezo-resistive cantilevers and interaction between probes Multi-probe atomic force microscopy using piezo-resistive cantilevers and interaction between probes e-Journal of Surface Science and Nanotechnology, 11, 13-17 e-Journal of Surface Science and Nanotechnology, 11, 13-17 e-Journal of Surface Science and Nanotechnology, 11, 13-17 2013/01 Refereed English Research paper(scientific journal) Disclose to all
M. Hattori; K. Noda; T. Nishi; K. Kobayashi; H. Yamada; K. Matsushige M. Hattori; K. Noda; T. Nishi; K. Kobayashi; H. Yamada; K. Matsushige M. Hattori; K. Noda; T. Nishi; K. Kobayashi; H. Yamada; K. Matsushige Erratum: Investigation of electrical transport in anodized single TiO <sub>2</sub> nanotubes (Applied Physics Letters (2013) 102 (043105)) Erratum: Investigation of electrical transport in anodized single TiO <sub>2</sub> nanotubes (Applied Physics Letters (2013) 102 (043105)) Erratum: Investigation of electrical transport in anodized single TiO <sub>2</sub> nanotubes (Applied Physics Letters (2013) 102 (043105)) Applied Physics Letters, 103, 3 Applied Physics Letters, 103, 3 Applied Physics Letters, 103, 3 2013 Refereed English Research paper(scientific journal) Disclose to all
Y. Yamagishi; K. Noda; H. Yamada; K. Matsushige Y. Yamagishi; K. Noda; H. Yamada; K. Matsushige Y. Yamagishi; K. Noda; H. Yamada; K. Matsushige Organic field-effect transistors with molecularly doped polymer gate buffer layer Organic field-effect transistors with molecularly doped polymer gate buffer layer Organic field-effect transistors with molecularly doped polymer gate buffer layer Synthetic Metals, 162, 21-22, 1887-1893 Synthetic Metals, 162, 21-22, 1887-1893 Synthetic Metals, 162, 21-22, 1887-1893 2012/12 Refereed English Research paper(scientific journal) Disclose to all
K.-I. Umeda; K. Kobayashi; K. Matsushige; H. Yamada K.-I. Umeda; K. Kobayashi; K. Matsushige; H. Yamada K.-I. Umeda; K. Kobayashi; K. Matsushige; H. Yamada Direct actuation of cantilever in aqueous solutions by electrostatic force using high-frequency electric fields Direct actuation of cantilever in aqueous solutions by electrostatic force using high-frequency electric fields Direct actuation of cantilever in aqueous solutions by electrostatic force using high-frequency electric fields Applied Physics Letters, 101, 12, 123112 Applied Physics Letters, 101, 12, 123112 Applied Physics Letters, 101, 12, 123112 2012/09/17 Refereed English Research paper(scientific journal) Disclose to all
S. Rode; R. Holscher; S. Sanna; S. Klassen; K. Kobayashi; H. Yamada; W.G. Schmidt; A. Kuhnle S. Rode; R. Holscher; S. Sanna; S. Klassen; K. Kobayashi; H. Yamada; W.G. Schmidt; A. Kuhnle S. Rode; R. Holscher; S. Sanna; S. Klassen; K. Kobayashi; H. Yamada; W.G. Schmidt; A. Kuhnle Atomic-resolution imaging of the polar (0001?) surface of LiNbO <sub>3</sub> in aqueous solution by frequency modulation atomic force microscopy Atomic-resolution imaging of the polar (0001?) surface of LiNbO <sub>3</sub> in aqueous solution by frequency modulation atomic force microscopy Atomic-resolution imaging of the polar (0001?) surface of LiNbO <sub>3</sub> in aqueous solution by frequency modulation atomic force microscopy Physical Review B - Condensed Matter and Materials Physics, 86, 7, 75468 Physical Review B - Condensed Matter and Materials Physics, 86, 7, 75468 Physical Review B - Condensed Matter and Materials Physics, 86, 7, 75468 2012/08/29 Refereed English Research paper(scientific journal) Disclose to all
Y. Naitoh; S. Takeshita; D. Ishida; E. Ohmura; K. Kobayashi; H. Yamada; Y. Majima Y. Naitoh; S. Takeshita; D. Ishida; E. Ohmura; K. Kobayashi; H. Yamada; Y. Majima Y. Naitoh; S. Takeshita; D. Ishida; E. Ohmura; K. Kobayashi; H. Yamada; Y. Majima Resistive switching effects in metallic nanogap electrode fabricated by electroless gold plating Resistive switching effects in metallic nanogap electrode fabricated by electroless gold plating Resistive switching effects in metallic nanogap electrode fabricated by electroless gold plating Applied Physics Express, 5, 8, 85201 Applied Physics Express, 5, 8, 85201 Applied Physics Express, 5, 8, 85201 2012/08 Refereed English Research paper(scientific journal) Disclose to all
T. Kimura; Y. Miyato; K. Kobayashi; H. Yamada; K. Matsushige T. Kimura; Y. Miyato; K. Kobayashi; H. Yamada; K. Matsushige T. Kimura; Y. Miyato; K. Kobayashi; H. Yamada; K. Matsushige Investigations of local electrical characteristics of a pentacene thin film by point-contact current imaging atomic force microscopy Investigations of local electrical characteristics of a pentacene thin film by point-contact current imaging atomic force microscopy Investigations of local electrical characteristics of a pentacene thin film by point-contact current imaging atomic force microscopy Japanese Journal of Applied Physics, 51, 8, 08KB05 Japanese Journal of Applied Physics, 51, 8, 08KB05 Japanese Journal of Applied Physics, 51, 8, 08KB05 2012/08 Refereed English Research paper(scientific journal) Disclose to all
Y. Araki; K. Tsukamoto; N. Oyabu; K. Kobayashi; H. Yamada Y. Araki; K. Tsukamoto; N. Oyabu; K. Kobayashi; H. Yamada Y. Araki; K. Tsukamoto; N. Oyabu; K. Kobayashi; H. Yamada Atomic-resolution imaging of aragonite (001) surface in water by frequency modulation atomic force microscopy Atomic-resolution imaging of aragonite (001) surface in water by frequency modulation atomic force microscopy Atomic-resolution imaging of aragonite (001) surface in water by frequency modulation atomic force microscopy Japanese Journal of Applied Physics, 51, 8, 08KB09 Japanese Journal of Applied Physics, 51, 8, 08KB09 Japanese Journal of Applied Physics, 51, 8, 08KB09 2012/08 Refereed English Research paper(scientific journal) Disclose to all
K. Kaisei; K. Kobayashi; K. Matsushige; H. Yamada K. Kaisei; K. Kobayashi; K. Matsushige; H. Yamada K. Kaisei; K. Kobayashi; K. Matsushige; H. Yamada Fabrication of glycerol liquid droplet array by nano-inkjet printing method Fabrication of glycerol liquid droplet array by nano-inkjet printing method Fabrication of glycerol liquid droplet array by nano-inkjet printing method Journal of Applied Physics, 111, 7, 74319 Journal of Applied Physics, 111, 7, 74319 Journal of Applied Physics, 111, 7, 74319 2012/04/01 Refereed English Research paper(scientific journal) Disclose to all
S.B. Sadale; K. Noda; K. Kobayashi; H. Yamada; K. Matsushige S.B. Sadale; K. Noda; K. Kobayashi; H. Yamada; K. Matsushige S.B. Sadale; K. Noda; K. Kobayashi; H. Yamada; K. Matsushige Real-time investigation on photocatalytic oxidation of gaseous methanol with nanocrystalline WO <sub>3</sub>-TiO <sub>2</sub> composite films Real-time investigation on photocatalytic oxidation of gaseous methanol with nanocrystalline WO <sub>3</sub>-TiO <sub>2</sub> composite films Real-time investigation on photocatalytic oxidation of gaseous methanol with nanocrystalline WO <sub>3</sub>-TiO <sub>2</sub> composite films Thin Solid Films, 520, 10, 3847-3851 Thin Solid Films, 520, 10, 3847-3851 Thin Solid Films, 520, 10, 3847-3851 2012/03/01 Refereed English Research paper(scientific journal) Disclose to all
Y. Jeong; M. Hirade; R. Kokawa; H. Yamada; K. Kobayashi; N. Oyabu; T. Arai; A. Sasahara; M. Tomitori Y. Jeong; M. Hirade; R. Kokawa; H. Yamada; K. Kobayashi; N. Oyabu; T. Arai; A. Sasahara; M. Tomitori Y. Jeong; M. Hirade; R. Kokawa; H. Yamada; K. Kobayashi; N. Oyabu; T. Arai; A. Sasahara; M. Tomitori Local interaction imaging by SiGe quantum dot probe Local interaction imaging by SiGe quantum dot probe Local interaction imaging by SiGe quantum dot probe Current Applied Physics, 12, 2, 581-584 Current Applied Physics, 12, 2, 581-584 Current Applied Physics, 12, 2, 581-584 2012/03 Refereed English Research paper(scientific journal) Disclose to all
K. Suzuki; N. Oyabu; K. Kobayashi; K. Matsushige; H. Yamada K. Suzuki; N. Oyabu; K. Kobayashi; K. Matsushige; H. Yamada K. Suzuki; N. Oyabu; K. Kobayashi; K. Matsushige; H. Yamada Atomic-resolution imaging of graphite-water interface by frequency modulation atomic force microscopy Atomic-resolution imaging of graphite-water interface by frequency modulation atomic force microscopy Atomic-resolution imaging of graphite-water interface by frequency modulation atomic force microscopy Applied Physics Express, 4, 12, 125102 Applied Physics Express, 4, 12, 125102 Applied Physics Express, 4, 12, 125102 2011/12 Refereed English Research paper(scientific journal) Disclose to all
S. Rode; R. Stark; J. Lubbe; L. Troger; J. Schutte; K. Umeda; K. Kobayashi; H. Yamada; A. Kuhnle S. Rode; R. Stark; J. Lubbe; L. Troger; J. Schutte; K. Umeda; K. Kobayashi; H. Yamada; A. Kuhnle S. Rode; R. Stark; J. Lubbe; L. Troger; J. Schutte; K. Umeda; K. Kobayashi; H. Yamada; A. Kuhnle Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment Review of Scientific Instruments, 82, 7, 73703 Review of Scientific Instruments, 82, 7, 73703 Review of Scientific Instruments, 82, 7, 73703 2011/07 Refereed English Research paper(scientific journal) Disclose to all
S. Katori; N. Satoh; M. Yahiro; K. Kobayashi; H. Yamada; K. Matsushige; S. Fujita S. Katori; N. Satoh; M. Yahiro; K. Kobayashi; H. Yamada; K. Matsushige; S. Fujita S. Katori; N. Satoh; M. Yahiro; K. Kobayashi; H. Yamada; K. Matsushige; S. Fujita Surface potential measurement of tris(8-hydroxyquinolinato)aluminum and bis[n-(1-Naphthyl)-N-Phenyl]benzidine thin films fabricated on indium-tin oxide by kelvin probe force microscopy Surface potential measurement of tris(8-hydroxyquinolinato)aluminum and bis[n-(1-Naphthyl)-N-Phenyl]benzidine thin films fabricated on indium-tin oxide by kelvin probe force microscopy Surface potential measurement of tris(8-hydroxyquinolinato)aluminum and bis[n-(1-Naphthyl)-N-Phenyl]benzidine thin films fabricated on indium-tin oxide by kelvin probe force microscopy Japanese Journal of Applied Physics, 50, 7, 71601 Japanese Journal of Applied Physics, 50, 7, 71601 Japanese Journal of Applied Physics, 50, 7, 71601 2011/07 Refereed English Research paper(scientific journal) Disclose to all
N. Satoh; S. Katori; K. Kobayashi; S. Watanabe; T. Fujii; K. Matsushige; H. Yamada N. Satoh; S. Katori; K. Kobayashi; S. Watanabe; T. Fujii; K. Matsushige; H. Yamada N. Satoh; S. Katori; K. Kobayashi; S. Watanabe; T. Fujii; K. Matsushige; H. Yamada Surface potential measurement of organic thin film on metal electrodes by dynamic force microscopy using a piezoelectric cantilever Surface potential measurement of organic thin film on metal electrodes by dynamic force microscopy using a piezoelectric cantilever Surface potential measurement of organic thin film on metal electrodes by dynamic force microscopy using a piezoelectric cantilever Journal of Applied Physics, 109, 11, 114306 Journal of Applied Physics, 109, 11, 114306 Journal of Applied Physics, 109, 11, 114306 2011/06/01 Refereed English Research paper(scientific journal) Disclose to all
K. Kaisei; N. Satoh; K. Kobayashi; K. Matsushige; H. Yamada K. Kaisei; N. Satoh; K. Kobayashi; K. Matsushige; H. Yamada K. Kaisei; N. Satoh; K. Kobayashi; K. Matsushige; H. Yamada Nanoscale liquid droplet deposition using the ultrasmall aperture on a dynamic mode AFM tip Nanoscale liquid droplet deposition using the ultrasmall aperture on a dynamic mode AFM tip Nanoscale liquid droplet deposition using the ultrasmall aperture on a dynamic mode AFM tip Nanotechnology, 22, 17, 175301 Nanotechnology, 22, 17, 175301 Nanotechnology, 22, 17, 175301 2011/04/29 Refereed English Research paper(scientific journal) Disclose to all
K. Nishi; Y. Hosokawa; K. Kobayashi; K. Matsushige; H. Yamada K. Nishi; Y. Hosokawa; K. Kobayashi; K. Matsushige; H. Yamada K. Nishi; Y. Hosokawa; K. Kobayashi; K. Matsushige; H. Yamada Highly sensitive electrostatic force detection using small amplitude frequency-modulation atomic force microscopy in the second flexural mode Highly sensitive electrostatic force detection using small amplitude frequency-modulation atomic force microscopy in the second flexural mode Highly sensitive electrostatic force detection using small amplitude frequency-modulation atomic force microscopy in the second flexural mode e-Journal of Surface Science and Nanotechnology, 9, 146-152 e-Journal of Surface Science and Nanotechnology, 9, 146-152 e-Journal of Surface Science and Nanotechnology, 9, 146-152 2011/04 Refereed English Research paper(scientific journal) Disclose to all
M. Ito; Y. Hosokawa; R. Nishi; Y. Miyato; K. Kobayashi; K. Matsushige; H. Yamada M. Ito; Y. Hosokawa; R. Nishi; Y. Miyato; K. Kobayashi; K. Matsushige; H. Yamada M. Ito; Y. Hosokawa; R. Nishi; Y. Miyato; K. Kobayashi; K. Matsushige; H. Yamada Effect of Trapped Charges on Local Potential Measurement of Carbon Nanotubes Using Frequency-Modulation Kelvin-Probe Force Microscopy Effect of Trapped Charges on Local Potential Measurement of Carbon Nanotubes Using Frequency-Modulation Kelvin-Probe Force Microscopy Effect of Trapped Charges on Local Potential Measurement of Carbon Nanotubes Using Frequency-Modulation Kelvin-Probe Force Microscopy e-Journal of Surface Science and Nanotechnology, 9, 210-214 e-Journal of Surface Science and Nanotechnology, 9, 210-214 e-Journal of Surface Science and Nanotechnology, 9, 210-214 2011/04 Refereed English Research paper(scientific journal) Disclose to all
K. Kobayashi; H. Yamada; K. Matsushige K. Kobayashi; H. Yamada; K. Matsushige K. Kobayashi; H. Yamada; K. Matsushige Reduction of frequency noise and frequency shift by phase shifting elements in frequency modulation atomic force microscopy Reduction of frequency noise and frequency shift by phase shifting elements in frequency modulation atomic force microscopy Reduction of frequency noise and frequency shift by phase shifting elements in frequency modulation atomic force microscopy Review of Scientific Instruments, 82, 3, 33702 Review of Scientific Instruments, 82, 3, 33702 Review of Scientific Instruments, 82, 3, 33702 2011/03 Refereed English Research paper(scientific journal) Disclose to all
E. Tsunemi; K. Kobayashi; K. Matsushige; H. Yamada E. Tsunemi; K. Kobayashi; K. Matsushige; H. Yamada E. Tsunemi; K. Kobayashi; K. Matsushige; H. Yamada Development of dual-probe atomic force microscopy system using optical beam deflection sensors with obliquely incident laser beams Development of dual-probe atomic force microscopy system using optical beam deflection sensors with obliquely incident laser beams Development of dual-probe atomic force microscopy system using optical beam deflection sensors with obliquely incident laser beams Review of Scientific Instruments, 82, 3, 33708 Review of Scientific Instruments, 82, 3, 33708 Review of Scientific Instruments, 82, 3, 33708 2011/03 Refereed English Research paper(scientific journal) Disclose to all
T. Mizukami; Y. Miyato; K. Kobayashi; K. Matsushige; H. Yamada T. Mizukami; Y. Miyato; K. Kobayashi; K. Matsushige; H. Yamada T. Mizukami; Y. Miyato; K. Kobayashi; K. Matsushige; H. Yamada Resistive switching effects in single metallic tunneling junction with nanometer-scale gap Resistive switching effects in single metallic tunneling junction with nanometer-scale gap Resistive switching effects in single metallic tunneling junction with nanometer-scale gap Applied Physics Letters, 98, 8, 83120 Applied Physics Letters, 98, 8, 83120 Applied Physics Letters, 98, 8, 83120 2011/02/21 Refereed English Research paper(scientific journal) Disclose to all
D. Kiracofe; K. Kobayashi; A. Labuda; A. Raman; H. Yamada D. Kiracofe; K. Kobayashi; A. Labuda; A. Raman; H. Yamada D. Kiracofe; K. Kobayashi; A. Labuda; A. Raman; H. Yamada High efficiency laser photothermal excitation of microcantilever vibrations in air and liquids High efficiency laser photothermal excitation of microcantilever vibrations in air and liquids High efficiency laser photothermal excitation of microcantilever vibrations in air and liquids Review of Scientific Instruments, 82, 1, 13702 Review of Scientific Instruments, 82, 1, 13702 Review of Scientific Instruments, 82, 1, 13702 2011/01 Refereed English Research paper(scientific journal) Disclose to all
Y. Hosokawa; K. Kobayashi; N. Oyabu; K. Matsushige; H. Yamada Y. Hosokawa; K. Kobayashi; N. Oyabu; K. Matsushige; H. Yamada Y. Hosokawa; K. Kobayashi; N. Oyabu; K. Matsushige; H. Yamada Erratum: A procedure to determine the optimum imaging parameters for atomic/molecular resolution frequency modulation atomic force microscopy (Review of Scientific Instruments (2010) 81 (093701)) Erratum: A procedure to determine the optimum imaging parameters for atomic/molecular resolution frequency modulation atomic force microscopy (Review of Scientific Instruments (2010) 81 (093701)) Erratum: A procedure to determine the optimum imaging parameters for atomic/molecular resolution frequency modulation atomic force microscopy (Review of Scientific Instruments (2010) 81 (093701)) Review of Scientific Instruments, 82, 1 Review of Scientific Instruments, 82, 1 Review of Scientific Instruments, 82, 1 2011/01 Refereed English Research paper(scientific journal) Disclose to all
A. Labuda; K. Kobayashi; D. Kiracofe; K. Suzuki; P.H. Grutter; H. Yamada A. Labuda; K. Kobayashi; D. Kiracofe; K. Suzuki; P.H. Grutter; H. Yamada A. Labuda; K. Kobayashi; D. Kiracofe; K. Suzuki; P.H. Grutter; H. Yamada Comparison of photothermal and piezoacoustic excitation methods for frequency and phase modulation atomic force microscopy in liquid environments Comparison of photothermal and piezoacoustic excitation methods for frequency and phase modulation atomic force microscopy in liquid environments Comparison of photothermal and piezoacoustic excitation methods for frequency and phase modulation atomic force microscopy in liquid environments AIP Advances, 1, 2, 22136 AIP Advances, 1, 2, 22136 AIP Advances, 1, 2, 22136 2011 Refereed English Research paper(scientific journal) Disclose to all
Y. Hosokawa; K. Kobayashi; N. Oyabu; K. Matsushige; H. Yamada Y. Hosokawa; K. Kobayashi; N. Oyabu; K. Matsushige; H. Yamada Y. Hosokawa; K. Kobayashi; N. Oyabu; K. Matsushige; H. Yamada A procedure to determine the optimum imaging parameters for atomic/molecular resolution frequency modulation atomic force microscopy A procedure to determine the optimum imaging parameters for atomic/molecular resolution frequency modulation atomic force microscopy A procedure to determine the optimum imaging parameters for atomic/molecular resolution frequency modulation atomic force microscopy Review of Scientific Instruments, 81, 9, 93701 Review of Scientific Instruments, 81, 9, 93701 Review of Scientific Instruments, 81, 9, 93701 2010/09 Refereed English Research paper(scientific journal) Disclose to all
M. Hirose; E. Tsunemi; K. Kobayashi; H. Yamada; K. Matsushige M. Hirose; E. Tsunemi; K. Kobayashi; H. Yamada; K. Matsushige M. Hirose; E. Tsunemi; K. Kobayashi; H. Yamada; K. Matsushige Investigations of local electrical properties of pentacene thin films by dual-probe atomic force microscopy Investigations of local electrical properties of pentacene thin films by dual-probe atomic force microscopy Investigations of local electrical properties of pentacene thin films by dual-probe atomic force microscopy Japanese Journal of Applied Physics, 49, 8, 08LB10 Japanese Journal of Applied Physics, 49, 8, 08LB10 Japanese Journal of Applied Physics, 49, 8, 08LB10 2010/08 Refereed English Research paper(scientific journal) Disclose to all
K. Suzuki; S.-I. Kitamura; S. Tanaka; K. Kobayashi; H. Yamada K. Suzuki; S.-I. Kitamura; S. Tanaka; K. Kobayashi; H. Yamada K. Suzuki; S.-I. Kitamura; S. Tanaka; K. Kobayashi; H. Yamada Development of high-resolution imaging of solid-liquid interface by frequency modulation atomic force microscopy Development of high-resolution imaging of solid-liquid interface by frequency modulation atomic force microscopy Development of high-resolution imaging of solid-liquid interface by frequency modulation atomic force microscopy Japanese Journal of Applied Physics, 49, 8, 08LB12 Japanese Journal of Applied Physics, 49, 8, 08LB12 Japanese Journal of Applied Physics, 49, 8, 08LB12 2010/08 Refereed English Research paper(scientific journal) Disclose to all
N. Satoh; T. Fukuma; K. Kobayashi; S. Watanabe; T. Fujii; K. Matsushige; H. Yamada N. Satoh; T. Fukuma; K. Kobayashi; S. Watanabe; T. Fujii; K. Matsushige; H. Yamada N. Satoh; T. Fukuma; K. Kobayashi; S. Watanabe; T. Fujii; K. Matsushige; H. Yamada Near-field light detection by conservative and dissipative force modulation methods using a piezoelectric cantilever Near-field light detection by conservative and dissipative force modulation methods using a piezoelectric cantilever Near-field light detection by conservative and dissipative force modulation methods using a piezoelectric cantilever Applied Physics Letters, 96, 23, 233104 Applied Physics Letters, 96, 23, 233104 Applied Physics Letters, 96, 23, 233104 2010/06/07 Refereed English Research paper(scientific journal) Disclose to all
K.-I. Umeda; N. Oyabu; K. Kobayashi; Y. Hirata; K. Matsushige; H. Yamada K.-I. Umeda; N. Oyabu; K. Kobayashi; Y. Hirata; K. Matsushige; H. Yamada K.-I. Umeda; N. Oyabu; K. Kobayashi; Y. Hirata; K. Matsushige; H. Yamada High-resolution frequency-modulation atomic force microscopy in liquids using electrostatic excitation method High-resolution frequency-modulation atomic force microscopy in liquids using electrostatic excitation method High-resolution frequency-modulation atomic force microscopy in liquids using electrostatic excitation method Applied Physics Express, 3, 6, 65205 Applied Physics Express, 3, 6, 65205 Applied Physics Express, 3, 6, 65205 2010/06 Refereed English Research paper(scientific journal) Disclose to all
K. Kaisei; K. Kobayashi; K. Matsushige; H. Yamada K. Kaisei; K. Kobayashi; K. Matsushige; H. Yamada K. Kaisei; K. Kobayashi; K. Matsushige; H. Yamada Ionic liquid thin film fabrication using nano-inkjet printing method Ionic liquid thin film fabrication using nano-inkjet printing method Ionic liquid thin film fabrication using nano-inkjet printing method Japanese Journal of Applied Physics, 49, 6, 06GH02 Japanese Journal of Applied Physics, 49, 6, 06GH02 Japanese Journal of Applied Physics, 49, 6, 06GH02 2010/06 Refereed English Research paper(scientific journal) Disclose to all
K. Kimura; S. Ido; N. Oyabu; K. Kobayashi; Y. Hirata; T. Imai; H. Yamada K. Kimura; S. Ido; N. Oyabu; K. Kobayashi; Y. Hirata; T. Imai; H. Yamada K. Kimura; S. Ido; N. Oyabu; K. Kobayashi; Y. Hirata; T. Imai; H. Yamada Visualizing water molecule distribution by atomic force microscopy Visualizing water molecule distribution by atomic force microscopy Visualizing water molecule distribution by atomic force microscopy Journal of Chemical Physics, 132, 19, 194705 Journal of Chemical Physics, 132, 19, 194705 Journal of Chemical Physics, 132, 19, 194705 2010/05/21 Refereed English Research paper(scientific journal) Disclose to all
E. Tsunemi; K. Kobayashi; K. Matsushige; H. Yamada E. Tsunemi; K. Kobayashi; K. Matsushige; H. Yamada E. Tsunemi; K. Kobayashi; K. Matsushige; H. Yamada Visualization of anisotropic conductance in polydiacetylene crystal by dual-probe frequency-modulation atomic force microscopy/Kelvin-probe force microscopy Visualization of anisotropic conductance in polydiacetylene crystal by dual-probe frequency-modulation atomic force microscopy/Kelvin-probe force microscopy Visualization of anisotropic conductance in polydiacetylene crystal by dual-probe frequency-modulation atomic force microscopy/Kelvin-probe force microscopy Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 28, 3, C4D24-C4D28 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 28, 3, C4D24-C4D28 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 28, 3, C4D24-C4D28 2010/05 Refereed English Research paper(scientific journal) Disclose to all
K. Nagashima; M. Abe; S. Morita; N. Oyabu; K. Kobayashi; H. Yamada; M. Ohta; R. Kokawa; R. Murai; H. Matsumura; H. Adachi; K. Takano; S. Murakami; T. Inoue; Y. Mori K. Nagashima; M. Abe; S. Morita; N. Oyabu; K. Kobayashi; H. Yamada; M. Ohta; R. Kokawa; R. Murai; H. Matsumura; H. Adachi; K. Takano; S. Murakami; T. Inoue; Y. Mori K. Nagashima; M. Abe; S. Morita; N. Oyabu; K. Kobayashi; H. Yamada; M. Ohta; R. Kokawa; R. Murai; H. Matsumura; H. Adachi; K. Takano; S. Murakami; T. Inoue; Y. Mori Molecular resolution investigation of tetragonal lysozyme (110) face in liquid by frequency-modulation atomic force microscopy Molecular resolution investigation of tetragonal lysozyme (110) face in liquid by frequency-modulation atomic force microscopy Molecular resolution investigation of tetragonal lysozyme (110) face in liquid by frequency-modulation atomic force microscopy Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 28, 3, C4C11-C4C14 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 28, 3, C4C11-C4C14 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 28, 3, C4C11-C4C14 2010/05 Refereed English Research paper(scientific journal) Disclose to all
K. Kaisei; K. Kobayashi; K. Matsushige; H. Yamada K. Kaisei; K. Kobayashi; K. Matsushige; H. Yamada K. Kaisei; K. Kobayashi; K. Matsushige; H. Yamada Fabrication of ionic liquid thin film by nano-inkjet printing method using atomic force microscope cantilever tip Fabrication of ionic liquid thin film by nano-inkjet printing method using atomic force microscope cantilever tip Fabrication of ionic liquid thin film by nano-inkjet printing method using atomic force microscope cantilever tip Ultramicroscopy, 110, 6, 733-736 Ultramicroscopy, 110, 6, 733-736 Ultramicroscopy, 110, 6, 733-736 2010/05 Refereed English Research paper(scientific journal) Disclose to all
Y. Miyato; K. Kobayashi; K. Matsushige; H. Yamada Y. Miyato; K. Kobayashi; K. Matsushige; H. Yamada Y. Miyato; K. Kobayashi; K. Matsushige; H. Yamada Surface potential investigation of carbon nanotube field-effect transistor by point-by-point atomic force microscope potentiometry Surface potential investigation of carbon nanotube field-effect transistor by point-by-point atomic force microscope potentiometry Surface potential investigation of carbon nanotube field-effect transistor by point-by-point atomic force microscope potentiometry Japanese Journal of Applied Physics, 49, 2, 02BD03 Japanese Journal of Applied Physics, 49, 2, 02BD03 Japanese Journal of Applied Physics, 49, 2, 02BD03 2010/02 Refereed English Research paper(scientific journal) Disclose to all
K. Kaneko; Y. Miyato; K. Kobayashi; K. Matsushige; H. Yamada K. Kaneko; Y. Miyato; K. Kobayashi; K. Matsushige; H. Yamada K. Kaneko; Y. Miyato; K. Kobayashi; K. Matsushige; H. Yamada Position control and electrical characterization of single-walled carbon nanotubes debundled by density gradient ultracentrifugation Position control and electrical characterization of single-walled carbon nanotubes debundled by density gradient ultracentrifugation Position control and electrical characterization of single-walled carbon nanotubes debundled by density gradient ultracentrifugation Japanese Journal of Applied Physics, 49, 2, 02BD04 Japanese Journal of Applied Physics, 49, 2, 02BD04 Japanese Journal of Applied Physics, 49, 2, 02BD04 2010/02 Refereed English Research paper(scientific journal) Disclose to all
T. Ichii; T. Fukuma; T. Yoda; K. Kobayashi; K. Matsushige; H. Yamada T. Ichii; T. Fukuma; T. Yoda; K. Kobayashi; K. Matsushige; H. Yamada T. Ichii; T. Fukuma; T. Yoda; K. Kobayashi; K. Matsushige; H. Yamada Submolecular-scale investigations on metal-phthalocyanine monolayers by frequency modulation atomic force microscopy Submolecular-scale investigations on metal-phthalocyanine monolayers by frequency modulation atomic force microscopy Submolecular-scale investigations on metal-phthalocyanine monolayers by frequency modulation atomic force microscopy Journal of Applied Physics, 107, 2, 24315 Journal of Applied Physics, 107, 2, 24315 Journal of Applied Physics, 107, 2, 24315 2010/01/15 Refereed English Research paper(scientific journal) Disclose to all
I.B. Rietveld; K. Kobayashi; T. Honjo; K. Ishida; H. Yamada; K. Matsushige I.B. Rietveld; K. Kobayashi; T. Honjo; K. Ishida; H. Yamada; K. Matsushige I.B. Rietveld; K. Kobayashi; T. Honjo; K. Ishida; H. Yamada; K. Matsushige Electrospray induced ferroelectricity in poly(vinylidene fluoride) thin films Electrospray induced ferroelectricity in poly(vinylidene fluoride) thin films Electrospray induced ferroelectricity in poly(vinylidene fluoride) thin films Journal of Materials Chemistry, 20, 38, 8272-8278 Journal of Materials Chemistry, 20, 38, 8272-8278 Journal of Materials Chemistry, 20, 38, 8272-8278 2010 Refereed English Research paper(scientific journal) Disclose to all
T. Hiasa; K. Kimura; H. Onishi; M. Ohta; K. Watanabe; R. Kokawa; N. Oyabu; K. Kobayashi; H. Yamada T. Hiasa; K. Kimura; H. Onishi; M. Ohta; K. Watanabe; R. Kokawa; N. Oyabu; K. Kobayashi; H. Yamada T. Hiasa; K. Kimura; H. Onishi; M. Ohta; K. Watanabe; R. Kokawa; N. Oyabu; K. Kobayashi; H. Yamada Aqueous solution structure over α-Al<sub>2</sub>o<sub>3</sub>(0112) probed by frequency-modulation atomic force microscopy Aqueous solution structure over α-Al<sub>2</sub>o<sub>3</sub>(0112) probed by frequency-modulation atomic force microscopy Aqueous solution structure over α-Al<sub>2</sub>o<sub>3</sub>(0112) probed by frequency-modulation atomic force microscopy Journal of Physical Chemistry C, 114, 49, 21423-21426 Journal of Physical Chemistry C, 114, 49, 21423-21426 Journal of Physical Chemistry C, 114, 49, 21423-21426 2010 Refereed English Research paper(scientific journal) Disclose to all
K. Kobayashi; H. Yamada; K. Matsushige K. Kobayashi; H. Yamada; K. Matsushige K. Kobayashi; H. Yamada; K. Matsushige Erratum: Frequency noise in frequency modulation atomic force microscopy (Review of Scientific Instruments (2009) 80 (043708)) Erratum: Frequency noise in frequency modulation atomic force microscopy (Review of Scientific Instruments (2009) 80 (043708)) Erratum: Frequency noise in frequency modulation atomic force microscopy (Review of Scientific Instruments (2009) 80 (043708)) Review of Scientific Instruments, 81, 12 Review of Scientific Instruments, 81, 12 Review of Scientific Instruments, 81, 12 2010 Refereed English Research paper(scientific journal) Disclose to all
I.B. Rietveld; K. Kobayashi; H. Yamada; K. Matsushige I.B. Rietveld; K. Kobayashi; H. Yamada; K. Matsushige I.B. Rietveld; K. Kobayashi; H. Yamada; K. Matsushige Process parameters for fast production of ultra-thin polymer film with electrospray deposition under ambient conditions Process parameters for fast production of ultra-thin polymer film with electrospray deposition under ambient conditions Process parameters for fast production of ultra-thin polymer film with electrospray deposition under ambient conditions Journal of Colloid and Interface Science, 339, 2, 481-488 Journal of Colloid and Interface Science, 339, 2, 481-488 Journal of Colloid and Interface Science, 339, 2, 481-488 2009/11/15 Refereed English Research paper(scientific journal) Disclose to all
Y. Hosokawa; K. Kobayashi; K. Matsushige; H. Yamada Y. Hosokawa; K. Kobayashi; K. Matsushige; H. Yamada Y. Hosokawa; K. Kobayashi; K. Matsushige; H. Yamada Reproducible noncontact force spectroscopy for studying molecules Reproducible noncontact force spectroscopy for studying molecules Reproducible noncontact force spectroscopy for studying molecules Measurement Science and Technology, 20, 9, 97001 Measurement Science and Technology, 20, 9, 97001 Measurement Science and Technology, 20, 9, 97001 2009/09 Refereed English Research paper(scientific journal) Disclose to all
H. Yamada; K. Kobayashi; T. Fukuma; Y. Hirata; T. Kajita; K. Matsushige H. Yamada; K. Kobayashi; T. Fukuma; Y. Hirata; T. Kajita; K. Matsushige H. Yamada; K. Kobayashi; T. Fukuma; Y. Hirata; T. Kajita; K. Matsushige Molecular resolution imaging of protein molecules in liquid using frequency modulation atomic force microscopy Molecular resolution imaging of protein molecules in liquid using frequency modulation atomic force microscopy Molecular resolution imaging of protein molecules in liquid using frequency modulation atomic force microscopy Applied Physics Express, 2, 9, 95007 Applied Physics Express, 2, 9, 95007 Applied Physics Express, 2, 9, 95007 2009/09 Refereed English Research paper(scientific journal) Disclose to all
K. Yamasue; K. Kobayashi; H. Yamada; K. Matsushige; T. Hikihara K. Yamasue; K. Kobayashi; H. Yamada; K. Matsushige; T. Hikihara K. Yamasue; K. Kobayashi; H. Yamada; K. Matsushige; T. Hikihara Controlling chaos in dynamic-mode atomic force microscope Controlling chaos in dynamic-mode atomic force microscope Controlling chaos in dynamic-mode atomic force microscope Physics Letters, Section A: General, Atomic and Solid State Physics, 373, 35, 3140-3144 Physics Letters, Section A: General, Atomic and Solid State Physics, 373, 35, 3140-3144 Physics Letters, Section A: General, Atomic and Solid State Physics, 373, 35, 3140-3144 2009/08/24 Refereed English Research paper(scientific journal) Disclose to all
S.-I. Yamamoto; H. Yamada S.-I. Yamamoto; H. Yamada S.-I. Yamamoto; H. Yamada Nanoscale investigation of Au Islands-Ni film interactions by magnetic-force-controlled atomic force microscopy Nanoscale investigation of Au Islands-Ni film interactions by magnetic-force-controlled atomic force microscopy Nanoscale investigation of Au Islands-Ni film interactions by magnetic-force-controlled atomic force microscopy Japanese Journal of Applied Physics, 48, 8, 08JB05 Japanese Journal of Applied Physics, 48, 8, 08JB05 Japanese Journal of Applied Physics, 48, 8, 08JB05 2009/08 Refereed English Research paper(scientific journal) Disclose to all
T. Hiasa; K. Kimura; H. Onishi; M. Ohta; K. Watanabe; R. Kokawa; N. Oyabu; K. Kobayashi; H. Yamada T. Hiasa; K. Kimura; H. Onishi; M. Ohta; K. Watanabe; R. Kokawa; N. Oyabu; K. Kobayashi; H. Yamada T. Hiasa; K. Kimura; H. Onishi; M. Ohta; K. Watanabe; R. Kokawa; N. Oyabu; K. Kobayashi; H. Yamada Solution-TiO<sub>2</sub> interface probed by frequency-modulation atomic force microscopy Solution-TiO<sub>2</sub> interface probed by frequency-modulation atomic force microscopy Solution-TiO<sub>2</sub> interface probed by frequency-modulation atomic force microscopy Japanese Journal of Applied Physics, 48, 8, 08JB19 Japanese Journal of Applied Physics, 48, 8, 08JB19 Japanese Journal of Applied Physics, 48, 8, 08JB19 2009/08 Refereed English Research paper(scientific journal) Disclose to all
S. Kuwajima; S. Horie; T. Horiuchi; H. Yamada; K. Matsushige; K. Ishida S. Kuwajima; S. Horie; T. Horiuchi; H. Yamada; K. Matsushige; K. Ishida S. Kuwajima; S. Horie; T. Horiuchi; H. Yamada; K. Matsushige; K. Ishida Crystal and layer structures of ferroelectric oligomer thin films Crystal and layer structures of ferroelectric oligomer thin films Crystal and layer structures of ferroelectric oligomer thin films Macromolecules, 42, 9, 3353-3357 Macromolecules, 42, 9, 3353-3357 Macromolecules, 42, 9, 3353-3357 2009/05/12 Refereed English Research paper(scientific journal) Disclose to all
K. Kobayashi; H. Yamada; K. Matsushige K. Kobayashi; H. Yamada; K. Matsushige K. Kobayashi; H. Yamada; K. Matsushige Frequency noise in frequency modulation atomic force microscopy Frequency noise in frequency modulation atomic force microscopy Frequency noise in frequency modulation atomic force microscopy Review of Scientific Instruments, 80, 4, 43708 Review of Scientific Instruments, 80, 4, 43708 Review of Scientific Instruments, 80, 4, 43708 2009/04 Refereed English Research paper(scientific journal) Disclose to all
T. Ichii; Y. Hosokawa; K. Kobayashi; K. Matsushige; H. Yamada T. Ichii; Y. Hosokawa; K. Kobayashi; K. Matsushige; H. Yamada T. Ichii; Y. Hosokawa; K. Kobayashi; K. Matsushige; H. Yamada Molecular-resolution imaging of lead phthalocyanine molecules by small amplitude frequency modulation atomic force microscopy using second flexural mode Molecular-resolution imaging of lead phthalocyanine molecules by small amplitude frequency modulation atomic force microscopy using second flexural mode Molecular-resolution imaging of lead phthalocyanine molecules by small amplitude frequency modulation atomic force microscopy using second flexural mode Applied Physics Letters, 94, 13, 133110 Applied Physics Letters, 94, 13, 133110 Applied Physics Letters, 94, 13, 133110 2009/03/30 Refereed English Research paper(scientific journal) Disclose to all
S. Rode; N. Oyabu; K. Kobayashi; H. Yamada; A. K?hnle S. Rode; N. Oyabu; K. Kobayashi; H. Yamada; A. K?hnle S. Rode; N. Oyabu; K. Kobayashi; H. Yamada; A. K?hnle True atomic-resolution imaging of (1014) calcite in aqueous solution by frequency modulation atomic force microscopy True atomic-resolution imaging of (1014) calcite in aqueous solution by frequency modulation atomic force microscopy True atomic-resolution imaging of (1014) calcite in aqueous solution by frequency modulation atomic force microscopy Langmuir, 25, 5, 2850-2853 Langmuir, 25, 5, 2850-2853 Langmuir, 25, 5, 2850-2853 2009/03/03 Refereed English Research paper(scientific journal) Disclose to all
I.B. Rietveld; K. Kobayashi; H. Yamada; K. Matsushige I.B. Rietveld; K. Kobayashi; H. Yamada; K. Matsushige I.B. Rietveld; K. Kobayashi; H. Yamada; K. Matsushige Electrospray deposition producing ultra-thin polymer films with a regular surface structure Electrospray deposition producing ultra-thin polymer films with a regular surface structure Electrospray deposition producing ultra-thin polymer films with a regular surface structure Soft Matter, 5, 3, 593-598 Soft Matter, 5, 3, 593-598 Soft Matter, 5, 3, 593-598 2009 Refereed English Research paper(scientific journal) Disclose to all
Y. Hosokawa; T. Ichii; K. Kobayashi; K. Matsushige; H. Yamada Y. Hosokawa; T. Ichii; K. Kobayashi; K. Matsushige; H. Yamada Y. Hosokawa; T. Ichii; K. Kobayashi; K. Matsushige; H. Yamada Small amplitude frequency modulation atomic force microscopy of lead phthalocyanine molecules using cantilever with very high spring constant Small amplitude frequency modulation atomic force microscopy of lead phthalocyanine molecules using cantilever with very high spring constant Small amplitude frequency modulation atomic force microscopy of lead phthalocyanine molecules using cantilever with very high spring constant Japanese Journal of Applied Physics, 47, 7, 6125-6127 Japanese Journal of Applied Physics, 47, 7, 6125-6127 Japanese Journal of Applied Physics, 47, 7, 6125-6127 2008/07 Refereed English Research paper(scientific journal) Disclose to all
I.B. Rietveld; N. Suganuma; K. Kobayashi; H. Yamada; K. Matsushige I.B. Rietveld; N. Suganuma; K. Kobayashi; H. Yamada; K. Matsushige I.B. Rietveld; N. Suganuma; K. Kobayashi; H. Yamada; K. Matsushige Electrospray deposition of photoresist: A low impact method for the fabrication of multilayered films Electrospray deposition of photoresist: A low impact method for the fabrication of multilayered films Electrospray deposition of photoresist: A low impact method for the fabrication of multilayered films Macromolecular Materials and Engineering, 293, 5, 387-399 Macromolecular Materials and Engineering, 293, 5, 387-399 Macromolecular Materials and Engineering, 293, 5, 387-399 2008/05/15 Refereed English Research paper(scientific journal) Disclose to all
S. Nozaki; K. Ishida; A. Matsumoto; S. Horie; S. Kuwajima; H. Yamada; K. Matsushige S. Nozaki; K. Ishida; A. Matsumoto; S. Horie; S. Kuwajima; H. Yamada; K. Matsushige S. Nozaki; K. Ishida; A. Matsumoto; S. Horie; S. Kuwajima; H. Yamada; K. Matsushige Characterization of ferroelectric/metal interface under the repeated polarization switching Characterization of ferroelectric/metal interface under the repeated polarization switching Characterization of ferroelectric/metal interface under the repeated polarization switching Thin Solid Films, 516, 9, 2450-2453 Thin Solid Films, 516, 9, 2450-2453 Thin Solid Films, 516, 9, 2450-2453 2008/03/03 Refereed English Research paper(scientific journal) Disclose to all
K. Kimura; K. Kobayashi; H. Yamada; K. Matsushige K. Kimura; K. Kobayashi; H. Yamada; K. Matsushige K. Kimura; K. Kobayashi; H. Yamada; K. Matsushige Submolecular resolution viscoelastic imaging of a poly(p-toluene-sulfonate) single crystal using force modulation microscopy Submolecular resolution viscoelastic imaging of a poly(p-toluene-sulfonate) single crystal using force modulation microscopy Submolecular resolution viscoelastic imaging of a poly(p-toluene-sulfonate) single crystal using force modulation microscopy Nanotechnology, 19, 6, 65701 Nanotechnology, 19, 6, 65701 Nanotechnology, 19, 6, 65701 2008/02/13 Refereed English Research paper(scientific journal) Disclose to all
T. Nishio; Y. Miyato; K. Kobayashi; K. Matsushige; H. Yamada T. Nishio; Y. Miyato; K. Kobayashi; K. Matsushige; H. Yamada T. Nishio; Y. Miyato; K. Kobayashi; K. Matsushige; H. Yamada Piezoresistive properties of carbon nanotubes under radial force investigated by atomic force microscopy Piezoresistive properties of carbon nanotubes under radial force investigated by atomic force microscopy Piezoresistive properties of carbon nanotubes under radial force investigated by atomic force microscopy Applied Physics Letters, 92, 6, 63117 Applied Physics Letters, 92, 6, 63117 Applied Physics Letters, 92, 6, 63117 2008/02/11 Refereed English Research paper(scientific journal) Disclose to all
S. Horie; K. Ishlda; S. Kuwajima; K. Kobayashi; H. Yamada; K. Matsushige S. Horie; K. Ishlda; S. Kuwajima; K. Kobayashi; H. Yamada; K. Matsushige S. Horie; K. Ishlda; S. Kuwajima; K. Kobayashi; H. Yamada; K. Matsushige Effect of ferroelectric/metal interface structure on polarization reversal Effect of ferroelectric/metal interface structure on polarization reversal Effect of ferroelectric/metal interface structure on polarization reversal Japanese Journal of Applied Physics, 47, 2, 1259-1262 Japanese Journal of Applied Physics, 47, 2, 1259-1262 Japanese Journal of Applied Physics, 47, 2, 1259-1262 2008/02 Refereed English Research paper(scientific journal) Disclose to all
T. Nishio; Y. Miyato; K. Kobayashi; K. Ishida; K. Matsushige; H. Yamada T. Nishio; Y. Miyato; K. Kobayashi; K. Ishida; K. Matsushige; H. Yamada T. Nishio; Y. Miyato; K. Kobayashi; K. Ishida; K. Matsushige; H. Yamada The effect of local polarized domains of ferroelectric P(VDF/TrFE) copolymer thin film on a carbon nanotube field-effect transistor The effect of local polarized domains of ferroelectric P(VDF/TrFE) copolymer thin film on a carbon nanotube field-effect transistor The effect of local polarized domains of ferroelectric P(VDF/TrFE) copolymer thin film on a carbon nanotube field-effect transistor Nanotechnology, 19, 3, 35202 Nanotechnology, 19, 3, 35202 Nanotechnology, 19, 3, 35202 2008/01/23 Refereed English Research paper(scientific journal) Disclose to all
K. Kimura; K. Kobayashi; H. Yamada; K. Matsushige K. Kimura; K. Kobayashi; H. Yamada; K. Matsushige K. Kimura; K. Kobayashi; H. Yamada; K. Matsushige High resolution molecular chain imaging of a poly(vinylidenefluoride- trifluoroethylene) crystal using force modulation microscopy High resolution molecular chain imaging of a poly(vinylidenefluoride- trifluoroethylene) crystal using force modulation microscopy High resolution molecular chain imaging of a poly(vinylidenefluoride- trifluoroethylene) crystal using force modulation microscopy Nanotechnology, 18, 30, 305504 Nanotechnology, 18, 30, 305504 Nanotechnology, 18, 30, 305504 2007/08 Refereed English Research paper(scientific journal) Disclose to all
N. Satoh; E. Tsunemi; Y. Miyato; K. Kobayashi; S. Watanabe; T. Fujii; K. Matsushige; H. Yamada N. Satoh; E. Tsunemi; Y. Miyato; K. Kobayashi; S. Watanabe; T. Fujii; K. Matsushige; H. Yamada N. Satoh; E. Tsunemi; Y. Miyato; K. Kobayashi; S. Watanabe; T. Fujii; K. Matsushige; H. Yamada Multi-probe atomic force microscopy using piezoelectric cantilevers Multi-probe atomic force microscopy using piezoelectric cantilevers Multi-probe atomic force microscopy using piezoelectric cantilevers Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 46, 8B, 5543-5547 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 46, 8B, 5543-5547 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 46, 8B, 5543-5547 2007/08 Refereed English Research paper(scientific journal) Disclose to all
E. Tsunemi; N. Satoh; Y. Mlyato; K. Kobayashi; K. Matsushige; H. Yamada E. Tsunemi; N. Satoh; Y. Mlyato; K. Kobayashi; K. Matsushige; H. Yamada E. Tsunemi; N. Satoh; Y. Mlyato; K. Kobayashi; K. Matsushige; H. Yamada Multi-probe atomic force microscopy with optical beam deflection method Multi-probe atomic force microscopy with optical beam deflection method Multi-probe atomic force microscopy with optical beam deflection method Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 46, 8B, 5636-5638 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 46, 8B, 5636-5638 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 46, 8B, 5636-5638 2007/08 Refereed English Research paper(scientific journal) Disclose to all
K. Kimura; K. Kobayashi; H. Yamada; K. Matsushige K. Kimura; K. Kobayashi; H. Yamada; K. Matsushige K. Kimura; K. Kobayashi; H. Yamada; K. Matsushige Investigation of molecular chain orientation change of polymer crystals in phase transitions by friction anisotropy measurement Investigation of molecular chain orientation change of polymer crystals in phase transitions by friction anisotropy measurement Investigation of molecular chain orientation change of polymer crystals in phase transitions by friction anisotropy measurement Langmuir, 23, 9, 4740-4745 Langmuir, 23, 9, 4740-4745 Langmuir, 23, 9, 4740-4745 2007/04 Refereed English Research paper(scientific journal) Disclose to all
S. Morita; H. Yamada; T. Ando S. Morita; H. Yamada; T. Ando S. Morita; H. Yamada; T. Ando Japan AFM roadmap 2006 Japan AFM roadmap 2006 Japan AFM roadmap 2006 Nanotechnology, 18, 8, 84001 Nanotechnology, 18, 8, 84001 Nanotechnology, 18, 8, 84001 2007/02 Refereed English Research paper(scientific journal) Disclose to all
Y. Miyato; K. Kobayashi; K. Matsushige; H. Yamada Y. Miyato; K. Kobayashi; K. Matsushige; H. Yamada Y. Miyato; K. Kobayashi; K. Matsushige; H. Yamada Surface potential investigation on single wall carbon nanotubes by Kelvin probe force microscopy and atomic force microscope potentiometry Surface potential investigation on single wall carbon nanotubes by Kelvin probe force microscopy and atomic force microscope potentiometry Surface potential investigation on single wall carbon nanotubes by Kelvin probe force microscopy and atomic force microscope potentiometry Nanotechnology, 18, 8, 84008 Nanotechnology, 18, 8, 84008 Nanotechnology, 18, 8, 84008 2007/02 Refereed English Research paper(scientific journal) Disclose to all
K. Kimura; K. Kobayashi; K. Matsushige; H. Yamada K. Kimura; K. Kobayashi; K. Matsushige; H. Yamada K. Kimura; K. Kobayashi; K. Matsushige; H. Yamada Improving sensitivity in electrostatic force detection utilizing cantilever with tailored resonance modes Improving sensitivity in electrostatic force detection utilizing cantilever with tailored resonance modes Improving sensitivity in electrostatic force detection utilizing cantilever with tailored resonance modes Applied Physics Letters, 90, 5, 53113 Applied Physics Letters, 90, 5, 53113 Applied Physics Letters, 90, 5, 53113 2007 Refereed English Research paper(scientific journal) Disclose to all
K. Kimura; K. Kobayashi; K. Matsushige; K. Usuda; H. Yamada K. Kimura; K. Kobayashi; K. Matsushige; K. Usuda; H. Yamada K. Kimura; K. Kobayashi; K. Matsushige; K. Usuda; H. Yamada Noncontact-mode scanning capacitance force microscopy towards quantitative two-dimensional carrier profiling on semiconductor devices Noncontact-mode scanning capacitance force microscopy towards quantitative two-dimensional carrier profiling on semiconductor devices Noncontact-mode scanning capacitance force microscopy towards quantitative two-dimensional carrier profiling on semiconductor devices Applied Physics Letters, 90, 8, 83101 Applied Physics Letters, 90, 8, 83101 Applied Physics Letters, 90, 8, 83101 2007 Refereed English Research paper(scientific journal) Disclose to all
A. Matsumoto; S. Horie; H. Yamada; K. Matsushige; S. Kuwajima; K. Ishida A. Matsumoto; S. Horie; H. Yamada; K. Matsushige; S. Kuwajima; K. Ishida A. Matsumoto; S. Horie; H. Yamada; K. Matsushige; S. Kuwajima; K. Ishida Ferro- and piezoelectric properties of vinylidene fluoride oligomer thin film fabricated on flexible polymer film Ferro- and piezoelectric properties of vinylidene fluoride oligomer thin film fabricated on flexible polymer film Ferro- and piezoelectric properties of vinylidene fluoride oligomer thin film fabricated on flexible polymer film Applied Physics Letters, 90, 20, 202906 Applied Physics Letters, 90, 20, 202906 Applied Physics Letters, 90, 20, 202906 2007 Refereed English Research paper(scientific journal) Disclose to all
S. Horie; K. Noda; H. Yamada; K. Matsushige; K. Ishida; S. Kuwajima S. Horie; K. Noda; H. Yamada; K. Matsushige; K. Ishida; S. Kuwajima S. Horie; K. Noda; H. Yamada; K. Matsushige; K. Ishida; S. Kuwajima Flexible programmable logic gate using organic ferroelectric multilayer Flexible programmable logic gate using organic ferroelectric multilayer Flexible programmable logic gate using organic ferroelectric multilayer Applied Physics Letters, 91, 19, 193506 Applied Physics Letters, 91, 19, 193506 Applied Physics Letters, 91, 19, 193506 2007 Refereed English Research paper(scientific journal) Disclose to all
I.B. Rietveld; K. Kobayashi; H. Yamada; K. Matsushige I.B. Rietveld; K. Kobayashi; H. Yamada; K. Matsushige I.B. Rietveld; K. Kobayashi; H. Yamada; K. Matsushige Electrospray deposition, model, and experiment: Toward general control of film morphology Electrospray deposition, model, and experiment: Toward general control of film morphology Electrospray deposition, model, and experiment: Toward general control of film morphology Journal of Physical Chemistry B, 110, 46, 23351-23364 Journal of Physical Chemistry B, 110, 46, 23351-23364 Journal of Physical Chemistry B, 110, 46, 23351-23364 2006/11/23 Refereed English Research paper(scientific journal) Disclose to all
I.B. Rietveld; K. Kobayashi; H. Yamada; K. Matsushige I.B. Rietveld; K. Kobayashi; H. Yamada; K. Matsushige I.B. Rietveld; K. Kobayashi; H. Yamada; K. Matsushige Morphology control of poly(vinylidene fluoride) thin film made with electrospray Morphology control of poly(vinylidene fluoride) thin film made with electrospray Morphology control of poly(vinylidene fluoride) thin film made with electrospray Journal of Colloid and Interface Science, 298, 2, 639-651 Journal of Colloid and Interface Science, 298, 2, 639-651 Journal of Colloid and Interface Science, 298, 2, 639-651 2006/06/15 Refereed English Research paper(scientific journal) Disclose to all
K. Kimura; K. Kobayashi; H. Yamada; T. Horiuchi; K. Ishida; K. Matsushige K. Kimura; K. Kobayashi; H. Yamada; T. Horiuchi; K. Ishida; K. Matsushige K. Kimura; K. Kobayashi; H. Yamada; T. Horiuchi; K. Ishida; K. Matsushige Study on orientation mechanisms of poly(vinylidenefluoride-trifluoroethylene) molecules aligned by atomic force microscopy Study on orientation mechanisms of poly(vinylidenefluoride-trifluoroethylene) molecules aligned by atomic force microscopy Study on orientation mechanisms of poly(vinylidenefluoride-trifluoroethylene) molecules aligned by atomic force microscopy Applied Surface Science, 252, 15, 5489-5494 Applied Surface Science, 252, 15, 5489-5494 Applied Surface Science, 252, 15, 5489-5494 2006/05/30 Refereed English Research paper(scientific journal) Disclose to all
K. Kimura; K. Kobayashi; H. Yamada; K. Matsushige; K. Usuda K. Kimura; K. Kobayashi; H. Yamada; K. Matsushige; K. Usuda K. Kimura; K. Kobayashi; H. Yamada; K. Matsushige; K. Usuda Two-dimensional carrier profiling on operating Si metal-oxide semiconductor field-effect transistor by scanning capacitance microscopy Two-dimensional carrier profiling on operating Si metal-oxide semiconductor field-effect transistor by scanning capacitance microscopy Two-dimensional carrier profiling on operating Si metal-oxide semiconductor field-effect transistor by scanning capacitance microscopy Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 24, 3, 1371-1376 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 24, 3, 1371-1376 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 24, 3, 1371-1376 2006/05 Refereed English Research paper(scientific journal) Disclose to all
A. Matsumoto; H. Uemura; S. Kuwajima; K. Ishida; T. Horiuchi; H. Yamada; K. Matsusige A. Matsumoto; H. Uemura; S. Kuwajima; K. Ishida; T. Horiuchi; H. Yamada; K. Matsusige A. Matsumoto; H. Uemura; S. Kuwajima; K. Ishida; T. Horiuchi; H. Yamada; K. Matsusige Application for the infrared sensor using pyroelectric VDF oligomer Application for the infrared sensor using pyroelectric VDF oligomer Application for the infrared sensor using pyroelectric VDF oligomer Polymer Preprints, Japan, 55, 1, 1495- Polymer Preprints, Japan, 55, 1, 1495- Polymer Preprints, Japan, 55, 1, 1495- 2006 Refereed English Research paper(scientific journal) Disclose to all
S. Horie; K. Ishida; S. Kuwajima; T. Horiuchi; H. Yamada; K. Matsushige S. Horie; K. Ishida; S. Kuwajima; T. Horiuchi; H. Yamada; K. Matsushige S. Horie; K. Ishida; S. Kuwajima; T. Horiuchi; H. Yamada; K. Matsushige Electrode dependency of electric characteristics in organic ferroelectrics VDF oligomer Electrode dependency of electric characteristics in organic ferroelectrics VDF oligomer Electrode dependency of electric characteristics in organic ferroelectrics VDF oligomer Polymer Preprints, Japan, 55, 1, 1497- Polymer Preprints, Japan, 55, 1, 1497- Polymer Preprints, Japan, 55, 1, 1497- 2006 Refereed English Research paper(scientific journal) Disclose to all
T. Fukuma; K. Kimura; K. Kobayashi; K. Matsushige; H. Yamada T. Fukuma; K. Kimura; K. Kobayashi; K. Matsushige; H. Yamada T. Fukuma; K. Kimura; K. Kobayashi; K. Matsushige; H. Yamada Frequency-modulation atomic force microscopy at high cantilever resonance frequencies using the heterodyne optical beam deflection method Frequency-modulation atomic force microscopy at high cantilever resonance frequencies using the heterodyne optical beam deflection method Frequency-modulation atomic force microscopy at high cantilever resonance frequencies using the heterodyne optical beam deflection method Review of Scientific Instruments, 76, 12 Review of Scientific Instruments, 76, 12 Review of Scientific Instruments, 76, 12 2005/12 Refereed English Research paper(scientific journal) Disclose to all
A.A. Farrell; T. Fukuma; T. Uchihashi; E.R. Kay; G. Bottari; D.A. Leigh; H. Yamada; S.P. Jarvis A.A. Farrell; T. Fukuma; T. Uchihashi; E.R. Kay; G. Bottari; D.A. Leigh; H. Yamada; S.P. Jarvis A.A. Farrell; T. Fukuma; T. Uchihashi; E.R. Kay; G. Bottari; D.A. Leigh; H. Yamada; S.P. Jarvis Conservative and dissipative force imaging of switchable rotaxanes with frequency-modulation atomic force microscopy Conservative and dissipative force imaging of switchable rotaxanes with frequency-modulation atomic force microscopy Conservative and dissipative force imaging of switchable rotaxanes with frequency-modulation atomic force microscopy Physical Review B - Condensed Matter and Materials Physics, 72, 12 Physical Review B - Condensed Matter and Materials Physics, 72, 12 Physical Review B - Condensed Matter and Materials Physics, 72, 12 2005/09 Refereed English Research paper(scientific journal) Disclose to all
T. Fukuma; K. Kobayashi; K. Matsushige; H. Yamada T. Fukuma; K. Kobayashi; K. Matsushige; H. Yamada T. Fukuma; K. Kobayashi; K. Matsushige; H. Yamada True atomic resolution in liquid by frequency-modulation atomic force microscopy True atomic resolution in liquid by frequency-modulation atomic force microscopy True atomic resolution in liquid by frequency-modulation atomic force microscopy Applied Physics Letters, 87, 3, 34101 Applied Physics Letters, 87, 3, 34101 Applied Physics Letters, 87, 3, 34101 2005/07/18 Refereed English Research paper(scientific journal) Disclose to all
T. Ichii; M. Urabe; T. Fukuma; K. Kobayashi; K. Matsushige; H. Yamada T. Ichii; M. Urabe; T. Fukuma; K. Kobayashi; K. Matsushige; H. Yamada T. Ichii; M. Urabe; T. Fukuma; K. Kobayashi; K. Matsushige; H. Yamada Self-assembled monolayers of alkanethiol and fluoroalkanethiol investigated by noncontact atomic force microscopy Self-assembled monolayers of alkanethiol and fluoroalkanethiol investigated by noncontact atomic force microscopy Self-assembled monolayers of alkanethiol and fluoroalkanethiol investigated by noncontact atomic force microscopy Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 44, 7B, 5378-5381 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 44, 7B, 5378-5381 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 44, 7B, 5378-5381 2005/07 Refereed English Research paper(scientific journal) Disclose to all
K. Kimura; K. Kobayashi; H. Yamada; K. Matsushige; K. Usuda K. Kimura; K. Kobayashi; H. Yamada; K. Matsushige; K. Usuda K. Kimura; K. Kobayashi; H. Yamada; K. Matsushige; K. Usuda Scanning capacitance force microscopy imaging of metal-oxide-semiconductor field effect transistors Scanning capacitance force microscopy imaging of metal-oxide-semiconductor field effect transistors Scanning capacitance force microscopy imaging of metal-oxide-semiconductor field effect transistors Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 23, 4, 1454-1458 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 23, 4, 1454-1458 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 23, 4, 1454-1458 2005/07 Refereed English Research paper(scientific journal) Disclose to all
T. Miyazaki; K. Kobayashi; K. Ishida; S. Hotta; T. Horiuchi; K. Matsushige; H. Yamada T. Miyazaki; K. Kobayashi; K. Ishida; S. Hotta; T. Horiuchi; K. Matsushige; H. Yamada T. Miyazaki; K. Kobayashi; K. Ishida; S. Hotta; T. Horiuchi; K. Matsushige; H. Yamada Increase in carrier mobility of organic ultrathin-film transistor with increasing molecular layers investigated by Kelvin probe force microscopy Increase in carrier mobility of organic ultrathin-film transistor with increasing molecular layers investigated by Kelvin probe force microscopy Increase in carrier mobility of organic ultrathin-film transistor with increasing molecular layers investigated by Kelvin probe force microscopy Journal of Applied Physics, 97, 12, 124503 Journal of Applied Physics, 97, 12, 124503 Journal of Applied Physics, 97, 12, 124503 2005/06/15 Refereed English Research paper(scientific journal) Disclose to all
J. Li; M. Yahiro; K. Ishida; H. Yamada; K. Matsushige J. Li; M. Yahiro; K. Ishida; H. Yamada; K. Matsushige J. Li; M. Yahiro; K. Ishida; H. Yamada; K. Matsushige Enhanced performance of organic light emitting device by insertion of conducting/insulating WO<sub>3</sub> anodic buffer layer Enhanced performance of organic light emitting device by insertion of conducting/insulating WO<sub>3</sub> anodic buffer layer Enhanced performance of organic light emitting device by insertion of conducting/insulating WO<sub>3</sub> anodic buffer layer Synthetic Metals, 151, 2, 141-146 Synthetic Metals, 151, 2, 141-146 Synthetic Metals, 151, 2, 141-146 2005/06/14 Refereed English Research paper(scientific journal) Disclose to all
T. Fukuma; K. Kobayashi; K. Matsushige; H. Yamada T. Fukuma; K. Kobayashi; K. Matsushige; H. Yamada T. Fukuma; K. Kobayashi; K. Matsushige; H. Yamada True molecular resolution in liquid by frequency-modulation atomic force microscopy True molecular resolution in liquid by frequency-modulation atomic force microscopy True molecular resolution in liquid by frequency-modulation atomic force microscopy Applied Physics Letters, 86, 19, 193108 Applied Physics Letters, 86, 19, 193108 Applied Physics Letters, 86, 19, 193108 2005/05/09 Refereed English Research paper(scientific journal) Disclose to all
T. Fukuma; M. Kimura; K. Kobayashi; K. Matsushige; H. Yamada T. Fukuma; M. Kimura; K. Kobayashi; K. Matsushige; H. Yamada T. Fukuma; M. Kimura; K. Kobayashi; K. Matsushige; H. Yamada Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy Review of Scientific Instruments, 76, 5, 53704 Review of Scientific Instruments, 76, 5, 53704 Review of Scientific Instruments, 76, 5, 53704 2005/05 Refereed English Research paper(scientific journal) Disclose to all
Y. Miyato; K. Kobayashi; K. Matsushige; H. Yamada Y. Miyato; K. Kobayashi; K. Matsushige; H. Yamada Y. Miyato; K. Kobayashi; K. Matsushige; H. Yamada Local surface potential measurements of carbon nanotube FETs by Kelvin probe force microscopy Local surface potential measurements of carbon nanotube FETs by Kelvin probe force microscopy Local surface potential measurements of carbon nanotube FETs by Kelvin probe force microscopy Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 44, 4A, 1633-1636 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 44, 4A, 1633-1636 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 44, 4A, 1633-1636 2005/04 Refereed English Research paper(scientific journal) Disclose to all
T. Ichii; H. Kawabata; T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige T. Ichii; H. Kawabata; T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige T. Ichii; H. Kawabata; T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige Molecular-scale investigations of semi-insulating polymer single crystals by noncontact atomic force microscopy Molecular-scale investigations of semi-insulating polymer single crystals by noncontact atomic force microscopy Molecular-scale investigations of semi-insulating polymer single crystals by noncontact atomic force microscopy Nanotechnology, 16, 3, S22-S26 Nanotechnology, 16, 3, S22-S26 Nanotechnology, 16, 3, S22-S26 2005/03 Refereed English Research paper(scientific journal) Disclose to all
T. Fukuma; T. Ichii; K. Kobayashi; H. Yamada; K. Matsushige T. Fukuma; T. Ichii; K. Kobayashi; H. Yamada; K. Matsushige T. Fukuma; T. Ichii; K. Kobayashi; H. Yamada; K. Matsushige True-molecular resolution imaging by frequency modulation atomic force microscopy in various environments True-molecular resolution imaging by frequency modulation atomic force microscopy in various environments True-molecular resolution imaging by frequency modulation atomic force microscopy in various environments Applied Physics Letters, 86, 3, 34103 Applied Physics Letters, 86, 3, 34103 Applied Physics Letters, 86, 3, 34103 2005/01/17 Refereed English Research paper(scientific journal) Disclose to all
K. Kimura; K. Kobayashi; H. Yamada; T. Horiuchi; K. Ishida; K. Matsushige K. Kimura; K. Kobayashi; H. Yamada; T. Horiuchi; K. Ishida; K. Matsushige K. Kimura; K. Kobayashi; H. Yamada; T. Horiuchi; K. Ishida; K. Matsushige Study on molecular chain orientation in edge-on crystals of vinylidenefluoride-trifluoroethylene copolymer using lateral modulation friction force microscopy Study on molecular chain orientation in edge-on crystals of vinylidenefluoride-trifluoroethylene copolymer using lateral modulation friction force microscopy Study on molecular chain orientation in edge-on crystals of vinylidenefluoride-trifluoroethylene copolymer using lateral modulation friction force microscopy Polymer Preprints, Japan, 54, 1, 613- Polymer Preprints, Japan, 54, 1, 613- Polymer Preprints, Japan, 54, 1, 613- 2005 Refereed English Research paper(scientific journal) Disclose to all
H. Uemura; S. Kuwajima; K. Ishida; T. Horiuchi; H. Yamada; K. Matsushige H. Uemura; S. Kuwajima; K. Ishida; T. Horiuchi; H. Yamada; K. Matsushige H. Uemura; S. Kuwajima; K. Ishida; T. Horiuchi; H. Yamada; K. Matsushige Evaluation of polarization switching characteristics of ferroelectric vinylidene fluoride oligomer Evaluation of polarization switching characteristics of ferroelectric vinylidene fluoride oligomer Evaluation of polarization switching characteristics of ferroelectric vinylidene fluoride oligomer Polymer Preprints, Japan, 54, 1, 1701- Polymer Preprints, Japan, 54, 1, 1701- Polymer Preprints, Japan, 54, 1, 1701- 2005 Refereed English Research paper(scientific journal) Disclose to all
K. Ishida; K. Katsumoto; S. Kuwajima; T. Horiuci; H. Yamada; K. Matsushige K. Ishida; K. Katsumoto; S. Kuwajima; T. Horiuci; H. Yamada; K. Matsushige K. Ishida; K. Katsumoto; S. Kuwajima; T. Horiuci; H. Yamada; K. Matsushige Fabrication and characterization of metal/organic ferroelectrics/Si memory device Fabrication and characterization of metal/organic ferroelectrics/Si memory device Fabrication and characterization of metal/organic ferroelectrics/Si memory device Polymer Preprints, Japan, 54, 1, 1401- Polymer Preprints, Japan, 54, 1, 1401- Polymer Preprints, Japan, 54, 1, 1401- 2005 Refereed English Research paper(scientific journal) Disclose to all
S. Kuwajima; K. Ishida; H. Uemura; A. Matsumoto; T. Horiuchi; H. Yamada; K. Matsushige S. Kuwajima; K. Ishida; H. Uemura; A. Matsumoto; T. Horiuchi; H. Yamada; K. Matsushige S. Kuwajima; K. Ishida; H. Uemura; A. Matsumoto; T. Horiuchi; H. Yamada; K. Matsushige Ferroelectric crystal structure of molecular oriented vinylidene fluoride oligomer thin film Ferroelectric crystal structure of molecular oriented vinylidene fluoride oligomer thin film Ferroelectric crystal structure of molecular oriented vinylidene fluoride oligomer thin film Polymer Preprints, Japan, 54, 1, 1085- Polymer Preprints, Japan, 54, 1, 1085- Polymer Preprints, Japan, 54, 1, 1085- 2005 Refereed English Research paper(scientific journal) Disclose to all
T. Fukuma; K. Kimura; K. Kobayashi; K. Matsushige; H. Yamada T. Fukuma; K. Kimura; K. Kobayashi; K. Matsushige; H. Yamada T. Fukuma; K. Kimura; K. Kobayashi; K. Matsushige; H. Yamada Dynamic force microscopy at high cantilever resonance frequencies using heterodyne optical beam deflection method Dynamic force microscopy at high cantilever resonance frequencies using heterodyne optical beam deflection method Dynamic force microscopy at high cantilever resonance frequencies using heterodyne optical beam deflection method Applied Physics Letters, 85, 25, 6287-6289 Applied Physics Letters, 85, 25, 6287-6289 Applied Physics Letters, 85, 25, 6287-6289 2004/12/20 Refereed English Research paper(scientific journal) Disclose to all
K. Kimura; K. Kobayashi; H. Yamada; T. Horiuchi; K. Ishida; K. Matsushige K. Kimura; K. Kobayashi; H. Yamada; T. Horiuchi; K. Ishida; K. Matsushige K. Kimura; K. Kobayashi; H. Yamada; T. Horiuchi; K. Ishida; K. Matsushige Orientation control of high-density polyethylene molecular chains using atomic force microscope Orientation control of high-density polyethylene molecular chains using atomic force microscope Orientation control of high-density polyethylene molecular chains using atomic force microscope Japanese Journal of Applied Physics, Part 2: Letters, 43, 11A, L1390-L1393 Japanese Journal of Applied Physics, Part 2: Letters, 43, 11A, L1390-L1393 Japanese Journal of Applied Physics, Part 2: Letters, 43, 11A, L1390-L1393 2004/11/01 Refereed English Research paper(scientific journal) Disclose to all
T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige Surface potential measurements by the dissipative force modulation method Surface potential measurements by the dissipative force modulation method Surface potential measurements by the dissipative force modulation method Review of Scientific Instruments, 75, 11, 4589-4594 Review of Scientific Instruments, 75, 11, 4589-4594 Review of Scientific Instruments, 75, 11, 4589-4594 2004/11 Refereed English Research paper(scientific journal) Disclose to all
T. Ichii; T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige T. Ichii; T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige T. Ichii; T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige Noncontact atomic force microscopy investigation, of phase-separated alkanethiol self-assembled monolayers with different head groups Noncontact atomic force microscopy investigation, of phase-separated alkanethiol self-assembled monolayers with different head groups Noncontact atomic force microscopy investigation, of phase-separated alkanethiol self-assembled monolayers with different head groups Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 43, 7B, 4545-4548 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 43, 7B, 4545-4548 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 43, 7B, 4545-4548 2004/07 Refereed English Research paper(scientific journal) Disclose to all
K. Kimura; K. Kobayashi; H. Yamada; T. Horiuchi; K. Ishida; K. Matsushige K. Kimura; K. Kobayashi; H. Yamada; T. Horiuchi; K. Ishida; K. Matsushige K. Kimura; K. Kobayashi; H. Yamada; T. Horiuchi; K. Ishida; K. Matsushige Orientation control of molecular chains in polymers using atomic force microscopy Orientation control of molecular chains in polymers using atomic force microscopy Orientation control of molecular chains in polymers using atomic force microscopy Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 43, 7B, 4575-4579 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 43, 7B, 4575-4579 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 43, 7B, 4575-4579 2004/07 Refereed English Research paper(scientific journal) Disclose to all
N. Satoh; K. Kobayashi; S. Watanabe; T. Fujii; T. Horiuchi; H. Yamada; K. Matsushige N. Satoh; K. Kobayashi; S. Watanabe; T. Fujii; T. Horiuchi; H. Yamada; K. Matsushige N. Satoh; K. Kobayashi; S. Watanabe; T. Fujii; T. Horiuchi; H. Yamada; K. Matsushige Investigations of nanoparticles by scanning near-field optical microscopy combined with kelvin probe force microscopy using a piezoelectric cantilever Investigations of nanoparticles by scanning near-field optical microscopy combined with kelvin probe force microscopy using a piezoelectric cantilever Investigations of nanoparticles by scanning near-field optical microscopy combined with kelvin probe force microscopy using a piezoelectric cantilever Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 43, 7B, 4651-4654 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 43, 7B, 4651-4654 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 43, 7B, 4651-4654 2004/07 Refereed English Research paper(scientific journal) Disclose to all
T. Yoda; T. Ichii; T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige T. Yoda; T. Ichii; T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige T. Yoda; T. Ichii; T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige Submolecular-resolution studies on metal-phthalocyanines by noncontact atomic force microscopy Submolecular-resolution studies on metal-phthalocyanines by noncontact atomic force microscopy Submolecular-resolution studies on metal-phthalocyanines by noncontact atomic force microscopy Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 43, 7B, 4691-4694 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 43, 7B, 4691-4694 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 43, 7B, 4691-4694 2004/07 Refereed English Research paper(scientific journal) Disclose to all
T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige Noncontact atomic force microscopy study of copper-phthalocyanines: Submolecular-scale contrasts in topography and energy dissipation Noncontact atomic force microscopy study of copper-phthalocyanines: Submolecular-scale contrasts in topography and energy dissipation Noncontact atomic force microscopy study of copper-phthalocyanines: Submolecular-scale contrasts in topography and energy dissipation Journal of Applied Physics, 95, 9, 4742-4746 Journal of Applied Physics, 95, 9, 4742-4746 Journal of Applied Physics, 95, 9, 4742-4746 2004/05/01 Refereed English Research paper(scientific journal) Disclose to all
K. Kimura; K. Kobayashi; H. Yamada; T. Horiuchi; K. Ishida; K. Matsushige K. Kimura; K. Kobayashi; H. Yamada; T. Horiuchi; K. Ishida; K. Matsushige K. Kimura; K. Kobayashi; H. Yamada; T. Horiuchi; K. Ishida; K. Matsushige Orientation control of ferroelectric polymer molecules using contact-mode AFM Orientation control of ferroelectric polymer molecules using contact-mode AFM Orientation control of ferroelectric polymer molecules using contact-mode AFM European Polymer Journal, 40, 5, 933-938 European Polymer Journal, 40, 5, 933-938 European Polymer Journal, 40, 5, 933-938 2004/05 Refereed English Research paper(scientific journal) Disclose to all
K. Kobayashi; H. Masuda; H. Yamada; K. Matsushige K. Kobayashi; H. Masuda; H. Yamada; K. Matsushige K. Kobayashi; H. Masuda; H. Yamada; K. Matsushige Structures and electrical properties of ferroelectric copolymer ultrathin films Structures and electrical properties of ferroelectric copolymer ultrathin films Structures and electrical properties of ferroelectric copolymer ultrathin films European Polymer Journal, 40, 5, 987-992 European Polymer Journal, 40, 5, 987-992 European Polymer Journal, 40, 5, 987-992 2004/05 Refereed English Research paper(scientific journal) Disclose to all
T. Fukuma; T. Ichii; K. Kobayashi; H. Yamada; K. Matsushige T. Fukuma; T. Ichii; K. Kobayashi; H. Yamada; K. Matsushige T. Fukuma; T. Ichii; K. Kobayashi; H. Yamada; K. Matsushige Molecular-scale noncontact atomic force microscopy contrasts in topography and energy dissipation on c(4×2) superlattice structures of alkanethiol self-assembled monolayers Molecular-scale noncontact atomic force microscopy contrasts in topography and energy dissipation on c(4×2) superlattice structures of alkanethiol self-assembled monolayers Molecular-scale noncontact atomic force microscopy contrasts in topography and energy dissipation on c(4×2) superlattice structures of alkanethiol self-assembled monolayers Journal of Applied Physics, 95, 3, 1222-1226 Journal of Applied Physics, 95, 3, 1222-1226 Journal of Applied Physics, 95, 3, 1222-1226 2004/02/01 Refereed English Research paper(scientific journal) Disclose to all
T. Ichii; T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige T. Ichii; T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige T. Ichii; T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige Surface potential measurements of phase-separated alkanethiol self-assembled monolayers by non-contact atomic force microscopy Surface potential measurements of phase-separated alkanethiol self-assembled monolayers by non-contact atomic force microscopy Surface potential measurements of phase-separated alkanethiol self-assembled monolayers by non-contact atomic force microscopy Nanotechnology, 15, 2, S30-S33 Nanotechnology, 15, 2, S30-S33 Nanotechnology, 15, 2, S30-S33 2004/02 Refereed English Research paper(scientific journal) Disclose to all
K. Noda; K. Ishida; T. Horiuchi; H. Yamada; K. Matsushige K. Noda; K. Ishida; T. Horiuchi; H. Yamada; K. Matsushige K. Noda; K. Ishida; T. Horiuchi; H. Yamada; K. Matsushige Pyroelectricity of ferroelectric vinylidene fluoride-oligomer-evaporated thin films Pyroelectricity of ferroelectric vinylidene fluoride-oligomer-evaporated thin films Pyroelectricity of ferroelectric vinylidene fluoride-oligomer-evaporated thin films Japanese Journal of Applied Physics Part 2-Letters, 42, 11A, L1334-L1336 Japanese Journal of Applied Physics Part 2-Letters, 42, 11A, L1334-L1336 Japanese Journal of Applied Physics Part 2-Letters, 42, 11A, L1334-L1336 2003/11/01 Refereed English Research paper(scientific journal) Disclose to all
N. Satoh; K. Kobayashi; S. Watanabe; T. Fujii; T. Horiuchi; H. Yamada; K. Matsushige N. Satoh; K. Kobayashi; S. Watanabe; T. Fujii; T. Horiuchi; H. Yamada; K. Matsushige N. Satoh; K. Kobayashi; S. Watanabe; T. Fujii; T. Horiuchi; H. Yamada; K. Matsushige Nanoscale investigation of optical and electrical properties by dynamic-mode atomic force microscopy using a piezoelectric cantilever Nanoscale investigation of optical and electrical properties by dynamic-mode atomic force microscopy using a piezoelectric cantilever Nanoscale investigation of optical and electrical properties by dynamic-mode atomic force microscopy using a piezoelectric cantilever Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 42, 7B, 4878-4881 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 42, 7B, 4878-4881 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 42, 7B, 4878-4881 2003/07 Refereed English Research paper(scientific journal) Disclose to all
T. Miyazaki; K. Kobayashi; K. Ishida; S. Hotta; T. Horiuchi; H. Yamada; K. Matsushige T. Miyazaki; K. Kobayashi; K. Ishida; S. Hotta; T. Horiuchi; H. Yamada; K. Matsushige T. Miyazaki; K. Kobayashi; K. Ishida; S. Hotta; T. Horiuchi; H. Yamada; K. Matsushige Nanoscale electrical properties of molecular films in the vicinity of platinum ultrathin film electrode Nanoscale electrical properties of molecular films in the vicinity of platinum ultrathin film electrode Nanoscale electrical properties of molecular films in the vicinity of platinum ultrathin film electrode Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 42, 7B, 4852-4855 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 42, 7B, 4852-4855 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 42, 7B, 4852-4855 2003/07 Refereed English Research paper(scientific journal) Disclose to all
K. Kimura; K. Kobayashi; H. Yamada; T. Horiuchi; K. Ishida; K. Matsushige K. Kimura; K. Kobayashi; H. Yamada; T. Horiuchi; K. Ishida; K. Matsushige K. Kimura; K. Kobayashi; H. Yamada; T. Horiuchi; K. Ishida; K. Matsushige Orientation control of poly(vinylidenefluoride-trifluoroethylene) crystals and molecules using atomic force microscopy Orientation control of poly(vinylidenefluoride-trifluoroethylene) crystals and molecules using atomic force microscopy Orientation control of poly(vinylidenefluoride-trifluoroethylene) crystals and molecules using atomic force microscopy Applied Physics Letters, 82, 23, 4050-4052 Applied Physics Letters, 82, 23, 4050-4052 Applied Physics Letters, 82, 23, 4050-4052 2003/06/09 Refereed English Research paper(scientific journal) Disclose to all
T. Miyazaki; K. Kobayashi; K. Ishida; S. Hotta; T. Horiuchi; H. Yamada; K. Matsushige T. Miyazaki; K. Kobayashi; K. Ishida; S. Hotta; T. Horiuchi; H. Yamada; K. Matsushige T. Miyazaki; K. Kobayashi; K. Ishida; S. Hotta; T. Horiuchi; H. Yamada; K. Matsushige Fabrication of nanogap electrodes using ultrathin metal film Fabrication of nanogap electrodes using ultrathin metal film Fabrication of nanogap electrodes using ultrathin metal film Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 42, 6B, 4173-4176 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 42, 6B, 4173-4176 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 42, 6B, 4173-4176 2003/06 Refereed English Research paper(scientific journal) Disclose to all
K. Kimura; K. Kobayashi; H. Yamada; K. Matsushige K. Kimura; K. Kobayashi; H. Yamada; K. Matsushige K. Kimura; K. Kobayashi; H. Yamada; K. Matsushige Two-dimensional dopant profiling by scanning capacitance force microscopy Two-dimensional dopant profiling by scanning capacitance force microscopy Two-dimensional dopant profiling by scanning capacitance force microscopy Applied Surface Science, 210, 93-98 Applied Surface Science, 210, 93-98 Applied Surface Science, 210, 93-98 2003/03/31 Refereed English Research paper(scientific journal) Disclose to all
T. Ichii; T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige T. Ichii; T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige T. Ichii; T. Fukuma; K. Kobayashi; H. Yamada; K. Matsushige Phase-separated alkanethiol self-assembled monolayers investigated by non-contact AFM Phase-separated alkanethiol self-assembled monolayers investigated by non-contact AFM Phase-separated alkanethiol self-assembled monolayers investigated by non-contact AFM Applied Surface Science, 210, 99-104 Applied Surface Science, 210, 99-104 Applied Surface Science, 210, 99-104 2003/03/31 Refereed English Research paper(scientific journal) Disclose to all
K. Iwahori; S. Watanabe; M. Kawai; K. Kobayashi; H. Yamada; K. Matsushige K. Iwahori; S. Watanabe; M. Kawai; K. Kobayashi; H. Yamada; K. Matsushige K. Iwahori; S. Watanabe; M. Kawai; K. Kobayashi; H. Yamada; K. Matsushige Effect of water adsorption on microscopic friction force on SrTiO<sub>3</sub>(001) Effect of water adsorption on microscopic friction force on SrTiO<sub>3</sub>(001) Effect of water adsorption on microscopic friction force on SrTiO<sub>3</sub>(001) Journal of Applied Physics, 93, 6, 3223-3227 Journal of Applied Physics, 93, 6, 3223-3227 Journal of Applied Physics, 93, 6, 3223-3227 2003/03/15 Refereed English Research paper(scientific journal) Disclose to all
K. Noda; K. Ishida; A. Kubono; T. Horiuchi; H. Yamada; K. Matsushige K. Noda; K. Ishida; A. Kubono; T. Horiuchi; H. Yamada; K. Matsushige K. Noda; K. Ishida; A. Kubono; T. Horiuchi; H. Yamada; K. Matsushige Remanent polarization of evaporated films of vinylidene fluoride oligomers Remanent polarization of evaporated films of vinylidene fluoride oligomers Remanent polarization of evaporated films of vinylidene fluoride oligomers Journal of Applied Physics, 93, 5, 2866-2870 Journal of Applied Physics, 93, 5, 2866-2870 Journal of Applied Physics, 93, 5, 2866-2870 2003/03/01 Refereed English Research paper(scientific journal) Disclose to all
K. Kobayashi; H. Yamada; K. Matsushige K. Kobayashi; H. Yamada; K. Matsushige K. Kobayashi; H. Yamada; K. Matsushige Dopant profiling on semiconducting sample by scanning capacitance force microscopy Dopant profiling on semiconducting sample by scanning capacitance force microscopy Dopant profiling on semiconducting sample by scanning capacitance force microscopy Applied Physics Letters, 81, 14, 2629-2631 Applied Physics Letters, 81, 14, 2629-2631 Applied Physics Letters, 81, 14, 2629-2631 2002/09/30 Refereed English Research paper(scientific journal) Disclose to all
T. Fukuma; K. Kobayashi; K. Noda; K. Ishida; T. Horiuchi; H. Yamada; K. Matsushige T. Fukuma; K. Kobayashi; K. Noda; K. Ishida; T. Horiuchi; H. Yamada; K. Matsushige T. Fukuma; K. Kobayashi; K. Noda; K. Ishida; T. Horiuchi; H. Yamada; K. Matsushige Molecular-scale non-contact AFM studies of ferroelectric organic thin films epitaxially grown on alkali halides Molecular-scale non-contact AFM studies of ferroelectric organic thin films epitaxially grown on alkali halides Molecular-scale non-contact AFM studies of ferroelectric organic thin films epitaxially grown on alkali halides Surface Science, 516, 103-108 Surface Science, 516, 103-108 Surface Science, 516, 103-108 2002/09/10 Refereed English Research paper(scientific journal) Disclose to all
T. Fukuma; K. Umeda; K. Kobayashi; H. Yamada; K. Matsushige T. Fukuma; K. Umeda; K. Kobayashi; H. Yamada; K. Matsushige T. Fukuma; K. Umeda; K. Kobayashi; H. Yamada; K. Matsushige Experimental study on energy dissipation induced by displacement current in non-contact aomic force microscopy imaging of molecular thin films Experimental study on energy dissipation induced by displacement current in non-contact aomic force microscopy imaging of molecular thin films Experimental study on energy dissipation induced by displacement current in non-contact aomic force microscopy imaging of molecular thin films Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 41, 7B, 4903-4907 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 41, 7B, 4903-4907 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 41, 7B, 4903-4907 2002/07 Refereed English Research paper(scientific journal) Disclose to all
T. Miyazaki; K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige T. Miyazaki; K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige T. Miyazaki; K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige Fabrication of nanometer-scale pattern using current-controlled scanning probe lithography Fabrication of nanometer-scale pattern using current-controlled scanning probe lithography Fabrication of nanometer-scale pattern using current-controlled scanning probe lithography Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 41, 7B, 4948-4951 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 41, 7B, 4948-4951 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 41, 7B, 4948-4951 2002/07 Refereed English Research paper(scientific journal) Disclose to all
H. Yamada; T. Fukuma; K. Umeda; K. Kobayashi; K. Matsushige H. Yamada; T. Fukuma; K. Umeda; K. Kobayashi; K. Matsushige H. Yamada; T. Fukuma; K. Umeda; K. Kobayashi; K. Matsushige Local structures and electrical properties of organic molecular films investigated by non-contact atomic force microscopy Local structures and electrical properties of organic molecular films investigated by non-contact atomic force microscopy Local structures and electrical properties of organic molecular films investigated by non-contact atomic force microscopy Applied Surface Science, 188, 391-398 Applied Surface Science, 188, 391-398 Applied Surface Science, 188, 391-398 2002/03/28 Refereed English Research paper(scientific journal) Disclose to all
N. Satoh; K. Kobayashi; S. Watanabe; T. Fujii; T. Horiuchi; H. Yamada; K. Matsushige N. Satoh; K. Kobayashi; S. Watanabe; T. Fujii; T. Horiuchi; H. Yamada; K. Matsushige N. Satoh; K. Kobayashi; S. Watanabe; T. Fujii; T. Horiuchi; H. Yamada; K. Matsushige Dynamic-mode AFM using the piezoelectric cantilever: Investigations of local optical and electrical properties Dynamic-mode AFM using the piezoelectric cantilever: Investigations of local optical and electrical properties Dynamic-mode AFM using the piezoelectric cantilever: Investigations of local optical and electrical properties Applied Surface Science, 188, 425-429 Applied Surface Science, 188, 425-429 Applied Surface Science, 188, 425-429 2002/03/28 Refereed English Research paper(scientific journal) Disclose to all
K. Kobayashi; H. Yamada; K. Matsushige K. Kobayashi; H. Yamada; K. Matsushige K. Kobayashi; H. Yamada; K. Matsushige Dynamic force microscopy using FM detection in various environments Dynamic force microscopy using FM detection in various environments Dynamic force microscopy using FM detection in various environments Applied Surface Science, 188, 430-434 Applied Surface Science, 188, 430-434 Applied Surface Science, 188, 430-434 2002/03/28 Refereed English Research paper(scientific journal) Disclose to all
H. Aoki; Y. Kunai; S. Ito; H. Yamada; K. Matsushige H. Aoki; Y. Kunai; S. Ito; H. Yamada; K. Matsushige H. Aoki; Y. Kunai; S. Ito; H. Yamada; K. Matsushige Two-dimensional phase separation of block copolymer and homopolymer blend studied by scanning near-field optical microscopy Two-dimensional phase separation of block copolymer and homopolymer blend studied by scanning near-field optical microscopy Two-dimensional phase separation of block copolymer and homopolymer blend studied by scanning near-field optical microscopy Applied Surface Science, 188, 534-538 Applied Surface Science, 188, 534-538 Applied Surface Science, 188, 534-538 2002/03/28 Refereed English Research paper(scientific journal) Disclose to all
K. Kobayashi; H. Yamada; K. Matsushige K. Kobayashi; H. Yamada; K. Matsushige K. Kobayashi; H. Yamada; K. Matsushige Resonance tracking ultrasonic atomic force microscopy Resonance tracking ultrasonic atomic force microscopy Resonance tracking ultrasonic atomic force microscopy Surface and Interface Analysis, 33, 2, 89-91 Surface and Interface Analysis, 33, 2, 89-91 Surface and Interface Analysis, 33, 2, 89-91 2002/02 Refereed English Research paper(scientific journal) Disclose to all
K. Kobayashi; H. Yamada; H. Itoh; T. Horiuchi; K. Matsushige K. Kobayashi; H. Yamada; H. Itoh; T. Horiuchi; K. Matsushige K. Kobayashi; H. Yamada; H. Itoh; T. Horiuchi; K. Matsushige Analog frequency modulation detector for dynamic force microscopy Analog frequency modulation detector for dynamic force microscopy Analog frequency modulation detector for dynamic force microscopy Review of Scientific Instruments, 72, 12, 4383-4387 Review of Scientific Instruments, 72, 12, 4383-4387 Review of Scientific Instruments, 72, 12, 4383-4387 2001/12 Refereed English Research paper(scientific journal) Disclose to all
T. Fukuma; K. Kobayashi; T. Horiuchi; H. Yamada; K. Matsushige T. Fukuma; K. Kobayashi; T. Horiuchi; H. Yamada; K. Matsushige T. Fukuma; K. Kobayashi; T. Horiuchi; H. Yamada; K. Matsushige Structures and local electrical properties of ferroelectric polymer thin films in thermal process investigated by dynamic-mode atomic force microscopy Structures and local electrical properties of ferroelectric polymer thin films in thermal process investigated by dynamic-mode atomic force microscopy Structures and local electrical properties of ferroelectric polymer thin films in thermal process investigated by dynamic-mode atomic force microscopy Thin Solid Films, 397, 133-137 Thin Solid Films, 397, 133-137 Thin Solid Films, 397, 133-137 2001/10/01 Refereed English Research paper(scientific journal) Disclose to all
H. Okino; T. Ida; H. Ebihara; H. Yamada; K. Matsushige; T. Yamamoto H. Okino; T. Ida; H. Ebihara; H. Yamada; K. Matsushige; T. Yamamoto H. Okino; T. Ida; H. Ebihara; H. Yamada; K. Matsushige; T. Yamamoto Domain orientation imaging of PbTiO<sub>3</sub> single crystals by vertical and lateral piezoresponse force microscopy Domain orientation imaging of PbTiO<sub>3</sub> single crystals by vertical and lateral piezoresponse force microscopy Domain orientation imaging of PbTiO<sub>3</sub> single crystals by vertical and lateral piezoresponse force microscopy Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 40, 9B, 5828-5832 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 40, 9B, 5828-5832 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 40, 9B, 5828-5832 2001/09 Refereed English Research paper(scientific journal) Disclose to all
K. El Hami; H. Yamada; K. Matsushige K. El Hami; H. Yamada; K. Matsushige K. El Hami; H. Yamada; K. Matsushige Organic variable capacitor as direct application of piezoelectric effect Organic variable capacitor as direct application of piezoelectric effect Organic variable capacitor as direct application of piezoelectric effect Thin Solid Films, 393, 343-346 Thin Solid Films, 393, 343-346 Thin Solid Films, 393, 343-346 2001/08/01 Refereed English Research paper(scientific journal) Disclose to all
X.Q. Chen; T. Saito; H. Yamada; K. Matsushige X.Q. Chen; T. Saito; H. Yamada; K. Matsushige X.Q. Chen; T. Saito; H. Yamada; K. Matsushige Aligning single-wall carbon nanotubes with an alternating-current electric field Aligning single-wall carbon nanotubes with an alternating-current electric field Aligning single-wall carbon nanotubes with an alternating-current electric field Applied Physics Letters, 78, 23, 3714-3716 Applied Physics Letters, 78, 23, 3714-3716 Applied Physics Letters, 78, 23, 3714-3716 2001/06/04 Refereed English Research paper(scientific journal) Disclose to all
K. Umeda; K. Kobayashi; K. Ishida; S. Hotta; H. Yamada; K. Matsushige K. Umeda; K. Kobayashi; K. Ishida; S. Hotta; H. Yamada; K. Matsushige K. Umeda; K. Kobayashi; K. Ishida; S. Hotta; H. Yamada; K. Matsushige Surface potential measurement of oligothiophene ultrathin films by Kelvin probe force microscopy Surface potential measurement of oligothiophene ultrathin films by Kelvin probe force microscopy Surface potential measurement of oligothiophene ultrathin films by Kelvin probe force microscopy Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 40, 6B, 4381-4383 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 40, 6B, 4381-4383 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 40, 6B, 4381-4383 2001/06 Refereed English Research paper(scientific journal) Disclose to all
K. Noda; K. Ishida; A. Kubono; T. Horiuchi; H. Yamada; K. Matsushige K. Noda; K. Ishida; A. Kubono; T. Horiuchi; H. Yamada; K. Matsushige K. Noda; K. Ishida; A. Kubono; T. Horiuchi; H. Yamada; K. Matsushige Molecular ferroelectricity of vinylidene fluoride oligomer investigated by atomic force microscopy Molecular ferroelectricity of vinylidene fluoride oligomer investigated by atomic force microscopy Molecular ferroelectricity of vinylidene fluoride oligomer investigated by atomic force microscopy Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 40, 6B, 4361-4364 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 40, 6B, 4361-4364 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 40, 6B, 4361-4364 2001/06 Refereed English Research paper(scientific journal) Disclose to all
T. Miyazaki; K. Kobayashi; T. Horiuchi; H. Yamada; K. Matsushige T. Miyazaki; K. Kobayashi; T. Horiuchi; H. Yamada; K. Matsushige T. Miyazaki; K. Kobayashi; T. Horiuchi; H. Yamada; K. Matsushige Fabrication of a nanogap on a metal nanowire using scanning probe lithography Fabrication of a nanogap on a metal nanowire using scanning probe lithography Fabrication of a nanogap on a metal nanowire using scanning probe lithography Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 40, 6B, 4365-4367 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 40, 6B, 4365-4367 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 40, 6B, 4365-4367 2001/06 Refereed English Research paper(scientific journal) Disclose to all
K. El Hami; H. Yamada; K. Matsushige K. El Hami; H. Yamada; K. Matsushige K. El Hami; H. Yamada; K. Matsushige Nanoscopic measurements of the electrostriction responses in P(VDF/TrFE) ultra-thin-film copolymer using atomic force microscopy Nanoscopic measurements of the electrostriction responses in P(VDF/TrFE) ultra-thin-film copolymer using atomic force microscopy Nanoscopic measurements of the electrostriction responses in P(VDF/TrFE) ultra-thin-film copolymer using atomic force microscopy Applied Physics A: Materials Science and Processing, 72, 3, 347-350 Applied Physics A: Materials Science and Processing, 72, 3, 347-350 Applied Physics A: Materials Science and Processing, 72, 3, 347-350 2001/03 Refereed English Research paper(scientific journal) Disclose to all
K. El-Hami; M. Hara; H. Yamada; K. Matsushige K. El-Hami; M. Hara; H. Yamada; K. Matsushige K. El-Hami; M. Hara; H. Yamada; K. Matsushige The use of nanotechnology to fabricate ultra-high density molecular memory in P(VDF/TRFE) copolymer: Data storage The use of nanotechnology to fabricate ultra-high density molecular memory in P(VDF/TRFE) copolymer: Data storage The use of nanotechnology to fabricate ultra-high density molecular memory in P(VDF/TRFE) copolymer: Data storage Annales de Chimie: Science des Materiaux, 26, 1, 217-220 Annales de Chimie: Science des Materiaux, 26, 1, 217-220 Annales de Chimie: Science des Materiaux, 26, 1, 217-220 2001/01 Refereed English Research paper(scientific journal) Disclose to all
H. Yamada; K. Matsushige H. Yamada; K. Matsushige H. Yamada; K. Matsushige Molecular-scale investigations of organic molecular films by dynamic force microscopy Molecular-scale investigations of organic molecular films by dynamic force microscopy Molecular-scale investigations of organic molecular films by dynamic force microscopy Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals, 370, 197-206 Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals, 370, 197-206 Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals, 370, 197-206 2001 Refereed English Research paper(scientific journal) Disclose to all
X. Chen; H. Yamada; M. Hara; T. Horiuchi; K. Matsushige X. Chen; H. Yamada; M. Hara; T. Horiuchi; K. Matsushige X. Chen; H. Yamada; M. Hara; T. Horiuchi; K. Matsushige Characterization of nanoscale domains in ferroelectric polymer thin films by scanning probe microscopy Characterization of nanoscale domains in ferroelectric polymer thin films by scanning probe microscopy Characterization of nanoscale domains in ferroelectric polymer thin films by scanning probe microscopy Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals, 370, 293-296 Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals, 370, 293-296 Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals, 370, 293-296 2001 Refereed English Research paper(scientific journal) Disclose to all
K. Noda; K. Ishida; A. Kubono; T. Horiuchi; H. Yamada; K. Matsushige K. Noda; K. Ishida; A. Kubono; T. Horiuchi; H. Yamada; K. Matsushige K. Noda; K. Ishida; A. Kubono; T. Horiuchi; H. Yamada; K. Matsushige Structures and ferroelectric natures of epitaxially grown vinylidene fluoride oligomer thin films Structures and ferroelectric natures of epitaxially grown vinylidene fluoride oligomer thin films Structures and ferroelectric natures of epitaxially grown vinylidene fluoride oligomer thin films Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 39, 11, 6358-6363 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 39, 11, 6358-6363 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 39, 11, 6358-6363 2000/11 Refereed English Research paper(scientific journal) Disclose to all
S.-I. Yamamoto; H. Yamada; K. Matsushige S.-I. Yamamoto; H. Yamada; K. Matsushige S.-I. Yamamoto; H. Yamada; K. Matsushige Differentiation of Au islands on Ni film by friction force microscopy, force curve and new force modulation method Differentiation of Au islands on Ni film by friction force microscopy, force curve and new force modulation method Differentiation of Au islands on Ni film by friction force microscopy, force curve and new force modulation method Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 39, 6B, 3717-3720 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 39, 6B, 3717-3720 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 39, 6B, 3717-3720 2000/06 Refereed English Research paper(scientific journal) Disclose to all
Y. Saya; S. Watanabe; M. Kawai; H. Yamada; K. Matsushige Y. Saya; S. Watanabe; M. Kawai; H. Yamada; K. Matsushige Y. Saya; S. Watanabe; M. Kawai; H. Yamada; K. Matsushige Investigation of nonswitching regions in ferroelectric thin films using scanning force microscopy Investigation of nonswitching regions in ferroelectric thin films using scanning force microscopy Investigation of nonswitching regions in ferroelectric thin films using scanning force microscopy Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 39, 6B, 3799-3803 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 39, 6B, 3799-3803 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 39, 6B, 3799-3803 2000/06 Refereed English Research paper(scientific journal) Disclose to all
K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige Structures and electrical properties of fullerene thin films on Si(111)-7×7 surface investigated by noncontact atomic force microscopy Structures and electrical properties of fullerene thin films on Si(111)-7×7 surface investigated by noncontact atomic force microscopy Structures and electrical properties of fullerene thin films on Si(111)-7×7 surface investigated by noncontact atomic force microscopy Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 39, 6B, 3827-3829 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 39, 6B, 3827-3829 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 39, 6B, 3827-3829 2000/06 Refereed English Research paper(scientific journal) Disclose to all
T. Fukuma; K. Kobayashi; T. Horiuchi; H. Yamada; K. Matsushige T. Fukuma; K. Kobayashi; T. Horiuchi; H. Yamada; K. Matsushige T. Fukuma; K. Kobayashi; T. Horiuchi; H. Yamada; K. Matsushige Nanometer-scale characterization of ferroelectric polymer thin films by variable-temperature atomic force microscopy Nanometer-scale characterization of ferroelectric polymer thin films by variable-temperature atomic force microscopy Nanometer-scale characterization of ferroelectric polymer thin films by variable-temperature atomic force microscopy Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 39, 6B, 3830-3833 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 39, 6B, 3830-3833 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 39, 6B, 3830-3833 2000/06 Refereed English Research paper(scientific journal) Disclose to all
K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige Imaging of fullerene molecules on Si(111)-7×7 surface with NC-AFM Imaging of fullerene molecules on Si(111)-7×7 surface with NC-AFM Imaging of fullerene molecules on Si(111)-7×7 surface with NC-AFM Applied Surface Science, 157, 4, 228-232 Applied Surface Science, 157, 4, 228-232 Applied Surface Science, 157, 4, 228-232 2000/04 Refereed English Research paper(scientific journal) Disclose to all
S.P. Jarvis; H. Yamada; K. Kobayashi; A. Toda; H. Tokumoto S.P. Jarvis; H. Yamada; K. Kobayashi; A. Toda; H. Tokumoto S.P. Jarvis; H. Yamada; K. Kobayashi; A. Toda; H. Tokumoto Normal and lateral force investigation using magnetically activated force sensors Normal and lateral force investigation using magnetically activated force sensors Normal and lateral force investigation using magnetically activated force sensors Applied Surface Science, 157, 4, 314-319 Applied Surface Science, 157, 4, 314-319 Applied Surface Science, 157, 4, 314-319 2000/04 Refereed English Research paper(scientific journal) Disclose to all
K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige Dynamic force microscopy investigations of C<sub>60</sub> deposited on Si(111) surface Dynamic force microscopy investigations of C<sub>60</sub> deposited on Si(111) surface Dynamic force microscopy investigations of C<sub>60</sub> deposited on Si(111) surface Japanese Journal of Applied Physics, Part 2: Letters, 38, 12B, L1550-L1552 Japanese Journal of Applied Physics, Part 2: Letters, 38, 12B, L1550-L1552 Japanese Journal of Applied Physics, Part 2: Letters, 38, 12B, L1550-L1552 1999/12/15 Refereed English Research paper(scientific journal) Disclose to all
S.P. Jarvis; H. Tokumoto; H. Yamada; K. Kobayashi; A. Toda S.P. Jarvis; H. Tokumoto; H. Yamada; K. Kobayashi; A. Toda S.P. Jarvis; H. Tokumoto; H. Yamada; K. Kobayashi; A. Toda Alternative method for the activation and measurement of lateral forces using magnetically controlled atomic force microscopy Alternative method for the activation and measurement of lateral forces using magnetically controlled atomic force microscopy Alternative method for the activation and measurement of lateral forces using magnetically controlled atomic force microscopy Applied Physics Letters, 75, 24, 3883-3885 Applied Physics Letters, 75, 24, 3883-3885 Applied Physics Letters, 75, 24, 3883-3885 1999/12/13 Refereed English Research paper(scientific journal) Disclose to all
X. Q. Chen; H. Yamada; T. Horiuchi; K. Matsushige; P. S. Weiss X. Q. Chen; H. Yamada; T. Horiuchi; K. Matsushige; P. S. Weiss X. Q. Chen; H. Yamada; T. Horiuchi; K. Matsushige; P. S. Weiss Surface potential of ferroelectric thin films investigated by scanning probe microscopy Surface potential of ferroelectric thin films investigated by scanning probe microscopy Surface potential of ferroelectric thin films investigated by scanning probe microscopy Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 17, 5, 1930-1934 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 17, 5, 1930-1934 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 17, 5, 1930-1934 1999/09 Refereed English Research paper(scientific journal) Disclose to all
K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige Investigations of C<sub>60</sub> molecules deposited on Si(111) by noncontact atomic force microscopy Investigations of C<sub>60</sub> molecules deposited on Si(111) by noncontact atomic force microscopy Investigations of C<sub>60</sub> molecules deposited on Si(111) by noncontact atomic force microscopy Applied Surface Science, 140, 281-286 Applied Surface Science, 140, 281-286 Applied Surface Science, 140, 281-286 1999 Refereed English Research paper(scientific journal) Disclose to all
Y. Miyahara; T. Fujii; S. Watanabe; A. Tonoli; S. Carabelli; H. Yamada; H. Bleuler Y. Miyahara; T. Fujii; S. Watanabe; A. Tonoli; S. Carabelli; H. Yamada; H. Bleuler Y. Miyahara; T. Fujii; S. Watanabe; A. Tonoli; S. Carabelli; H. Yamada; H. Bleuler Lead zirconate titanate cantilever for noncontact atomic force microscopy Lead zirconate titanate cantilever for noncontact atomic force microscopy Lead zirconate titanate cantilever for noncontact atomic force microscopy Applied Surface Science, 140, 428-431 Applied Surface Science, 140, 428-431 Applied Surface Science, 140, 428-431 1999 Refereed English Research paper(scientific journal) Disclose to all
K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige UHV-STM studies on the structures of alkanedithiol self-assembled monolayers UHV-STM studies on the structures of alkanedithiol self-assembled monolayers UHV-STM studies on the structures of alkanedithiol self-assembled monolayers Applied Surface Science, 144-145, 435-438 Applied Surface Science, 144-145, 435-438 Applied Surface Science, 144-145, 435-438 1999 Refereed English Research paper(scientific journal) Disclose to all
H. Yamada; H. Itoh; S. Watanabe; K. Kobayashi; K. Matsushige H. Yamada; H. Itoh; S. Watanabe; K. Kobayashi; K. Matsushige H. Yamada; H. Itoh; S. Watanabe; K. Kobayashi; K. Matsushige Scanning near-field optical microscopy using piezoelectric cantilevers Scanning near-field optical microscopy using piezoelectric cantilevers Scanning near-field optical microscopy using piezoelectric cantilevers Surface and Interface Analysis, 27, 503-506 Surface and Interface Analysis, 27, 503-506 Surface and Interface Analysis, 27, 503-506 1999 Refereed English Research paper(scientific journal) Disclose to all
X. Chen; H. Yamada; T. Horiuchi; K. Matsushige X. Chen; H. Yamada; T. Horiuchi; K. Matsushige X. Chen; H. Yamada; T. Horiuchi; K. Matsushige Investigation of surface potential of ferroelectric organic molecules by scanning probe microscopy Investigation of surface potential of ferroelectric organic molecules by scanning probe microscopy Investigation of surface potential of ferroelectric organic molecules by scanning probe microscopy Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 38, 6B, 3932-3935 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 38, 6B, 3932-3935 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 38, 6B, 3932-3935 1999 Refereed English Research paper(scientific journal) Disclose to all
S.-I. Yamamoto; H. Yamada; K. Matsushige; T. Ishida; W. Mizutani; H. Tokumoto S.-I. Yamamoto; H. Yamada; K. Matsushige; T. Ishida; W. Mizutani; H. Tokumoto S.-I. Yamamoto; H. Yamada; K. Matsushige; T. Ishida; W. Mizutani; H. Tokumoto Nanoscopic imaging of mechanical properties of metal films with magnetic-force-controlled AFM Nanoscopic imaging of mechanical properties of metal films with magnetic-force-controlled AFM Nanoscopic imaging of mechanical properties of metal films with magnetic-force-controlled AFM Surface Science, 433, 567-574 Surface Science, 433, 567-574 Surface Science, 433, 567-574 1999 Refereed English Research paper(scientific journal) Disclose to all
X.Q. Chen; H. Yamada; Y. Terai; T. Horiuchi; K. Matsushige; P.S. Weiss X.Q. Chen; H. Yamada; Y. Terai; T. Horiuchi; K. Matsushige; P.S. Weiss X.Q. Chen; H. Yamada; Y. Terai; T. Horiuchi; K. Matsushige; P.S. Weiss Strong substrate effect in local poling of ultrathin ferroelectric polymer films Strong substrate effect in local poling of ultrathin ferroelectric polymer films Strong substrate effect in local poling of ultrathin ferroelectric polymer films Thin Solid Films, 353, 259-263 Thin Solid Films, 353, 259-263 Thin Solid Films, 353, 259-263 1999 Refereed English Research paper(scientific journal) Disclose to all
L. Men; Q. Chen; H. Tada; H. Yamada; K. Matsushige L. Men; Q. Chen; H. Tada; H. Yamada; K. Matsushige L. Men; Q. Chen; H. Tada; H. Yamada; K. Matsushige Nanometer scale current-voltage charcteristics of C<sub>60</sub> films Nanometer scale current-voltage charcteristics of C<sub>60</sub> films Nanometer scale current-voltage charcteristics of C<sub>60</sub> films Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals, 337, 519-523 Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals, 337, 519-523 Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals, 337, 519-523 1999 Refereed English Research paper(scientific journal) Disclose to all
Q. Chen; H. Tada; H. Yamada; K. Matsushige Q. Chen; H. Tada; H. Yamada; K. Matsushige Q. Chen; H. Tada; H. Yamada; K. Matsushige Local electrical properties of vanadyl phthalocyanine multilayers studied by atomic force microscopy Local electrical properties of vanadyl phthalocyanine multilayers studied by atomic force microscopy Local electrical properties of vanadyl phthalocyanine multilayers studied by atomic force microscopy Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals, 337, 505-509 Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals, 337, 505-509 Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals, 337, 505-509 1999 Refereed English Research paper(scientific journal) Disclose to all
X. Q. Chen, H. Yamada, T. Horiuchi, K. Matsushige and P. S. Weiss X. Q. Chen, H. Yamada, T. Horiuchi, K. Matsushige and P. S. Weiss X. Q. Chen, H. Yamada, T. Horiuchi, K. Matsushige and P. S. Weiss Formation of Nanoscale Polarized Domains in Organic Ferroelectric Thin Films by Scanning Force Microscopy Formation of Nanoscale Polarized Domains in Organic Ferroelectric Thin Films by Scanning Force Microscopy Formation of Nanoscale Polarized Domains in Organic Ferroelectric Thin Films by Scanning Force Microscopy Molecular Crystals and Liquid Crystals, 337, 285-288 Molecular Crystals and Liquid Crystals, 337, 285-288 Molecular Crystals and Liquid Crystals, 337, 285-288 1999 Refereed English Research paper(scientific journal) Disclose to all
S.P. Jarvis; U. Durig; M.A. Lantz; H. Yamada; H. Tokumoto S.P. Jarvis; U. Durig; M.A. Lantz; H. Yamada; H. Tokumoto S.P. Jarvis; U. Durig; M.A. Lantz; H. Yamada; H. Tokumoto Feedback stabilized force-sensors: A gateway to the direct measurement of interaction potentials Feedback stabilized force-sensors: A gateway to the direct measurement of interaction potentials Feedback stabilized force-sensors: A gateway to the direct measurement of interaction potentials Applied Physics A: Materials Science and Processing, 66, S211-S213 Applied Physics A: Materials Science and Processing, 66, S211-S213 Applied Physics A: Materials Science and Processing, 66, S211-S213 1998 Refereed English Research paper(scientific journal) Disclose to all
K. Matsushige; H. Yamada; H. Tada; T. Horiuchi; X.Q. Chen K. Matsushige; H. Yamada; H. Tada; T. Horiuchi; X.Q. Chen K. Matsushige; H. Yamada; H. Tada; T. Horiuchi; X.Q. Chen Nanoscopic molecular memories Nanoscopic molecular memories Nanoscopic molecular memories Annals of the New York Academy of Sciences, 852, 290-305 Annals of the New York Academy of Sciences, 852, 290-305 Annals of the New York Academy of Sciences, 852, 290-305 1998 Refereed English Research paper(scientific journal) Disclose to all
K. Kobayashi; J. Umemura; T. Horiuchi; H. Yamada; K. Matsushige K. Kobayashi; J. Umemura; T. Horiuchi; H. Yamada; K. Matsushige K. Kobayashi; J. Umemura; T. Horiuchi; H. Yamada; K. Matsushige Structural study on self-assembled monolayers of alkanedithiol molecules Structural study on self-assembled monolayers of alkanedithiol molecules Structural study on self-assembled monolayers of alkanedithiol molecules Japanese Journal of Applied Physics, Part 2: Letters, 37, 3A, L297-L299 Japanese Journal of Applied Physics, Part 2: Letters, 37, 3A, L297-L299 Japanese Journal of Applied Physics, Part 2: Letters, 37, 3A, L297-L299 1998 Refereed English Research paper(scientific journal) Disclose to all
K. Kobayashi; T. Horiuchi; H. Yamada; K. Matsushige K. Kobayashi; T. Horiuchi; H. Yamada; K. Matsushige K. Kobayashi; T. Horiuchi; H. Yamada; K. Matsushige Structures and electrical properties of self-assembled monolayers of alkanethiol and alkanedithiol Structures and electrical properties of self-assembled monolayers of alkanethiol and alkanedithiol Structures and electrical properties of self-assembled monolayers of alkanethiol and alkanedithiol Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals, 316, 167-170 Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals, 316, 167-170 Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals, 316, 167-170 1998 Refereed English Research paper(scientific journal) Disclose to all
K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige K. Kobayashi; H. Yamada; T. Horiuchi; K. Matsushige The molecular arrangements of alkanethiol self-assembled monolayers on Au(111) studied by scanning tunneling microscopy The molecular arrangements of alkanethiol self-assembled monolayers on Au(111) studied by scanning tunneling microscopy The molecular arrangements of alkanethiol self-assembled monolayers on Au(111) studied by scanning tunneling microscopy Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 37, 11, 6183-6185 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 37, 11, 6183-6185 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 37, 11, 6183-6185 1998 Refereed English Research paper(scientific journal) Disclose to all
X. Chen; H. Yamada; T. Horiuchi; K. Matsushige X. Chen; H. Yamada; T. Horiuchi; K. Matsushige X. Chen; H. Yamada; T. Horiuchi; K. Matsushige Structures and local polarized domains of ferroelectric organic films studied by atomic force microscopy Structures and local polarized domains of ferroelectric organic films studied by atomic force microscopy Structures and local polarized domains of ferroelectric organic films studied by atomic force microscopy Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 37, 6B, 3834-3837 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 37, 6B, 3834-3837 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 37, 6B, 3834-3837 1998 Refereed English Research paper(scientific journal) Disclose to all
K. Matsushige; H. Yamada; H. Tanaka; T. Horiuchi; X.Q. Chen K. Matsushige; H. Yamada; H. Tanaka; T. Horiuchi; X.Q. Chen K. Matsushige; H. Yamada; H. Tanaka; T. Horiuchi; X.Q. Chen Nanoscale control and detection of electric dipoles in organic molecules Nanoscale control and detection of electric dipoles in organic molecules Nanoscale control and detection of electric dipoles in organic molecules Nanotechnology, 9, 3, 208-211 Nanotechnology, 9, 3, 208-211 Nanotechnology, 9, 3, 208-211 1998 Refereed English Research paper(scientific journal) Disclose to all
K. Kobayashi; T. Horiuchi; H. Yamada; K. Matsushige K. Kobayashi; T. Horiuchi; H. Yamada; K. Matsushige K. Kobayashi; T. Horiuchi; H. Yamada; K. Matsushige STM studies on nanoscopic structures and electric characteristics of alkanethiol and alkanedithiol self-assembled monolayers STM studies on nanoscopic structures and electric characteristics of alkanethiol and alkanedithiol self-assembled monolayers STM studies on nanoscopic structures and electric characteristics of alkanethiol and alkanedithiol self-assembled monolayers Thin Solid Films, 331, 12, 210-215 Thin Solid Films, 331, 12, 210-215 Thin Solid Films, 331, 12, 210-215 1998 Refereed English Research paper(scientific journal) Disclose to all
M. Kageshima; T. Imayoshi; H. Yamada; K. Nakayama; H. Sakama; A. Kawazu M. Kageshima; T. Imayoshi; H. Yamada; K. Nakayama; H. Sakama; A. Kawazu M. Kageshima; T. Imayoshi; H. Yamada; K. Nakayama; H. Sakama; A. Kawazu Nature of tip-sample interaction in dynamic mode atomic force microscopy Nature of tip-sample interaction in dynamic mode atomic force microscopy Nature of tip-sample interaction in dynamic mode atomic force microscopy Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 36, 12A, 7354-7357 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 36, 12A, 7354-7357 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 36, 12A, 7354-7357 1997/12 Refereed English Research paper(scientific journal) Disclose to all
S.-I. Yamamoto; H. Yamada; H. Tokumoto S.-I. Yamamoto; H. Yamada; H. Tokumoto S.-I. Yamamoto; H. Yamada; H. Tokumoto Precise force curve detection system with a cantilever controlled by magnetic force feedback Precise force curve detection system with a cantilever controlled by magnetic force feedback Precise force curve detection system with a cantilever controlled by magnetic force feedback Review of Scientific Instruments, 68, 11, 4132-4136 Review of Scientific Instruments, 68, 11, 4132-4136 Review of Scientific Instruments, 68, 11, 4132-4136 1997/11 Refereed English Research paper(scientific journal) Disclose to all
S.-I. Yamamoto; H. Yamada; H. Tokumoto S.-I. Yamamoto; H. Yamada; H. Tokumoto S.-I. Yamamoto; H. Yamada; H. Tokumoto Precise force curves in air and liquid by magnetic force feedback Precise force curves in air and liquid by magnetic force feedback Precise force curves in air and liquid by magnetic force feedback Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 15, 5, 1633-1636 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 15, 5, 1633-1636 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 15, 5, 1633-1636 1997/09 Refereed English Research paper(scientific journal) Disclose to all
T. Fujii; M. Yamaguchi; M. Suzuki; H. Yamada; K. Nakayama T. Fujii; M. Yamaguchi; M. Suzuki; H. Yamada; K. Nakayama T. Fujii; M. Yamaguchi; M. Suzuki; H. Yamada; K. Nakayama Error budget of step height and pitch measurement using a scanning tunneling microscope with a three-dimensional interferometer Error budget of step height and pitch measurement using a scanning tunneling microscope with a three-dimensional interferometer Error budget of step height and pitch measurement using a scanning tunneling microscope with a three-dimensional interferometer Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 15, 4, 1494-1497 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 15, 4, 1494-1497 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 15, 4, 1494-1497 1997/07 Refereed English Research paper(scientific journal) Disclose to all
S.-I. Yamamoto; T. Ishida; W. Mizutani; H. Tokumoto; H. Yamada S.-I. Yamamoto; T. Ishida; W. Mizutani; H. Tokumoto; H. Yamada S.-I. Yamamoto; T. Ishida; W. Mizutani; H. Tokumoto; H. Yamada Identification of materials using direct force modulation technique with magnetic AFM cantilever Identification of materials using direct force modulation technique with magnetic AFM cantilever Identification of materials using direct force modulation technique with magnetic AFM cantilever Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 36, 6B, 3868-3871 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 36, 6B, 3868-3871 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 36, 6B, 3868-3871 1997/06 Refereed English Research paper(scientific journal) Disclose to all
S.P. Jarvis; S.-I. Yamamoto; H. Yamada; H. Tokumoto; J.B. Pethica S.P. Jarvis; S.-I. Yamamoto; H. Yamada; H. Tokumoto; J.B. Pethica S.P. Jarvis; S.-I. Yamamoto; H. Yamada; H. Tokumoto; J.B. Pethica Tip-surface interactions studied using a force controlled atomic force microscope in ultrahigh vacuum Tip-surface interactions studied using a force controlled atomic force microscope in ultrahigh vacuum Tip-surface interactions studied using a force controlled atomic force microscope in ultrahigh vacuum Applied Physics Letters, 70, 17, 2238-2240 Applied Physics Letters, 70, 17, 2238-2240 Applied Physics Letters, 70, 17, 2238-2240 1997/04/28 Refereed English Research paper(scientific journal) Disclose to all
S. Yamamoto and H. Yamada S. Yamamoto and H. Yamada S. Yamamoto and H. Yamada Interpretation of Direct and Indirect Force Modulation Methods Using Polymer Films Interpretation of Direct and Indirect Force Modulation Methods Using Polymer Films Interpretation of Direct and Indirect Force Modulation Methods Using Polymer Films Langmuir, 13, 4861-4864 Langmuir, 13, 4861-4864 Langmuir, 13, 4861-4864 1997 Refereed English Research paper(scientific journal) Disclose to all
S. P. Jarvis; S. Yamamoto; H. Yamada; H. Tokumoto and J. B. Pethica S. P. Jarvis; S. Yamamoto; H. Yamada; H. Tokumoto and J. B. Pethica S. P. Jarvis; S. Yamamoto; H. Yamada; H. Tokumoto and J. B. Pethica Direct mechanical measurement of interatomic potentials Direct mechanical measurement of interatomic potentials Direct mechanical measurement of interatomic potentials Nature, 384, 21, 247-249 Nature, 384, 21, 247-249 Nature, 384, 21, 247-249 1996/11 Refereed English Research paper(scientific journal) Disclose to all
S. P. Jarvis; H. Yamada; S. Yamamoto; and H. Tokumoto S. P. Jarvis; H. Yamada; S. Yamamoto; and H. Tokumoto S. P. Jarvis; H. Yamada; S. Yamamoto; and H. Tokumoto A new force controlled atomic force microscope for use in ultrahigh vacuum A new force controlled atomic force microscope for use in ultrahigh vacuum A new force controlled atomic force microscope for use in ultrahigh vacuum Review of Scientific Instruments, 67, 6, 2281-2285 Review of Scientific Instruments, 67, 6, 2281-2285 Review of Scientific Instruments, 67, 6, 2281-2285 1996/06 Refereed English Research paper(scientific journal) Disclose to all
G. Misawa; H. Yamada; Y. Seino; K. Nakayama G. Misawa; H. Yamada; Y. Seino; K. Nakayama G. Misawa; H. Yamada; Y. Seino; K. Nakayama Atomic force microscopy of cracks on Si(100) and GaAs(100) caused by Vickers indenter Atomic force microscopy of cracks on Si(100) and GaAs(100) caused by Vickers indenter Atomic force microscopy of cracks on Si(100) and GaAs(100) caused by Vickers indenter Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 35, 6B, 3778-3782 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 35, 6B, 3778-3782 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 35, 6B, 3778-3782 1996/06 Refereed English Research paper(scientific journal) Disclose to all
H. Yamada; H. Tokumoto; S. Akamine; K. Fukuzawa; H. Kuwano H. Yamada; H. Tokumoto; S. Akamine; K. Fukuzawa; H. Kuwano H. Yamada; H. Tokumoto; S. Akamine; K. Fukuzawa; H. Kuwano Imaging of organic molecular films using a scanning near-field optical microscope combined with an atomic force microscope Imaging of organic molecular films using a scanning near-field optical microscope combined with an atomic force microscope Imaging of organic molecular films using a scanning near-field optical microscope combined with an atomic force microscope Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 14, 2, 812-815 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 14, 2, 812-815 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 14, 2, 812-815 1996/03 Refereed English Research paper(scientific journal) Disclose to all
S. Akamine; H. Kuwano; H. Yamada S. Akamine; H. Kuwano; H. Yamada S. Akamine; H. Kuwano; H. Yamada Scanning near-field optical microscope using an atomic force microscope cantilever with integrated photodiode Scanning near-field optical microscope using an atomic force microscope cantilever with integrated photodiode Scanning near-field optical microscope using an atomic force microscope cantilever with integrated photodiode Applied Physics Letters, 68, 5, 579-581 Applied Physics Letters, 68, 5, 579-581 Applied Physics Letters, 68, 5, 579-581 1996/01 Refereed English Research paper(scientific journal) Disclose to all
K. Fukuzawa; Y. Tanaka; S. Akamine; H. Kuwano; H. Yamada K. Fukuzawa; Y. Tanaka; S. Akamine; H. Kuwano; H. Yamada K. Fukuzawa; Y. Tanaka; S. Akamine; H. Kuwano; H. Yamada Imaging of optical and topographical distributions by simultaneous near field scanning optical/atomic force microscopy with a microfabricated photocantilever Imaging of optical and topographical distributions by simultaneous near field scanning optical/atomic force microscopy with a microfabricated photocantilever Imaging of optical and topographical distributions by simultaneous near field scanning optical/atomic force microscopy with a microfabricated photocantilever Journal of Applied Physics, 78, 12, 7376-7381 Journal of Applied Physics, 78, 12, 7376-7381 Journal of Applied Physics, 78, 12, 7376-7381 1995/12 Refereed English Research paper(scientific journal) Disclose to all
S.-I. Yamamoto; H. Yamada; H.Tokumoto S.-I. Yamamoto; H. Yamada; H.Tokumoto S.-I. Yamamoto; H. Yamada; H.Tokumoto Nanometer modifications of non-conductive materials using resist-films by atomic force microscopy Nanometer modifications of non-conductive materials using resist-films by atomic force microscopy Nanometer modifications of non-conductive materials using resist-films by atomic force microscopy Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 34, 6B, 3396-3399 Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 34, 6B, 3396-3399 Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 34, 6B, 3396-3399 1995/06 Refereed English Research paper(scientific journal) Disclose to all
H. Yamada; Y. Hirata; J. Miyake H. Yamada; Y. Hirata; J. Miyake H. Yamada; Y. Hirata; J. Miyake Force modulation imaging of protein membranes Force modulation imaging of protein membranes Force modulation imaging of protein membranes Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 13, 3, 1742-1745 Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 13, 3, 1742-1745 Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 13, 3, 1742-1745 1995/05 Refereed English Research paper(scientific journal) Disclose to all
T. Fujii; M. Suzuki; M. Yamaguchi; R. Kawaguchi; H. Yamada and K. Nakayama T. Fujii; M. Suzuki; M. Yamaguchi; R. Kawaguchi; H. Yamada and K. Nakayama T. Fujii; M. Suzuki; M. Yamaguchi; R. Kawaguchi; H. Yamada and K. Nakayama Three-dimensional displacement measurement of a tube scanner for a scanning tunneling microscope by optical interferometer Three-dimensional displacement measurement of a tube scanner for a scanning tunneling microscope by optical interferometer Three-dimensional displacement measurement of a tube scanner for a scanning tunneling microscope by optical interferometer Nanotechnology, 6, 121-126 Nanotechnology, 6, 121-126 Nanotechnology, 6, 121-126 1995 Refereed English Research paper(scientific journal) Disclose to all
M. Kageshima; H. Yamada; Y. Morita; H. Tokumoto; K. Nakayama; A. Kawazu M. Kageshima; H. Yamada; Y. Morita; H. Tokumoto; K. Nakayama; A. Kawazu M. Kageshima; H. Yamada; Y. Morita; H. Tokumoto; K. Nakayama; A. Kawazu Tip-induced surface disorder on hydrogen-terminated silicon(111) surface observed by ultrahigh-vacuum atomic force microscopy Tip-induced surface disorder on hydrogen-terminated silicon(111) surface observed by ultrahigh-vacuum atomic force microscopy Tip-induced surface disorder on hydrogen-terminated silicon(111) surface observed by ultrahigh-vacuum atomic force microscopy Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 33, 6B, 3735-3738 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 33, 6B, 3735-3738 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 33, 6B, 3735-3738 1994 Refereed English Research paper(scientific journal) Disclose to all
T. Fujii; M. Suzuki; H. Yamada; K. Nakayama T. Fujii; M. Suzuki; H. Yamada; K. Nakayama T. Fujii; M. Suzuki; H. Yamada; K. Nakayama Development of a new force microscope with a fluorescence optical microscope Development of a new force microscope with a fluorescence optical microscope Development of a new force microscope with a fluorescence optical microscope Thin Solid Films, 243, 407-410 Thin Solid Films, 243, 407-410 Thin Solid Films, 243, 407-410 1994 Refereed English Research paper(scientific journal) Disclose to all
H. Yamada; Y. Hirata; M. Hara; J. Miyake H. Yamada; Y. Hirata; M. Hara; J. Miyake H. Yamada; Y. Hirata; M. Hara; J. Miyake Atomic force microscopy studies of photosynthetic protein membrane Langmuir-Blodgett films Atomic force microscopy studies of photosynthetic protein membrane Langmuir-Blodgett films Atomic force microscopy studies of photosynthetic protein membrane Langmuir-Blodgett films Thin Solid Films, 243, 455-458 Thin Solid Films, 243, 455-458 Thin Solid Films, 243, 455-458 1994 Refereed English Research paper(scientific journal) Disclose to all
M. Kageshima; H. Yamada; K. Nakayama; H. Sakama; A. Kawazu; T. Fujii; M. Suzuki M. Kageshima; H. Yamada; K. Nakayama; H. Sakama; A. Kawazu; T. Fujii; M. Suzuki M. Kageshima; H. Yamada; K. Nakayama; H. Sakama; A. Kawazu; T. Fujii; M. Suzuki Development of an ultrahigh-vacuum atomic Force microscope for investigations of semiconductor surfaces Development of an ultrahigh-vacuum atomic Force microscope for investigations of semiconductor surfaces Development of an ultrahigh-vacuum atomic Force microscope for investigations of semiconductor surfaces Journal of Vacuum Science & Technology B, 11, 6, 1987-1991 Journal of Vacuum Science & Technology B, 11, 6, 1987-1991 Journal of Vacuum Science & Technology B, 11, 6, 1987-1991 1993/11 Refereed English Research paper(scientific journal) Disclose to all
M. Kageshima; H. Yamada; Y. Morita; H. Tokumoto; K. Nakayama and A. Kawazu M. Kageshima; H. Yamada; Y. Morita; H. Tokumoto; K. Nakayama and A. Kawazu M. Kageshima; H. Yamada; Y. Morita; H. Tokumoto; K. Nakayama and A. Kawazu Observation of Hydrogen-Terminated Silicon (111) Surface by Ultrahigh-Vacuum Atomic Force Microscopy Observation of Hydrogen-Terminated Silicon (111) Surface by Ultrahigh-Vacuum Atomic Force Microscopy Observation of Hydrogen-Terminated Silicon (111) Surface by Ultrahigh-Vacuum Atomic Force Microscopy Japanese Journal of Applied Physics, 32, 9B, L1321-L1323 Japanese Journal of Applied Physics, 32, 9B, L1321-L1323 Japanese Journal of Applied Physics, 32, 9B, L1321-L1323 1993/09/15 Refereed English Research paper(scientific journal) Disclose to all
H. Yamada; K. Nakayama H. Yamada; K. Nakayama H. Yamada; K. Nakayama Imaging of organic molecules by atomic force microscopy Imaging of organic molecules by atomic force microscopy Imaging of organic molecules by atomic force microscopy Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 32, 6B, 2958-2961 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 32, 6B, 2958-2961 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 32, 6B, 2958-2961 1993 Refereed English Research paper(scientific journal) Disclose to all
H. Yamada; S. Okada; T. Fujii; M. Kageshima; A. Kawazu; H. Matsuda; H. Nakanishi; K. Nakayama H. Yamada; S. Okada; T. Fujii; M. Kageshima; A. Kawazu; H. Matsuda; H. Nakanishi; K. Nakayama H. Yamada; S. Okada; T. Fujii; M. Kageshima; A. Kawazu; H. Matsuda; H. Nakanishi; K. Nakayama Imaging of polydiacetylenes by atomic force microscopy Imaging of polydiacetylenes by atomic force microscopy Imaging of polydiacetylenes by atomic force microscopy Applied Surface Science, 65-66, C, 366-370 Applied Surface Science, 65-66, C, 366-370 Applied Surface Science, 65-66, C, 366-370 1993 Refereed English Research paper(scientific journal) Disclose to all
H. Yamada; S. Akamine and C. F. Quate H. Yamada; S. Akamine and C. F. Quate H. Yamada; S. Akamine and C. F. Quate Imaging of organic molecular films with the atomic force microscope Imaging of organic molecular films with the atomic force microscope Imaging of organic molecular films with the atomic force microscope Ultramicroscopy, 42-44, 1044-1048 Ultramicroscopy, 42-44, 1044-1048 Ultramicroscopy, 42-44, 1044-1048 1992 Refereed English Research paper(scientific journal) Disclose to all
T. Fujii; M. Suzuki; M. Miyashita; M. Yamaguchi; T. Onuki; H. Nakamura; T. Matsubara; H. Yamada; K. Nakayama T. Fujii; M. Suzuki; M. Miyashita; M. Yamaguchi; T. Onuki; H. Nakamura; T. Matsubara; H. Yamada; K. Nakayama T. Fujii; M. Suzuki; M. Miyashita; M. Yamaguchi; T. Onuki; H. Nakamura; T. Matsubara; H. Yamada; K. Nakayama Micropattern measurement with an atomic force microscope Micropattern measurement with an atomic force microscope Micropattern measurement with an atomic force microscope Journal of Vacuum Science & Technology B, 9, 2, 666-669 Journal of Vacuum Science & Technology B, 9, 2, 666-669 Journal of Vacuum Science & Technology B, 9, 2, 666-669 1991/03 Refereed English Research paper(scientific journal) Disclose to all
H. Yamada; T. Fujii; K. Nakayama H. Yamada; T. Fujii; K. Nakayama H. Yamada; T. Fujii; K. Nakayama Linewidth measurement by a new scanning tunneling microscope Linewidth measurement by a new scanning tunneling microscope Linewidth measurement by a new scanning tunneling microscope Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 28, 11, 2402-2404 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 28, 11, 2402-2404 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 28, 11, 2402-2404 1989 Refereed English Research paper(scientific journal) Disclose to all
H. Yamada; T. Fujii; and K. Nakayama H. Yamada; T. Fujii; and K. Nakayama H. Yamada; T. Fujii; and K. Nakayama Experimental study of forces between a tunnel tip and the graphite surface Experimental study of forces between a tunnel tip and the graphite surface Experimental study of forces between a tunnel tip and the graphite surface Journal of Vacuum Science & Technology A, 6, 313, 293-295 Journal of Vacuum Science & Technology A, 6, 313, 293-295 Journal of Vacuum Science & Technology A, 6, 313, 293-295 1988/03 Refereed English Research paper(scientific journal) Disclose to all
T. Hatsuzawa; Y. Tanimura; H. Yamada; K. Toyoda T. Hatsuzawa; Y. Tanimura; H. Yamada; K. Toyoda T. Hatsuzawa; Y. Tanimura; H. Yamada; K. Toyoda Piezodriven spindle for a specimen holder in the vacuum chamber of a scanning electron microscope Piezodriven spindle for a specimen holder in the vacuum chamber of a scanning electron microscope Piezodriven spindle for a specimen holder in the vacuum chamber of a scanning electron microscope Review of Scientific Instruments, 57, 12, 3110-3113 Review of Scientific Instruments, 57, 12, 3110-3113 Review of Scientific Instruments, 57, 12, 3110-3113 1986/12 Refereed English Research paper(scientific journal) Disclose to all
S. Asaka; H. Yamada; H. Nakatsuka; M. Matsuoka S. Asaka; H. Yamada; H. Nakatsuka; M. Matsuoka S. Asaka; H. Yamada; H. Nakatsuka; M. Matsuoka Collisional Relaxation of Backward Photon Echo in Molecular Sodium Collisional Relaxation of Backward Photon Echo in Molecular Sodium Collisional Relaxation of Backward Photon Echo in Molecular Sodium Journal of the Physical Society of Japan, 52, 9, 3029-3038 Journal of the Physical Society of Japan, 52, 9, 3029-3038 Journal of the Physical Society of Japan, 52, 9, 3029-3038 1983/09 Refereed English Research paper(scientific journal) Disclose to all

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Title language:
Misc
Author Author(Japanese) Author(English) Title Title(Japanese) Title(English) Bibliography Bibliography(Japanese) Bibliography(English) Publication date Refereed paper Language Publishing type Disclose
YAMADA Hirofumi 山田 啓文 YAMADA Hirofumi Nanometer-Scale Electric Potential and Charge Density Measurements in Electrolyte Solution Using Frequency Modulation Atomic Force Microscopy 周波数変調原子間力顕微鏡を用いた溶液環境下のナノスケール電位・電荷密度計測 Nanometer-Scale Electric Potential and Charge Density Measurements in Electrolyte Solution Using Frequency Modulation Atomic Force Microscopy Joural fo the Surface Science of Japan, 37, 10, 475-481 表面科学, 37, 10, 475-481 Joural fo the Surface Science of Japan, 37, 10, 475-481 2016/10 Disclose to all
山田 啓文、小林 圭 山田 啓文、小林 圭 山田 啓文、小林 圭 周波数変調原子間力顕微鏡による抗体分子の高分解能観察 周波数変調原子間力顕微鏡による抗体分子の高分解能観察 周波数変調原子間力顕微鏡による抗体分子の高分解能観察 生物物理, 56, 4, 234-237 生物物理, 56, 4, 234-237 生物物理, 56, 4, 234-237 2016/03 Disclose to all
山田 啓文 山田 啓文 山田 啓文 原子間力顕微鏡による抗体分子の直接可視化とその2次元結晶形成 原子間力顕微鏡による抗体分子の直接可視化とその2次元結晶形成 原子間力顕微鏡による抗体分子の直接可視化とその2次元結晶形成 感染 炎症 免疫, 44, 4, 38-47 感染 炎症 免疫, 44, 4, 38-47 感染 炎症 免疫, 44, 4, 38-47 2014 Japanese Introduction and explanation (bulletin of university, research institution) Disclose to all
山田 啓文 山田 啓文 山田 啓文 周波数変調方式原子間力顕微鏡の開発と液中生体分子イメージング 周波数変調方式原子間力顕微鏡の開発と液中生体分子イメージング 周波数変調方式原子間力顕微鏡の開発と液中生体分子イメージング 光学, 42, 2, 95-101 光学, 42, 2, 95-101 光学, 42, 2, 95-101 2013 Japanese Introduction and explanation (scientific journal) Disclose to all
山田 啓文 山田 啓文 山田 啓文 In-situ FM-AFMによる固液界面の原子・分子スケール評価 In-situ FM-AFMによる固液界面の原子・分子スケール評価 In-situ FM-AFMによる固液界面の原子・分子スケール評価 電気化学, 80, 9, 660-664 電気化学, 80, 9, 660-664 電気化学, 80, 9, 660-664 2012 Japanese Introduction and explanation (scientific journal) Disclose to all
山田 啓文, 松重 和美 山田 啓文, 松重 和美 山田 啓文, 松重 和美 生きたまま生体分子の姿を見る原子間力顕微鏡 生きたまま生体分子の姿を見る原子間力顕微鏡 生きたまま生体分子の姿を見る原子間力顕微鏡 化学, 63, 10, 38-40 化学, 63, 10, 38-40 化学, 63, 10, 38-40 2008 Japanese Introduction and explanation (scientific journal) Disclose to all
山田 啓文 山田 啓文 山田 啓文 溶液環境における原子間力顕微鏡による表面計測 溶液環境における原子間力顕微鏡による表面計測 溶液環境における原子間力顕微鏡による表面計測 表面科学, 29, 4, 221-228 表面科学, 29, 4, 221-228 表面科学, 29, 4, 221-228 2008 Japanese Introduction and explanation (scientific journal) Disclose to all
山田 啓文 山田 啓文 山田 啓文 周波数変調型ケルビンプローブ原子間力顕微鏡による有機薄膜評価 周波数変調型ケルビンプローブ原子間力顕微鏡による有機薄膜評価 周波数変調型ケルビンプローブ原子間力顕微鏡による有機薄膜評価 表面科学, 28, 5, 253-263 表面科学, 28, 5, 253-263 表面科学, 28, 5, 253-263 2007 Japanese Introduction and explanation (scientific journal) Disclose to all
臼田 宏治, 木村 建次郎, 小林 圭, 山田 啓文 臼田 宏治, 木村 建次郎, 小林 圭, 山田 啓文 臼田 宏治, 木村 建次郎, 小林 圭, 山田 啓文 走査型容量顕微鏡によるMOSFET動作時の不純物分布計測 走査型容量顕微鏡によるMOSFET動作時の不純物分布計測 走査型容量顕微鏡によるMOSFET動作時の不純物分布計測 表面科学, 28, 2, 84-90 表面科学, 28, 2, 84-90 表面科学, 28, 2, 84-90 2007 Japanese Introduction and explanation (scientific journal) Disclose to all
山田 啓文 山田 啓文 山田 啓文 周波数検出方式原子間力顕微鏡による有機分子の溶液中高分解能計測 周波数検出方式原子間力顕微鏡による有機分子の溶液中高分解能計測 周波数検出方式原子間力顕微鏡による有機分子の溶液中高分解能計測 真空, 49, 11, 667-672 真空, 49, 11, 667-672 真空, 49, 11, 667-672 2006 Japanese Introduction and explanation (scientific journal) Disclose to all
宮戸 祐治, 小林 圭, 松重 和美, 山田 啓文 宮戸 祐治, 小林 圭, 松重 和美, 山田 啓文 宮戸 祐治, 小林 圭, 松重 和美, 山田 啓文 誘電泳動による分子配向 −単一/少数分子デバイス構築に向けて− 誘電泳動による分子配向 −単一/少数分子デバイス構築に向けて− 誘電泳動による分子配向 −単一/少数分子デバイス構築に向けて− 機能材料, 3, 14-19 機能材料, 3, 14-19 機能材料, 3, 14-19 2006 Japanese Introduction and explanation (scientific journal) Disclose to all
山田 啓文 山田 啓文 山田 啓文 NC−AFMによる構造・物性計測の最先端 NC−AFMによる構造・物性計測の最先端 NC−AFMによる構造・物性計測の最先端 電気化学会誌, 73, 10, 903-908 電気化学会誌, 73, 10, 903-908 電気化学会誌, 73, 10, 903-908 2005 Japanese Introduction and explanation (scientific journal) Disclose to all
山田 啓文 山田 啓文 山田 啓文 ダイナミックモードSPMの有機・バイオセンシングへの応用 ダイナミックモードSPMの有機・バイオセンシングへの応用 ダイナミックモードSPMの有機・バイオセンシングへの応用 有機分子・バイオエレクトロニクス分科会M&BE誌, 15, 4, 187-192 有機分子・バイオエレクトロニクス分科会M&BE誌, 15, 4, 187-192 有機分子・バイオエレクトロニクス分科会M&BE誌, 15, 4, 187-192 2004 Japanese Introduction and explanation (scientific journal) Disclose to all
山田 啓文 山田 啓文 山田 啓文 ダイナミックモード原子間力顕微鏡の有機分子材料評価への応用 ダイナミックモード原子間力顕微鏡の有機分子材料評価への応用 ダイナミックモード原子間力顕微鏡の有機分子材料評価への応用 高分子, 52, 6, 413-418 高分子, 52, 6, 413-418 高分子, 52, 6, 413-418 2003 Japanese Introduction and explanation (scientific journal) Disclose to all
山田 啓文 山田 啓文 山田 啓文 非接触原子間力顕微鏡による有機分子薄膜の構造・表面電位評価 非接触原子間力顕微鏡による有機分子薄膜の構造・表面電位評価 非接触原子間力顕微鏡による有機分子薄膜の構造・表面電位評価 表面科学, 23, 3, 167-177 表面科学, 23, 3, 167-177 表面科学, 23, 3, 167-177 2002 Japanese Introduction and explanation (scientific journal) Disclose to all
山田 啓文、松重 和美 山田 啓文、松重 和美 山田 啓文、松重 和美 高分解能非接触原子間力顕微鏡による有機分子材料の評価 高分解能非接触原子間力顕微鏡による有機分子材料の評価 高分解能非接触原子間力顕微鏡による有機分子材料の評価 真空, 44, 11, 932-939 真空, 44, 11, 932-939 真空, 44, 11, 932-939 2001 Japanese Introduction and explanation (scientific journal) Disclose to all
和田 恭雄、山田 啓文、松重 和美 和田 恭雄、山田 啓文、松重 和美 和田 恭雄、山田 啓文、松重 和美 分子ナノエレクトロニクスの展望 分子ナノエレクトロニクスの展望 分子ナノエレクトロニクスの展望 応用物理, 70, 12, 1395-1406 応用物理, 70, 12, 1395-1406 応用物理, 70, 12, 1395-1406 2001 Japanese Introduction and explanation (scientific journal) Disclose to all
山田 啓文 山田 啓文 山田 啓文 非接触原子間力顕微鏡による有機分子薄膜の局所構造・物性評価 非接触原子間力顕微鏡による有機分子薄膜の局所構造・物性評価 非接触原子間力顕微鏡による有機分子薄膜の局所構造・物性評価 応用物理, 70, 10, 1200-1202 応用物理, 70, 10, 1200-1202 応用物理, 70, 10, 1200-1202 2001 Japanese Introduction and explanation (scientific journal) Disclose to all
山田 啓文 山田 啓文 山田 啓文 AFM微細加工探針による表面記録・加工 AFM微細加工探針による表面記録・加工 AFM微細加工探針による表面記録・加工 第21回表面科学セミナー資料集, 121-133 第21回表面科学セミナー資料集, 121-133 第21回表面科学セミナー資料集, 121-133 2000 Japanese Lecture materials etc.(seminar, tutorial, course, lecture and others) Disclose to all
山田 啓文 山田 啓文 山田 啓文 有機分子薄膜の高分解能AFM観察と局所物性計測 有機分子薄膜の高分解能AFM観察と局所物性計測 有機分子薄膜の高分解能AFM観察と局所物性計測 有機分子・バイオエレクトロニクス分科会M&BE誌, 10, 4, 229-236 有機分子・バイオエレクトロニクス分科会M&BE誌, 10, 4, 229-236 有機分子・バイオエレクトロニクス分科会M&BE誌, 10, 4, 229-236 1999 Japanese Introduction and explanation (scientific journal) Disclose to all
山田 啓文 山田 啓文 山田 啓文 走査プローブ顕微鏡の最近の動向 走査プローブ顕微鏡の最近の動向 走査プローブ顕微鏡の最近の動向 第19回表面科学セミナー資料集, 1-13 第19回表面科学セミナー資料集, 1-13 第19回表面科学セミナー資料集, 1-13 1998 Japanese Lecture materials etc.(seminar, tutorial, course, lecture and others) Disclose to all
山田 啓文 山田 啓文 山田 啓文 原子間力顕微鏡の進展の現状 原子間力顕微鏡の進展の現状 原子間力顕微鏡の進展の現状 表面科学, 17, 1, 2-7 表面科学, 17, 1, 2-7 表面科学, 17, 1, 2-7 1996 Japanese Introduction and explanation (scientific journal) Disclose to all
山田 啓文 山田 啓文 山田 啓文 AFMによる有機分子の観察 AFMによる有機分子の観察 AFMによる有機分子の観察 第13回表面科学セミナー資料集, 1-7 第13回表面科学セミナー資料集, 1-7 第13回表面科学セミナー資料集, 1-7 1993 Japanese Lecture materials etc.(seminar, tutorial, course, lecture and others) Disclose to all
正井 純次, 柴田 禎子, 山田 啓文, 三宅 淳, 清水 肇 正井 純次, 柴田 禎子, 山田 啓文, 三宅 淳, 清水 肇 正井 純次, 柴田 禎子, 山田 啓文, 三宅 淳, 清水 肇 走査型トンネル顕微鏡および原子間力顕微鏡を用いた生体物質の観察 -原理とその適用の現状- 走査型トンネル顕微鏡および原子間力顕微鏡を用いた生体物質の観察 -原理とその適用の現状- 走査型トンネル顕微鏡および原子間力顕微鏡を用いた生体物質の観察 -原理とその適用の現状- 蛋白質 核酸 酵素, 38, 4, 741-752 蛋白質 核酸 酵素, 38, 4, 741-752 蛋白質 核酸 酵素, 38, 4, 741-752 1993 Japanese Introduction and explanation (scientific journal) Disclose to all
山田 啓文 山田 啓文 山田 啓文 原子間力顕微鏡による有機分子の観察 原子間力顕微鏡による有機分子の観察 原子間力顕微鏡による有機分子の観察 応用物理, 61, 3, 270-273 応用物理, 61, 3, 270-273 応用物理, 61, 3, 270-273 1992 Japanese Introduction and explanation (scientific journal) Disclose to all
山田 啓文 山田 啓文 山田 啓文 原子間力顕微鏡 原子間力顕微鏡 原子間力顕微鏡 応用物理, 59, 2, 191-192 応用物理, 59, 2, 191-192 応用物理, 59, 2, 191-192 1990 Japanese Prompt report, short report, and research note, etc.(scientific journal) Disclose to all
山田 啓文 山田 啓文 山田 啓文 非線形誤差の低減 非線形誤差の低減 非線形誤差の低減 応用物理, 58, 10, 1515-1516 応用物理, 58, 10, 1515-1516 応用物理, 58, 10, 1515-1516 1989 Japanese Prompt report, short report, and research note, etc.(scientific journal) Disclose to all
山田 啓文 山田 啓文 山田 啓文 AFM(原子間力顕微鏡) AFM(原子間力顕微鏡) AFM(原子間力顕微鏡) 高分子, 38, 6, 424 高分子, 38, 6, 424 高分子, 38, 6, 424 1989 Japanese Prompt report, short report, and research note, etc.(scientific journal) Disclose to all
山田 啓文 山田 啓文 山田 啓文 AFM の原理と絶縁物表面観察について AFM の原理と絶縁物表面観察について AFM の原理と絶縁物表面観察について 電気化学および工業物理化学, 56, 6, 388-391 電気化学および工業物理化学, 56, 6, 388-391 電気化学および工業物理化学, 56, 6, 388-391 1988 Japanese Introduction and explanation (scientific journal) Disclose to all
山田 啓文 山田 啓文 山田 啓文 STM の精密計測への応用 STM の精密計測への応用 STM の精密計測への応用 精密工学会誌, 53, 12, 1817-1819 精密工学会誌, 53, 12, 1817-1819 精密工学会誌, 53, 12, 1817-1819 1987 Japanese Introduction and explanation (scientific journal) Disclose to all
山田 啓文 山田 啓文 山田 啓文 走査型トンネル顕微鏡の現状と将来 走査型トンネル顕微鏡の現状と将来 走査型トンネル顕微鏡の現状と将来 OplusE, 97, 12, 63-68 OplusE, 97, 12, 63-68 OplusE, 97, 12, 63-68 1987 Japanese Introduction and explanation (scientific journal) Disclose to all
山田 啓文 山田 啓文 山田 啓文 表面構造及びトポグラフィーの高空間分解能計測 表面構造及びトポグラフィーの高空間分解能計測 表面構造及びトポグラフィーの高空間分解能計測 計量研究所報告, 34, 2, 42-52 計量研究所報告, 34, 2, 42-52 計量研究所報告, 34, 2, 42-52 1985 Japanese Introduction and explanation (bulletin of university, research institution) Disclose to all

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Title language:
Conference Activities & Talks
Title Title(Japanese) Title(English) Conference Conference(Japanese) Conference(English) Promotor Promotor(Japanese) Promotor(English) Date Language Assortment Disclose
Molecular-scale Investigations of Solid-Liquid Interfaces by Frequency Modulation Atomic Force Microscopy[Invited] Molecular-scale Investigations of Solid-Liquid Interfaces by Frequency Modulation Atomic Force Microscopy [Invited] Molecular-scale Investigations of Solid-Liquid Interfaces by Frequency Modulation Atomic Force Microscopy [Invited] The 16th European Microscopy Congress (EMC 2016) The 16th European Microscopy Congress (EMC 2016) The 16th European Microscopy Congress (EMC 2016) 2016/08 English Oral presentation(invited, special) Disclose to all
Molecular-Scale Investigations of Solid-Liquid Interfaces by Frequency Modulation Atomic Force Microscopy[Invited] Molecular-Scale Investigations of Solid-Liquid Interfaces by Frequency Modulation Atomic Force Microscopy [Invited] Molecular-Scale Investigations of Solid-Liquid Interfaces by Frequency Modulation Atomic Force Microscopy [Invited] 10th International Symposium on Atomic Level Characterizations for New Materials and Devices’ 15 (ALC’ 15) 10th International Symposium on Atomic Level Characterizations for New Materials and Devices’ 15 (ALC’ 15) 10th International Symposium on Atomic Level Characterizations for New Materials and Devices’ 15 (ALC’ 15) 2015/10 English Oral presentation(invited, special) Disclose to all
Molecular-scale visualization of hydration structures at solid-liquid interfaces by frequency modulation atomic force microscopy[Invited] Molecular-scale visualization of hydration structures at solid-liquid interfaces by frequency modulation atomic force microscopy [Invited] Molecular-scale visualization of hydration structures at solid-liquid interfaces by frequency modulation atomic force microscopy [Invited] 3rd International Symposium on Application of Nano-Geosciences in Petroleum Engineering 3rd International Symposium on Application of Nano-Geosciences in Petroleum Engineering 3rd International Symposium on Application of Nano-Geosciences in Petroleum Engineering 2015/09 English Oral presentation(invited, special) Disclose to all
Molecular-scale Visualization of Solid-Liquid Interfaces by Frequency Modulation Atomic Force Microscopy[Invited] Molecular-scale Visualization of Solid-Liquid Interfaces by Frequency Modulation Atomic Force Microscopy [Invited] Molecular-scale Visualization of Solid-Liquid Interfaces by Frequency Modulation Atomic Force Microscopy [Invited] NIMS Conference 2015 NIMS Conference 2015 NIMS Conference 2015 2015/07 English Oral presentation(invited, special) Disclose to all
Molecular-scale visualization of self-assembly of biomolecules by frequency modulation atomic force microscopy in liquids[Invited] Molecular-scale visualization of self-assembly of biomolecules by frequency modulation atomic force microscopy in liquids [Invited] Molecular-scale visualization of self-assembly of biomolecules by frequency modulation atomic force microscopy in liquids [Invited] The XVII Linz Winter Workshop 2015 The XVII Linz Winter Workshop 2015 The XVII Linz Winter Workshop 2015 2015/01 English Oral presentation(invited, special) Disclose to all
Molecular-scale Investigations of Solid-Liquid Interfaces by both FM-AFM and 3-Dimensional Force Mapping Method[Invited] Molecular-scale Investigations of Solid-Liquid Interfaces by both FM-AFM and 3-Dimensional Force Mapping Method [Invited] Molecular-scale Investigations of Solid-Liquid Interfaces by both FM-AFM and 3-Dimensional Force Mapping Method [Invited] XXI International Summer School “Nicolás Cabrera" XXI International Summer School “Nicolás Cabrera" XXI International Summer School “Nicolás Cabrera" 2014/07 English Oral presentation(invited, special) Disclose to all
Molecular-scale visualization of biomolecules and their biochemical functions by frequency modulation atomic force microscopy[Invited] Molecular-scale visualization of biomolecules and their biochemical functions by frequency modulation atomic force microscopy [Invited] Molecular-scale visualization of biomolecules and their biochemical functions by frequency modulation atomic force microscopy [Invited] 5th Multifrequency AFM Conference 5th Multifrequency AFM Conference 5th Multifrequency AFM Conference 2014/06 English Oral presentation(invited, special) Disclose to all
FM-AFMおよび3次元フォースマッピング法による固液界面領域の高分解能構造・物性可視化[Invited] FM-AFMおよび3次元フォースマッピング法による固液界面領域の高分解能構造・物性可視化 [Invited] FM-AFMおよび3次元フォースマッピング法による固液界面領域の高分解能構造・物性可視化 [Invited] 電気化学会第81回大会 電気化学会第81回大会 電気化学会第81回大会 2014/03/29 Japanese Oral presentation(invited, special) Disclose to all
FM-AFMおよび3次元フォースマッピング法による液中高分解能生体分子可視化の現状と展望[Invited] FM-AFMおよび3次元フォースマッピング法による液中高分解能生体分子可視化の現状と展望 [Invited] FM-AFMおよび3次元フォースマッピング法による液中高分解能生体分子可視化の現状と展望 [Invited] 日本顕微鏡学会SPM分科会 バイオ系SPM研究会 日本顕微鏡学会SPM分科会 バイオ系SPM研究会 日本顕微鏡学会SPM分科会 バイオ系SPM研究会 2013/12/08 Japanese Oral presentation(invited, special) Disclose to all
周波数変調原子間力顕微鏡による液中高分解能生体分子可視化[Invited] 周波数変調原子間力顕微鏡による液中高分解能生体分子可視化 [Invited] 周波数変調原子間力顕微鏡による液中高分解能生体分子可視化 [Invited] 顕微鏡学会第57回シンポジウム 顕微鏡学会第57回シンポジウム 顕微鏡学会第57回シンポジウム 2013/11/16 Japanese Oral presentation(invited, special) Disclose to all
Molecular-scale 3D Visualization of Solid-liquid Interfaces by Force Mapping Method Based on Frequency Modulation Atomic Force Microscopy[Invited] Molecular-scale 3D Visualization of Solid-liquid Interfaces by Force Mapping Method Based on Frequency Modulation Atomic Force Microscopy [Invited] Molecular-scale 3D Visualization of Solid-liquid Interfaces by Force Mapping Method Based on Frequency Modulation Atomic Force Microscopy [Invited] 2013 JSAP-MRS Joint Symposia 2013 JSAP-MRS Joint Symposia 2013 JSAP-MRS Joint Symposia 2013/09 English Oral presentation(invited, special) Disclose to all
Molecular-Scale Biological Interactions in Liquids Revealed by Frequency Modulation Atomic Force Microscopy[Invited] Molecular-Scale Biological Interactions in Liquids Revealed by Frequency Modulation Atomic Force Microscopy [Invited] Molecular-Scale Biological Interactions in Liquids Revealed by Frequency Modulation Atomic Force Microscopy [Invited] AFM BioMed Conference AFM BioMed Conference AFM BioMed Conference 2013/05 English Oral presentation(invited, special) Disclose to all
Molecular-scale 3D Visualization of Solid-liquid Interfaces by Frequency Modulation Atomic Force Microscopy[Invited] Molecular-scale 3D Visualization of Solid-liquid Interfaces by Frequency Modulation Atomic Force Microscopy [Invited] Molecular-scale 3D Visualization of Solid-liquid Interfaces by Frequency Modulation Atomic Force Microscopy [Invited] 2013 Materials Research Society Spring Meeting 2013 Materials Research Society Spring Meeting 2013 Materials Research Society Spring Meeting 2013/04 English Oral presentation(invited, special) Disclose to all
Molecular-Scale Biological Interactions in Liquids Investigated by Atomic Force Microscopy[Invited] Molecular-Scale Biological Interactions in Liquids Investigated by Atomic Force Microscopy [Invited] Molecular-Scale Biological Interactions in Liquids Investigated by Atomic Force Microscopy [Invited] CRC International Symposium New Challenges on the Bio-interfaces: Structures and Dynamics CRC International Symposium New Challenges on the Bio-interfaces: Structures and Dynamics CRC International Symposium New Challenges on the Bio-interfaces: Structures and Dynamics 2013/02 English Oral presentation(invited, special) Disclose to all
周波数変調原子間力顕微鏡による固体表面/分子薄膜-溶液界面の分子スケー ル3次元構造・物性可視[Invited] 周波数変調原子間力顕微鏡による固体表面/分子薄膜-溶液界面の分子スケー ル3次元構造・物性可視 [Invited] 周波数変調原子間力顕微鏡による固体表面/分子薄膜-溶液界面の分子スケー ル3次元構造・物性可視 [Invited] 油化学会オレオマテリアル部会講演会 油化学会オレオマテリアル部会講演会 油化学会オレオマテリアル部会講演会 2013/01/17 Japanese Oral presentation(invited, special) Disclose to all
原子間力顕微鏡による分子スケール固液界面計測の最近の動向[Invited] 原子間力顕微鏡による分子スケール固液界面計測の最近の動向 [Invited] 原子間力顕微鏡による分子スケール固液界面計測の最近の動向 [Invited] 第53回 真空に関する連合講演会 第53回 真空に関する連合講演会 第53回 真空に関する連合講演会 2012/11/15 Japanese Oral presentation(invited, special) Disclose to all
Molecular-scale visualization of biomolecules and their biochemical functions by frequency modulation atomic force microscopy[Invited] Molecular-scale visualization of biomolecules and their biochemical functions by frequency modulation atomic force microscopy [Invited] Molecular-scale visualization of biomolecules and their biochemical functions by frequency modulation atomic force microscopy [Invited] 3rd Kanazawa Bio-AFM Workshop 3rd Kanazawa Bio-AFM Workshop 3rd Kanazawa Bio-AFM Workshop 2012/11/08 English Oral presentation(invited, special) Disclose to all
Molecular-scale Imaging of Biomolecules and Visualization of Their Biochemical Functions by Frequency Modulation Atomic Force Microscopy[Invited] Molecular-scale Imaging of Biomolecules and Visualization of Their Biochemical Functions by Frequency Modulation Atomic Force Microscopy [Invited] Molecular-scale Imaging of Biomolecules and Visualization of Their Biochemical Functions by Frequency Modulation Atomic Force Microscopy [Invited] 大阪大学応用物理学専攻 LaSIEセミナー 大阪大学応用物理学専攻 LaSIEセミナー 大阪大学応用物理学専攻 LaSIEセミナー 2012/11/06 English Oral presentation(invited, special) Disclose to all
FM-AFM が明らかにする固液界面の微視的描像−最近の研究動向と今後の展開・ロードマップ−[Invited] FM-AFM が明らかにする固液界面の微視的描像−最近の研究動向と今後の展開・ロードマップ− [Invited] FM-AFM が明らかにする固液界面の微視的描像−最近の研究動向と今後の展開・ロードマップ− [Invited] ナノプローブテクノロジー第167委員会 第68回研究会 ナノプローブテクノロジー第167委員会 第68回研究会 ナノプローブテクノロジー第167委員会 第68回研究会 2012/10/18 Japanese Oral presentation(invited, special) Disclose to all
Atomic-scale 3D Visualization of Solid-Liquid Interfaces by FM-AFM[Invited] Atomic-scale 3D Visualization of Solid-Liquid Interfaces by FM-AFM [Invited] Atomic-scale 3D Visualization of Solid-Liquid Interfaces by FM-AFM [Invited] Japan-Netherlands Symposium on Crystal Growth -Theory and in situ Measurements- (JANE-2012) Japan-Netherlands Symposium on Crystal Growth -Theory and in situ Measurements- (JANE-2012) Japan-Netherlands Symposium on Crystal Growth -Theory and in situ Measurements- (JANE-2012) 2012/07 English Oral presentation(invited, special) Disclose to all
Recent Progress in High-resolution Frequency Modulation Atomic Force Microscopy in Various Environments[Invited] Recent Progress in High-resolution Frequency Modulation Atomic Force Microscopy in Various Environments [Invited] Recent Progress in High-resolution Frequency Modulation Atomic Force Microscopy in Various Environments [Invited] 9th MicRO Alliance Meeting 9th MicRO Alliance Meeting 9th MicRO Alliance Meeting 2012/06 English Oral presentation(invited, special) Disclose to all
原子間力顕微鏡による液中原子分解能観察の最前線[Invited] 原子間力顕微鏡による液中原子分解能観察の最前線 [Invited] 原子間力顕微鏡による液中原子分解能観察の最前線 [Invited] 日本表面科学会平成24年特別講演会 日本表面科学会平成24年特別講演会 日本表面科学会平成24年特別講演会 2012/05/19 Japanese Oral presentation(invited, special) Disclose to all
液中原子間力顕微鏡による高分解能イメージングの現状とその固液界面計測への応用[Invited] 液中原子間力顕微鏡による高分解能イメージングの現状とその固液界面計測への応用 [Invited] 液中原子間力顕微鏡による高分解能イメージングの現状とその固液界面計測への応用 [Invited] 日本顕微鏡学会第68回学術講演会 日本顕微鏡学会第68回学術講演会 日本顕微鏡学会第68回学術講演会 2012/05/16 Japanese Oral presentation(invited, special) Disclose to all
原子間力顕微鏡による固液界面の原子・分子スケール計測の現状と展望[Invited] 原子間力顕微鏡による固液界面の原子・分子スケール計測の現状と展望 [Invited] 原子間力顕微鏡による固液界面の原子・分子スケール計測の現状と展望 [Invited] 基盤研究S「原子分解能顕微鏡の歴史と最先端」研究会−森田教授紫綬褒章受章&退職記念公開シンポジウム− 基盤研究S「原子分解能顕微鏡の歴史と最先端」研究会−森田教授紫綬褒章受章&退職記念公開シンポジウム− 基盤研究S「原子分解能顕微鏡の歴史と最先端」研究会−森田教授紫綬褒章受章&退職記念公開シンポジウム− 2012/02/10 Japanese Oral presentation(invited, special) Disclose to all
周波数変調原子間力顕微鏡による生体分子可視化の現状と展望[Invited] 周波数変調原子間力顕微鏡による生体分子可視化の現状と展望 [Invited] 周波数変調原子間力顕微鏡による生体分子可視化の現状と展望 [Invited] 定量生物学会第4回年会 定量生物学会第4回年会 定量生物学会第4回年会 2012/01/08 Japanese Oral presentation(invited, special) Disclose to all
FM-AFMによる生体分子イメージングおよびその機能計測への応用[Invited] FM-AFMによる生体分子イメージングおよびその機能計測への応用 [Invited] FM-AFMによる生体分子イメージングおよびその機能計測への応用 [Invited] 顕微鏡学会関西支部・特別講演会 AFMバイオイメージングフォーラム 顕微鏡学会関西支部・特別講演会 AFMバイオイメージングフォーラム 顕微鏡学会関西支部・特別講演会 AFMバイオイメージングフォーラム 2011/12/27 Japanese Oral presentation(invited, special) Disclose to all
周波数変調原子間力顕微鏡による分子スケール固液界面評価[Invited] 周波数変調原子間力顕微鏡による分子スケール固液界面評価 [Invited] 周波数変調原子間力顕微鏡による分子スケール固液界面評価 [Invited] 表面科学会中部支部「プローブ顕微鏡の新展開」 表面科学会中部支部「プローブ顕微鏡の新展開」 表面科学会中部支部「プローブ顕微鏡の新展開」 2011/11/25 Japanese Oral presentation(invited, special) Disclose to all
プローブ顕微鏡による液中原子・分子スケールイメージングおよび固液界面評価の最前線[Invited] プローブ顕微鏡による液中原子・分子スケールイメージングおよび固液界面評価の最前線 [Invited] プローブ顕微鏡による液中原子・分子スケールイメージングおよび固液界面評価の最前線 [Invited] 第39回薄膜・表面物理セミナー 第39回薄膜・表面物理セミナー 第39回薄膜・表面物理セミナー 2011/10/28 Japanese Oral presentation(invited, special) Disclose to all
プローブ顕微鏡を用いた最新のナノ表面・界面物性評価[Invited] プローブ顕微鏡を用いた最新のナノ表面・界面物性評価 [Invited] プローブ顕微鏡を用いた最新のナノ表面・界面物性評価 [Invited] 第24回マイクロプロセス・ナノテクノロジー国際会議 第24回マイクロプロセス・ナノテクノロジー国際会議 第24回マイクロプロセス・ナノテクノロジー国際会議 2011/10/24 Japanese Oral presentation(invited, special) Disclose to all
AFMによる3次元構造可視化-表面上フォースマップから表面下超音波イメージング-[Invited] AFMによる3次元構造可視化-表面上フォースマップから表面下超音波イメージング- [Invited] AFMによる3次元構造可視化-表面上フォースマップから表面下超音波イメージング- [Invited] ATI バイオSPM 研究会 ATI バイオSPM 研究会 ATI バイオSPM 研究会 2011/09 Japanese Oral presentation(invited, special) Disclose to all
Recent Progress in High-resolution Three-dimensional Force Mapping Method- from Visualization of Hydration Structures to Electrical Potential Mapping -[Invited] Recent Progress in High-resolution Three-dimensional Force Mapping Method- from Visualization of Hydration Structures to Electrical Potential Mapping - [Invited] Recent Progress in High-resolution Three-dimensional Force Mapping Method- from Visualization of Hydration Structures to Electrical Potential Mapping - [Invited] 5th International Conference on Thin Films (ICTF2011) 5th International Conference on Thin Films (ICTF2011) 5th International Conference on Thin Films (ICTF2011) 2011/08 English Oral presentation(invited, special) Disclose to all
Molecular-scale 3D Visualization of Solid-Liquid Interfaces by FM-AFM[Invited] Molecular-scale 3D Visualization of Solid-Liquid Interfaces by FM-AFM [Invited] Molecular-scale 3D Visualization of Solid-Liquid Interfaces by FM-AFM [Invited] XXII Congress & General Assembly, International Union of Crystallography (IUCr2011) XXII Congress & General Assembly, International Union of Crystallography (IUCr2011) XXII Congress & General Assembly, International Union of Crystallography (IUCr2011) 2011/08 English Oral presentation(invited, special) Disclose to all
原子/分子間力を利用した表面・界面物性計測の最近の動向[Invited] 原子/分子間力を利用した表面・界面物性計測の最近の動向 [Invited] 原子/分子間力を利用した表面・界面物性計測の最近の動向 [Invited] 「単分子エレクトロニクスの現状認識と近未来実現へ向けての中核体制構築」2011年度第1回研究会 「単分子エレクトロニクスの現状認識と近未来実現へ向けての中核体制構築」2011年度第1回研究会 「単分子エレクトロニクスの現状認識と近未来実現へ向けての中核体制構築」2011年度第1回研究会 2011/07/23 Japanese Oral presentation(invited, special) Disclose to all
周波数変調原子間力顕微鏡による分子スケールイメージングおよびその固液界面3次元可視化への応用[Invited] 周波数変調原子間力顕微鏡による分子スケールイメージングおよびその固液界面3次元可視化への応用 [Invited] 周波数変調原子間力顕微鏡による分子スケールイメージングおよびその固液界面3次元可視化への応用 [Invited] 第1回Park Systems Japan Users Meeting 第1回Park Systems Japan Users Meeting 第1回Park Systems Japan Users Meeting 2011/07/08 Japanese Oral presentation(invited, special) Disclose to all
Recent Progress in High-resolution Frequency Modulation Atomic Force Microscopy in Various Environments - 3D Visualization of Molecular-scale Structures at Solid-liquid Interfaces-[Invited] Recent Progress in High-resolution Frequency Modulation Atomic Force Microscopy in Various Environments - 3D Visualization of Molecular-scale Structures at Solid-liquid Interfaces- [Invited] Recent Progress in High-resolution Frequency Modulation Atomic Force Microscopy in Various Environments - 3D Visualization of Molecular-scale Structures at Solid-liquid Interfaces- [Invited] The 7th Nanoscience and Nanotechnology Conference (NanoTR7) The 7th Nanoscience and Nanotechnology Conference (NanoTR7) The 7th Nanoscience and Nanotechnology Conference (NanoTR7) 2011/06 English Oral presentation(invited, special) Disclose to all
周波数変調検出原子間力顕微鏡による固液界面の原子スケール評価[Invited] 周波数変調検出原子間力顕微鏡による固液界面の原子スケール評価 [Invited] 周波数変調検出原子間力顕微鏡による固液界面の原子スケール評価 [Invited] 日本地球惑星科学連合 2011年度大会 日本地球惑星科学連合 2011年度大会 日本地球惑星科学連合 2011年度大会 2011/05/24 Japanese Oral presentation(invited, special) Disclose to all
Atomic-scale Investigations of Solid-Liquid Interfaces by Frequency Modulation Atomic Force Microscopy[Invited] Atomic-scale Investigations of Solid-Liquid Interfaces by Frequency Modulation Atomic Force Microscopy [Invited] Atomic-scale Investigations of Solid-Liquid Interfaces by Frequency Modulation Atomic Force Microscopy [Invited] The 29th International Brand Ritchie Workshop (BRW2011) The 29th International Brand Ritchie Workshop (BRW2011) The 29th International Brand Ritchie Workshop (BRW2011) 2011/05 English Oral presentation(invited, special) Disclose to all
周波数変調原子間力顕微鏡による生体分子イメージングの現状と今後の展望[Invited] 周波数変調原子間力顕微鏡による生体分子イメージングの現状と今後の展望 [Invited] 周波数変調原子間力顕微鏡による生体分子イメージングの現状と今後の展望 [Invited] 平成22年度 日本顕微鏡学会 SPM研究部会 研究会 平成22年度 日本顕微鏡学会 SPM研究部会 研究会 平成22年度 日本顕微鏡学会 SPM研究部会 研究会 2011/03 Japanese Oral presentation(invited, special) Disclose to all
原子間力顕微鏡を用いたフォースマッピング法による分子スケール固液界面評価[Invited] 原子間力顕微鏡を用いたフォースマッピング法による分子スケール固液界面評価 [Invited] 原子間力顕微鏡を用いたフォースマッピング法による分子スケール固液界面評価 [Invited] 第14回高分子表面研究討論会 第14回高分子表面研究討論会 第14回高分子表面研究討論会 2011/01/28 Japanese Oral presentation(invited, special) Disclose to all
周波数変調原子間力顕微鏡による生体分子イメージングおよび局所水和構造可視化[Invited] 周波数変調原子間力顕微鏡による生体分子イメージングおよび局所水和構造可視化 [Invited] 周波数変調原子間力顕微鏡による生体分子イメージングおよび局所水和構造可視化 [Invited] 第15回情報バイオトロニクス研究会「ナノ・バイオの融合による新規バイオデバイスに関する研究」 第15回情報バイオトロニクス研究会「ナノ・バイオの融合による新規バイオデバイスに関する研究」 第15回情報バイオトロニクス研究会「ナノ・バイオの融合による新規バイオデバイスに関する研究」 2011/01/25 Japanese Oral presentation(invited, special) Disclose to all
3次元フォースマッピング法による分子スケール固液界面評価[Invited] 3次元フォースマッピング法による分子スケール固液界面評価 [Invited] 3次元フォースマッピング法による分子スケール固液界面評価 [Invited] 表面科学技術研究会2011 固液界面のナノ世界が切り拓くエネルギー、環境、そして命 表面科学技術研究会2011 固液界面のナノ世界が切り拓くエネルギー、環境、そして命 表面科学技術研究会2011 固液界面のナノ世界が切り拓くエネルギー、環境、そして命 2011/01/20 Japanese Oral presentation(invited, special) Disclose to all
High-resolution Three-dimensional Force Mapping in Various Environments[Invited] High-resolution Three-dimensional Force Mapping in Various Environments [Invited] High-resolution Three-dimensional Force Mapping in Various Environments [Invited] The 12th International Scanning Probe Microscopy Conference The 12th International Scanning Probe Microscopy Conference The 12th International Scanning Probe Microscopy Conference 2010/05 English Oral presentation(invited, special) Disclose to all
Molecular-scale Investigations of Functional Biomolecules and Their Hydration Structures by Frequency Modulation Atomic Force Microscopy[Invited] Molecular-scale Investigations of Functional Biomolecules and Their Hydration Structures by Frequency Modulation Atomic Force Microscopy [Invited] Molecular-scale Investigations of Functional Biomolecules and Their Hydration Structures by Frequency Modulation Atomic Force Microscopy [Invited] The 3rd Taiwan-Japan Joint Symposium on Organized Nanomaterials and Nanostructures Related to Photoscience The 3rd Taiwan-Japan Joint Symposium on Organized Nanomaterials and Nanostructures Related to Photoscience The 3rd Taiwan-Japan Joint Symposium on Organized Nanomaterials and Nanostructures Related to Photoscience 2010/03 English Oral presentation(invited, special) Disclose to all
Molecular-scale Investigations of Biomolecules and Their Hydration Structures by Frequency Modulation Atomic Force Microscopy[Invited] Molecular-scale Investigations of Biomolecules and Their Hydration Structures by Frequency Modulation Atomic Force Microscopy [Invited] Molecular-scale Investigations of Biomolecules and Their Hydration Structures by Frequency Modulation Atomic Force Microscopy [Invited] 2nd Global COE International Symposium Electronic Devices Innovation (EDIS2009) 2nd Global COE International Symposium Electronic Devices Innovation (EDIS2009) 2nd Global COE International Symposium Electronic Devices Innovation (EDIS2009) 2010/01 English Oral presentation(invited, special) Disclose to all
Frequency Modulation Atomic Force Microscopy Studies of Biomolecules and Their Local Hydration Structures[Invited] Frequency Modulation Atomic Force Microscopy Studies of Biomolecules and Their Local Hydration Structures [Invited] Frequency Modulation Atomic Force Microscopy Studies of Biomolecules and Their Local Hydration Structures [Invited] Advanced Studies Institute Workshop: Biological Applications of AFM Advanced Studies Institute Workshop: Biological Applications of AFM Advanced Studies Institute Workshop: Biological Applications of AFM 2010/01 English Oral presentation(invited, special) Disclose to all
Molecular-scale Visualization of Biomolecules and their Hydration Structures by Frequency Modulation Atomic Force Microscopy[Invited] Molecular-scale Visualization of Biomolecules and their Hydration Structures by Frequency Modulation Atomic Force Microscopy [Invited] Molecular-scale Visualization of Biomolecules and their Hydration Structures by Frequency Modulation Atomic Force Microscopy [Invited] MBSJ Satellite Symposium 2009 Interface between Nano-biology and Molecular Biology MBSJ Satellite Symposium 2009 Interface between Nano-biology and Molecular Biology MBSJ Satellite Symposium 2009 Interface between Nano-biology and Molecular Biology 2009/12/08 English Oral presentation(invited, special) Disclose to all
生体分子のFM-AFM高分解能観察およびその3次元局所水和構造計測[Invited] 生体分子のFM-AFM高分解能観察およびその3次元局所水和構造計測 [Invited] 生体分子のFM-AFM高分解能観察およびその3次元局所水和構造計測 [Invited] 日本顕微鏡学会 SPM研究部会 第12回研究会 日本顕微鏡学会 SPM研究部会 第12回研究会 日本顕微鏡学会 SPM研究部会 第12回研究会 2009/12 Japanese Oral presentation(invited, special) Disclose to all
高分解能イメージングと水和構造計測[Invited] 高分解能イメージングと水和構造計測 [Invited] 高分解能イメージングと水和構造計測 [Invited] 第58回高分子討論会 第58回高分子討論会 第58回高分子討論会 2009/09/18 Japanese Oral presentation(invited, special) Disclose to all
Frequency Modulation AFM Imaging of Biomolecules and Nanoscale Hydration Force Measurements[Invited] Frequency Modulation AFM Imaging of Biomolecules and Nanoscale Hydration Force Measurements [Invited] Frequency Modulation AFM Imaging of Biomolecules and Nanoscale Hydration Force Measurements [Invited] Seeing at the Nanoscale VII Seeing at the Nanoscale VII Seeing at the Nanoscale VII 2009/07 English Oral presentation(invited, special) Disclose to all
Three-Dimensional Hydration Force Measurement using AFM Cantilevers[Invited] Three-Dimensional Hydration Force Measurement using AFM Cantilevers [Invited] Three-Dimensional Hydration Force Measurement using AFM Cantilevers [Invited] Nanomechnical Cantilever Sensors (NMC 2009) Nanomechnical Cantilever Sensors (NMC 2009) Nanomechnical Cantilever Sensors (NMC 2009) 2009/05 English Oral presentation(invited, special) Disclose to all
High-resolution Imaging in Liquids by Frequency Modulation Atomic Force Microscopy[Invited] High-resolution Imaging in Liquids by Frequency Modulation Atomic Force Microscopy [Invited] High-resolution Imaging in Liquids by Frequency Modulation Atomic Force Microscopy [Invited] The 2nd International Symposium "Interface Mineralogy" The 2nd International Symposium "Interface Mineralogy" The 2nd International Symposium "Interface Mineralogy" 2009/03 English Oral presentation(invited, special) Disclose to all
Frequency Modulation AFM Imaging of Biomolecules and Local Hydration Force Measurements[Invited] Frequency Modulation AFM Imaging of Biomolecules and Local Hydration Force Measurements [Invited] Frequency Modulation AFM Imaging of Biomolecules and Local Hydration Force Measurements [Invited] 2009 WPI-AIMR Annual Workshop 2009 WPI-AIMR Annual Workshop 2009 WPI-AIMR Annual Workshop 2009/03 English Oral presentation(invited, special) Disclose to all
FM-AFMによるDNA2重螺旋構造の高分解能観察[Invited] FM-AFMによるDNA2重螺旋構造の高分解能観察 [Invited] FM-AFMによるDNA2重螺旋構造の高分解能観察 [Invited] 「生命活動を観測する走査型プローブ顕微鏡法研究部会」2008年度日本顕微鏡学会SPM研究部会第11回研究会 「生命活動を観測する走査型プローブ顕微鏡法研究部会」2008年度日本顕微鏡学会SPM研究部会第11回研究会 「生命活動を観測する走査型プローブ顕微鏡法研究部会」2008年度日本顕微鏡学会SPM研究部会第11回研究会 2008/11 Japanese Oral presentation(invited, special) Disclose to all
Subnanometer-resolution Imaging of Biomolecules and Hydration Force Measurements by Frequency Modulation Atomic Force Microscopy[Invited] Subnanometer-resolution Imaging of Biomolecules and Hydration Force Measurements by Frequency Modulation Atomic Force Microscopy [Invited] Subnanometer-resolution Imaging of Biomolecules and Hydration Force Measurements by Frequency Modulation Atomic Force Microscopy [Invited] The 5th International Symposium on Surface Science & Nanotechnology (ISSS-5) The 5th International Symposium on Surface Science & Nanotechnology (ISSS-5) The 5th International Symposium on Surface Science & Nanotechnology (ISSS-5) 2008/11 English Oral presentation(invited, special) Disclose to all
Subnanometer-resolution Imaging of Biomolecules and Hydration Force Measurements by FM-AFM[Invited] Subnanometer-resolution Imaging of Biomolecules and Hydration Force Measurements by FM-AFM [Invited] Subnanometer-resolution Imaging of Biomolecules and Hydration Force Measurements by FM-AFM [Invited] The 9th Asia-Pacific Microscopy Conference (APMC-9) The 9th Asia-Pacific Microscopy Conference (APMC-9) The 9th Asia-Pacific Microscopy Conference (APMC-9) 2008/11 English Oral presentation(invited, special) Disclose to all
Frequency Modulation Atomic Force Microscopy as a Nano-measurement Tool[Invited] Frequency Modulation Atomic Force Microscopy as a Nano-measurement Tool [Invited] Frequency Modulation Atomic Force Microscopy as a Nano-measurement Tool [Invited] 21st International Microprocesses and Nanotechnology Conference (MNC 2008) 21st International Microprocesses and Nanotechnology Conference (MNC 2008) 21st International Microprocesses and Nanotechnology Conference (MNC 2008) 2008/10 English Oral presentation(invited, special) Disclose to all
FM-AFMによる液中高分解能観察と水和構造計測[Invited] FM-AFMによる液中高分解能観察と水和構造計測 [Invited] FM-AFMによる液中高分解能観察と水和構造計測 [Invited] 有機バイオSPM研究会・2008-微小空間を観る・測る- 有機バイオSPM研究会・2008-微小空間を観る・測る- 有機バイオSPM研究会・2008-微小空間を観る・測る- 2008/09/29 Japanese Oral presentation(invited, special) Disclose to all
High Resolution Frequency Modulation AFM Imaging[Invited] High Resolution Frequency Modulation AFM Imaging [Invited] High Resolution Frequency Modulation AFM Imaging [Invited] 1st International Symposium on SPM Standardization 1st International Symposium on SPM Standardization 1st International Symposium on SPM Standardization 2008/07 English Oral presentation(invited, special) Disclose to all
液中での高分解能観測技術[Invited] 液中での高分解能観測技術 [Invited] 液中での高分解能観測技術 [Invited] 日本顕微鏡学会第64回学術講演会 日本顕微鏡学会第64回学術講演会 日本顕微鏡学会第64回学術講演会 2008/05 Japanese Oral presentation(invited, special) Disclose to all
Recent Development of High-resolution Atomic Force Microscopy in Various Environments[Invited] Recent Development of High-resolution Atomic Force Microscopy in Various Environments [Invited] Recent Development of High-resolution Atomic Force Microscopy in Various Environments [Invited] 1st International Symposium on Photonics and Electronics Science and Engineering 1st International Symposium on Photonics and Electronics Science and Engineering 1st International Symposium on Photonics and Electronics Science and Engineering 2008/03 English Oral presentation(invited, special) Disclose to all
Subnanometer-resolution Imaging of Biomolecules and Hydration Force Measurements by Dynamic Force Microscopy[Invited] Subnanometer-resolution Imaging of Biomolecules and Hydration Force Measurements by Dynamic Force Microscopy [Invited] Subnanometer-resolution Imaging of Biomolecules and Hydration Force Measurements by Dynamic Force Microscopy [Invited] 10th Annual Linz Winter Workshop 10th Annual Linz Winter Workshop 10th Annual Linz Winter Workshop 2008/02 English Oral presentation(invited, special) Disclose to all
周波数変調型ケルビンプローブ原子間力顕微鏡による有機薄膜評価[Invited] 周波数変調型ケルビンプローブ原子間力顕微鏡による有機薄膜評価 [Invited] 周波数変調型ケルビンプローブ原子間力顕微鏡による有機薄膜評価 [Invited] 高分子表面研究会 高分子表面研究会 高分子表面研究会 2008/01/17 Japanese Oral presentation(invited, special) Disclose to all
液中での高分解能測定[Invited] 液中での高分解能測定 [Invited] 液中での高分解能測定 [Invited] 「生命活動を観測する走査型プローブ顕微鏡法研究部会」2007年度日本顕微鏡学会SPM研究部会第10回研究会 「生命活動を観測する走査型プローブ顕微鏡法研究部会」2007年度日本顕微鏡学会SPM研究部会第10回研究会 「生命活動を観測する走査型プローブ顕微鏡法研究部会」2007年度日本顕微鏡学会SPM研究部会第10回研究会 2007/12 Japanese Oral presentation(invited, special) Disclose to all
液中原子・分子の識別・操作の最新動向と未来[Invited] 液中原子・分子の識別・操作の最新動向と未来 [Invited] 液中原子・分子の識別・操作の最新動向と未来 [Invited] 第48回研究会「半導体分析技術を支えるSPM技術の現状と未来」 第48回研究会「半導体分析技術を支えるSPM技術の現状と未来」 第48回研究会「半導体分析技術を支えるSPM技術の現状と未来」 2007/11/19 Japanese Oral presentation(invited, special) Disclose to all
High-resolution Imaging in Liquids by Dynamic Force Microscopy[Invited] High-resolution Imaging in Liquids by Dynamic Force Microscopy [Invited] High-resolution Imaging in Liquids by Dynamic Force Microscopy [Invited] ATI International Forum 2007 on Future of SPM in Life Sciences ATI International Forum 2007 on Future of SPM in Life Sciences ATI International Forum 2007 on Future of SPM in Life Sciences 2007/10 English Oral presentation(invited, special) Disclose to all
散逸力の分子像(液中AFM)[Invited] 散逸力の分子像(液中AFM) [Invited] 散逸力の分子像(液中AFM) [Invited] 日本物理学会第62回年次大会 日本物理学会第62回年次大会 日本物理学会第62回年次大会 2007/09/23 Japanese Oral presentation(invited, special) Disclose to all
Frequency modulation atomic force microscopy in low-Q environments[Invited] Frequency modulation atomic force microscopy in low-Q environments [Invited] Frequency modulation atomic force microscopy in low-Q environments [Invited] 10th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM 2007) 10th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM 2007) 10th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM 2007) 2007/09 English Oral presentation(invited, special) Disclose to all
Frequency modulation atomic force microscopy in low-Q environments[Invited] Frequency modulation atomic force microscopy in low-Q environments [Invited] Frequency modulation atomic force microscopy in low-Q environments [Invited] Workshop on atomic/molecular manipulation and spectroscopy using scanning probe techniques Workshop on atomic/molecular manipulation and spectroscopy using scanning probe techniques Workshop on atomic/molecular manipulation and spectroscopy using scanning probe techniques 2007/08 English Oral presentation(invited, special) Disclose to all
Investigations of molecular systems by high-resolution dynamic force microscopy 「高分解能ダイナミック原子間力顕微鏡(DFM)による分子系の評価」[Invited] Investigations of molecular systems by high-resolution dynamic force microscopy 「高分解能ダイナミック原子間力顕微鏡(DFM)による分子系の評価」 [Invited] Investigations of molecular systems by high-resolution dynamic force microscopy 「高分解能ダイナミック原子間力顕微鏡(DFM)による分子系の評価」 [Invited] ドイツ/バーデン・ヴュルテンベルク州 ナノテクノロジー・フォーラム 2007 ドイツ/バーデン・ヴュルテンベルク州 ナノテクノロジー・フォーラム 2007 ドイツ/バーデン・ヴュルテンベルク州 ナノテクノロジー・フォーラム 2007 2007/06/13 English Oral presentation(invited, special) Disclose to all
Subnanometer-resolution Imaging in Liquid by Frequency Modulation Atomic Force Microscopy[Invited] Subnanometer-resolution Imaging in Liquid by Frequency Modulation Atomic Force Microscopy [Invited] Subnanometer-resolution Imaging in Liquid by Frequency Modulation Atomic Force Microscopy [Invited] Workshop on Coupled Nonlinear Oscillators and Applications in Nanosystems Workshop on Coupled Nonlinear Oscillators and Applications in Nanosystems Workshop on Coupled Nonlinear Oscillators and Applications in Nanosystems 2007/05 English Oral presentation(invited, special) Disclose to all
周波数検出方式の原子間力顕微鏡による大気・溶液環境下での原子・分子分 解能イメージング[Invited] 周波数検出方式の原子間力顕微鏡による大気・溶液環境下での原子・分子分 解能イメージング [Invited] 周波数検出方式の原子間力顕微鏡による大気・溶液環境下での原子・分子分 解能イメージング [Invited] エレクトロニクス基礎研究所第14回シンポジウム 原子・分子レベルの材料創製とキャラクタリゼーション「先端計測分析技術の展望」 エレクトロニクス基礎研究所第14回シンポジウム 原子・分子レベルの材料創製とキャラクタリゼーション「先端計測分析技術の展望」 エレクトロニクス基礎研究所第14回シンポジウム 原子・分子レベルの材料創製とキャラクタリゼーション「先端計測分析技術の展望」 2007/01 Japanese Oral presentation(invited, special) Disclose to all
Subnanometer-resolution Imaging in Liquid by Frequency ModulationAtomic Force Microscopy[Invited] Subnanometer-resolution Imaging in Liquid by Frequency ModulationAtomic Force Microscopy [Invited] Subnanometer-resolution Imaging in Liquid by Frequency ModulationAtomic Force Microscopy [Invited] 2007 Chinese Physics Society annual meeting 2007 Chinese Physics Society annual meeting 2007 Chinese Physics Society annual meeting 2007/01 English Oral presentation(invited, special) Disclose to all
Subnanometer-Resolution FM-AFM Imaging in Liquid[Invited] Subnanometer-Resolution FM-AFM Imaging in Liquid [Invited] Subnanometer-Resolution FM-AFM Imaging in Liquid [Invited] Nanoscience and Nanotechnology International Symposium Nanoscience and Nanotechnology International Symposium Nanoscience and Nanotechnology International Symposium 2006/11 English Oral presentation(invited, special) Disclose to all
Subnanometer-resolution Imaging in Liquid by Frequency-Modulation Atomic Force Microscopy[Invited] Subnanometer-resolution Imaging in Liquid by Frequency-Modulation Atomic Force Microscopy [Invited] Subnanometer-resolution Imaging in Liquid by Frequency-Modulation Atomic Force Microscopy [Invited] 3rd International Workshop on Advanced Scanning Probe Microscopy 3rd International Workshop on Advanced Scanning Probe Microscopy 3rd International Workshop on Advanced Scanning Probe Microscopy 2006/10 English Oral presentation(invited, special) Disclose to all
周波数検出方式AFM による溶液環境下での原子・分子分解能イメージング[Invited] 周波数検出方式AFM による溶液環境下での原子・分子分解能イメージング [Invited] 周波数検出方式AFM による溶液環境下での原子・分子分解能イメージング [Invited] 第44回茅コンファレンス 第44回茅コンファレンス 第44回茅コンファレンス 2006/09 Japanese Oral presentation(invited, special) Disclose to all
カーボンナノチューブのAFM による電気物性評価[Invited] カーボンナノチューブのAFM による電気物性評価 [Invited] カーボンナノチューブのAFM による電気物性評価 [Invited] 第67回応用物理学会学術講演会・シンポジウム「カーボンナノチューブの最新動向」 第67回応用物理学会学術講演会・シンポジウム「カーボンナノチューブの最新動向」 第67回応用物理学会学術講演会・シンポジウム「カーボンナノチューブの最新動向」 2006/08/29 Japanese Oral presentation(invited, special) Disclose to all
溶液環境における高分解能AFM イメージング[Invited] 溶液環境における高分解能AFM イメージング [Invited] 溶液環境における高分解能AFM イメージング [Invited] SII ナノテクノロジー社 SPM セミナー SII ナノテクノロジー社 SPM セミナー SII ナノテクノロジー社 SPM セミナー 2006/07/07 Japanese Oral presentation(invited, special) Disclose to all
Nanostructures and material properties investigated by dynamic force microscopy[Invited] Nanostructures and material properties investigated by dynamic force microscopy [Invited] Nanostructures and material properties investigated by dynamic force microscopy [Invited] Second International Symposium on Standard Materials and Metrology for Nanotechnology (SMAM-2) Second International Symposium on Standard Materials and Metrology for Nanotechnology (SMAM-2) Second International Symposium on Standard Materials and Metrology for Nanotechnology (SMAM-2) 2006/05 English Oral presentation(invited, special) Disclose to all
生命を観るSPMの可能性と展開[Invited] 生命を観るSPMの可能性と展開 [Invited] 生命を観るSPMの可能性と展開 [Invited] 第53回応用物理学関係連合講演会・シンポジウム「生命の世界・視えるものと観たいもの-生体計測・SPMの可能性」 第53回応用物理学関係連合講演会・シンポジウム「生命の世界・視えるものと観たいもの-生体計測・SPMの可能性」 第53回応用物理学関係連合講演会・シンポジウム「生命の世界・視えるものと観たいもの-生体計測・SPMの可能性」 2006/03/25 Japanese Oral presentation(invited, special) Disclose to all
有機分子材料のAFM 構造・物性計測の現状と汎用SPM シミュレータへの期待[Invited] 有機分子材料のAFM 構造・物性計測の現状と汎用SPM シミュレータへの期待 [Invited] 有機分子材料のAFM 構造・物性計測の現状と汎用SPM シミュレータへの期待 [Invited] 研究会「走査プローブ顕微鏡の最前線とシミュレータ」 研究会「走査プローブ顕微鏡の最前線とシミュレータ」 研究会「走査プローブ顕微鏡の最前線とシミュレータ」 2006/03/01 Japanese Oral presentation(invited, special) Disclose to all
周波数変調方式の原子間力顕微鏡による溶液環境下での原子・分子分解能イメージング[Invited] 周波数変調方式の原子間力顕微鏡による溶液環境下での原子・分子分解能イメージング [Invited] 周波数変調方式の原子間力顕微鏡による溶液環境下での原子・分子分解能イメージング [Invited] 日本顕微鏡学会アクティブナノ顕微鏡研究部会第4回研究会 日本顕微鏡学会アクティブナノ顕微鏡研究部会第4回研究会 日本顕微鏡学会アクティブナノ顕微鏡研究部会第4回研究会 2006/01/25 Japanese Oral presentation(invited, special) Disclose to all
溶液環境における高分解能FM-AFMイメージング[Invited] 溶液環境における高分解能FM-AFMイメージング [Invited] 溶液環境における高分解能FM-AFMイメージング [Invited] 日本顕微鏡学会平成17年度SPM研究部会・第8回研究会 日本顕微鏡学会平成17年度SPM研究部会・第8回研究会 日本顕微鏡学会平成17年度SPM研究部会・第8回研究会 2005/12/11 Japanese Oral presentation(invited, special) Disclose to all
Subnanometer-resolution Imaging of Molecules in Liquid by AFM[Invited] Subnanometer-resolution Imaging of Molecules in Liquid by AFM [Invited] Subnanometer-resolution Imaging of Molecules in Liquid by AFM [Invited] 5th International Symposium on Atomic Level Characterizations for New Materials and Devices '05 5th International Symposium on Atomic Level Characterizations for New Materials and Devices '05 5th International Symposium on Atomic Level Characterizations for New Materials and Devices '05 2005/12 English Oral presentation(invited, special) Disclose to all
Subnanometer-resolution Imaging of Molecules in Liquid by Dynamic Force Microscopy[Invited] Subnanometer-resolution Imaging of Molecules in Liquid by Dynamic Force Microscopy [Invited] Subnanometer-resolution Imaging of Molecules in Liquid by Dynamic Force Microscopy [Invited] 2005 Materials Research Society Fall Meeting 2005 Materials Research Society Fall Meeting 2005 Materials Research Society Fall Meeting 2005/12 English Oral presentation(invited, special) Disclose to all
溶液中AFM測定[Invited] 溶液中AFM測定 [Invited] 溶液中AFM測定 [Invited] 日本顕微鏡学会走査型プローブ顕微鏡分科会研究会 日本顕微鏡学会走査型プローブ顕微鏡分科会研究会 日本顕微鏡学会走査型プローブ顕微鏡分科会研究会 2005/11/22 Japanese Oral presentation(invited, special) Disclose to all
ダイナミックモード原子間力顕微鏡による分子スケール構造・物性計測の現状[Invited] ダイナミックモード原子間力顕微鏡による分子スケール構造・物性計測の現状 [Invited] ダイナミックモード原子間力顕微鏡による分子スケール構造・物性計測の現状 [Invited] 「第5回京都ナノテクスクール」&「第6回ナノ工学セミナー」ジョイントフォーラム 「第5回京都ナノテクスクール」&「第6回ナノ工学セミナー」ジョイントフォーラム 「第5回京都ナノテクスクール」&「第6回ナノ工学セミナー」ジョイントフォーラム 2005/11/21 Japanese Oral presentation(invited, special) Disclose to all
Molecular-scale imaging in liquid by Frequency-Modulation AFM[Invited] Molecular-scale imaging in liquid by Frequency-Modulation AFM [Invited] Molecular-scale imaging in liquid by Frequency-Modulation AFM [Invited] Joint Workshop on Molecules, Nanostructures, and Scanning Probe Microscopy Joint Workshop on Molecules, Nanostructures, and Scanning Probe Microscopy Joint Workshop on Molecules, Nanostructures, and Scanning Probe Microscopy 2005/11 English Oral presentation(invited, special) Disclose to all
ダイナミックモード原子間力顕微鏡による分子スケール構造・物性評価[Invited] ダイナミックモード原子間力顕微鏡による分子スケール構造・物性評価 [Invited] ダイナミックモード原子間力顕微鏡による分子スケール構造・物性評価 [Invited] 日本化学会有機結晶部会・第14回有機結晶シンポジウム 日本化学会有機結晶部会・第14回有機結晶シンポジウム 日本化学会有機結晶部会・第14回有機結晶シンポジウム 2005/09/30 Japanese Oral presentation(invited, special) Disclose to all
FM-AFMによる有機・生体分子試料の構造・物性計測[Invited] FM-AFMによる有機・生体分子試料の構造・物性計測 [Invited] FM-AFMによる有機・生体分子試料の構造・物性計測 [Invited] 日本物理学会2005年秋季大会・シンポジウム「原子間力顕微鏡法の新展開」 日本物理学会2005年秋季大会・シンポジウム「原子間力顕微鏡法の新展開」 日本物理学会2005年秋季大会・シンポジウム「原子間力顕微鏡法の新展開」 2005/09/19 Japanese Oral presentation(invited, special) Disclose to all
FM-AFMによる大気・液中環境での原子・分子分解能イメージング[Invited] FM-AFMによる大気・液中環境での原子・分子分解能イメージング [Invited] FM-AFMによる大気・液中環境での原子・分子分解能イメージング [Invited] 第66回応用物理学会学術講演会・シンポジウム「急速に進歩・発展する高分解能AFM」 第66回応用物理学会学術講演会・シンポジウム「急速に進歩・発展する高分解能AFM」 第66回応用物理学会学術講演会・シンポジウム「急速に進歩・発展する高分解能AFM」 2005/09/08 Japanese Oral presentation(invited, special) Disclose to all
カンチレバーの変位検出過程における雑音低減 −実用環境における原子・分子分解能AFM観察−[Invited] カンチレバーの変位検出過程における雑音低減 −実用環境における原子・分子分解能AFM観察− [Invited] カンチレバーの変位検出過程における雑音低減 −実用環境における原子・分子分解能AFM観察− [Invited] 日本学術振興会・第167委員会研究会 日本学術振興会・第167委員会研究会 日本学術振興会・第167委員会研究会 2005/07/27 Japanese Oral presentation(invited, special) Disclose to all
非接触原子間力顕微鏡による有機材料の構造物性・評価[Invited] 非接触原子間力顕微鏡による有機材料の構造物性・評価 [Invited] 非接触原子間力顕微鏡による有機材料の構造物性・評価 [Invited] 平成17年度顕微鏡学会関西支部特別講演 平成17年度顕微鏡学会関西支部特別講演 平成17年度顕微鏡学会関西支部特別講演 2005/07/09 Japanese Oral presentation(invited, special) Disclose to all
ダイナミックモード原子間力顕微鏡によるナノスケール電気計測の開拓[Invited] ダイナミックモード原子間力顕微鏡によるナノスケール電気計測の開拓 [Invited] ダイナミックモード原子間力顕微鏡によるナノスケール電気計測の開拓 [Invited] 日本顕微鏡学会第61回学術講演会材料系シンポジウム原子間力顕微鏡の新展開 日本顕微鏡学会第61回学術講演会材料系シンポジウム原子間力顕微鏡の新展開 日本顕微鏡学会第61回学術講演会材料系シンポジウム原子間力顕微鏡の新展開 2005/06/01 Japanese Oral presentation(invited, special) Disclose to all
非接触原子間力顕微鏡の可能性[Invited] 非接触原子間力顕微鏡の可能性 [Invited] 非接触原子間力顕微鏡の可能性 [Invited] 第52回応用物理学関係連合講演会・シンポジウム「プローブ顕微鏡の新展開に向けて現状と未来・可能性」 第52回応用物理学関係連合講演会・シンポジウム「プローブ顕微鏡の新展開に向けて現状と未来・可能性」 第52回応用物理学関係連合講演会・シンポジウム「プローブ顕微鏡の新展開に向けて現状と未来・可能性」 2005/03/29 Japanese Oral presentation(invited, special) Disclose to all
非接触AFM を用いた単分子観察[Invited] 非接触AFM を用いた単分子観察 [Invited] 非接触AFM を用いた単分子観察 [Invited] 日本化学会第85春季年会 日本化学会第85春季年会 日本化学会第85春季年会 2005/03/29 Japanese Oral presentation(invited, special) Disclose to all
Structures and Functions of Molecular Films Investigated by Dynamic Force Microscopy[Invited] Structures and Functions of Molecular Films Investigated by Dynamic Force Microscopy [Invited] Structures and Functions of Molecular Films Investigated by Dynamic Force Microscopy [Invited] 第4回界面ナノアーキテクトニクスワークショップ 第4回界面ナノアーキテクトニクスワークショップ 第4回界面ナノアーキテクトニクスワークショップ 2005/03 Japanese Oral presentation(invited, special) Disclose to all
有機分子材料のAFM 構造・物性計測の現状と汎用SPM シミュレータへの期待[Invited] 有機分子材料のAFM 構造・物性計測の現状と汎用SPM シミュレータへの期待 [Invited] 有機分子材料のAFM 構造・物性計測の現状と汎用SPM シミュレータへの期待 [Invited] 研究会「走査プローブ顕微鏡の最前線とシミュレータ」 研究会「走査プローブ顕微鏡の最前線とシミュレータ」 研究会「走査プローブ顕微鏡の最前線とシミュレータ」 2005/03 Japanese Oral presentation(invited, special) Disclose to all
局所物性分析のための走査プローブ顕微鏡の開発[Invited] 局所物性分析のための走査プローブ顕微鏡の開発 [Invited] 局所物性分析のための走査プローブ顕微鏡の開発 [Invited] 日本学術振興会薄膜131・154・151委員会合同研究会 日本学術振興会薄膜131・154・151委員会合同研究会 日本学術振興会薄膜131・154・151委員会合同研究会 2005/02/04 Japanese Oral presentation(invited, special) Disclose to all
ダイナミックモード原子間力顕微鏡による大気・液中環境での高分解能イメージング[Invited] ダイナミックモード原子間力顕微鏡による大気・液中環境での高分解能イメージング [Invited] ダイナミックモード原子間力顕微鏡による大気・液中環境での高分解能イメージング [Invited] 日本顕微鏡学会SPM研究部会H16年度研究会 日本顕微鏡学会SPM研究部会H16年度研究会 日本顕微鏡学会SPM研究部会H16年度研究会 2005/02 Japanese Oral presentation(invited, special) Disclose to all
周波数変調方式の原子間力顕微鏡による大気・液中環境での高分解能イメージング[Invited] 周波数変調方式の原子間力顕微鏡による大気・液中環境での高分解能イメージング [Invited] 周波数変調方式の原子間力顕微鏡による大気・液中環境での高分解能イメージング [Invited] ナノプローブテクノロジー第167委員会研究会 ナノプローブテクノロジー第167委員会研究会 ナノプローブテクノロジー第167委員会研究会 2005/01/27 Japanese Oral presentation(invited, special) Disclose to all
Dynamic Force Microscopy in Liquid[Invited] Dynamic Force Microscopy in Liquid [Invited] Dynamic Force Microscopy in Liquid [Invited] The 12th International Colloquium on Scanning Probe Microscopy The 12th International Colloquium on Scanning Probe Microscopy The 12th International Colloquium on Scanning Probe Microscopy 2004/12 English Oral presentation(invited, special) Disclose to all
NC-AFMによる分子材料の構造・物性計測の現状[Invited] NC-AFMによる分子材料の構造・物性計測の現状 [Invited] NC-AFMによる分子材料の構造・物性計測の現状 [Invited] 日本顕微鏡学会SPM分科会H16年度研究会 日本顕微鏡学会SPM分科会H16年度研究会 日本顕微鏡学会SPM分科会H16年度研究会 2004/11/11 Japanese Oral presentation(invited, special) Disclose to all
ダイナミックSPM の有機・バイオセンシングへの応用[Invited] ダイナミックSPM の有機・バイオセンシングへの応用 [Invited] ダイナミックSPM の有機・バイオセンシングへの応用 [Invited] 有機バイオSPM 研究会2004 有機バイオSPM 研究会2004 有機バイオSPM 研究会2004 2004/11 Japanese Oral presentation(invited, special) Disclose to all
ダイナミックモード原子間力顕微鏡によるナノスケール電気計測の開拓[Invited] ダイナミックモード原子間力顕微鏡によるナノスケール電気計測の開拓 [Invited] ダイナミックモード原子間力顕微鏡によるナノスケール電気計測の開拓 [Invited] 日本学術振興会167委員会研究会 日本学術振興会167委員会研究会 日本学術振興会167委員会研究会 2004/07 Japanese Oral presentation(invited, special) Disclose to all
非接触原子間力顕微鏡による有機分子の散逸イメージング[Invited] 非接触原子間力顕微鏡による有機分子の散逸イメージング [Invited] 非接触原子間力顕微鏡による有機分子の散逸イメージング [Invited] 日本物理学会2004年春季大会 格子欠陥・ナノ構造分科 日本物理学会2004年春季大会 格子欠陥・ナノ構造分科 日本物理学会2004年春季大会 格子欠陥・ナノ構造分科 2004/03/28 Japanese Oral presentation(invited, special) Disclose to all
ナノプローブによる分子スケール構造・物性評価の現状[Invited] ナノプローブによる分子スケール構造・物性評価の現状 [Invited] ナノプローブによる分子スケール構造・物性評価の現状 [Invited] 日本化学会第84春季年会イブニングセッション先端ウオッチング「分子ナノテクノロジー」 日本化学会第84春季年会イブニングセッション先端ウオッチング「分子ナノテクノロジー」 日本化学会第84春季年会イブニングセッション先端ウオッチング「分子ナノテクノロジー」 2004/03/26 Japanese Oral presentation(invited, special) Disclose to all
特別講演 ダイナミックモードAFMによる有機分子薄膜の構造・物性評価[Invited] 特別講演 ダイナミックモードAFMによる有機分子薄膜の構造・物性評価 [Invited] 特別講演 ダイナミックモードAFMによる有機分子薄膜の構造・物性評価 [Invited] 電気化学会第71回大会 電気化学会第71回大会 電気化学会第71回大会 2004/03/24 Japanese Oral presentation(invited, special) Disclose to all
Applications of Dynamic Force Microscopy to Molecular-scale Investigations of Organic Molecular Films[Invited] Applications of Dynamic Force Microscopy to Molecular-scale Investigations of Organic Molecular Films [Invited] Applications of Dynamic Force Microscopy to Molecular-scale Investigations of Organic Molecular Films [Invited] Kyoto University SPM Workshop (Dr. Rohrer's Award Workshop) Kyoto University SPM Workshop (Dr. Rohrer's Award Workshop) Kyoto University SPM Workshop (Dr. Rohrer's Award Workshop) 2004/02 English Oral presentation(invited, special) Disclose to all
ダイナミックモード原子間力顕微鏡による有機分子材料評価[Invited] ダイナミックモード原子間力顕微鏡による有機分子材料評価 [Invited] ダイナミックモード原子間力顕微鏡による有機分子材料評価 [Invited] 21世紀COE 「京都大学化学連携研究教育拠点」化学研究所有機薄膜研究セミナー 21世紀COE 「京都大学化学連携研究教育拠点」化学研究所有機薄膜研究セミナー 21世紀COE 「京都大学化学連携研究教育拠点」化学研究所有機薄膜研究セミナー 2003/11/08 Japanese Oral presentation(invited, special) Disclose to all
ナノの力で分子を見て操作する−単一分子イメージング−[Invited] ナノの力で分子を見て操作する−単一分子イメージング− [Invited] ナノの力で分子を見て操作する−単一分子イメージング− [Invited] 第18回「大学と科学」公開シンポジウム「極微な力で拓くナノの世界−原子・分子のナノ力学最前線−」 第18回「大学と科学」公開シンポジウム「極微な力で拓くナノの世界−原子・分子のナノ力学最前線−」 第18回「大学と科学」公開シンポジウム「極微な力で拓くナノの世界−原子・分子のナノ力学最前線−」 2003/11 Japanese Oral presentation(invited, special) Disclose to all
Investigations of Organic Molecules by Non-contact Atomic Force Microscopy[Invited] Investigations of Organic Molecules by Non-contact Atomic Force Microscopy [Invited] Investigations of Organic Molecules by Non-contact Atomic Force Microscopy [Invited] 6th International Conference on Noncontact Atomic Force Microscopy (NC-AFM 2003) 6th International Conference on Noncontact Atomic Force Microscopy (NC-AFM 2003) 6th International Conference on Noncontact Atomic Force Microscopy (NC-AFM 2003) 2003/09 English Oral presentation(invited, special) Disclose to all
走査プローブテクノロジーの現状とその分子ナノエレクトロニクスへの応用[Invited] 走査プローブテクノロジーの現状とその分子ナノエレクトロニクスへの応用 [Invited] 走査プローブテクノロジーの現状とその分子ナノエレクトロニクスへの応用 [Invited] ナノ構造ポリマー研究会講演会 ナノ構造ポリマー研究会講演会 ナノ構造ポリマー研究会講演会 2003/06/19 Japanese Oral presentation(invited, special) Disclose to all
ナノプローブによる分子の分極配向・配座の直接制御[Invited] ナノプローブによる分子の分極配向・配座の直接制御 [Invited] ナノプローブによる分子の分極配向・配座の直接制御 [Invited] 原子・分子のナノ力学−原子・分子の操作と組立− 原子・分子のナノ力学−原子・分子の操作と組立− 原子・分子のナノ力学−原子・分子の操作と組立− 2003/03/19 Japanese Oral presentation(invited, special) Disclose to all
ナノプローブによる分子の分極配向・配座の直接制御[Invited] ナノプローブによる分子の分極配向・配座の直接制御 [Invited] ナノプローブによる分子の分極配向・配座の直接制御 [Invited] 物性研短期研究会「ナノ力学による原子分子の操作と組立」 物性研短期研究会「ナノ力学による原子分子の操作と組立」 物性研短期研究会「ナノ力学による原子分子の操作と組立」 2003/01/21 Japanese Oral presentation(invited, special) Disclose to all
ケルビンプローブ原子間力顕微鏡による有機分子薄膜のナノスケール表面電位計測[Invited] ケルビンプローブ原子間力顕微鏡による有機分子薄膜のナノスケール表面電位計測 [Invited] ケルビンプローブ原子間力顕微鏡による有機分子薄膜のナノスケール表面電位計測 [Invited] 科研費学術創成研究「有機デバイス関連界面の解明と制御」第1回シンポジウム 科研費学術創成研究「有機デバイス関連界面の解明と制御」第1回シンポジウム 科研費学術創成研究「有機デバイス関連界面の解明と制御」第1回シンポジウム 2003/01/08 Japanese Oral presentation(invited, special) Disclose to all
招待講演 非接触原子間力顕微鏡の現状と液中観察への応用[Invited] 招待講演 非接触原子間力顕微鏡の現状と液中観察への応用 [Invited] 招待講演 非接触原子間力顕微鏡の現状と液中観察への応用 [Invited] 日本電子顕微鏡学会「SPMによる細胞の構造・物性のインテグレーション研究部会」 日本電子顕微鏡学会「SPMによる細胞の構造・物性のインテグレーション研究部会」 日本電子顕微鏡学会「SPMによる細胞の構造・物性のインテグレーション研究部会」 2002/12/02 Japanese Oral presentation(invited, special) Disclose to all
Investigations of Organic Molecules by Non-contact Atomic Force Microscopy[Invited] Investigations of Organic Molecules by Non-contact Atomic Force Microscopy [Invited] Investigations of Organic Molecules by Non-contact Atomic Force Microscopy [Invited] Japan-Germany Joint Seminar Japan-Germany Joint Seminar Japan-Germany Joint Seminar 2002/07 English Oral presentation(invited, special) Disclose to all
非接触原子間力顕微鏡による有機分子/金属界面の電子物性評価[Invited] 非接触原子間力顕微鏡による有機分子/金属界面の電子物性評価 [Invited] 非接触原子間力顕微鏡による有機分子/金属界面の電子物性評価 [Invited] 分子スケールナノサイエンス研究会 分子スケールナノサイエンス研究会 分子スケールナノサイエンス研究会 2002/03/18 Japanese Oral presentation(invited, special) Disclose to all
走査プローブテクノロジーの分子ナノエレクトロニクスへの応用[Invited] 走査プローブテクノロジーの分子ナノエレクトロニクスへの応用 [Invited] 走査プローブテクノロジーの分子ナノエレクトロニクスへの応用 [Invited] 日本化学会第80秋季年会 日本化学会第80秋季年会 日本化学会第80秋季年会 2001/09/20 Japanese Oral presentation(invited, special) Disclose to all
計測:少数分子の誘電制御:単分子膜から単一分子へ[Invited] 計測:少数分子の誘電制御:単分子膜から単一分子へ [Invited] 計測:少数分子の誘電制御:単分子膜から単一分子へ [Invited] 日本物理学会2001年秋季大会 日本物理学会2001年秋季大会 日本物理学会2001年秋季大会 2001/09/18 Japanese Oral presentation(invited, special) Disclose to all
Local Structures and Electrical Properties of Organic Molecular Films Investigated by Non-contact Atomic Force Microscopy[Invited] Local Structures and Electrical Properties of Organic Molecular Films Investigated by Non-contact Atomic Force Microscopy [Invited] Local Structures and Electrical Properties of Organic Molecular Films Investigated by Non-contact Atomic Force Microscopy [Invited] 4th International Conference on Noncontact Atomic Force Microscopy (NC-AFM 2001) 4th International Conference on Noncontact Atomic Force Microscopy (NC-AFM 2001) 4th International Conference on Noncontact Atomic Force Microscopy (NC-AFM 2001) 2001/09 English Oral presentation(invited, special) Disclose to all
ダイナミックモード AFM による有機分子系試料の構造・物性評価[Invited] ダイナミックモード AFM による有機分子系試料の構造・物性評価 [Invited] ダイナミックモード AFM による有機分子系試料の構造・物性評価 [Invited] 日本電子 顕微鏡学会「生物試料解析のための走査型プローブ顕微鏡法」研究部会 日本電子 顕微鏡学会「生物試料解析のための走査型プローブ顕微鏡法」研究部会 日本電子 顕微鏡学会「生物試料解析のための走査型プローブ顕微鏡法」研究部会 2000/12 Japanese Oral presentation(invited, special) Disclose to all
Local Structures and Electrical Properties of Organic Molecular Films Investigated by Noncontact Atomic Force Microscopy[Invited] Local Structures and Electrical Properties of Organic Molecular Films Investigated by Noncontact Atomic Force Microscopy [Invited] Local Structures and Electrical Properties of Organic Molecular Films Investigated by Noncontact Atomic Force Microscopy [Invited] Interdisciplinary Symposium on Ordered Molecular Films for Nano-Electronics and Photonics in PacifiChem 2000 Interdisciplinary Symposium on Ordered Molecular Films for Nano-Electronics and Photonics in PacifiChem 2000 Interdisciplinary Symposium on Ordered Molecular Films for Nano-Electronics and Photonics in PacifiChem 2000 2000/12 English Oral presentation(invited, special) Disclose to all
Molecular-scale Investigations of Organic Molecular Films by Dynamic Force Microscopy[Invited] Molecular-scale Investigations of Organic Molecular Films by Dynamic Force Microscopy [Invited] Molecular-scale Investigations of Organic Molecular Films by Dynamic Force Microscopy [Invited] Korea-Japan Joint Forum 2000 (KJF 2000) Korea-Japan Joint Forum 2000 (KJF 2000) Korea-Japan Joint Forum 2000 (KJF 2000) 2000/10 English Oral presentation(invited, special) Disclose to all
Practical Applications of Dynamic Force Microscopy using a Stable FM Detector to High-resolution Imaging of Organic Molecular Films[Invited] Practical Applications of Dynamic Force Microscopy using a Stable FM Detector to High-resolution Imaging of Organic Molecular Films [Invited] Practical Applications of Dynamic Force Microscopy using a Stable FM Detector to High-resolution Imaging of Organic Molecular Films [Invited] 4th International Conference on the Development and Technological Application of Scanning Probe Methods (SXM4) 4th International Conference on the Development and Technological Application of Scanning Probe Methods (SXM4) 4th International Conference on the Development and Technological Application of Scanning Probe Methods (SXM4) 2000/09 English Oral presentation(invited, special) Disclose to all
走査プローブ顕微鏡を用いた局所電子物性計測とその制御[Invited] 走査プローブ顕微鏡を用いた局所電子物性計測とその制御 [Invited] 走査プローブ顕微鏡を用いた局所電子物性計測とその制御 [Invited] 応用物理学会・日本化学会合同シンポジウム 応用物理学会・日本化学会合同シンポジウム 応用物理学会・日本化学会合同シンポジウム 2000/03/27 Japanese Oral presentation(invited, special) Disclose to all
非接触原子間力顕微鏡による有機分子材料科学への応用[Invited] 非接触原子間力顕微鏡による有機分子材料科学への応用 [Invited] 非接触原子間力顕微鏡による有機分子材料科学への応用 [Invited] 日本物理学会シンポジウム「非接触原子間力顕微鏡の新展開」 日本物理学会シンポジウム「非接触原子間力顕微鏡の新展開」 日本物理学会シンポジウム「非接触原子間力顕微鏡の新展開」 2000/03/24 Japanese Oral presentation(invited, special) Disclose to all
Structures and Local Surface Properties of Organic Molecular Films Investigated by Atomic Force Microscopy[Invited] Structures and Local Surface Properties of Organic Molecular Films Investigated by Atomic Force Microscopy [Invited] Structures and Local Surface Properties of Organic Molecular Films Investigated by Atomic Force Microscopy [Invited] 3rd France-Japan Workshop N2M’99 3rd France-Japan Workshop N2M’99 3rd France-Japan Workshop N2M’99 1999/11 English Oral presentation(invited, special) Disclose to all
High resolution imaging of organic thin films by dynamic force microscopy[Invited] High resolution imaging of organic thin films by dynamic force microscopy [Invited] High resolution imaging of organic thin films by dynamic force microscopy [Invited] 1st International Workshop on Noncontact Atomic Force Microscopy 1st International Workshop on Noncontact Atomic Force Microscopy 1st International Workshop on Noncontact Atomic Force Microscopy 1998/07 English Oral presentation(invited, special) Disclose to all
AFM の将来展望[Invited] AFM の将来展望 [Invited] AFM の将来展望 [Invited] 日本電子顕微鏡学会第53回学術講演会 日本電子顕微鏡学会第53回学術講演会 日本電子顕微鏡学会第53回学術講演会 1997/05 Japanese Oral presentation(invited, special) Disclose to all
Formation of Nanometer-scale Ferroelectric Domains by Scanning Probe Microscopy[Invited] Formation of Nanometer-scale Ferroelectric Domains by Scanning Probe Microscopy [Invited] Formation of Nanometer-scale Ferroelectric Domains by Scanning Probe Microscopy [Invited] France - Japan Workshop N2M'97 France - Japan Workshop N2M'97 France - Japan Workshop N2M'97 1997/05 English Oral presentation(invited, special) Disclose to all

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Title language:
Books etc
Author Author(Japanese) Author(English) Title Title(Japanese) Title(English) Publisher Publisher(Japanese) Publisher(English) Publication date Language Type Disclose
山田 啓文 山田 啓文 山田 啓文 ライフサイエンス顕微鏡ハンドブック ライフサイエンス顕微鏡ハンドブック ライフサイエンス顕微鏡ハンドブック 朝倉書店 朝倉書店 朝倉書店 2018/01 Japanese Contributor Disclose to all
K. Kobayashi, H. Yamada 小林 圭、山田 啓文 K. Kobayashi, H. Yamada Noncontact Atomic Force Microscopy Vol. 3 Noncontact Atomic Force Microscopy Vol. 3 Noncontact Atomic Force Microscopy Vol. 3 Springer Springer Springer 2016/06 English Contributor Disclose to all
YAMADA Hirofumi, KOBAYASHI Kei 山田 啓文、小林 圭 YAMADA Hirofumi, KOBAYASHI Kei Atomic Force Microscopy in Nanobiology Atomic Force Microscopy in Nanobiology Atomic Force Microscopy in Nanobiology Pan Stanford Publishing Pan Stanford Publishing Pan Stanford Publishing 2014/05 English Contributor Disclose to all
山田 啓文 山田 啓文 山田 啓文 走査型プローブ顕微鏡入門 走査型プローブ顕微鏡入門 走査型プローブ顕微鏡入門 オーム社 オーム社 オーム社 2013/08 Japanese Contributor Disclose to all
YAMADA Hirofumi, KOBAYASHI Kei 山田 啓文、小林 圭 YAMADA Hirofumi, KOBAYASHI Kei Noncontact Atomic Force Microscopy Vol. 2 Noncontact Atomic Force Microscopy Vol. 2 Noncontact Atomic Force Microscopy Vol. 2 Springer Springer Springer 2009/10 English Contributor Disclose to all
山田 啓文、小林 圭 山田 啓文、小林 圭 山田 啓文、小林 圭 実験物理科学シリーズ6 走査プローブ顕微鏡−正しい実験とデータ解析のために必要なこと− 実験物理科学シリーズ6 走査プローブ顕微鏡−正しい実験とデータ解析のために必要なこと− 実験物理科学シリーズ6 走査プローブ顕微鏡−正しい実験とデータ解析のために必要なこと− 共立出版 共立出版 共立出版 2009/03 Japanese Contributor Disclose to all
宮戸 祐治、山田 啓文、松重 和美 宮戸 祐治、山田 啓文、松重 和美 宮戸 祐治、山田 啓文、松重 和美 分子エレクトロニクスの基盤技術と将来展望 分子エレクトロニクスの基盤技術と将来展望 分子エレクトロニクスの基盤技術と将来展望 シーエムシー出版 シーエムシー出版 シーエムシー出版 2009/01 Japanese Contributor Disclose to all
山田 啓文 山田 啓文 山田 啓文 ナノテクノロジー入門シリーズIV ナノテクのための工学入門 ナノテクノロジー入門シリーズIV ナノテクのための工学入門 ナノテクノロジー入門シリーズIV ナノテクのための工学入門 共立出版 共立出版 共立出版 2007/02 Japanese Contributor Disclose to all
YAMADA Hirofumi 山田 啓文 YAMADA Hirofumi Roadmap of Scanning Probe Microscopy Roadmap of Scanning Probe Microscopy Roadmap of Scanning Probe Microscopy Springer Springer Springer 2007 English Contributor Disclose to all
YAMADA Hirofumi, KOBAYASHI Kei 山田 啓文、小林 圭 YAMADA Hirofumi, KOBAYASHI Kei Applied Scanning Probe Methods VI Applied Scanning Probe Methods VI Applied Scanning Probe Methods VI Springer Springer Springer 2007 English Contributor Disclose to all
山田 啓文 山田 啓文 山田 啓文 走査型プローブ顕微鏡−最新技術と未来予測− 走査型プローブ顕微鏡−最新技術と未来予測− 走査型プローブ顕微鏡−最新技術と未来予測− 丸善 丸善 丸善 2005/12 Japanese Contributor Disclose to all
山田 啓文 山田 啓文 山田 啓文 実戦ナノテクノロジー 走査プローブ顕微鏡と局所分光 実戦ナノテクノロジー 走査プローブ顕微鏡と局所分光 実戦ナノテクノロジー 走査プローブ顕微鏡と局所分光 裳華房 裳華房 裳華房 2005/11 Japanese Contributor Disclose to all
山田 啓文 山田 啓文 山田 啓文 表面・界面工学大系 基礎編 表面・界面工学大系 基礎編 表面・界面工学大系 基礎編 フジ・テクノシステム フジ・テクノシステム フジ・テクノシステム 2005/03 Japanese Contributor Disclose to all
山田 啓文 山田 啓文 山田 啓文 極微な力で拓くナノの世界 原子・分子のナノ力学最前線 極微な力で拓くナノの世界 原子・分子のナノ力学最前線 極微な力で拓くナノの世界 原子・分子のナノ力学最前線 クバプロ クバプロ クバプロ 2004/10 Japanese Contributor Disclose to all
山田 啓文 山田 啓文 山田 啓文 新訂版 表面科学の基礎と応用 新訂版 表面科学の基礎と応用 新訂版 表面科学の基礎と応用 2004/06 Japanese Contributor Disclose to all
山田 啓文 山田 啓文 山田 啓文 先端化学シリーズVI 界面・コロイド/ナノテクノロジー/分子エレクトロニクス/ナノ分析 先端化学シリーズVI 界面・コロイド/ナノテクノロジー/分子エレクトロニクス/ナノ分析 先端化学シリーズVI 界面・コロイド/ナノテクノロジー/分子エレクトロニクス/ナノ分析 丸善 丸善 丸善 2004/03 Japanese Contributor Disclose to all
山田 啓文 山田 啓文 山田 啓文 21世紀版 薄膜作製応用ハンドブック 21世紀版 薄膜作製応用ハンドブック 21世紀版 薄膜作製応用ハンドブック エヌ・ティー・エス エヌ・ティー・エス エヌ・ティー・エス 2003/04 Japanese Contributor Disclose to all
山田 啓文 山田 啓文 山田 啓文 原子・分子のナノ力学 原子・分子のナノ力学 原子・分子のナノ力学 丸善 丸善 丸善 2003/01 Japanese Contributor Disclose to all
山田 啓文 山田 啓文 山田 啓文 エレクトロニクス材料シリーズ 新しいレジスト材料とナノテクノロジー エレクトロニクス材料シリーズ 新しいレジスト材料とナノテクノロジー エレクトロニクス材料シリーズ 新しいレジスト材料とナノテクノロジー シーエムシー シーエムシー シーエムシー 2002/10 Japanese Contributor Disclose to all
山田 啓文 山田 啓文 山田 啓文 マイクロマシン マイクロマシン マイクロマシン 産業技術サービスセンター 産業技術サービスセンター 産業技術サービスセンター 2002/02 Japanese Contributor Disclose to all
YAMADA Hirofumi YAMADA Hirofumi YAMADA Hirofumi Noncontact Atomic Force Microscopy Noncontact Atomic Force Microscopy Noncontact Atomic Force Microscopy Springer Springer Springer 2002 English Contributor Disclose to all
山田 啓文 山田 啓文 山田 啓文 有機分子のSTM/AFM 有機分子のSTM/AFM 有機分子のSTM/AFM 共立出版 共立出版 共立出版 1993/06 Japanese Contributor Disclose to all

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Title language:
Industrial Property Rights (Patent)
Inventor(s) Inventor(s) (Japanese) Inventor(s) (English) Title Title(Japanese) Title(English) Stage Patent number Date Disclose
大田 昌弘、梅田 健一、小林 圭、山田 啓文 大田 昌弘、梅田 健一、小林 圭、山田 啓文 大田 昌弘、梅田 健一、小林 圭、山田 啓文 原子間力顕微鏡を用いた表面電荷密度測定装置 原子間力顕微鏡を用いた表面電荷密度測定装置 原子間力顕微鏡を用いた表面電荷密度測定装置 特許出願 PCT/JP2023/55002 2013/02/26 Disclose to all
粉川 良平、大田 昌弘、梅田 健一、小林 圭、山田 啓文、松重 和美 粉川 良平、大田 昌弘、梅田 健一、小林 圭、山田 啓文、松重 和美 粉川 良平、大田 昌弘、梅田 健一、小林 圭、山田 啓文、松重 和美 原子間力顕微鏡におけるカンチレバー励振方法及び原子間力顕微鏡 原子間力顕微鏡におけるカンチレバー励振方法及び原子間力顕微鏡 原子間力顕微鏡におけるカンチレバー励振方法及び原子間力顕微鏡 特許出願 特願2011-190980 2011/09/01 Disclose to all
粉川 良平、大田 昌弘、梅田 健一、小林 圭、山田 啓文、松重 和美 粉川 良平、大田 昌弘、梅田 健一、小林 圭、山田 啓文、松重 和美 粉川 良平、大田 昌弘、梅田 健一、小林 圭、山田 啓文、松重 和美 原子間力顕微鏡を用いた誘電特性測定方法 原子間力顕微鏡を用いた誘電特性測定方法 原子間力顕微鏡を用いた誘電特性測定方法 特許出願 特願2011-190981 2011/09/01 Disclose to all
粉川 良平、大田 昌弘、梅田 健一、大藪 範昭、小林 圭、山田 啓文、松重 和美 粉川 良平、大田 昌弘、梅田 健一、大藪 範昭、小林 圭、山田 啓文、松重 和美 粉川 良平、大田 昌弘、梅田 健一、大藪 範昭、小林 圭、山田 啓文、松重 和美 原子間力顕微鏡におけるカンチレバー励振方法及び原子間力顕微鏡 原子間力顕微鏡におけるカンチレバー励振方法及び原子間力顕微鏡 原子間力顕微鏡におけるカンチレバー励振方法及び原子間力顕微鏡 特許出願 特願2010-128127 2010/06/03 Disclose to all
西 啓介、細川 義浩、小林 圭、山田 啓文、松重 和美 西 啓介、細川 義浩、小林 圭、山田 啓文、松重 和美 西 啓介、細川 義浩、小林 圭、山田 啓文、松重 和美 走査形プローブ顕微鏡 走査形プローブ顕微鏡 走査形プローブ顕微鏡 特許出願 PCT/JP2010/055168 2010/03/25 Disclose to all
大藪 範昭、木村 建次郎、小林 圭、山田 啓文、松重 和美 大藪 範昭、木村 建次郎、小林 圭、山田 啓文、松重 和美 大藪 範昭、木村 建次郎、小林 圭、山田 啓文、松重 和美 振動体の周波数検出装置、原子間力顕微鏡、振動体の周波数検出方法およびプログラム 振動体の周波数検出装置、原子間力顕微鏡、振動体の周波数検出方法およびプログラム 振動体の周波数検出装置、原子間力顕微鏡、振動体の周波数検出方法およびプログラム 特許出願 特願2009-193606 2009/08/24 Disclose to all
大藪 範昭、木村 建次郎、井戸 慎一郎、鈴木 一博、小林 圭、山田 啓文、松重 和美 大藪 範昭、木村 建次郎、井戸 慎一郎、鈴木 一博、小林 圭、山田 啓文、松重 和美 大藪 範昭、木村 建次郎、井戸 慎一郎、鈴木 一博、小林 圭、山田 啓文、松重 和美 制御装置、原子間力顕微鏡、制御方法およびプログラム 制御装置、原子間力顕微鏡、制御方法およびプログラム 制御装置、原子間力顕微鏡、制御方法およびプログラム 特許出願 特願2009-180137 2009/07/31 Disclose to all
常見 英加、佐藤 宣夫、小林 圭、山田 啓文、松重 和美 常見 英加、佐藤 宣夫、小林 圭、山田 啓文、松重 和美 常見 英加、佐藤 宣夫、小林 圭、山田 啓文、松重 和美 走査型プローブ顕微鏡の出力処理方法及び走査型プローブ顕微鏡 走査型プローブ顕微鏡の出力処理方法及び走査型プローブ顕微鏡 走査型プローブ顕微鏡の出力処理方法及び走査型プローブ顕微鏡 特許出願 特願2008-314113 2008/12/10 Disclose to all
大藪 範昭、大田 昌弘、木村 建次郎、井戸 慎一郎、小林 圭、山田 啓文、松重 和美 大藪 範昭、大田 昌弘、木村 建次郎、井戸 慎一郎、小林 圭、山田 啓文、松重 和美 大藪 範昭、大田 昌弘、木村 建次郎、井戸 慎一郎、小林 圭、山田 啓文、松重 和美 走査装置 走査装置 走査装置 特許出願 特願2008-002057 2008/07/31 Disclose to all
細川 義浩、小林 圭、山田 啓文、松重 和美、森 ゆき子 細川 義浩、小林 圭、山田 啓文、松重 和美、森 ゆき子 細川 義浩、小林 圭、山田 啓文、松重 和美、森 ゆき子 表面物性計測方法、および表面物性計測装置 表面物性計測方法、および表面物性計測装置 表面物性計測方法、および表面物性計測装置 特許出願 特願2008-123953 2008/05/09 Disclose to all
木村 建次郎、小林 圭、山田 啓文、堀内 喬、佐藤 宣夫、中井 章文、松重 和美 木村 建次郎、小林 圭、山田 啓文、堀内 喬、佐藤 宣夫、中井 章文、松重 和美 木村 建次郎、小林 圭、山田 啓文、堀内 喬、佐藤 宣夫、中井 章文、松重 和美 3次元場取得装置、方法およびプログラム、磁気力顕微鏡、情報読み取り装置、電流分布測定装置、生体磁場測定装置、非破壊検査装置、並びにn次元場取得装置 3次元場取得装置、方法およびプログラム、磁気力顕微鏡、情報読み取り装置、電流分布測定装置、生体磁場測定装置、非破壊検査装置、並びにn次元場取得装置 3次元場取得装置、方法およびプログラム、磁気力顕微鏡、情報読み取り装置、電流分布測定装置、生体磁場測定装置、非破壊検査装置、並びにn次元場取得装置 特許出願 特願2007-91856 2007/03/30 Disclose to all
木村 邦子、小林 圭、山田 啓文、堀内 俊寿、石田 謙司、松重 和美 木村 邦子、小林 圭、山田 啓文、堀内 俊寿、石田 謙司、松重 和美 木村 邦子、小林 圭、山田 啓文、堀内 俊寿、石田 謙司、松重 和美 分子配向装置および分子配向方法 分子配向装置および分子配向方法 分子配向装置および分子配向方法 特許出願 特願2006-130821 2006/05/09 Disclose to all
木村 邦子、小林 圭、山田 啓文、堀内 俊寿、石田 謙司、松重 和美 木村 邦子、小林 圭、山田 啓文、堀内 俊寿、石田 謙司、松重 和美 木村 邦子、小林 圭、山田 啓文、堀内 俊寿、石田 謙司、松重 和美 高密度情報記録、再生、消去方法、並びにそれに使用される媒体および装置 高密度情報記録、再生、消去方法、並びにそれに使用される媒体および装置 高密度情報記録、再生、消去方法、並びにそれに使用される媒体および装置 特許出願 PCT/JP2005/023687 2005/12/23 Disclose to all
木村 建次郎、小林 圭、山田 啓文、松重 和美 木村 建次郎、小林 圭、山田 啓文、松重 和美 木村 建次郎、小林 圭、山田 啓文、松重 和美 電子顕微鏡制御装置、電子顕微鏡制御方法、制御プログラム、制御プログラムを記録した記録媒体、電子顕微鏡システム、および電子線照射装置 電子顕微鏡制御装置、電子顕微鏡制御方法、制御プログラム、制御プログラムを記録した記録媒体、電子顕微鏡システム、および電子線照射装置 電子顕微鏡制御装置、電子顕微鏡制御方法、制御プログラム、制御プログラムを記録した記録媒体、電子顕微鏡システム、および電子線照射装置 特許出願 特願2005-337824 2005/11/22 Disclose to all
宮戸 祐治、西尾 太一、小林 圭、山田 啓文、松重 和美 宮戸 祐治、西尾 太一、小林 圭、山田 啓文、松重 和美 宮戸 祐治、西尾 太一、小林 圭、山田 啓文、松重 和美 分子トランジスタおよびその製造方法、並びにそれを用いた不揮発性メモリおよび圧電センサ 分子トランジスタおよびその製造方法、並びにそれを用いた不揮発性メモリおよび圧電センサ 分子トランジスタおよびその製造方法、並びにそれを用いた不揮発性メモリおよび圧電センサ 特許出願 特願2005-285552 2005/09/29 Disclose to all
木村 邦子、小林 圭、山田 啓文、堀内 俊寿、松重 和美 木村 邦子、小林 圭、山田 啓文、堀内 俊寿、松重 和美 木村 邦子、小林 圭、山田 啓文、堀内 俊寿、松重 和美 圧電アクチュエータおよびその製造方法 圧電アクチュエータおよびその製造方法 圧電アクチュエータおよびその製造方法 特許出願 特願2005-255586 2005/09/02 Disclose to all
宮戸 祐治 小林 圭 山田 啓文 松重 和美 宮戸 祐治 小林 圭 山田 啓文 松重 和美 宮戸 祐治 小林 圭 山田 啓文 松重 和美 分子デバイス及びその製造方法 分子デバイス及びその製造方法 分子デバイス及びその製造方法 特許出願 PCT/JP2005/015773 2005/08/30 Disclose to all
木村 建次郎、小林 圭、山田 啓文、松重 和美 木村 建次郎、小林 圭、山田 啓文、松重 和美 木村 建次郎、小林 圭、山田 啓文、松重 和美 電子ビームの照射装置、半導体製造装置 電子ビームの照射装置、半導体製造装置 電子ビームの照射装置、半導体製造装置 特許出願 特願2005-144049 2005/05/17 Disclose to all
木村 建次郎、小林 圭、山田 啓文、松重 和美、臼田 宏治 木村 建次郎、小林 圭、山田 啓文、松重 和美、臼田 宏治 木村 建次郎、小林 圭、山田 啓文、松重 和美、臼田 宏治 評価用半導体デバイス、評価用半導体デバイスの作製方法、半導体デバイスの評価方法 評価用半導体デバイス、評価用半導体デバイスの作製方法、半導体デバイスの評価方法 評価用半導体デバイス、評価用半導体デバイスの作製方法、半導体デバイスの評価方法 特許出願 特願2005-56724 2005/03/01 Disclose to all
木村 邦子、小林 圭、山田 啓文、堀内 俊寿、石田 謙司、松重 和美 木村 邦子、小林 圭、山田 啓文、堀内 俊寿、石田 謙司、松重 和美 木村 邦子、小林 圭、山田 啓文、堀内 俊寿、石田 謙司、松重 和美 有機エレクトロルミネッセンス素子およびその製造方法 有機エレクトロルミネッセンス素子およびその製造方法 有機エレクトロルミネッセンス素子およびその製造方法 特許出願 特願2005-038844 2005/02/16 Disclose to all
木村 邦子、小林 圭、山田 啓文、堀内 俊寿、石田 謙司、松重 和美 木村 邦子、小林 圭、山田 啓文、堀内 俊寿、石田 謙司、松重 和美 木村 邦子、小林 圭、山田 啓文、堀内 俊寿、石田 謙司、松重 和美 有機電界効果型トランジスタおよびその製造方法 有機電界効果型トランジスタおよびその製造方法 有機電界効果型トランジスタおよびその製造方法 特許出願 特願2005-038843 2005/02/16 Disclose to all
木村 邦子、小林 圭、山田 啓文、堀内 俊寿、石田 謙司、松重 和美 木村 邦子、小林 圭、山田 啓文、堀内 俊寿、石田 謙司、松重 和美 木村 邦子、小林 圭、山田 啓文、堀内 俊寿、石田 謙司、松重 和美 高密度メモリー素子および製造方法 高密度メモリー素子および製造方法 高密度メモリー素子および製造方法 特許出願 特願2004-379324 2004/12/28 Disclose to all
古川 貴大、木村 建次郎、小林 圭、山田 啓文、松重 和美 古川 貴大、木村 建次郎、小林 圭、山田 啓文、松重 和美 古川 貴大、木村 建次郎、小林 圭、山田 啓文、松重 和美 カンチレバーおよびその利用 カンチレバーおよびその利用 カンチレバーおよびその利用 特許出願 特願2004-253258 2004/08/31 Disclose to all
福間 剛士、小林 圭、山田 啓文、松重 和美 福間 剛士、小林 圭、山田 啓文、松重 和美 福間 剛士、小林 圭、山田 啓文、松重 和美 高周波微小振動測定装置 高周波微小振動測定装置 高周波微小振動測定装置 特許出願 特願2004-091217 2004/03/26 Disclose to all
小林 圭、木村 建次郎、山田 啓文、松重 和美 小林 圭、木村 建次郎、山田 啓文、松重 和美 小林 圭、木村 建次郎、山田 啓文、松重 和美 原子間力顕微鏡用カンチレバー 原子間力顕微鏡用カンチレバー 原子間力顕微鏡用カンチレバー 特許出願 特願2004-036389 2004/02/13 Disclose to all
木村 邦子、小林 圭、山田 啓文、堀内 俊寿、石田 謙司、松重 和美 木村 邦子、小林 圭、山田 啓文、堀内 俊寿、石田 謙司、松重 和美 木村 邦子、小林 圭、山田 啓文、堀内 俊寿、石田 謙司、松重 和美 薄膜及びその製造方法 薄膜及びその製造方法 薄膜及びその製造方法 特許出願 PCT/P2003/011670 2003/09/11 Disclose to all
福間 剛士、小林 圭、山田 啓文、松重 和美 福間 剛士、小林 圭、山田 啓文、松重 和美 福間 剛士、小林 圭、山田 啓文、松重 和美 物性値の測定方法および走査型プローブ顕微鏡 物性値の測定方法および走査型プローブ顕微鏡 物性値の測定方法および走査型プローブ顕微鏡 特許出願 特願2003-085746 2003/03/26 Disclose to all
木村 邦子、小林 圭、山田 啓文、堀内 俊寿、石田 謙司、松重 和美 木村 邦子、小林 圭、山田 啓文、堀内 俊寿、石田 謙司、松重 和美 木村 邦子、小林 圭、山田 啓文、堀内 俊寿、石田 謙司、松重 和美 機能素子、機能素子を用いた装置、および機能素子の製造方法 機能素子、機能素子を用いた装置、および機能素子の製造方法 機能素子、機能素子を用いた装置、および機能素子の製造方法 特許出願 特願2003-071054 2003/03/14 Disclose to all
小林 圭、山田 啓文、松重 和美 小林 圭、山田 啓文、松重 和美 小林 圭、山田 啓文、松重 和美 物性値の測定方法および走査型プローブ顕微鏡 物性値の測定方法および走査型プローブ顕微鏡 物性値の測定方法および走査型プローブ顕微鏡 特許出願 特願2001-373060 2001/12/06 Disclose to all
山田 啓文 、小林圭 山田 啓文 、小林圭 山田 啓文 、小林圭 周波数検出装置およびそれを用いた走査型プローブ顕微鏡 周波数検出装置およびそれを用いた走査型プローブ顕微鏡 周波数検出装置およびそれを用いた走査型プローブ顕微鏡 特許出願 特願平11-298781 1999/10/20 Disclose to all
渡辺 俊二、藤井 透、山田 啓文、沖野 裕丈 渡辺 俊二、藤井 透、山田 啓文、沖野 裕丈 渡辺 俊二、藤井 透、山田 啓文、沖野 裕丈 走査型プローブ顕微鏡用カンチレバー及び走査型プローブ顕微鏡 走査型プローブ顕微鏡用カンチレバー及び走査型プローブ顕微鏡 走査型プローブ顕微鏡用カンチレバー及び走査型プローブ顕微鏡 特許出願 特願平11-291753 1999/10/14 Disclose to all
山田 啓文 、小林 圭 山田 啓文 、小林 圭 山田 啓文 、小林 圭 走査形プローブ顕微鏡 走査形プローブ顕微鏡 走査形プローブ顕微鏡 特許出願 特願平11-203906 1999/07/16 Disclose to all

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Title language:
Awards
Title(Japanese) Title(English) Organization name(Japanese) Organization name(English) Date
第7回沼田記念論文賞 精密工学会 1990/01/
第167委員会ナノプローブテクノロジー賞 日本学術振興会産学協力委員会 2004/00/00
平成20年度日本表面科学会技術賞 日本表面科学会 2004/06/
第14回 平成29年度(2017年度)表面科学会(現 表面真空学会)会誌賞 表面科学会(現 表面真空学会) 2017/08/
External funds: competitive funds and Grants-in-Aid for Scientific Research (Kakenhi)
Type Position Title(Japanese) Title(English) Period
基盤(A)(2)一般 Representative 走査プローブ顕微鏡による有機強誘電体薄膜のナノスケール分域特性 1997-1999
特定(A)(2) Representative 微細加工カンチレバーを用いた近接場光学プローブによる機能性有機薄膜の評価 1998-1999
基盤(A)(2)展開 Representative 圧電薄膜カンチレバーを用いた近接場音響顕微鏡の開発 1998-1999
特定(B)(2) Representative 分子間相互作用を用いた分子の同定と制御 1999-2002
基盤(A)(2)一般 Representative 走査プローブ法による少数分子系の界面近傍分極の評価と制御 2002-2004
基盤研究(S) Representative 周波数検出型AFMに基づく大気・液中ナノ空間相関計測・制御法の開発 Proximal multi-probe measurement and control method for nanometer-scale structures based on frequency modulation AFM 2007-2011
特定領域研究 Representative 新規ナノプローブ計測法によるカーボンナノチューブの電気・力学物性評価 Novel Nanoprobe Method for Investigating of Electrical and Mechanical Properties of Carbon Nanotubes 2007-2011
基盤研究(A) Representative 3次元フォースマッピング法による生体分子-溶液界面の構造・機能可視化 2012/04/01-2012/09/10
基盤研究(S) Representative 複合機能プローブシステムによるバイオ・ナノ材料の分子スケール機能可視化 Molecular-scale functional visualization of bio- and nano-materials by AFM functional probes 2012-2016
挑戦的萌芽研究 Representative 3次元フォースマッピング法による生体分子の揺らぎ計測 Application of 3-dimensional force mapping method to the measurement of biomolecule fluctuations 2014-2015
基盤研究(A) Representative 3次元フォース解析による生体分子-溶液界面の構造・機能可視化 2017/04/01-2017/05/30
基盤研究(S) Representative 高分解能原子間力顕微鏡・分光法による生体分子間認識・相互作用力の直接可視化 Direct visualization of molecular recognition forces by high-resolution atomic force microscopy and spectroscopy 2017/05/31-2022/03/31
基盤研究(A) Representative 3次元フォース解析による生体分子-溶液界面の構造・機能可視化 (平成29年度分) 2017/04/01-2018/03/31
基盤研究(S) Representative 高分解能原子間力顕微鏡・分光法による生体分子間認識・相互作用力の直接可視化 (平成29年度分) 2017/04/01-2018/03/31
基盤研究(S) Representative 高分解能原子間力顕微鏡・分光法による生体分子間認識・相互作用力の直接可視化 (平成30年度分) 2018/04/01-2019/03/31

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External funds: other than those above
System Main person Title(Japanese) Title(English) Period
包括的産学融合アライアンス 山田 啓文 有機高分子超薄膜のための真空スプレー体積法の開発 2002-2006
科学技術振興機構 戦略的基礎研究推進事業(CREST) 田中 一義 精密分子設計に基づくナノ電子デバイス構築 2002-2007
文部科学省 リーディングプロジェクト(LP) 山田 啓文 走査型マルチプローブ統合制御装置の開発 (マルチプローブAFM制御装置の開発) Development of Scanning Probe Microscopy for Nanometer - scale Surface Propeities 2004-2006
科学技術振興機構 先端計測分析技術・機器開発事業 大気中・液中で動作する原子分解能分析顕微鏡 Atomic Resolution Scanning Probe Microscope Working in Air/Liquid 2005-2010
NEDO 国際共同研究助成事業(NEDOグラント) AFMを用いたナノ物質形態の精密評価手法のISO国際標準化 2005/10-2008/09
NEDO 戦略的技術開発費委託費(ナノエレクトロニクス半導体新材料・新構造技術開発-うち新材料・新構造ナノ電子デバイス" 山田 啓文 超稠密金属ナノギャップ不揮発性メモリの研究開発-うちナノギャップデバイス評価技術の開発 Development of Nanoelectronic Device Technology, Development of Nanogap Nonvolatile Memory Technology 2007-2011
Teaching subject(s)
Name(Japanese) Name(English) Term Department Period
表面電子物性工学 前期 工学研究科 2011/04-2012/03
電気電子材料学 後期 工学部 2011/04-2012/03
音響工学 前期 工学部 2011/04-2012/03
表面電子物性工学 Surface Electronic Properties 前期 工学研究科 2012/04-2013/03
電気電子材料学 Electrical and Electronic Materials 後期 工学部 2012/04-2013/03
電気電子材料学 Electrical and Electronic Materials 後期 工学部 2013/04-2014/03
電気電子工学実験A Electrical and Electronic Engineering Practice A 前期 工学部 2013/04-2014/03
電気電子工学実験B Electrical and Electronic Engineering Practice B 後期 工学部 2013/04-2014/03
電気電子工学実習A Electrical and Electronic Engineering Advanced Practice A 前期 工学部 2013/04-2014/03
電気電子工学実習B Electrical and Electronic Engineering Advanced Practice B 後期 工学部 2013/04-2014/03
分子エレクトロニクス Molecular Electronics 前期 工学研究科 2013/04-2014/03
表面電子物性工学 Surface Electronic Properties 前期 工学研究科 2013/04-2014/03
電気電子材料学 Electrical and Electronic Materials 後期 工学部 2014/04-2015/03
表面電子物性工学 Surface Electronic Properties 前期 工学研究科 2014/04-2015/03
分子エレクトロニクス Molecular Electronics 前期 工学研究科 2015/04-2016/03
表面電子物性工学 Surface Electronic Properties 前期 工学研究科 2015/04-2016/03
電気電子材料学 Electrical and Electronic Materials 後期 工学部 2015/04-2016/03
研究インターンシップD Research Internship (D) 通年 工学研究科 2016/04-2017/03
研究インターンシップM Research Internship(M) 通年 工学研究科 2016/04-2017/03
研究論文 Master's Thesis 通年 工学研究科 2016/04-2017/03
表面電子物性工学 Surface Electronic Properties 前期 工学研究科 2016/04-2017/03
電子工学特別セミナー Advanced Seminar on Electronic Science and Engineering 通年 工学研究科 2016/04-2017/03
電子工学特別実験及演習2 Advanced Experiments and Exercises in Electronic Science and Engineering II 通年 工学研究科 2016/04-2017/03
電子工学特別実験及演習1 Advanced Experiments and Exercises in Electronic Science and Engineering I 通年 工学研究科 2016/04-2017/03
電子工学特別演習1 Advanced Exercises on Electronic Science and Engineering I 通年 工学研究科 2016/04-2017/03
電子工学特別演習2 Advanced Exercises on Electronic Science and Engineering II 通年 工学研究科 2016/04-2017/03
電子工学特別研修2(インターン) Advanced Seminar in Electronic Science and Engineering II 前期 工学研究科 2016/04-2017/03
電子工学特別研修1(インターン) Advanced Seminar in Electronic Science and Engineering I 前期 工学研究科 2016/04-2017/03
電気電子材料学 Electrical and Electronic Materials 後期 工学部 2016/04-2017/03
分子エレクトロニクス Molecular Electronics 前期 工学研究科 2017/04-2018/03
表面電子物性工学 Surface Electronic Properties 前期 工学研究科 2017/04-2018/03
電気電子材料学 Electrical and Electronic Materials 後期 工学部 2017/04-2018/03
表面電子物性工学 Surface Electronic Properties 前期 工学研究科 2018/04-2019/03
電気電子材料学 Electrical and Electronic Materials 後期 工学部 2018/04-2019/03
分子エレクトロニクス Molecular Electronics 前期 工学研究科 2019/04-2020/03
表面電子物性工学 Surface Electronic Properties 前期 工学研究科 2019/04-2020/03
電気電子材料学 Electrical and Electronic Materials 後期 工学部 2019/04-2020/03

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School management (title, position)
Title Period
電気電子工学系 学系長 2016/10/01-2017/03/31
Faculty management (title, position)
Title Period
電子工学専攻長 2016/04/01-2017/03/31
工学研究科教育制度委員会 委員 2017/04/01-2019/03/31
工学研究科・工学部図書委員会 委員 2017/04/01-2019/03/31
Other activities (magazines and newspapers)
Title Contents Media Column Date
抗体分子の構造・機能の直接可視化と6量体・2次元結晶形成の発見 読売新聞、京都新聞、日刊工業新聞、朝日新聞夕刊 2014/01/20
DNA二重らせん及びその微細構造の直接イメージングに成功 京都新聞、日刊工業新聞 2013/02/20
Other activities (public organizations)
Committee(Japanese) Committee(English) Title Organization name Period
外部評価委員 独立行政法人科学技術振興機構 2011/11/21-2011/12/31
科学研究費委員会 専門委員 独立行政法人 日本学術振興会 2011/12/01-2012/11/30
科学研究費委員会 専門委員 独立行政法人 日本学術振興会 2012/12/01-2013/11/30
Other activities (private companies, NPOs, etc.)
Company name Activity Period
財団法人新世代研究所 「ATI研究助成」選考委員会委員 2011/04/01-2013/03/31